JP5744712B2 - 電力検波回路 - Google Patents
電力検波回路 Download PDFInfo
- Publication number
- JP5744712B2 JP5744712B2 JP2011275015A JP2011275015A JP5744712B2 JP 5744712 B2 JP5744712 B2 JP 5744712B2 JP 2011275015 A JP2011275015 A JP 2011275015A JP 2011275015 A JP2011275015 A JP 2011275015A JP 5744712 B2 JP5744712 B2 JP 5744712B2
- Authority
- JP
- Japan
- Prior art keywords
- power
- detection
- resistor
- circuit
- characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001514 detection method Methods 0.000 title claims description 90
- 238000010586 diagram Methods 0.000 description 12
- 239000003990 capacitor Substances 0.000 description 5
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D1/00—Demodulation of amplitude-modulated oscillations
- H03D1/08—Demodulation of amplitude-modulated oscillations by means of non-linear two-pole elements
- H03D1/10—Demodulation of amplitude-modulated oscillations by means of non-linear two-pole elements of diodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/01—Arrangements for measuring electric power or power factor in circuits having distributed constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/10—Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance
- G01R21/12—Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance in circuits having distributed constants
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D1/00—Demodulation of amplitude-modulated oscillations
- H03D1/02—Details
- H03D1/06—Modifications of demodulators to reduce distortion, e.g. by negative feedback
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Measurement Of Current Or Voltage (AREA)
Description
図1は、第1の実施形態の電力検波回路100の前提となる回路を示す模式図である。図1に示す回路は、コンデンサ102、ダイオード106、抵抗108、抵抗110、コンデンサ112、入力端子114、出力端子116を有して構成されている。
次に、本発明の第2の実施形態について説明する。図6は、第2の実施形態に係る電力検波回路100の構成を示す模式図である。図6に示すように、第2の実施形態では、ダイオード118の代わりにトランジスタ122が配置されている。また、出力端子116における検波電圧はオペアンプ124に入力され、検波電圧は、抵抗126と抵抗128の分圧比に応じて係数倍されてトランジスタ122のゲートに入力される。
108 抵抗
118 ダイオード
120 抵抗
122 トランジスタ
Claims (1)
- 電流が印加されて入力電力の検波電圧値を調整する第1の抵抗と、
前記入力電力が低い場合は高抵抗になり、前記入力電力が高い場合は低抵抗になる素子と、
前記素子と接続され、前記素子が低抵抗になると電流が印加されて前記入力電力の検波電圧値を調整する第2の抵抗と、
を備え、
前記第1の抵抗及び前記第2の抵抗は印加される電流が変化して前記入力電力の検波電圧値を調整し、
前記素子は前記入力電力の検波電圧値のフィードバックに応じて抵抗値が変動することを特徴とする、電力検波回路。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011275015A JP5744712B2 (ja) | 2011-12-15 | 2011-12-15 | 電力検波回路 |
KR1020120032420A KR101503971B1 (ko) | 2011-12-15 | 2012-03-29 | 전력 검파 회로 |
US13/612,516 US9297840B2 (en) | 2011-12-15 | 2012-09-12 | Power detection circuit |
CN201210360846.7A CN103163365B (zh) | 2011-12-15 | 2012-09-21 | 功率检测电路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011275015A JP5744712B2 (ja) | 2011-12-15 | 2011-12-15 | 電力検波回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013126187A JP2013126187A (ja) | 2013-06-24 |
JP5744712B2 true JP5744712B2 (ja) | 2015-07-08 |
Family
ID=48586620
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011275015A Expired - Fee Related JP5744712B2 (ja) | 2011-12-15 | 2011-12-15 | 電力検波回路 |
Country Status (4)
Country | Link |
---|---|
US (1) | US9297840B2 (ja) |
JP (1) | JP5744712B2 (ja) |
KR (1) | KR101503971B1 (ja) |
CN (1) | CN103163365B (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102016206958A1 (de) * | 2016-04-25 | 2017-10-26 | Continental Automotive Gmbh | Verfahren zum Bestimmen eines Laststroms und Batteriesensor |
Family Cites Families (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2467407A1 (fr) * | 1979-10-15 | 1981-04-17 | Jaeger | Dispositif de mesure des valeurs cretes d'un phenomene non periodique a recurrence faible |
JPS58147309U (ja) * | 1982-03-26 | 1983-10-04 | 日本電気株式会社 | ダイオ−ド検波回路 |
JPS60148205A (ja) * | 1984-01-13 | 1985-08-05 | Fujitsu Ltd | 検波回路 |
JPH0434457Y2 (ja) | 1985-07-22 | 1992-08-17 | ||
US4810950A (en) * | 1986-07-17 | 1989-03-07 | Ob Products, Inc. | Load resistance measuring technique |
JPH0254177A (ja) * | 1988-08-18 | 1990-02-23 | Fujitsu Ltd | ピーク値検出回路 |
JPH02141109U (ja) * | 1989-04-28 | 1990-11-27 | ||
US5083080A (en) * | 1989-06-30 | 1992-01-21 | Anritsu Corporation | High frequency signal measuring equipment with cabled detecting and signal companding |
JPH0340504A (ja) * | 1989-07-06 | 1991-02-21 | Matsushita Electric Ind Co Ltd | 包絡線検波回路 |
JPH03258121A (ja) | 1990-03-08 | 1991-11-18 | Oki Electric Ind Co Ltd | 検波回路 |
JP2776071B2 (ja) * | 1991-07-19 | 1998-07-16 | 松下電器産業株式会社 | 送信出力包絡線検波回路および線形送信回路 |
US5811984A (en) * | 1995-10-05 | 1998-09-22 | The Regents Of The University Of California | Current mode I/O for digital circuits |
JPH09162644A (ja) * | 1995-12-04 | 1997-06-20 | Fujitsu Ltd | 検波回路 |
JPH11148950A (ja) * | 1997-11-14 | 1999-06-02 | Oki Electric Ind Co Ltd | ピークホールド回路 |
EP0920038A1 (de) * | 1997-11-25 | 1999-06-02 | Electrowatt Technology Innovation AG | Schaltung zur Überwachung eines Wechselstromschalters |
US6397160B1 (en) * | 1999-06-04 | 2002-05-28 | Teradyne, Inc. | Power sensor module for microwave test systems |
JP2001044763A (ja) * | 1999-07-29 | 2001-02-16 | Nec Eng Ltd | 検波回路 |
JP2001203536A (ja) | 2000-01-18 | 2001-07-27 | Mitsubishi Electric Corp | 検波回路及び送信装置 |
US6710716B1 (en) * | 2000-05-31 | 2004-03-23 | Sony Corporation | Power detecting circuit and demodulator comprising the same |
DE10029446A1 (de) * | 2000-06-21 | 2002-01-03 | Braun Gmbh | Verfahren und Schaltungsanordnung zur Messung einer Spannung und/oder einer Temperatur |
US6639433B1 (en) * | 2002-04-18 | 2003-10-28 | Johnson Controls Technology Company | Self-configuring output circuit and method |
DE60308135T2 (de) * | 2003-01-31 | 2006-12-21 | Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto | Sensorvorrichtung, Messsystem und Verfahren zur Kalibrierung |
US7394172B2 (en) * | 2003-10-22 | 2008-07-01 | Scientific-Atlanta, Inc. | Systems and methods for switching to a back-up power supply |
KR100535040B1 (ko) * | 2004-03-22 | 2005-12-07 | 주식회사 하이닉스반도체 | 강유전체 센스앰프 |
TWI341511B (en) * | 2006-11-03 | 2011-05-01 | Chimei Innolux Corp | Power supply circuit |
JP2008236354A (ja) * | 2007-03-20 | 2008-10-02 | Fujitsu Ltd | 増幅器 |
JP4966265B2 (ja) * | 2008-07-18 | 2012-07-04 | 株式会社東芝 | 電流ドライバ回路 |
CN201307137Y (zh) | 2008-12-02 | 2009-09-09 | 高效电子股份有限公司 | 输出功率自动检测装置 |
US7944199B2 (en) * | 2009-03-05 | 2011-05-17 | Analog Devices, Inc. | Voltage-measuring circuit and method |
JP2010267253A (ja) * | 2009-04-16 | 2010-11-25 | Semiconductor Energy Lab Co Ltd | 復調信号生成回路および復調信号生成回路を有する半導体装置 |
JP5481161B2 (ja) * | 2009-10-30 | 2014-04-23 | ルネサスエレクトロニクス株式会社 | 半導体装置および電源装置 |
JP5733605B2 (ja) * | 2010-11-09 | 2015-06-10 | 富士電機株式会社 | スイッチング電源装置 |
-
2011
- 2011-12-15 JP JP2011275015A patent/JP5744712B2/ja not_active Expired - Fee Related
-
2012
- 2012-03-29 KR KR1020120032420A patent/KR101503971B1/ko active IP Right Grant
- 2012-09-12 US US13/612,516 patent/US9297840B2/en not_active Expired - Fee Related
- 2012-09-21 CN CN201210360846.7A patent/CN103163365B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN103163365A (zh) | 2013-06-19 |
KR101503971B1 (ko) | 2015-03-18 |
CN103163365B (zh) | 2016-01-20 |
JP2013126187A (ja) | 2013-06-24 |
US9297840B2 (en) | 2016-03-29 |
KR20130071329A (ko) | 2013-06-28 |
US20130154665A1 (en) | 2013-06-20 |
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