JP5710473B2 - サンプリング手順における試料収集機器と被分析表面の位置関係のレーザ・センサを使用した制御 - Google Patents
サンプリング手順における試料収集機器と被分析表面の位置関係のレーザ・センサを使用した制御 Download PDFInfo
- Publication number
- JP5710473B2 JP5710473B2 JP2011516271A JP2011516271A JP5710473B2 JP 5710473 B2 JP5710473 B2 JP 5710473B2 JP 2011516271 A JP2011516271 A JP 2011516271A JP 2011516271 A JP2011516271 A JP 2011516271A JP 5710473 B2 JP5710473 B2 JP 5710473B2
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- JP
- Japan
- Prior art keywords
- laser sensor
- distance
- collection device
- actual
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims description 54
- 238000005070 sampling Methods 0.000 title claims description 34
- 230000008569 process Effects 0.000 claims description 24
- 238000013459 approach Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 7
- 238000004458 analytical method Methods 0.000 claims description 6
- 238000004364 calculation method Methods 0.000 claims description 4
- 238000012935 Averaging Methods 0.000 claims description 2
- 230000000977 initiatory effect Effects 0.000 claims description 2
- 230000004044 response Effects 0.000 claims description 2
- 239000000523 sample Substances 0.000 description 83
- 238000000688 desorption electrospray ionisation Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 238000002360 preparation method Methods 0.000 description 5
- 238000001396 desorption atmospheric pressure chemical ionisation Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000003795 desorption Methods 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000002441 reversible effect Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000004809 thin layer chromatography Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/217,225 US8117929B2 (en) | 2008-07-02 | 2008-07-02 | Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor |
| US12/217,225 | 2008-07-02 | ||
| PCT/US2009/003347 WO2010002427A2 (en) | 2008-07-02 | 2009-06-02 | Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011527075A JP2011527075A (ja) | 2011-10-20 |
| JP2011527075A5 JP2011527075A5 (enExample) | 2012-07-19 |
| JP5710473B2 true JP5710473B2 (ja) | 2015-04-30 |
Family
ID=41327314
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011516271A Active JP5710473B2 (ja) | 2008-07-02 | 2009-06-02 | サンプリング手順における試料収集機器と被分析表面の位置関係のレーザ・センサを使用した制御 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8117929B2 (enExample) |
| EP (1) | EP2304766B1 (enExample) |
| JP (1) | JP5710473B2 (enExample) |
| CA (1) | CA2729701C (enExample) |
| WO (1) | WO2010002427A2 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8766177B2 (en) | 2010-10-11 | 2014-07-01 | University Of North Texas | Nanomanipulation coupled nanospray mass spectrometry (NMS) |
| JP2012237557A (ja) * | 2011-05-09 | 2012-12-06 | Shimadzu Corp | 液体試料採取装置及び液体試料採取方法 |
| US9176028B2 (en) | 2012-10-04 | 2015-11-03 | Ut-Battelle, Llc | Ball assisted device for analytical surface sampling |
| US9632066B2 (en) | 2015-04-09 | 2017-04-25 | Ut-Battelle, Llc | Open port sampling interface |
| US10060838B2 (en) | 2015-04-09 | 2018-08-28 | Ut-Battelle, Llc | Capture probe |
| WO2017181394A1 (zh) * | 2016-04-21 | 2017-10-26 | 深圳市樊溪电子有限公司 | 一种油气包裹体成分取样方法 |
| US11125657B2 (en) | 2018-01-30 | 2021-09-21 | Ut-Battelle, Llc | Sampling probe |
| US20220208538A1 (en) * | 2019-05-31 | 2022-06-30 | Purdue Research Foundation | Integrated microfluidic probe (imfp) and methods of use thereof |
| DE102021128848B4 (de) * | 2021-11-05 | 2025-08-07 | Bruker Daltonics GmbH & Co. KG | Vorrichtung zum desorbierenden Abtasten von Analytmaterial auf einem Probenträger |
| CN116218649B (zh) * | 2022-12-30 | 2024-07-02 | 德诺杰亿（北京）生物科技有限公司 | 基因分析仪上样台的自动校准方法、装置及基因分析仪 |
| CN118857839B (zh) * | 2024-09-25 | 2024-12-06 | 大连馨士俐科技服务有限公司 | 一种用于市政道路施工质量检测的取芯装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0687003B2 (ja) | 1990-02-09 | 1994-11-02 | 株式会社日立製作所 | 走査型トンネル顕微鏡付き走査型電子顕微鏡 |
| JPH04162337A (ja) * | 1990-10-24 | 1992-06-05 | Hitachi Ltd | 電子線装置 |
| DE4116803A1 (de) | 1991-05-23 | 1992-12-10 | Agfa Gevaert Ag | Vorrichtung zur gleichmaessigen ausleuchtung einer projektionsflaeche |
| US5196713A (en) * | 1991-08-22 | 1993-03-23 | Wyko Corporation | Optical position sensor with corner-cube and servo-feedback for scanning microscopes |
| JP3015980B2 (ja) * | 1992-01-10 | 2000-03-06 | キヤノン株式会社 | 原子間力顕微鏡及び記録再生装置及び再生装置 |
| JP2002175770A (ja) | 2000-12-08 | 2002-06-21 | Hitachi Ltd | 気体排気用試料室及びそれを用いた回路パターン形成装置 |
| GB0112903D0 (en) * | 2001-05-26 | 2001-07-18 | Univ Heriot Watt | Permeability measurement apparatus and method |
| US6803566B2 (en) | 2002-04-16 | 2004-10-12 | Ut-Battelle, Llc | Sampling probe for microarray read out using electrospray mass spectrometry |
| JP4427824B2 (ja) | 2003-09-03 | 2010-03-10 | 日立建機株式会社 | プローブの製造方法、プローブおよび走査型プローブ顕微鏡 |
| US20080033275A1 (en) * | 2004-04-28 | 2008-02-07 | Blank Thomas B | Method and Apparatus for Sample Probe Movement Control |
| JP2006215004A (ja) * | 2005-02-07 | 2006-08-17 | Ricoh Co Ltd | 近接場光顕微鏡、近接場光による試料測定方法 |
| US7295026B2 (en) | 2005-06-03 | 2007-11-13 | Ut-Battelle, Llc | Automated position control of a surface array relative to a liquid microjunction surface sampler |
-
2008
- 2008-07-02 US US12/217,225 patent/US8117929B2/en active Active
-
2009
- 2009-06-02 JP JP2011516271A patent/JP5710473B2/ja active Active
- 2009-06-02 WO PCT/US2009/003347 patent/WO2010002427A2/en not_active Ceased
- 2009-06-02 EP EP09773880.1A patent/EP2304766B1/en active Active
- 2009-06-02 CA CA2729701A patent/CA2729701C/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CA2729701A1 (en) | 2010-01-07 |
| US20100000338A1 (en) | 2010-01-07 |
| EP2304766A2 (en) | 2011-04-06 |
| WO2010002427A2 (en) | 2010-01-07 |
| US8117929B2 (en) | 2012-02-21 |
| CA2729701C (en) | 2015-11-03 |
| JP2011527075A (ja) | 2011-10-20 |
| WO2010002427A3 (en) | 2010-02-25 |
| EP2304766B1 (en) | 2019-07-31 |
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