JP5704065B2 - 放電イオン化電流検出器 - Google Patents

放電イオン化電流検出器 Download PDF

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Publication number
JP5704065B2
JP5704065B2 JP2011275922A JP2011275922A JP5704065B2 JP 5704065 B2 JP5704065 B2 JP 5704065B2 JP 2011275922 A JP2011275922 A JP 2011275922A JP 2011275922 A JP2011275922 A JP 2011275922A JP 5704065 B2 JP5704065 B2 JP 5704065B2
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flow path
gas flow
gas
electrode
metal
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Japanese (ja)
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JP2013125022A5 (enExample
JP2013125022A (ja
Inventor
品田　恵
恵 品田
重吉 堀池
重吉 堀池
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2011275922A priority Critical patent/JP5704065B2/ja
Priority to US13/714,070 priority patent/US9784713B2/en
Priority to CN201210548770.0A priority patent/CN103163256B/zh
Publication of JP2013125022A publication Critical patent/JP2013125022A/ja
Publication of JP2013125022A5 publication Critical patent/JP2013125022A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
    • G01N27/70—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas and measuring current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • G01N27/66—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/64—Electrical detectors

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2011275922A 2011-12-16 2011-12-16 放電イオン化電流検出器 Expired - Fee Related JP5704065B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011275922A JP5704065B2 (ja) 2011-12-16 2011-12-16 放電イオン化電流検出器
US13/714,070 US9784713B2 (en) 2011-12-16 2012-12-13 Discharge ionization current detector
CN201210548770.0A CN103163256B (zh) 2011-12-16 2012-12-17 放电离子化电流检测器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011275922A JP5704065B2 (ja) 2011-12-16 2011-12-16 放電イオン化電流検出器

Publications (3)

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JP2013125022A JP2013125022A (ja) 2013-06-24
JP2013125022A5 JP2013125022A5 (enExample) 2014-05-08
JP5704065B2 true JP5704065B2 (ja) 2015-04-22

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Family Applications (1)

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JP2011275922A Expired - Fee Related JP5704065B2 (ja) 2011-12-16 2011-12-16 放電イオン化電流検出器

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US (1) US9784713B2 (enExample)
JP (1) JP5704065B2 (enExample)
CN (1) CN103163256B (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104756334B (zh) * 2012-07-13 2017-05-10 Sp技术有限公司 在电极上设有导电体突出部的介质阻挡放电式的等离子产生电极结构
US11002684B2 (en) 2012-10-25 2021-05-11 Agilent Technologies, Inc. Chemiluminescent detector having coating to reduce excited species adsorption
US9448177B2 (en) 2012-10-25 2016-09-20 Agilent Technologies, Inc. Flame photometric detector
CH707685A1 (de) * 2013-03-06 2014-09-15 Inficon Gmbh Ionisations-Vakuummesszelle mit Abschirmvorrichtung.
CN103776893B (zh) * 2014-02-17 2016-09-21 哈尔滨工业大学（威海） 一种介质阻挡放电电离源离子迁移谱仪
JP6350391B2 (ja) * 2015-05-22 2018-07-04 株式会社島津製作所 放電イオン化検出器
WO2017050361A1 (de) * 2015-09-23 2017-03-30 Inficon ag Ionisations-vakuummesszelle
JP6775141B2 (ja) 2016-09-08 2020-10-28 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6747197B2 (ja) * 2016-09-08 2020-08-26 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6743599B2 (ja) 2016-09-08 2020-08-19 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6675709B2 (ja) * 2016-09-08 2020-04-01 株式会社島津製作所 誘電体バリア放電イオン化検出器
JP6747198B2 (ja) 2016-09-08 2020-08-26 株式会社島津製作所 誘電体バリア放電イオン化検出器
KR102046637B1 (ko) * 2018-01-30 2019-11-19 한국기계연구원 공정 모니터링을 위한 플라즈마 반응기
JP2023077708A (ja) * 2021-11-25 2023-06-06 株式会社島津製作所 放電イオン化検出器およびガスクロマトグラフ分析装置
CN114235943B (zh) * 2021-12-31 2024-11-19 北京华泰诺安技术有限公司 用于光离子化传感器的一体化离子收集机构及其制备方法
US12146854B2 (en) * 2023-03-01 2024-11-19 Mocon, Inc. Galvanic current protection for photoionization detector
CN120076146A (zh) * 2024-08-22 2025-05-30 南方科技大学 多级电容耦合等离子激发器

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3447071A (en) * 1965-09-22 1969-05-27 Webb James E Probes having guard ring and primary sensor at same potential to prevent collection of stray wall currents in ionized gases
US3526828A (en) * 1967-08-07 1970-09-01 Univ Minnesota Method and apparatus for measuring particle concentration
SU1048395A1 (ru) * 1982-04-19 1983-10-15 Московский Ордена Октябрьской Революции И Ордена Трудового Красного Знамени Институт Стали И Сплавов Ионизационный детектор дл хроматографа
US5594346A (en) * 1991-02-28 1997-01-14 Valco Instruments Co., Inc. Apparatus and methods for identifying and quantifying compounds using a plurality of pulsed rare gas photoionization detectors
US5394090A (en) * 1991-02-28 1995-02-28 Wentworth; Wayne E. Improved system for detecting compounds in a gaseous sample using induced photoionizations and electron capture detection
US5394092A (en) 1991-02-28 1995-02-28 Valco Instruments Co., Inc. System for identifying and quantifying selected constituents of gas samples using selective photoionization
JPH10307123A (ja) * 1997-05-07 1998-11-17 Hitachi Ltd 光イオン化検出方法及び光イオン化検出器
US5892364A (en) 1997-09-11 1999-04-06 Monagle; Matthew Trace constituent detection in inert gases
US6333632B1 (en) * 1999-09-16 2001-12-25 Rae Systems, Inc. Alternating current discharge ionization detector
US6448777B1 (en) * 2001-08-20 2002-09-10 Agilent Technologies, Inc. Hermetically-sealed miniaturized discharge ionization detector
US6842008B2 (en) * 2003-03-11 2005-01-11 Stanley D. Stearns Gas detector with modular detection and discharge source calibration
US7812614B2 (en) * 2004-10-27 2010-10-12 Hitachi High-Tech Science Systems Corporation Electron capture detector and nonradiative electron capture detector
CN200968949Y (zh) * 2006-07-10 2007-10-31 尹俊荣 脉冲放电氦离子化气相色谱仪
CN101981441B (zh) * 2008-03-25 2013-03-13 国立大学法人大阪大学 放电电离电流检测器
JP5136300B2 (ja) * 2008-09-02 2013-02-06 株式会社島津製作所 放電イオン化電流検出器
CN101770924B (zh) * 2008-12-30 2013-07-03 株式会社岛津制作所 一种解吸电离装置
JP2011117854A (ja) * 2009-12-04 2011-06-16 Osaka Univ 放電イオン化電流検出器
JP5423439B2 (ja) * 2010-02-01 2014-02-19 株式会社島津製作所 放電イオン化電流検出器

Also Published As

Publication number Publication date
JP2013125022A (ja) 2013-06-24
US9784713B2 (en) 2017-10-10
CN103163256A (zh) 2013-06-19
CN103163256B (zh) 2015-04-01
US20130154658A1 (en) 2013-06-20

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