JP5662742B2 - 粒径計測装置及び粒径計測方法 - Google Patents

粒径計測装置及び粒径計測方法 Download PDF

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Publication number
JP5662742B2
JP5662742B2 JP2010191572A JP2010191572A JP5662742B2 JP 5662742 B2 JP5662742 B2 JP 5662742B2 JP 2010191572 A JP2010191572 A JP 2010191572A JP 2010191572 A JP2010191572 A JP 2010191572A JP 5662742 B2 JP5662742 B2 JP 5662742B2
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light
intensity
particles
flow path
particle size
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JP2010191572A
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Japanese (ja)
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JP2012047648A (ja
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岩井　俊昭
俊昭 岩井
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AISTHESIS CO LTD
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AISTHESIS CO LTD
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Priority to JP2010191572A priority Critical patent/JP5662742B2/ja
Priority to PCT/JP2011/069353 priority patent/WO2012026600A1/ja
Priority to CN201180041418.1A priority patent/CN103069265B/zh
Publication of JP2012047648A publication Critical patent/JP2012047648A/ja
Priority to HK13107489.8A priority patent/HK1180394A1/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means

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  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2010191572A 2010-08-27 2010-08-27 粒径計測装置及び粒径計測方法 Expired - Fee Related JP5662742B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010191572A JP5662742B2 (ja) 2010-08-27 2010-08-27 粒径計測装置及び粒径計測方法
PCT/JP2011/069353 WO2012026600A1 (ja) 2010-08-27 2011-08-26 粒径計測装置及び粒径計測方法
CN201180041418.1A CN103069265B (zh) 2010-08-27 2011-08-26 粒径测量装置与粒径测量方法
HK13107489.8A HK1180394A1 (zh) 2010-08-27 2013-06-26 粒徑測量裝置與粒徑測量方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010191572A JP5662742B2 (ja) 2010-08-27 2010-08-27 粒径計測装置及び粒径計測方法

Publications (2)

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JP2012047648A JP2012047648A (ja) 2012-03-08
JP5662742B2 true JP5662742B2 (ja) 2015-02-04

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JP2010191572A Expired - Fee Related JP5662742B2 (ja) 2010-08-27 2010-08-27 粒径計測装置及び粒径計測方法

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JP (1) JP5662742B2 (zh)
CN (1) CN103069265B (zh)
HK (1) HK1180394A1 (zh)
WO (1) WO2012026600A1 (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
JP6936229B2 (ja) 2015-09-23 2021-09-15 マルバーン パナリティカル リミテッド 粒子特性評価
GB201604460D0 (en) 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN107782645A (zh) * 2017-12-12 2018-03-09 海宁智测光电科技有限公司 一种气固两相流颗粒粒径在线测量装置与方法
CN108444877B (zh) * 2018-06-11 2024-02-23 浙江大学 一种用于测量液滴的相位粒子干涉成像方法及装置
WO2021131578A1 (ja) * 2019-12-27 2021-07-01 昭和電工株式会社 フッ素ガス製造装置及び光散乱検出器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61153546A (ja) * 1984-12-26 1986-07-12 Canon Inc 粒子解析装置
CA1292628C (en) * 1986-02-12 1991-12-03 James Phinazee Sutton Iii In situ particle size measuring device
JPH0213829A (ja) * 1988-06-30 1990-01-18 Canon Inc 粒子測定装置
JP2675895B2 (ja) * 1990-04-25 1997-11-12 キヤノン株式会社 検体処理方法及び検体測定方法及び検体測定装置
US5198369A (en) * 1990-04-25 1993-03-30 Canon Kabushiki Kaisha Sample measuring method using agglomeration reaction of microcarriers
US5037202A (en) * 1990-07-02 1991-08-06 International Business Machines Corporation Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field
CN2251721Y (zh) * 1995-08-28 1997-04-09 周定益 激光粒度测试仪
JPH11352048A (ja) * 1998-06-04 1999-12-24 Toray Eng Co Ltd 液中微粒子測定装置
JP2000325729A (ja) * 1999-05-21 2000-11-28 Yokogawa Electric Corp 微粒子濃縮装置及びこれを用いた微粒子分析装置
JP4594810B2 (ja) * 2005-06-27 2010-12-08 三井造船株式会社 試料液中粒子の位置制御方法および粒子測定装置

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HK1180394A1 (zh) 2013-10-18
CN103069265A (zh) 2013-04-24
WO2012026600A1 (ja) 2012-03-01
CN103069265B (zh) 2015-05-27
JP2012047648A (ja) 2012-03-08

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