JP5699796B2 - イオントラップ装置 - Google Patents

イオントラップ装置 Download PDF

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Publication number
JP5699796B2
JP5699796B2 JP2011110076A JP2011110076A JP5699796B2 JP 5699796 B2 JP5699796 B2 JP 5699796B2 JP 2011110076 A JP2011110076 A JP 2011110076A JP 2011110076 A JP2011110076 A JP 2011110076A JP 5699796 B2 JP5699796 B2 JP 5699796B2
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JP
Japan
Prior art keywords
ion trap
ion
ions
voltage
ring electrode
Prior art date
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Active
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JP2011110076A
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English (en)
Japanese (ja)
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JP2012243439A (ja
JP2012243439A5 (enExample
Inventor
谷口　純一
純一 谷口
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Shimadzu Corp
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Shimadzu Corp
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Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2011110076A priority Critical patent/JP5699796B2/ja
Priority to US13/458,708 priority patent/US8742330B2/en
Publication of JP2012243439A publication Critical patent/JP2012243439A/ja
Publication of JP2012243439A5 publication Critical patent/JP2012243439A5/ja
Application granted granted Critical
Publication of JP5699796B2 publication Critical patent/JP5699796B2/ja
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2011110076A 2011-05-17 2011-05-17 イオントラップ装置 Active JP5699796B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011110076A JP5699796B2 (ja) 2011-05-17 2011-05-17 イオントラップ装置
US13/458,708 US8742330B2 (en) 2011-05-17 2012-04-27 Specific phase range for ion injection into ion trap device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011110076A JP5699796B2 (ja) 2011-05-17 2011-05-17 イオントラップ装置

Publications (3)

Publication Number Publication Date
JP2012243439A JP2012243439A (ja) 2012-12-10
JP2012243439A5 JP2012243439A5 (enExample) 2013-11-28
JP5699796B2 true JP5699796B2 (ja) 2015-04-15

Family

ID=47174244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011110076A Active JP5699796B2 (ja) 2011-05-17 2011-05-17 イオントラップ装置

Country Status (2)

Country Link
US (1) US8742330B2 (enExample)
JP (1) JP5699796B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5533612B2 (ja) * 2010-12-07 2014-06-25 株式会社島津製作所 イオントラップ飛行時間型質量分析装置
US9396923B2 (en) * 2012-09-10 2016-07-19 Shimadzu Corporation Ion selection method in ion trap and ion trap system
US8969794B2 (en) * 2013-03-15 2015-03-03 1St Detect Corporation Mass dependent automatic gain control for mass spectrometer
KR20160083785A (ko) 2014-12-31 2016-07-12 한국기초과학지원연구원 질량 분석기 및 그것의 전자빔 주입을 제어하는 방법
GB201615132D0 (en) * 2016-09-06 2016-10-19 Micromass Ltd Quadrupole devices
GB201615127D0 (en) * 2016-09-06 2016-10-19 Micromass Ltd Quadrupole devices
CN109300768B (zh) * 2018-08-23 2023-09-26 金华职业技术学院 一种光反应探测方法
CN109300767B (zh) * 2018-08-23 2024-01-30 金华职业技术学院 一种光反应探测装置
CN110165959B (zh) * 2019-05-29 2020-11-13 哈尔滨工业大学 一种永磁同步电机自抗扰无位置传感器控制方法及控制装置
CN118658771B (zh) * 2024-07-29 2025-10-03 中国科学院大连化学物理研究所 方波相位调制线形离子阱-飞行时间质谱质量窗口的方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3937955A (en) * 1974-10-15 1976-02-10 Nicolet Technology Corporation Fourier transform ion cyclotron resonance spectroscopy method and apparatus
DE19520319A1 (de) * 1995-06-02 1996-12-12 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für die Einführung von Ionen in Quadrupol-Ionenfallen
DE19628179C2 (de) * 1996-07-12 1998-04-23 Bruker Franzen Analytik Gmbh Vorrichtung und Verfahren zum Einschuß von Ionen in eine Ionenfalle
JP3386048B2 (ja) 2000-12-14 2003-03-10 株式会社島津製作所 イオントラップ型質量分析装置
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
GB0526245D0 (en) * 2005-12-22 2006-02-01 Shimadzu Res Lab Europe Ltd A mass spectrometer using a dynamic pressure ion source
WO2007096970A1 (ja) * 2006-02-23 2007-08-30 Shimadzu Corporation 質量分析方法及び質量分析装置
WO2008072326A1 (ja) * 2006-12-14 2008-06-19 Shimadzu Corporation イオントラップ飛行時間型質量分析装置
JP2008282594A (ja) * 2007-05-09 2008-11-20 Shimadzu Corp イオントラップ型質量分析装置
JP5071179B2 (ja) * 2008-03-17 2012-11-14 株式会社島津製作所 質量分析装置及び質量分析方法
US8258462B2 (en) * 2008-09-05 2012-09-04 Thermo Finnigan Llc Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics
JPWO2010116396A1 (ja) * 2009-03-30 2012-10-11 株式会社島津製作所 イオントラップ装置

Also Published As

Publication number Publication date
US8742330B2 (en) 2014-06-03
JP2012243439A (ja) 2012-12-10
US20120292499A1 (en) 2012-11-22

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