JP5850292B2 - 眼科装置 - Google Patents

眼科装置 Download PDF

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Publication number
JP5850292B2
JP5850292B2 JP2010249228A JP2010249228A JP5850292B2 JP 5850292 B2 JP5850292 B2 JP 5850292B2 JP 2010249228 A JP2010249228 A JP 2010249228A JP 2010249228 A JP2010249228 A JP 2010249228A JP 5850292 B2 JP5850292 B2 JP 5850292B2
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JP
Japan
Prior art keywords
fundus
presenting
visual field
measurement
target
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Application number
JP2010249228A
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English (en)
Japanese (ja)
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JP2012100713A5 (fr
JP2012100713A (ja
Inventor
近藤 直幸
直幸 近藤
寿成 鳥居
寿成 鳥居
俊夫 村田
俊夫 村田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2010249228A priority Critical patent/JP5850292B2/ja
Priority to EP20110187640 priority patent/EP2449957B1/fr
Priority to US13/288,610 priority patent/US8931904B2/en
Publication of JP2012100713A publication Critical patent/JP2012100713A/ja
Publication of JP2012100713A5 publication Critical patent/JP2012100713A5/ja
Priority to US14/570,970 priority patent/US9649022B2/en
Application granted granted Critical
Publication of JP5850292B2 publication Critical patent/JP5850292B2/ja
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  • Eye Examination Apparatus (AREA)
JP2010249228A 2010-11-05 2010-11-05 眼科装置 Active JP5850292B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010249228A JP5850292B2 (ja) 2010-11-05 2010-11-05 眼科装置
EP20110187640 EP2449957B1 (fr) 2010-11-05 2011-11-03 Procédé de contrôle pour appareil d'examen de fond
US13/288,610 US8931904B2 (en) 2010-11-05 2011-11-03 Control method of a fundus examination apparatus
US14/570,970 US9649022B2 (en) 2010-11-05 2014-12-15 Control method of a fundus examination apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010249228A JP5850292B2 (ja) 2010-11-05 2010-11-05 眼科装置

Publications (3)

Publication Number Publication Date
JP2012100713A JP2012100713A (ja) 2012-05-31
JP2012100713A5 JP2012100713A5 (fr) 2013-12-12
JP5850292B2 true JP5850292B2 (ja) 2016-02-03

Family

ID=46391917

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010249228A Active JP5850292B2 (ja) 2010-11-05 2010-11-05 眼科装置

Country Status (1)

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JP (1) JP5850292B2 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2883492B1 (fr) * 2012-08-10 2022-08-24 Kowa Company Ltd. Périmètre
JP6241040B2 (ja) * 2013-01-23 2017-12-06 株式会社ニデック 眼科解析装置、及び眼科解析プログラム
JP2014188254A (ja) * 2013-03-28 2014-10-06 Nidek Co Ltd 視野検査装置
ES2936340T3 (es) 2013-06-25 2023-03-16 Oculus Optikgeraete Gmbh Procedimiento de análisis
KR101609365B1 (ko) 2014-05-27 2016-04-21 주식회사 고영테크놀러지 착탈식 oct 장치
EP3166474B1 (fr) * 2014-07-09 2021-09-08 Cellview Imaging Inc. Épaisseur rétinienne
JP6518044B2 (ja) * 2014-07-18 2019-05-22 株式会社トプコン 視機能検査装置および視機能検査システム
JP7201855B2 (ja) * 2018-03-30 2023-01-10 株式会社トプコン 眼科装置、及び眼科情報処理プログラム
JP7116572B2 (ja) * 2018-03-30 2022-08-10 株式会社トプコン 眼科装置、及び眼科情報処理プログラム
JP7537212B2 (ja) 2020-09-29 2024-08-21 株式会社ニデック 眼底撮影装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0654804A (ja) * 1992-08-05 1994-03-01 Canon Inc 視野計
JP2000262472A (ja) * 1999-03-19 2000-09-26 Kowa Co 視野計
JP4458935B2 (ja) * 2004-06-01 2010-04-28 株式会社ニデック 視野計
JP4971864B2 (ja) * 2007-04-18 2012-07-11 株式会社トプコン 光画像計測装置及びそれを制御するプログラム
JP5101975B2 (ja) * 2007-10-04 2012-12-19 株式会社トプコン 眼底観察装置及び眼底画像処理装置
CA2708332C (fr) * 2007-12-10 2015-03-24 Ophthalmic Technologies, Inc. Procede pour effectuer des examens de micro-perimetrie sur la base d'une image de volume retinien et d'une image de fond d'oeil bien alignee
JP5473358B2 (ja) * 2009-03-02 2014-04-16 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
JP5543126B2 (ja) * 2009-04-16 2014-07-09 キヤノン株式会社 医用画像処理装置及びその制御方法

Also Published As

Publication number Publication date
JP2012100713A (ja) 2012-05-31

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