WO2012157867A3 - 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템 - Google Patents

초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템 Download PDF

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Publication number
WO2012157867A3
WO2012157867A3 PCT/KR2012/003463 KR2012003463W WO2012157867A3 WO 2012157867 A3 WO2012157867 A3 WO 2012157867A3 KR 2012003463 W KR2012003463 W KR 2012003463W WO 2012157867 A3 WO2012157867 A3 WO 2012157867A3
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WO
WIPO (PCT)
Prior art keywords
time based
flight time
ultra high
mass
multi mode
Prior art date
Application number
PCT/KR2012/003463
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English (en)
French (fr)
Other versions
WO2012157867A2 (ko
Inventor
문정희
문대원
이태걸
윤소희
김주황
Original Assignee
한국표준과학연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 한국표준과학연구원 filed Critical 한국표준과학연구원
Priority to US14/117,116 priority Critical patent/US8772713B1/en
Priority to JP2014511282A priority patent/JP5743170B2/ja
Priority to DE112012002078.2T priority patent/DE112012002078B4/de
Publication of WO2012157867A2 publication Critical patent/WO2012157867A2/ko
Publication of WO2012157867A3 publication Critical patent/WO2012157867A3/ko

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/406—Time-of-flight spectrometers with multiple reflections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

본 발명의 목적은 분석하고자 하는 대상의 분자량에 제한받지 않고 약물/대사체/지질/펩타이드와 같은 저분자량 분석이나 유전자/단백질과 같은 고분자량 분석이 모두 가능하도록 레이저빔 또는 이온빔을 동시에 사용하고, 또한 주사형 방법이 아닌 현미경 방법을 사용함으로써 측정 속도를 비약적으로 증대시키는, 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템을 제공함에 있다.
PCT/KR2012/003463 2011-05-13 2012-05-03 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템 WO2012157867A2 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US14/117,116 US8772713B1 (en) 2011-05-13 2012-05-03 Flight time based mass microscope system for ultra high-speed multi mode mass analysis
JP2014511282A JP5743170B2 (ja) 2011-05-13 2012-05-03 超高速マルチモード質量分析のための飛行時間に基づく質量顕微鏡システム
DE112012002078.2T DE112012002078B4 (de) 2011-05-13 2012-05-03 Flugzeit-basierendes Massenmikroskopsystem zur Ultrahochgeschwindigkeits-multimodalen Massenanalyse

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2011-0045281 2011-05-13
KR1020110045281A KR101790534B1 (ko) 2011-05-13 2011-05-13 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템

Publications (2)

Publication Number Publication Date
WO2012157867A2 WO2012157867A2 (ko) 2012-11-22
WO2012157867A3 true WO2012157867A3 (ko) 2013-01-17

Family

ID=47177430

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2012/003463 WO2012157867A2 (ko) 2011-05-13 2012-05-03 초고속 멀티 모드 질량 분석을 위한 비행시간 기반 질량 현미경 시스템

Country Status (5)

Country Link
US (1) US8772713B1 (ko)
JP (1) JP5743170B2 (ko)
KR (1) KR101790534B1 (ko)
DE (1) DE112012002078B4 (ko)
WO (1) WO2012157867A2 (ko)

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GB201507363D0 (en) 2015-04-30 2015-06-17 Micromass Uk Ltd And Leco Corp Multi-reflecting TOF mass spectrometer
US9754772B2 (en) 2015-09-02 2017-09-05 Canon Kabushiki Kaisha Charged particle image measuring device and imaging mass spectrometry apparatus
GB201520134D0 (en) * 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520130D0 (en) * 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520540D0 (en) 2015-11-23 2016-01-06 Micromass Uk Ltd And Leco Corp Improved ion mirror and ion-optical lens for imaging
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
EP3662502A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Printed circuit ion mirror with compensation
US11049712B2 (en) 2017-08-06 2021-06-29 Micromass Uk Limited Fields for multi-reflecting TOF MS
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
EP3662501A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Ion mirror for multi-reflecting mass spectrometers
CN111164731B (zh) 2017-08-06 2022-11-18 英国质谱公司 进入多通道质谱分析仪的离子注入
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
WO2019030475A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov MASS SPECTROMETER WITH MULTIPASSAGE
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
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Also Published As

Publication number Publication date
DE112012002078T5 (de) 2014-06-18
JP2014514591A (ja) 2014-06-19
DE112012002078B4 (de) 2017-10-26
KR20120127054A (ko) 2012-11-21
US20140183354A1 (en) 2014-07-03
US8772713B1 (en) 2014-07-08
JP5743170B2 (ja) 2015-07-01
WO2012157867A2 (ko) 2012-11-22
KR101790534B1 (ko) 2017-10-27

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