JP2007066533A - レーザー照射質量分析装置 - Google Patents
レーザー照射質量分析装置 Download PDFInfo
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- JP2007066533A JP2007066533A JP2005247134A JP2005247134A JP2007066533A JP 2007066533 A JP2007066533 A JP 2007066533A JP 2005247134 A JP2005247134 A JP 2005247134A JP 2005247134 A JP2005247134 A JP 2005247134A JP 2007066533 A JP2007066533 A JP 2007066533A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0004—Imaging particle spectrometry
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
【解決手段】 照射位置を制御して試料にレーザーを照射し、そこで生成された試料のイオンを質量分析して、試料の位置情報とその位置における質量分析情報を得るレーザー照射質量分析装置において、該イオンの質量分析に、周波数駆動型イオントラップと飛行時間型質量分析装置を用いる。これにより、高い質量数のイオンも確実にトラップし、分析対象とすることができる。この周波数駆動型イオントラップの駆動方式には、デジタル駆動方式を用いることが望ましい。また、飛行時間型質量分析装置は、マルチターン型飛行時間質量分析装置とすることが望ましい。
【選択図】 図1
Description
いずれにせよ、上記LDI/MALDI−MSを用いる場合、照射レーザー光のスポット径を微小に絞ることにより、微小部分の質量分析を行うことができ、また、高解像度の質量分析顕微鏡像を得ることができる(非特許文献1、特許文献1)。
該イオンの質量分析に、周波数駆動型イオントラップと飛行時間型質量分析装置を用いることを特徴とする。
12…試料
13…レーザー光源
14…イオン
15…イオンガイド
16…質量分析部
17…検出器
21…イオントラップ
211…リング電極
212、213…エンドキャップ電極
22…リフレクトロン型飛行時間質量分析装置
31…周波数駆動型イオントラップ
41、51…マルチターン型飛行時間質量分析装置
Claims (3)
- 照射位置を制御して試料にレーザーを照射し、そこで生成された試料のイオンを質量分析して、試料の位置情報とその位置における質量分析情報を得るレーザー照射質量分析装置において、
該イオンの質量分析に、周波数駆動型イオントラップと飛行時間型質量分析装置を用いることを特徴とするレーザー照射質量分析装置。 - 周波数駆動型イオントラップの駆動方式としてデジタル駆動方式を用いることを特徴とする請求項1に記載のレーザー照射質量分析装置。
- 飛行時間型質量分析装置にマルチターン型飛行時間質量分析装置を用いることを特徴とする請求項1又は2に記載のレーザー照射質量分析装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005247134A JP4766549B2 (ja) | 2005-08-29 | 2005-08-29 | レーザー照射質量分析装置 |
US11/362,526 US7501620B2 (en) | 2005-08-29 | 2006-02-27 | Laser irradiation mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005247134A JP4766549B2 (ja) | 2005-08-29 | 2005-08-29 | レーザー照射質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007066533A true JP2007066533A (ja) | 2007-03-15 |
JP4766549B2 JP4766549B2 (ja) | 2011-09-07 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2005247134A Active JP4766549B2 (ja) | 2005-08-29 | 2005-08-29 | レーザー照射質量分析装置 |
Country Status (2)
Country | Link |
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US (1) | US7501620B2 (ja) |
JP (1) | JP4766549B2 (ja) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007127485A (ja) * | 2005-11-02 | 2007-05-24 | Shimadzu Corp | イメージ質量分析装置 |
JP2008269845A (ja) * | 2007-04-17 | 2008-11-06 | Noguchi Inst | 質量分析法 |
WO2012157867A2 (ko) * | 2011-05-13 | 2012-11-22 | 한국표준과학연구원 | 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템 |
US8324569B2 (en) | 2008-07-03 | 2012-12-04 | Shimadzu Corporation | Mass spectrometer |
US8433122B2 (en) | 2010-03-05 | 2013-04-30 | Shimadzu Corporation | Method and apparatus for processing mass analysis data |
US8743138B2 (en) | 2010-11-29 | 2014-06-03 | Shimadzu Corporation | Method and system for processing mass analysis data |
US8816274B2 (en) | 2009-03-31 | 2014-08-26 | Shimadzu Corporation | Mass spectrometer |
US8873796B2 (en) | 2010-03-16 | 2014-10-28 | Shimadzu Corporation | Mass analysis data processing method and mass analysis data processing apparatus |
JP2015514300A (ja) * | 2012-03-28 | 2015-05-18 | アルバック・ファイ株式会社 | 質量分析/質量分析データを並列取得するための方法および装置 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7347294B2 (en) * | 2003-05-21 | 2008-03-25 | Gonzalez Encarnacion H | Power system for electrically powered land vehicle |
JP2006228435A (ja) * | 2005-02-15 | 2006-08-31 | Shimadzu Corp | 飛行時間型質量分析装置 |
US7633059B2 (en) * | 2006-10-13 | 2009-12-15 | Agilent Technologies, Inc. | Mass spectrometry system having ion deflector |
CN101669027B (zh) * | 2007-05-09 | 2013-09-25 | 株式会社岛津制作所 | 带电粒子分析装置 |
DE102007060438B4 (de) * | 2007-12-14 | 2011-09-22 | Bruker Daltonik Gmbh | Untersuchung einzelner biologischer Zellen |
US7932487B2 (en) * | 2008-01-11 | 2011-04-26 | Thermo Finnigan Llc | Mass spectrometer with looped ion path |
WO2010100675A1 (ja) * | 2009-03-05 | 2010-09-10 | 株式会社島津製作所 | 質量分析装置 |
JP5359924B2 (ja) * | 2010-02-18 | 2013-12-04 | 株式会社島津製作所 | 質量分析装置 |
JP6025141B2 (ja) * | 2011-04-28 | 2016-11-16 | 公益財団法人がん研究会 | 質量分析データ処理方法及び装置 |
GB201617628D0 (en) * | 2016-10-18 | 2016-11-30 | University Of Manchester The | Method of determining presence of Isotopes |
CN109712862A (zh) * | 2019-01-28 | 2019-05-03 | 安图实验仪器(郑州)有限公司 | 适于基质辅助激光解析电离飞行时间质谱仪的光路系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08189917A (ja) * | 1995-01-11 | 1996-07-23 | Hitachi Ltd | 質量分析装置 |
US5808300A (en) * | 1996-05-10 | 1998-09-15 | Board Of Regents, The University Of Texas System | Method and apparatus for imaging biological samples with MALDI MS |
JP2003512702A (ja) * | 1999-10-19 | 2003-04-02 | シマヅ リサーチ ラボラトリー(ヨーロッパ)リミティド | 四重極イオントラップ装置を駆動する方法と装置 |
JP2004303719A (ja) * | 2003-03-31 | 2004-10-28 | Hitachi High-Technologies Corp | 質量分析計 |
JP2005116246A (ja) * | 2003-10-06 | 2005-04-28 | Shimadzu Corp | 質量分析装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6107625A (en) * | 1997-05-30 | 2000-08-22 | Bruker Daltonics, Inc. | Coaxial multiple reflection time-of-flight mass spectrometer |
US6777673B2 (en) * | 2001-12-28 | 2004-08-17 | Academia Sinica | Ion trap mass spectrometer |
US6963066B2 (en) * | 2003-06-05 | 2005-11-08 | Thermo Finnigan Llc | Rod assembly in ion source |
-
2005
- 2005-08-29 JP JP2005247134A patent/JP4766549B2/ja active Active
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2006
- 2006-02-27 US US11/362,526 patent/US7501620B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08189917A (ja) * | 1995-01-11 | 1996-07-23 | Hitachi Ltd | 質量分析装置 |
US5808300A (en) * | 1996-05-10 | 1998-09-15 | Board Of Regents, The University Of Texas System | Method and apparatus for imaging biological samples with MALDI MS |
JP2003512702A (ja) * | 1999-10-19 | 2003-04-02 | シマヅ リサーチ ラボラトリー(ヨーロッパ)リミティド | 四重極イオントラップ装置を駆動する方法と装置 |
JP2004303719A (ja) * | 2003-03-31 | 2004-10-28 | Hitachi High-Technologies Corp | 質量分析計 |
JP2005116246A (ja) * | 2003-10-06 | 2005-04-28 | Shimadzu Corp | 質量分析装置 |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007127485A (ja) * | 2005-11-02 | 2007-05-24 | Shimadzu Corp | イメージ質量分析装置 |
JP2008269845A (ja) * | 2007-04-17 | 2008-11-06 | Noguchi Inst | 質量分析法 |
US8324569B2 (en) | 2008-07-03 | 2012-12-04 | Shimadzu Corporation | Mass spectrometer |
US8816274B2 (en) | 2009-03-31 | 2014-08-26 | Shimadzu Corporation | Mass spectrometer |
US8433122B2 (en) | 2010-03-05 | 2013-04-30 | Shimadzu Corporation | Method and apparatus for processing mass analysis data |
US8873796B2 (en) | 2010-03-16 | 2014-10-28 | Shimadzu Corporation | Mass analysis data processing method and mass analysis data processing apparatus |
US8743138B2 (en) | 2010-11-29 | 2014-06-03 | Shimadzu Corporation | Method and system for processing mass analysis data |
WO2012157867A2 (ko) * | 2011-05-13 | 2012-11-22 | 한국표준과학연구원 | 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템 |
WO2012157867A3 (ko) * | 2011-05-13 | 2013-01-17 | 한국표준과학연구원 | 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템 |
US8772713B1 (en) | 2011-05-13 | 2014-07-08 | Korea Research Institute Of Standards And Science | Flight time based mass microscope system for ultra high-speed multi mode mass analysis |
JP2015514300A (ja) * | 2012-03-28 | 2015-05-18 | アルバック・ファイ株式会社 | 質量分析/質量分析データを並列取得するための方法および装置 |
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Publication number | Publication date |
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US20070045527A1 (en) | 2007-03-01 |
US7501620B2 (en) | 2009-03-10 |
JP4766549B2 (ja) | 2011-09-07 |
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