JP2012243439A5 - - Google Patents
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- JP2012243439A5 JP2012243439A5 JP2011110076A JP2011110076A JP2012243439A5 JP 2012243439 A5 JP2012243439 A5 JP 2012243439A5 JP 2011110076 A JP2011110076 A JP 2011110076A JP 2011110076 A JP2011110076 A JP 2011110076A JP 2012243439 A5 JP2012243439 A5 JP 2012243439A5
- Authority
- JP
- Japan
- Prior art keywords
- ion
- trajectory
- range
- target
- end cap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011110076A JP5699796B2 (ja) | 2011-05-17 | 2011-05-17 | イオントラップ装置 |
| US13/458,708 US8742330B2 (en) | 2011-05-17 | 2012-04-27 | Specific phase range for ion injection into ion trap device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011110076A JP5699796B2 (ja) | 2011-05-17 | 2011-05-17 | イオントラップ装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012243439A JP2012243439A (ja) | 2012-12-10 |
| JP2012243439A5 true JP2012243439A5 (enExample) | 2013-11-28 |
| JP5699796B2 JP5699796B2 (ja) | 2015-04-15 |
Family
ID=47174244
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011110076A Active JP5699796B2 (ja) | 2011-05-17 | 2011-05-17 | イオントラップ装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8742330B2 (enExample) |
| JP (1) | JP5699796B2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5533612B2 (ja) * | 2010-12-07 | 2014-06-25 | 株式会社島津製作所 | イオントラップ飛行時間型質量分析装置 |
| US9396923B2 (en) * | 2012-09-10 | 2016-07-19 | Shimadzu Corporation | Ion selection method in ion trap and ion trap system |
| US8969794B2 (en) * | 2013-03-15 | 2015-03-03 | 1St Detect Corporation | Mass dependent automatic gain control for mass spectrometer |
| KR20160083785A (ko) | 2014-12-31 | 2016-07-12 | 한국기초과학지원연구원 | 질량 분석기 및 그것의 전자빔 주입을 제어하는 방법 |
| GB201615132D0 (en) * | 2016-09-06 | 2016-10-19 | Micromass Ltd | Quadrupole devices |
| GB201615127D0 (en) * | 2016-09-06 | 2016-10-19 | Micromass Ltd | Quadrupole devices |
| CN109300768B (zh) * | 2018-08-23 | 2023-09-26 | 金华职业技术学院 | 一种光反应探测方法 |
| CN109300767B (zh) * | 2018-08-23 | 2024-01-30 | 金华职业技术学院 | 一种光反应探测装置 |
| CN110165959B (zh) * | 2019-05-29 | 2020-11-13 | 哈尔滨工业大学 | 一种永磁同步电机自抗扰无位置传感器控制方法及控制装置 |
| CN118658771B (zh) * | 2024-07-29 | 2025-10-03 | 中国科学院大连化学物理研究所 | 方波相位调制线形离子阱-飞行时间质谱质量窗口的方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3937955A (en) * | 1974-10-15 | 1976-02-10 | Nicolet Technology Corporation | Fourier transform ion cyclotron resonance spectroscopy method and apparatus |
| DE19520319A1 (de) * | 1995-06-02 | 1996-12-12 | Bruker Franzen Analytik Gmbh | Verfahren und Vorrichtung für die Einführung von Ionen in Quadrupol-Ionenfallen |
| DE19628179C2 (de) * | 1996-07-12 | 1998-04-23 | Bruker Franzen Analytik Gmbh | Vorrichtung und Verfahren zum Einschuß von Ionen in eine Ionenfalle |
| JP3386048B2 (ja) | 2000-12-14 | 2003-03-10 | 株式会社島津製作所 | イオントラップ型質量分析装置 |
| US7385187B2 (en) * | 2003-06-21 | 2008-06-10 | Leco Corporation | Multi-reflecting time-of-flight mass spectrometer and method of use |
| GB0526245D0 (en) * | 2005-12-22 | 2006-02-01 | Shimadzu Res Lab Europe Ltd | A mass spectrometer using a dynamic pressure ion source |
| WO2007096970A1 (ja) * | 2006-02-23 | 2007-08-30 | Shimadzu Corporation | 質量分析方法及び質量分析装置 |
| WO2008072326A1 (ja) * | 2006-12-14 | 2008-06-19 | Shimadzu Corporation | イオントラップ飛行時間型質量分析装置 |
| JP2008282594A (ja) * | 2007-05-09 | 2008-11-20 | Shimadzu Corp | イオントラップ型質量分析装置 |
| JP5071179B2 (ja) * | 2008-03-17 | 2012-11-14 | 株式会社島津製作所 | 質量分析装置及び質量分析方法 |
| US8258462B2 (en) * | 2008-09-05 | 2012-09-04 | Thermo Finnigan Llc | Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics |
| JPWO2010116396A1 (ja) * | 2009-03-30 | 2012-10-11 | 株式会社島津製作所 | イオントラップ装置 |
-
2011
- 2011-05-17 JP JP2011110076A patent/JP5699796B2/ja active Active
-
2012
- 2012-04-27 US US13/458,708 patent/US8742330B2/en not_active Expired - Fee Related
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