JP5769423B2 - 自動感度調整付き磁場センサ - Google Patents
自動感度調整付き磁場センサ Download PDFInfo
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- JP5769423B2 JP5769423B2 JP2010547666A JP2010547666A JP5769423B2 JP 5769423 B2 JP5769423 B2 JP 5769423B2 JP 2010547666 A JP2010547666 A JP 2010547666A JP 2010547666 A JP2010547666 A JP 2010547666A JP 5769423 B2 JP5769423 B2 JP 5769423B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
- G01R33/0041—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration using feed-back or modulation techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- Condensed Matter Physics & Semiconductors (AREA)
- Measuring Magnetic Variables (AREA)
Description
次に図3を参照すると、磁場を感知するための回路150が、図1の回路10と同一であっても、または類似であってもよく、図1のフィードバック回路12と同一であっても、または類似であってもよいフィードバック回路152を含むことが可能である。フィードバック回路152は、より十分に後述する。
次に、図3Bを参照すると、図3の回路150と同様に、磁場を感知するための回路240が、ホール効果素子の感度の直接的な測定によって利得調整を達成する。しかし、回路150と異なり、感度を直接的に測定するために使用される素子は、第2のホール効果素子254であり、磁場を測定することを意図されたホール効果素子280ではない。
次に、図4Aを参照すると、磁場を感知するための回路400が、図4の回路300に類似しているが、別のやり方で、ピエゾ抵抗器によって生成される信号に関して動作する。回路400は、図1の回路10と同一であっても、または類似であってもよく、図1のフィードバック回路12と同一であっても、または類似であってもよいフィードバック回路402を含むことが可能である。フィードバック回路402は、より十分に後述する。
次に、図4Bを参照すると、磁場を感知するための回路500が、図3の回路150の態様との組合せで、図2の回路70の態様を含む。すなわち、回路500は、ホール効果素子の感度に間接的に関連する基板の歪みを感知するために、図2におけるように2つのピエゾ抵抗器を含み、また、ホール効果素子の感度の変化を直接的に感知するためにホール効果素子に隣接して図3におけるように導体も含む。
次に、図5を参照すると、図2〜図4Bにおいて先に示したピエゾ抵抗器および電流導体の構成のより詳細を示す様々な物理的構成が示されている。
本発明の好ましい実施形態を説明してきたが、ここで、それらの概念を組み込んだ他の実施形態が使用可能であることは当業者には明白になるであろう。そのため、これらの実施形態は、開示する実施形態に限定すべきでなく、むしろ添付の特許請求の範囲の趣旨および範囲によってのみ限定すべきであると思われる。
Claims (13)
- 基板によって支持され、磁場応答信号部分を含む出力信号を生成するための磁場感知素子と、フィードバック回路と、を備え、前記磁場応答信号部分は、第1の磁場に対する感度を有し、
前記フィードバック回路は、
前記基板によって支持され、前記磁場感知素子に隣接し、第2の磁場を生成するための電流導体と、
利得調整信号を生成するためのイネーブル信号に応答して利得演算信号をサンプル/ホールドするように構成されたサンプル/ホールド回路を含み、前記第2の磁場に応答する前記利得演算信号と前記利得調整信号の両方を生成するように構成されている利得演算回路と、
前記基板によって支持され、前記利得調整信号を受け取るために結合される利得調整ノードを有し、前記利得調整信号に応答して前記磁場応答信号部分の感度を調整するように構成されている、利得調整回路と、
前記基板によって支持され、第1の圧電出力信号が生成されるノードを有する第1のピエゾ抵抗器と、を備え、
前記第1の圧電出力信号は、第1の方向における前記基板の歪みに応答し、また前記第2の磁場にも応答し、前記第1の圧電出力信号は、前記利得調整信号に関連する、
磁場センサ。 - 前記磁場感知素子によって生成される前記出力信号は、前記磁場応答信号部分と、また前記第2の磁場に応答し、前記利得調整信号に関連する利得調整信号関連部分との両方を含み、前記利得調整信号関連部分は、AC信号成分を含み、前記磁場センサは、前記磁場感知素子に結合され、前記磁場応答信号部分から前記利得調整信号関連部分を分離するように構成されているフィルタ回路をさらに備える、請求項1に記載の磁場センサ。
- 前記フィードバック回路は、
電流パルスが生成される出力ノードを有する電流生成器回路をさらに備え、前記電流導体は、前記第2の磁場をもたらす前記電流パルスを受け取るために結合され、前記利得調整信号関連部分の前記AC信号成分は、前記電流パルスのAC信号成分に関連する、
請求項2に記載の磁場センサ。 - 前記磁場感知素子は、ホール効果素子であり、前記利得調整回路は、前記ホール素子に結合される電流生成器を備え、前記電流生成器は、前記利得調整信号を受け取るために結合される制御ノードを有する、請求項1に記載の磁場センサ。
- 前記利得調整回路は、前記磁場感知素子から前記出力信号を受け取るために結合される増幅器を備え、前記増幅器は、前記利得調整信号を受け取るために結合される制御ノードを有する、請求項1に記載の磁場センサ。
- 前記フィードバック回路は、
前記基板によって支持される第2のピエゾ抵抗器をさらに備え、前記第1および第2のピエゾ抵抗器のそれぞれは、それぞれの一次応答軸を有し、前記第1および第2のピエゾ抵抗器は、そのそれぞれの一次応答軸が、概して垂直になるように相対配向に配設され、前記第2のピエゾ抵抗器は、第2の圧電出力信号が生成されるノードを有し、前記第2の圧電出力信号は、前記第1の方向に、概して垂直な第2の方向における前記基板の歪みに応答し、また前記第2の磁場にも応答し、前記第2の圧電出力信号はまた、前記利得調整信号に関連し、前記利得演算回路は、前記第1および第2の圧電出力信号に関連する信号を受け取るために結合される第1および第2の入力ノードと、前記利得調整信号が生成される出力ノードとを有する結合回路を備える、
請求項1に記載の磁場センサ。 - 前記電流導体は、第1および第2の電流導体を備え、前記第2の磁場は、第1および第2の磁場部分を含み、前記第1のピエゾ抵抗器は、前記第1の磁場部分に応答し、前記第2のピエゾ抵抗器は、前記第2の磁場部分に応答する、請求項6に記載の磁場センサ。
- 前記磁場感知素子によって生成される前記出力信号は、前記磁場応答信号部分と、また前記第2の磁場に応答し、前記利得調整信号に関連する利得調整信号関連部分との両方を備え、前記利得調整信号関連部分は、AC信号成分を含み、前記磁場センサは、前記磁場感知素子に結合され、前記磁場応答信号部分から前記利得調整信号関連部分を分離するように構成されているフィルタ回路をさらに備える、請求項6に記載の磁場センサ。
- 前記フィードバック回路は、
電流パルスが生成される出力ノードを有する電流生成器回路をさらに備え、前記電流導体は、前記第2の磁場をもたらす前記電流パルスを受け取るために結合され、前記利得調整信号関連部分の前記AC信号成分は、前記電流パルスのAC信号成分に関連する、請求項8に記載の磁場センサ。 - 前記磁場感知素子は、ホール効果素子であり、前記利得調整回路は、前記ホール素子に結合される電流生成器を備え、前記電流生成器は、前記利得調整信号を受け取るために結合される制御ノードを有する、請求項6に記載の磁場センサ。
- 前記利得調整回路は、前記磁場感知素子から前記出力信号を受け取るために結合される増幅器を備え、前記増幅器は、前記利得調整信号を受け取るために結合される制御ノードを有する、請求項6に記載の磁場センサ。
- 温度閾値を上回っている温度に応答して、温度イネーブル信号を生成するように構成されている温度閾値回路をさらに備え、前記フィードバック回路の選択された部分は、前記温度イネーブル信号の状態に応じて、オンまたはオフする、請求項1に記載の磁場センサ。
- パワーオンである前記磁場センサに応答して、パワーオンイネーブル信号を生成するように構成されているパワーオン回路をさらに備え、前記フィードバック回路の選択された部分は、前記パワーオンイネーブル信号の状態に応じて、オンまたはオフする、請求項1に記載の磁場センサ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US12/037,393 US7923996B2 (en) | 2008-02-26 | 2008-02-26 | Magnetic field sensor with automatic sensitivity adjustment |
US12/037,393 | 2008-02-26 | ||
PCT/US2009/031776 WO2009108422A2 (en) | 2008-02-26 | 2009-01-23 | Magnetic field sensor with automatic sensitivity adjustment |
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JP2013139605A Division JP5539576B2 (ja) | 2008-02-26 | 2013-07-03 | 自動感度調整付き磁場センサ |
JP2015013206A Division JP6166741B2 (ja) | 2008-02-26 | 2015-01-27 | 自動感度調整付き磁場センサ |
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JP2011513706A JP2011513706A (ja) | 2011-04-28 |
JP2011513706A5 JP2011513706A5 (ja) | 2012-02-23 |
JP5769423B2 true JP5769423B2 (ja) | 2015-08-26 |
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JP2010547666A Active JP5769423B2 (ja) | 2008-02-26 | 2009-01-23 | 自動感度調整付き磁場センサ |
JP2013139605A Active JP5539576B2 (ja) | 2008-02-26 | 2013-07-03 | 自動感度調整付き磁場センサ |
JP2015013206A Active JP6166741B2 (ja) | 2008-02-26 | 2015-01-27 | 自動感度調整付き磁場センサ |
JP2016166491A Withdrawn JP2016224064A (ja) | 2008-02-26 | 2016-08-29 | 自動感度調整付き磁場センサ |
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JP2013139605A Active JP5539576B2 (ja) | 2008-02-26 | 2013-07-03 | 自動感度調整付き磁場センサ |
JP2015013206A Active JP6166741B2 (ja) | 2008-02-26 | 2015-01-27 | 自動感度調整付き磁場センサ |
JP2016166491A Withdrawn JP2016224064A (ja) | 2008-02-26 | 2016-08-29 | 自動感度調整付き磁場センサ |
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US (2) | US7923996B2 (ja) |
JP (4) | JP5769423B2 (ja) |
KR (2) | KR101556587B1 (ja) |
CN (1) | CN101960319B (ja) |
DE (1) | DE112009000448T5 (ja) |
WO (1) | WO2009108422A2 (ja) |
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KR101518241B1 (ko) | 2015-05-08 |
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WO2009108422A2 (en) | 2009-09-03 |
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