JP5801798B2 - 二成分エッチング - Google Patents

二成分エッチング Download PDF

Info

Publication number
JP5801798B2
JP5801798B2 JP2012513486A JP2012513486A JP5801798B2 JP 5801798 B2 JP5801798 B2 JP 5801798B2 JP 2012513486 A JP2012513486 A JP 2012513486A JP 2012513486 A JP2012513486 A JP 2012513486A JP 5801798 B2 JP5801798 B2 JP 5801798B2
Authority
JP
Japan
Prior art keywords
fluoride
ink
etching
composition according
etching composition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2012513486A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012529163A5 (enExample
JP2012529163A (ja
Inventor
ドル,オリヴァー
プランマー,エドワード
ジェームズ,マーク
ケーラー,インゴ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Merck Patent GmbH
Original Assignee
Merck Patent GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Merck Patent GmbH filed Critical Merck Patent GmbH
Publication of JP2012529163A publication Critical patent/JP2012529163A/ja
Publication of JP2012529163A5 publication Critical patent/JP2012529163A5/ja
Application granted granted Critical
Publication of JP5801798B2 publication Critical patent/JP5801798B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/04Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/08Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Photovoltaic Devices (AREA)
  • Weting (AREA)
JP2012513486A 2009-06-04 2010-05-12 二成分エッチング Expired - Fee Related JP5801798B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP09007411 2009-06-04
EP09007411.3 2009-06-04
PCT/EP2010/002949 WO2010139390A1 (en) 2009-06-04 2010-05-12 Two component etching

Publications (3)

Publication Number Publication Date
JP2012529163A JP2012529163A (ja) 2012-11-15
JP2012529163A5 JP2012529163A5 (enExample) 2015-08-20
JP5801798B2 true JP5801798B2 (ja) 2015-10-28

Family

ID=42830717

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012513486A Expired - Fee Related JP5801798B2 (ja) 2009-06-04 2010-05-12 二成分エッチング

Country Status (8)

Country Link
US (1) US8647526B2 (enExample)
EP (1) EP2438140A1 (enExample)
JP (1) JP5801798B2 (enExample)
KR (1) KR20120036939A (enExample)
CN (1) CN102449112B (enExample)
SG (1) SG176274A1 (enExample)
TW (1) TWI481693B (enExample)
WO (1) WO2010139390A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013008877A (ja) * 2011-06-24 2013-01-10 Kuraray Co Ltd カーボンナノチューブ層とオーバーコート層とを具備する複合層のパターン形成方法、及び前記方法で形成されたパターン
CN102929418A (zh) * 2011-08-09 2013-02-13 群康科技(深圳)有限公司 装饰膜、影像显示系统及触控感测装置的制造方法
TWI495560B (zh) * 2011-08-09 2015-08-11 Chimei Innolux Corp 透明基底上的裝飾膜、影像顯示系統及觸控感測裝置之製造方法
US20140234198A1 (en) * 2011-08-12 2014-08-21 Daikin Industries, Ltd. Etching method and method for performing surface processing on solid material for solar cell
JP6011234B2 (ja) * 2012-10-16 2016-10-19 日立化成株式会社 組成物
JP6136186B2 (ja) * 2012-10-16 2017-05-31 日立化成株式会社 液状組成物
JP2014082330A (ja) * 2012-10-16 2014-05-08 Hitachi Chemical Co Ltd SiN膜の除去方法
JP6060611B2 (ja) * 2012-10-16 2017-01-18 日立化成株式会社 組成物
US9550940B2 (en) 2012-10-16 2017-01-24 Hitachi Chemical Company, Ltd. Etching material
EP2920809B1 (en) * 2012-11-14 2021-09-01 Sun Chemical Corporation Compositions and processes for fabrication of rear passivated solar cells
JP6369460B2 (ja) * 2013-05-31 2018-08-08 日立化成株式会社 エッチング組成物
CN104993019A (zh) * 2015-07-09 2015-10-21 苏州阿特斯阳光电力科技有限公司 一种局部背接触太阳能电池的制备方法
TWI550886B (zh) * 2015-07-10 2016-09-21 國立屏東科技大學 矽基板表面粗糙化方法
JP2016086187A (ja) * 2016-02-01 2016-05-19 日立化成株式会社 SiN膜の除去方法
JP7603517B2 (ja) * 2021-04-26 2024-12-20 株式会社Screenホールディングス 基板処理方法、および、基板処理装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979241A (en) * 1968-12-28 1976-09-07 Fujitsu Ltd. Method of etching films of silicon nitride and silicon dioxide
US4781792A (en) * 1985-05-07 1988-11-01 Hogan James V Method for permanently marking glass
GB9210514D0 (en) * 1992-05-16 1992-07-01 Micro Image Technology Ltd Etching compositions
WO1997002958A1 (en) * 1995-07-10 1997-01-30 Advanced Chemical Systems International Organic amine/hydrogen fluoride etchant composition and method
US5698503A (en) * 1996-11-08 1997-12-16 Ashland Inc. Stripping and cleaning composition
DE19962136A1 (de) * 1999-12-22 2001-06-28 Merck Patent Gmbh Verfahren zur Rauhätzung von Siliziumsolarzellen
KR100812891B1 (ko) 2000-04-28 2008-03-11 메르크 파텐트 게엠베하 무기물 표면용 에칭 페이스트
JP2004503081A (ja) * 2000-06-30 2004-01-29 エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッド シリコンウェーハのエッチング方法
GB2367788A (en) * 2000-10-16 2002-04-17 Seiko Epson Corp Etching using an ink jet print head
DE10241300A1 (de) * 2002-09-04 2004-03-18 Merck Patent Gmbh Ätzpasten für Siliziumoberflächen und -schichten
US20040188385A1 (en) * 2003-03-26 2004-09-30 Kenji Yamada Etching agent composition for thin films having high permittivity and process for etching
AU2003901559A0 (en) 2003-04-07 2003-05-01 Unisearch Limited Glass texturing method
CN1853138B (zh) * 2003-10-14 2011-06-15 株式会社Adeka 光致抗蚀剂组合物
JP4964119B2 (ja) * 2004-03-05 2012-06-27 ハネウェル・インターナショナル・インコーポレーテッド 複素環式アミン類のイオン液体
DE102005007743A1 (de) * 2005-01-11 2006-07-20 Merck Patent Gmbh Druckfähiges Medium zur Ätzung von Siliziumdioxid- und Siliziumnitridschichten
DE102005033724A1 (de) * 2005-07-15 2007-01-18 Merck Patent Gmbh Druckfähige Ätzmedien für Siliziumdioxid-und Siliziumnitridschichten
GB0608463D0 (en) * 2006-04-27 2006-06-07 Sericol Ltd A printing ink
DE602006014551D1 (de) * 2006-10-31 2010-07-08 Soitec Silicon On Insulator Verfahren zur Charakterisierung von Defekten auf Silizium-Oberflächen, Ätzlösung für Silizium-Oberflächen und Verfahren zur Behandlung von Silizium-Oberflächen mit der Ätzlösung
US7582398B2 (en) * 2007-06-13 2009-09-01 Xerox Corporation Inkless reimageable printing paper and method
JP4947654B2 (ja) * 2007-09-28 2012-06-06 シャープ株式会社 誘電体膜のパターニング方法

Also Published As

Publication number Publication date
KR20120036939A (ko) 2012-04-18
TWI481693B (zh) 2015-04-21
CN102449112A (zh) 2012-05-09
US20120085965A1 (en) 2012-04-12
WO2010139390A1 (en) 2010-12-09
US8647526B2 (en) 2014-02-11
EP2438140A1 (en) 2012-04-11
JP2012529163A (ja) 2012-11-15
SG176274A1 (en) 2012-01-30
HK1169136A1 (en) 2013-01-18
TW201116612A (en) 2011-05-16
CN102449112B (zh) 2014-09-24

Similar Documents

Publication Publication Date Title
JP5801798B2 (ja) 二成分エッチング
JP5827623B2 (ja) インクジェット印刷可能なエッチングインク及び関連する方法
US9379326B2 (en) Selective etching of a matrix comprising silver nano wires
TWI292390B (en) Combined etching and doping media
US7837890B2 (en) Printable medium for the etching of silicon dioxide and silicon nitride layers
CN101223116A (zh) 用于二氧化硅和氮化硅层的可印刷蚀刻介质
TWI620770B (zh) 用於矽晶圓之可印刷擴散阻障
CA2829269A1 (en) Aluminium oxide-based metallisation barrier
CN102971868A (zh) 制造太阳能电池的方法
Lennon et al. Direct patterned etching of silicon dioxide and silicon nitride dielectric layers by inkjet printing
JP6279254B2 (ja) 入射光の反射率を低減させるための単結晶半導体基体のテクスチャー化
US20130178011A1 (en) Dopant compositions and the method of making to form doped regions in semiconductor materials
KR20050058410A (ko) 티타늄 옥시드 표면을 위한 에칭 페이스트
TWI387002B (zh) 用於製造SiO2光阻層之組合物及其使用方法
HK1169136B (en) Two component etching
JP2017526159A (ja) 太陽電池及び半導体製造用の噴射可能なインク
CN114824102B (zh) 一种调控碘化铅层的微观形貌制备钙钛矿薄膜的方法
TW201443108A (zh) 用於矽晶圓之污染物去疵的氧化物介質
JP2004134499A (ja) 太陽電池の製造方法およびその製造装置
TWI488944B (zh) 用以降低入射光反射率之單晶半導體基板之紋理化
JP2011139048A (ja) 少なくとも片面が粗面化された太陽電池用基板

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20130510

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140722

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150303

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20150603

RD13 Notification of appointment of power of sub attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7433

Effective date: 20150612

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150622

A524 Written submission of copy of amendment under article 19 pct

Free format text: JAPANESE INTERMEDIATE CODE: A524

Effective date: 20150622

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20150615

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150728

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150827

R150 Certificate of patent or registration of utility model

Ref document number: 5801798

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

LAPS Cancellation because of no payment of annual fees