JP5831347B2 - 質量分析装置及び質量分析方法 - Google Patents

質量分析装置及び質量分析方法 Download PDF

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JP5831347B2
JP5831347B2 JP2012098359A JP2012098359A JP5831347B2 JP 5831347 B2 JP5831347 B2 JP 5831347B2 JP 2012098359 A JP2012098359 A JP 2012098359A JP 2012098359 A JP2012098359 A JP 2012098359A JP 5831347 B2 JP5831347 B2 JP 5831347B2
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mass
ions
ion
ion trap
peak
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JP2013228211A5 (https=
JP2013228211A (ja
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慎治 船津
慎治 船津
尾島　典行
典行 尾島
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Shimadzu Corp
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  • Electron Tubes For Measurement (AREA)
JP2012098359A 2012-04-24 2012-04-24 質量分析装置及び質量分析方法 Expired - Fee Related JP5831347B2 (ja)

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JP2012098359A JP5831347B2 (ja) 2012-04-24 2012-04-24 質量分析装置及び質量分析方法

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JP2012098359A JP5831347B2 (ja) 2012-04-24 2012-04-24 質量分析装置及び質量分析方法

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JP2013228211A JP2013228211A (ja) 2013-11-07
JP2013228211A5 JP2013228211A5 (https=) 2014-11-20
JP5831347B2 true JP5831347B2 (ja) 2015-12-09

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2531285B (en) 2014-10-14 2017-07-26 Smiths Detection-Watford Ltd Ion mobility spectrometer with ion modification
WO2018190013A1 (ja) * 2017-04-10 2018-10-18 株式会社島津製作所 イオン分析装置及びイオン解離方法
CN108317768A (zh) * 2017-12-29 2018-07-24 中国海洋石油集团有限公司 井下光谱仪的主动制冷系统
JP7409260B2 (ja) * 2020-08-19 2024-01-09 株式会社島津製作所 質量分析方法及び質量分析装置

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