CA2729701C - Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor - Google Patents

Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor Download PDF

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Publication number
CA2729701C
CA2729701C CA2729701A CA2729701A CA2729701C CA 2729701 C CA2729701 C CA 2729701C CA 2729701 A CA2729701 A CA 2729701A CA 2729701 A CA2729701 A CA 2729701A CA 2729701 C CA2729701 C CA 2729701C
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CA
Canada
Prior art keywords
laser sensor
distance
collection instrument
actual
collection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CA2729701A
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English (en)
French (fr)
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CA2729701A1 (en
Inventor
Gary J. Van Berkel
Vilmos Kertesz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UT Battelle LLC
Original Assignee
UT Battelle LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of CA2729701A1 publication Critical patent/CA2729701A1/en
Application granted granted Critical
Publication of CA2729701C publication Critical patent/CA2729701C/en
Active legal-status Critical Current
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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Electron Tubes For Measurement (AREA)
CA2729701A 2008-07-02 2009-06-02 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor Active CA2729701C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/217,225 2008-07-02
US12/217,225 US8117929B2 (en) 2008-07-02 2008-07-02 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor
PCT/US2009/003347 WO2010002427A2 (en) 2008-07-02 2009-06-02 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor

Publications (2)

Publication Number Publication Date
CA2729701A1 CA2729701A1 (en) 2010-01-07
CA2729701C true CA2729701C (en) 2015-11-03

Family

ID=41327314

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2729701A Active CA2729701C (en) 2008-07-02 2009-06-02 Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor

Country Status (5)

Country Link
US (1) US8117929B2 (enExample)
EP (1) EP2304766B1 (enExample)
JP (1) JP5710473B2 (enExample)
CA (1) CA2729701C (enExample)
WO (1) WO2010002427A2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8766177B2 (en) * 2010-10-11 2014-07-01 University Of North Texas Nanomanipulation coupled nanospray mass spectrometry (NMS)
JP2012237557A (ja) * 2011-05-09 2012-12-06 Shimadzu Corp 液体試料採取装置及び液体試料採取方法
US9176028B2 (en) 2012-10-04 2015-11-03 Ut-Battelle, Llc Ball assisted device for analytical surface sampling
US10060838B2 (en) 2015-04-09 2018-08-28 Ut-Battelle, Llc Capture probe
US9632066B2 (en) 2015-04-09 2017-04-25 Ut-Battelle, Llc Open port sampling interface
WO2017181394A1 (zh) * 2016-04-21 2017-10-26 深圳市樊溪电子有限公司 一种油气包裹体成分取样方法
US11125657B2 (en) 2018-01-30 2021-09-21 Ut-Battelle, Llc Sampling probe
WO2020242911A1 (en) * 2019-05-31 2020-12-03 Purdue Research Foundation Integrated microfluidic probe (imfp) and methods of use thereof
DE102021128848B4 (de) 2021-11-05 2025-08-07 Bruker Daltonics GmbH & Co. KG Vorrichtung zum desorbierenden Abtasten von Analytmaterial auf einem Probenträger
CN116218649B (zh) * 2022-12-30 2024-07-02 德诺杰亿(北京)生物科技有限公司 基因分析仪上样台的自动校准方法、装置及基因分析仪
CN118857839B (zh) * 2024-09-25 2024-12-06 大连馨士俐科技服务有限公司 一种用于市政道路施工质量检测的取芯装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0687003B2 (ja) * 1990-02-09 1994-11-02 株式会社日立製作所 走査型トンネル顕微鏡付き走査型電子顕微鏡
JPH04162337A (ja) * 1990-10-24 1992-06-05 Hitachi Ltd 電子線装置
DE4116803A1 (de) * 1991-05-23 1992-12-10 Agfa Gevaert Ag Vorrichtung zur gleichmaessigen ausleuchtung einer projektionsflaeche
US5196713A (en) * 1991-08-22 1993-03-23 Wyko Corporation Optical position sensor with corner-cube and servo-feedback for scanning microscopes
JP3015980B2 (ja) * 1992-01-10 2000-03-06 キヤノン株式会社 原子間力顕微鏡及び記録再生装置及び再生装置
JP2002175770A (ja) * 2000-12-08 2002-06-21 Hitachi Ltd 気体排気用試料室及びそれを用いた回路パターン形成装置
GB0112903D0 (en) * 2001-05-26 2001-07-18 Univ Heriot Watt Permeability measurement apparatus and method
US6803566B2 (en) * 2002-04-16 2004-10-12 Ut-Battelle, Llc Sampling probe for microarray read out using electrospray mass spectrometry
JP4427824B2 (ja) 2003-09-03 2010-03-10 日立建機株式会社 プローブの製造方法、プローブおよび走査型プローブ顕微鏡
US20080033275A1 (en) * 2004-04-28 2008-02-07 Blank Thomas B Method and Apparatus for Sample Probe Movement Control
JP2006215004A (ja) * 2005-02-07 2006-08-17 Ricoh Co Ltd 近接場光顕微鏡、近接場光による試料測定方法
US7295026B2 (en) * 2005-06-03 2007-11-13 Ut-Battelle, Llc Automated position control of a surface array relative to a liquid microjunction surface sampler

Also Published As

Publication number Publication date
JP2011527075A (ja) 2011-10-20
JP5710473B2 (ja) 2015-04-30
WO2010002427A3 (en) 2010-02-25
EP2304766A2 (en) 2011-04-06
CA2729701A1 (en) 2010-01-07
US20100000338A1 (en) 2010-01-07
US8117929B2 (en) 2012-02-21
EP2304766B1 (en) 2019-07-31
WO2010002427A2 (en) 2010-01-07

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Effective date: 20140422