JP5761913B2 - 半導体オプトエレクトロニクスデバイス - Google Patents
半導体オプトエレクトロニクスデバイス Download PDFInfo
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- JP5761913B2 JP5761913B2 JP2009514793A JP2009514793A JP5761913B2 JP 5761913 B2 JP5761913 B2 JP 5761913B2 JP 2009514793 A JP2009514793 A JP 2009514793A JP 2009514793 A JP2009514793 A JP 2009514793A JP 5761913 B2 JP5761913 B2 JP 5761913B2
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- 239000002585 base Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- 125000004106 butoxy group Chemical group [*]OC([H])([H])C([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 1
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000012412 chemical coupling Methods 0.000 description 1
- 125000003636 chemical group Chemical group 0.000 description 1
- NNKJLYMBVRDUEI-UHFFFAOYSA-N chloro-tris(ethenyl)silane Chemical compound C=C[Si](Cl)(C=C)C=C NNKJLYMBVRDUEI-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000007334 copolymerization reaction Methods 0.000 description 1
- 239000006184 cosolvent Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229940097362 cyclodextrins Drugs 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- YLJJAVFOBDSYAN-UHFFFAOYSA-N dichloro-ethenyl-methylsilane Chemical compound C[Si](Cl)(Cl)C=C YLJJAVFOBDSYAN-UHFFFAOYSA-N 0.000 description 1
- PZPGRFITIJYNEJ-UHFFFAOYSA-N disilane Chemical group [SiH3][SiH3] PZPGRFITIJYNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- HHFAWKCIHAUFRX-UHFFFAOYSA-N ethoxide Chemical group CC[O-] HHFAWKCIHAUFRX-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 125000004836 hexamethylene group Chemical group [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 238000005984 hydrogenation reaction Methods 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical class II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 125000002346 iodo group Chemical group I* 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000002082 metal nanoparticle Substances 0.000 description 1
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N n-Octanol Natural products CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 239000011234 nano-particulate material Substances 0.000 description 1
- 125000004957 naphthylene group Chemical group 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 125000003518 norbornenyl group Chemical group C12(C=CC(CC1)C2)* 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 1
- 229930015698 phenylpropene Natural products 0.000 description 1
- 125000004344 phenylpropyl group Chemical group 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920000548 poly(silane) polymer Polymers 0.000 description 1
- 238000012643 polycondensation polymerization Methods 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000003361 porogen Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 239000013074 reference sample Substances 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000001029 thermal curing Methods 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- AANDRHFJEFRPSS-UHFFFAOYSA-N trichloro-[1-[dichloro(methyl)silyl]ethyl]silane Chemical compound C[Si](Cl)(Cl)C(C)[Si](Cl)(Cl)Cl AANDRHFJEFRPSS-UHFFFAOYSA-N 0.000 description 1
- ORSQWESKUMTRGJ-UHFFFAOYSA-N trichloro-[2-[dichloro(3-methylbut-3-en-2-yl)silyl]ethyl]silane Chemical compound CC(=C)C(C)[Si](Cl)(Cl)CC[Si](Cl)(Cl)Cl ORSQWESKUMTRGJ-UHFFFAOYSA-N 0.000 description 1
- QLCVAEPJWWVJRC-UHFFFAOYSA-N trichloro-[2-[dichloro(3-phenylpropyl)silyl]ethyl]silane Chemical compound Cl[Si](Cl)(Cl)CC[Si](Cl)(Cl)CCCC1=CC=CC=C1 QLCVAEPJWWVJRC-UHFFFAOYSA-N 0.000 description 1
- KQHUBKRXHLPMFV-UHFFFAOYSA-N trichloro-[2-[dichloro(methyl)silyl]ethyl]silane Chemical compound C[Si](Cl)(Cl)CC[Si](Cl)(Cl)Cl KQHUBKRXHLPMFV-UHFFFAOYSA-N 0.000 description 1
- JLLLCZOPLLTYBT-UHFFFAOYSA-N trichloro-[2-[dichloro(octyl)silyl]ethyl]silane Chemical compound CCCCCCCC[Si](Cl)(Cl)CC[Si](Cl)(Cl)Cl JLLLCZOPLLTYBT-UHFFFAOYSA-N 0.000 description 1
- CGEJKBBUTONHLY-UHFFFAOYSA-N trichloro-[2-[dichloro-[3-(3,5-dimethyl-1-adamantyl)propyl]silyl]ethyl]silane Chemical compound C1C(C2)CC3(C)CC1(C)CC2(CCC[Si](Cl)(Cl)CC[Si](Cl)(Cl)Cl)C3 CGEJKBBUTONHLY-UHFFFAOYSA-N 0.000 description 1
- JCGDCINCKDQXDX-UHFFFAOYSA-N trimethoxy(2-trimethoxysilylethyl)silane Chemical compound CO[Si](OC)(OC)CC[Si](OC)(OC)OC JCGDCINCKDQXDX-UHFFFAOYSA-N 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
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- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02214—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
- H01L21/02216—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
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- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- H01L21/312—Organic layers, e.g. photoresist
- H01L21/3121—Layers comprising organo-silicon compounds
- H01L21/3122—Layers comprising organo-silicon compounds layers comprising polysiloxane compounds
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
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Description
R2は、水素、有機の架橋する基、反応性の切断する基又は分極率を減少させる有機基であり、
R3は、橋渡しする直線状または分岐状の2価のヒドロカルビル基である。)
R2は、アルキル基、アルケニル基、アルキニル基、アリール基、多環式基又は有機含ケイ素基などの、有機の架橋する基、反応性の切断する基、分極率を減少させる有機基又はそれらすべての組み合わせであり、R3は、橋渡しする直線状または分岐状の2価のヒドロカルビル基である。)
R2は、水素であり、
R3は、橋渡しする直線状または分岐状の2価のヒドロカルビル基である)
を有するモノマーが製造される。
金属酸化物:TiO2、ZnO、Ta2O5、Nb2O5、SnO2、ZrO2、MgO2、Er2O3及びSiO2.
炭化物:SiC.
窒化物:Si3N4、AlNおよびTiN.
複数のトランジスターを半導体基板上に形成するステップと、
・金属の層を堆積させ、
・金属層をパターン形成し、
・第1のモジュラス及び第1のk値を有する第1の誘電性材料を堆積させ、
・第1の材料の第1のモジュラスより高い第2のモジュラス及び第1の材料の第1のk値より低いk値を有する第2の誘電性材料を堆積させ、
・第1及び第2の誘電性材料をパターン形成し、ビア充填金属材料をパターン形成した領域に堆積させる
ことによって多層の相互接続を形成するステップとを含む。
4.0以下、又はより好ましくは3.5以下のk値、
1.58以上、又はより好ましくは1.6以上の屈折率、
30ppm以下のCTE、及び
4GPa以上のヤング・モジュラス
を示す。
1,1,1,4,4−ペンタクロロ−1,4−ジシラブタン(中間体)
トリス(3,3,6,6,6−ペンタクロロ−3,6−ジシラヘキシル)クロロシラン
1,1,1,4,4,7,7,7−オクタクロロ−1,4,7−トリシラヘプタン
1,1,1,4,4,7,7,7−オクタクロロ−1,4,7−トリシラヘプタン
1,1,1,4,4−ペンタクロロ−1,4−ジシラデカン
1,1,1,4,4−ペンタクロロ−1,4−ジシラドデカン
1,1,1,4,4−ペンタクロロ−1,4−ジシラテトラカイデカン(disilatetrakaidecane)
1,1,1,4,4−ペンタクロロ−7−フェニル−1,4−ジシラヘプタン
1,1,1,4,4−ペンタクロロ−6−ペンタフルオロフェニル−1,4−ジシラヘキサン
1,1,1,4,4−ペンタクロロ−1,4−ジシラ−5−ヘキセン
1,1,1,4,4−ペンタクロロ−7−(3,5−ジメチルアダマンチル)−1,4−ジシラヘプタン
1,1,1,4,4−ペンタクロロ−5.6−ジメチル−1,4−ジシラ−6−ヘプテン
1,1,1,4,4−ペンタクロロ−6−(5−ノルボルン−2−エン)−1,4−ジシラヘキサン
9−フェナントレニルトリエトキシシラン
1−(9−フェナントレニル)−1,1,4,4,4−ペンタメトキシ−1,4−ジシラブタン
3−(9−フェナントレニル)プロピルトリメトキシシラン
高屈折率のポリマー1
9−フェナントレニルトリエトキシシラン(15g、44mmol)、アセトン(22.5g)及び0.01M HCl(7.2g、400mmol)を、100mL rb フラスコ内に入れ、23時間還流した。揮発物を減圧下で蒸発させた。白色固体のポリマー(11.84g)が得られた。ポリマーをPGMEA(29.6g、250%)で希釈し、次いでシリコンウエハ上に注いだ。ソフトベーク(soft bake)を150℃/5分間行い、続いて400℃/15分間硬化した。屈折率は、632.8nmの波長範囲で1.6680であり、誘電率は1MHzで3.5であった。しかしながら、ポリマーは、標準的な有機溶媒及びアルカリウェットエッチング薬品に対して優れた化学的耐性を有さなかった。
高屈折率のポリマー2
9−フェナントレニルトリエトキシシラン(17.00g、0.05mol、THF中の9−ブロモフェナントレン、マグネシウム及びテトラエトキシシランの間のグリニャール反応によって製造したもの)及びアセトン(15.00g)を、固体が溶解するまで攪拌した。次に、希硝酸(0.01M HNO3、6.77g、0.38mol)を添加した。2相(水及び有機)を分離した。システムを、溶液が透明になるまで(〜15分)還流した。グリシジルオキシプロピルトリメトキシシラン(3.00g、0.01)を添加し、フラスコを6時間還流した。揮発物を、ロータリーエバポレーターで、25.00gのポリマー溶液が残存するまで蒸発させた。N−プロピルアセテート(32.50g)を添加し、27gが残存するまで再び蒸発を続けた。次に、プロピレングリコールモノメチルエーテルアセテート(30g)を添加し、24.84gが粘性のポリマーとして残るまで蒸発させた。非揮発物の量を測定したところ、69.24%であった。より多くのPGMEA(8.89g)を固形分が〜50%であるように添加した。溶液を油浴(165℃)で加熱し、4時間20分間還流した。反応中に生じた水をロータリーエバポレーターでPGMEAと共に18gが残存するまで除去した。より多くのPGMEA(12g)を添加して、固形分22.16%の溶液を得た。ポリマーは、Mn/Mw=1,953/2,080g/molを有し、Mn/Mwは、THF中での単分散ポリスチレン標準に対するGPCによって測定したものである。
高屈折率ポリマー3
1−(9−フェナントレニル)−1,1,4,4,4−ペンタメトキシ−1,4−ジシラブタン(9.55g、22.9mmol)、9−フェナントレニルトリエトキシシラン(9.02g、26.5mmol)及びSLSIグレードのアセトン(14.0g)を、テフロン(登録商標)で被覆した磁気攪拌棒を備えた250ml rb フラスコに入れた。蒸留水(6.0g、333mmol)を添加し、システムを15分間還流した。次に、2滴の希塩酸溶液(3.7重量%)を滴下した。2分後、溶液が均質となり、このことは加水分解の進行を示す。1−(9−フェナントレニル)−1,1,4,4,4−ペンタメトキシ−1,4−ジシラブタン(11.45g、27.5mmol)のアセトン(16.0g)の溶液を注ぎ、続いて0.01M HCl溶液(8.4g、466mmol)を注いだ。反応を14時間還流させた。還流後、すべての揮発物を真空下で除去し、28.1gの乾燥したポリマーを透明な無色の固体として得た。該ポリマーは、TGAで測定したところ、アルゴン雰囲気中で500℃まで熱的に安定であった(図2)。
高屈折率のポリマー4
3−(9−フェナントレニル)プロピルトリメトキシシラン(11.0g,mmol)、アセトン(16.5g)及び0.01M HClを100ml rb フラスコに入れ、16時間還流した。開始時、溶液は乳白色であったが、加水分解開始後すぐに透明になった。重合をさらに進行させた際、溶液は再びわずかに濁った。揮発物を減圧下で蒸発させることによって除去し、白色無色の粉末9.60gを得た。TGAによって測定したところ、ポリマーは、アルゴン下で450℃まで安定であった(図3)。
高屈折率のポリマー5
9−フェナントレニルトリエトキシシラン(17.00g、0.05mol、THF中の9−ブロモフェナントレン、マグネシウム及びテトラエトキシシランの間のグリニャール反応によって製造したもの)及びアセトン(15.00g)を、固体が溶解するまで攪拌した。次に、希硝酸(0.01M HNO3、6.77g、0.38mol)を添加した。2相(水及び有機)を分離した。システムを、溶液が透明になるまで(〜15分)還流した。グリシジルオキシプロピルトリメトキシシラン(3.00g、0.01)を添加し、フラスコを6時間還流した。揮発物を、ロータリーエバポレーターで、25.00gのポリマー溶液が残存するまで蒸発させた。N−プロピルアセテート(32.50g)を添加し、27gが残存するまで再び蒸発を続けた。次に、プロピレングリコールモノメチルエーテルアセテート(30g)を添加し、24.84gが粘性のポリマーとして残るまで蒸発させた。非揮発物の量を測定したところ、69.24%であった。より多くのPGMEA(8.89g)を固形分が〜50%であるように添加した。溶液を油浴(165℃)で加熱し、4時間20分間還流した。反応中に生じた水をロータリーエバポレーターでPGMEAと共に18gが残存するまで除去した。より多くのPGMEA(12g)を添加して、固形分22.16%の溶液を得た。ポリマーは、Mn/Mw=1,953/2,080g/molを有し、Mn/Mwは、THF中での単分散ポリスチレン標準に対するGPCによって測定したものである。
ポリマー5とルチルTiO2ナノ粒子の混合物の調製
ポリマー5の濃縮物を、ルチルTiO2ナノ粒子(NanoGram社製 商標名‘nSol-101-5K’、MEK中5%)で、ポリマー/粒子の質量比が3/1〜1/3変動するように処方した。界面活性剤(BYK-Chemie社製BYK-307、0.2%)及びカチオン開始剤(Rhodorsil 2074、0.3%)を各サンプルに添加した。それらを、4''シリコンウエハ上に2,000rpmでスピンコーティングした。フィルムを、130℃/5分でソフトベークし、200℃/5分で硬化した。フィルム厚さ及び屈折率を、PGMEAで希釈し、〜400nmのフィルム厚さとした参考サンプルと共に表1にまとめて示す。
ポリマー3とルチルTiO2ナノ粒子の混合物の調製
ポリマー3の溶液(MEK中17%)を、例22におけるものと同様の5%TiO2溶液と、1−2の質量比で混合した。溶液を、〜17%の固形分となるように蒸発させた。溶液を2000rpmでスピンコーティングし、150+200℃/5+5分でソフトベークし、300℃/15分で硬化した。結果を表2に示す。
ポリマー5とアナターゼTiO2ナノ粒子の混合物の調製
ポリマー5を、アナターゼTiO2ナノ粒子(Sumitomo社製 商標名‘ZRM-001’MEK中12%)と固形分の比率1−1及び1−3で混合した。フィルムを200℃/5分で焼成した。結果を表3に示す。
20 フォトダイオード
30 金属ライン、中間層の誘電体及び金属間誘電体(intermetal dielectrics)
40 カラーフィルターアレイ層
50 マイクロレンズアレイ
100 高屈折率シロキサンポリマーで充填された高アスペクト比のフォトダイオードのギャップ
200 カラーフィルターの平坦化及び保護のための高屈折率シロキサンポリマー
300 マイクロレンズ保護シロキサンポリマー
Claims (18)
- 半導体基板と、
半導体基板上に配置した複数のフォトダイオードと、
基板上の相互接続層であって、フォトダイオードにおける開口部を規定する相互接続層としての金属ライン及び誘電性材料と、
フォトダイオードを覆うようにギャップを充填する第1のポリマーと、
フォトダイオードの向かい側のギャップ充填ポリマー層上に配置したカラーフィルター層と、
カラーフィルター層を覆い、平坦化し、かつ保護するための、相互接続層上に配置した第2のポリマーと、
カラーフィルターの向かい側の平坦化ポリマー上に配置した複数のマイクロレンズと、
マイクロレンズを保護するための、マイクロレンズ上に配置した第3のポリマー層
とを備え、
少なくとも1つのポリマー材料がシロキサンポリマーからなり、
少なくとも1つのポリマーが、下記の一般化学構造:
R2は、アルキル基、アルケニル基、アルキニル基、アリール基、多環式基又は有機含ケイ素基などの、有機の架橋する基、反応性の切断する基、分極率を減少させる有機基又はそれらすべての組み合わせであり、
R3は、橋渡しする直線状または分岐状の2価のヒドロカルビル基、芳香族基、多芳香族基又は多環式基である)
を有する前駆体を用いて重合され、
前記第1のポリマーが、632.8nmにおける1.58以上又はそれより高い屈折率を有し、
前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが4.0GPaより高いヤング・モジュラスを有する半導体デバイス。 - 3つのポリマー材料のそれぞれがオルガノシロキサンポリマーである請求項1記載の半導体デバイス。
- 少なくとも1つのポリマーが、−Si−O−Si−基及び−Si−(CHx)y−Si(式中、xは1又は2の整数であり、yは1〜20の整数である)の基を示すシロキサンポリマーを含む請求項1又は2記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、632.8nmにおける1.65以上又はそれより高い屈折率を有する請求項1〜3のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、632.8nmにおける1.60以上又はそれより高い屈折率と、4.0又はそれより低い誘電率(1MHz)を有する請求項1〜3のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、632.8nmにおける1.60以上又はそれより高い屈折率と、3.5又はそれより低い誘電率(1MHz)を有する請求項1〜3のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、632.8nmにおける1.60以上又はそれより高い屈折率を有する請求項1〜3のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、180℃〜450℃の温度で熱硬化される請求項1〜7項のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、加熱及びUV照射の組み合わせで硬化される請求項8記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、最初に熱で硬化され、次いで、さらに化学機械研磨によって処理される請求項8又は9記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、最初に熱で硬化され、次いで、さらにドライエッチプラズマ処理によってエッチングされる請求項8〜10のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、UV照射ステップにおいて処理される請求項8〜11のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、最初に熱で硬化され、次いで、さらに化学機械研磨によって処理され、その後、最終的に熱又はUVで硬化される請求項1〜12のいずれか1項に記載の半導体デバイス。
- 少なくとも1つのポリマーが、可視波長範囲において、カラーフィルター又はマイクロレンズと0.1以下の屈折率の差を有する請求項1〜13のいずれか1項に記載の半導体デバイス。
- 第1のポリマーが、開口部を規定する材料より少なくとも1%高い屈折率を有する請求項1〜14のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーのポリマー材料が、ナノ粒子の組み込みによって修飾されている請求項1〜15のいずれか1項に記載の半導体デバイス。
- 前記第1のポリマー、前記第2のポリマーおよび前記第3のポリマーが、ポリマー100質量部に対して、1〜500質量部のナノ粒子と結合して、ナノ粒子含有複合体を形成する請求項16記載の半導体デバイス。
- ナノ粒子が、金属、合金、金属酸化物、炭化物及び窒化物並びにそれらの混合物からなる群より選択される請求項16又は17記載の半導体デバイス。
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Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2904144A1 (fr) * | 2006-07-19 | 2008-01-25 | St Microelectronics Rousset | Procede de fabrication d'un wafer de semi-conducteur comprenant un filtre optique integre |
KR101176545B1 (ko) * | 2006-07-26 | 2012-08-28 | 삼성전자주식회사 | 마이크로 렌즈의 형성방법과 마이크로 렌즈를 포함한이미지 센서 및 그의 제조방법 |
TWM309290U (en) * | 2006-09-19 | 2007-04-01 | Compal Communications Inc | Dynamic sound volume adjustment device of telephone equipment |
KR100763232B1 (ko) * | 2006-09-20 | 2007-10-04 | 삼성전자주식회사 | 이미지 센서의 제조 방법 |
US7566359B2 (en) * | 2006-11-07 | 2009-07-28 | Lennox Manufacturing Inc. | Ultraviolet lamp with absorptive barrier |
KR101478189B1 (ko) * | 2007-11-19 | 2015-01-02 | 삼성전자주식회사 | 이미지 센서의 제조 방법 |
JP4730429B2 (ja) * | 2008-12-03 | 2011-07-20 | ソニー株式会社 | 固体撮像装置、および、その製造方法、カメラ |
TWI399873B (zh) * | 2009-03-03 | 2013-06-21 | Everlight Electronics Co Ltd | 發光二極體封裝結構及其製作方法 |
US9063005B2 (en) | 2012-04-05 | 2015-06-23 | Heptagon Micro Optics Pte. Ltd. | Reflowable opto-electronic module |
JP6130221B2 (ja) * | 2013-05-24 | 2017-05-17 | ソニー株式会社 | 固体撮像装置、および電子機器 |
US9324755B2 (en) * | 2014-05-05 | 2016-04-26 | Semiconductor Components Industries, Llc | Image sensors with reduced stack height |
EP3032583B1 (en) * | 2014-12-08 | 2020-03-04 | ams AG | Integrated optical sensor and method of producing an integrated optical sensor |
US10241609B2 (en) * | 2015-12-30 | 2019-03-26 | Lg Display Co., Ltd. | Display device with touch sensor |
US10106666B2 (en) * | 2016-03-02 | 2018-10-23 | Samsung Electronics Co., Ltd. | Curable silicone resin composition containing inorganic oxide and optical member using same |
US9824982B1 (en) | 2016-08-09 | 2017-11-21 | International Business Machines Corporation | Structure and fabrication method for enhanced mechanical strength crack stop |
KR102318084B1 (ko) * | 2017-09-28 | 2021-10-28 | 도레이 카부시키가이샤 | 유기 el 표시 장치, 그리고 화소 분할층 및 평탄화층의 형성 방법 |
US11233189B2 (en) | 2018-12-11 | 2022-01-25 | Facebook Technologies, Llc | Nanovoided tunable birefringence |
US10957731B1 (en) * | 2019-10-04 | 2021-03-23 | Visera Technologies Company Limited | Sensor device and method for manufacturing the same |
KR20220008586A (ko) * | 2020-07-14 | 2022-01-21 | 엘지디스플레이 주식회사 | 커버 윈도우 및 이를 포함하는 플렉서블 표시 장치 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1618257A1 (de) * | 1965-12-07 | 1970-11-12 | Dynamit Nobel Ag | Verfahren zur Herstellung von halogenierten Phenoxysilanen |
US4923716A (en) * | 1988-09-26 | 1990-05-08 | Hughes Aircraft Company | Chemical vapor desposition of silicon carbide |
JPH06232379A (ja) * | 1993-02-01 | 1994-08-19 | Sharp Corp | 固体撮像素子 |
JPH10270672A (ja) * | 1997-03-25 | 1998-10-09 | Sony Corp | 固体撮像素子 |
US6696538B2 (en) * | 1999-07-27 | 2004-02-24 | Lg Chemical Ltd. | Semiconductor interlayer dielectric material and a semiconductor device using the same |
DE19956810C1 (de) * | 1999-11-25 | 2001-02-15 | Wacker Chemie Gmbh | Verfahren zur Herstellung von halogenierten 1,2-Disilaethanen |
JP3517698B2 (ja) * | 2000-03-03 | 2004-04-12 | 独立行政法人産業技術総合研究所 | ナノ粒子分散構造体及びその積層体 |
EP1150346B1 (en) * | 2000-04-28 | 2011-12-28 | LG Chem Investment, Ltd | A process for preparing insulating material having low dielectric constant |
US6465368B2 (en) * | 2000-05-16 | 2002-10-15 | Jsr Corporation | Method of manufacturing insulating film-forming material, the insulating film-forming material, and insulating film |
GB0118473D0 (en) * | 2001-07-28 | 2001-09-19 | Dow Corning | High refractive index polysiloxanes and their preparation |
KR100506695B1 (ko) * | 2003-06-02 | 2005-08-08 | 삼성전자주식회사 | 실록산계 수지 및 이를 이용한 반도체 층간 절연막 |
JP4564794B2 (ja) * | 2004-07-16 | 2010-10-20 | キヤノン株式会社 | 固体撮像素子 |
US7119319B2 (en) * | 2004-04-08 | 2006-10-10 | Canon Kabushiki Kaisha | Solid-state image sensing element and its design support method, and image sensing device |
JP2008511711A (ja) * | 2004-08-31 | 2008-04-17 | シレクス オサケユキチュア | 新規ポリオルガノシロキサン誘電体 |
US7892648B2 (en) * | 2005-01-21 | 2011-02-22 | International Business Machines Corporation | SiCOH dielectric material with improved toughness and improved Si-C bonding |
JP2006216792A (ja) * | 2005-02-03 | 2006-08-17 | Seiko Epson Corp | 絶縁膜、絶縁膜の形成方法、半導体素子、電子デバイスおよび電子機器 |
WO2006134206A2 (en) * | 2005-06-13 | 2006-12-21 | Silecs Oy | Functionalized silane monomers with bridging hydrocarbon group and siloxane polymers of the same |
-
2006
- 2006-12-13 US US11/637,961 patent/US20070284687A1/en not_active Abandoned
-
2007
- 2007-06-13 JP JP2009514793A patent/JP5761913B2/ja active Active
- 2007-06-13 EP EP07730120A patent/EP2033222A2/en not_active Ceased
- 2007-06-13 WO PCT/EP2007/055818 patent/WO2007144371A2/en active Application Filing
- 2007-06-13 KR KR1020097000594A patent/KR101596358B1/ko active IP Right Grant
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2013
- 2013-03-07 US US13/789,446 patent/US20130193543A1/en not_active Abandoned
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2014
- 2014-04-10 US US14/249,976 patent/US20140217539A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20140217539A1 (en) | 2014-08-07 |
JP2009540589A (ja) | 2009-11-19 |
KR101596358B1 (ko) | 2016-02-22 |
WO2007144371A3 (en) | 2008-03-27 |
US20070284687A1 (en) | 2007-12-13 |
WO2007144371A2 (en) | 2007-12-21 |
KR20090020689A (ko) | 2009-02-26 |
US20130193543A1 (en) | 2013-08-01 |
EP2033222A2 (en) | 2009-03-11 |
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