HK1180394A1 - 粒徑測量裝置與粒徑測量方法 - Google Patents

粒徑測量裝置與粒徑測量方法

Info

Publication number
HK1180394A1
HK1180394A1 HK13107489.8A HK13107489A HK1180394A1 HK 1180394 A1 HK1180394 A1 HK 1180394A1 HK 13107489 A HK13107489 A HK 13107489A HK 1180394 A1 HK1180394 A1 HK 1180394A1
Authority
HK
Hong Kong
Prior art keywords
particle diameter
diameter measurement
measurement device
measurement method
particle
Prior art date
Application number
HK13107489.8A
Other languages
English (en)
Inventor
岩井俊昭
Original Assignee
艾斯特希斯株式會社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 艾斯特希斯株式會社 filed Critical 艾斯特希斯株式會社
Publication of HK1180394A1 publication Critical patent/HK1180394A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK13107489.8A 2010-08-27 2013-06-26 粒徑測量裝置與粒徑測量方法 HK1180394A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010191572A JP5662742B2 (ja) 2010-08-27 2010-08-27 粒径計測装置及び粒径計測方法
PCT/JP2011/069353 WO2012026600A1 (ja) 2010-08-27 2011-08-26 粒径計測装置及び粒径計測方法

Publications (1)

Publication Number Publication Date
HK1180394A1 true HK1180394A1 (zh) 2013-10-18

Family

ID=45723589

Family Applications (1)

Application Number Title Priority Date Filing Date
HK13107489.8A HK1180394A1 (zh) 2010-08-27 2013-06-26 粒徑測量裝置與粒徑測量方法

Country Status (4)

Country Link
JP (1) JP5662742B2 (zh)
CN (1) CN103069265B (zh)
HK (1) HK1180394A1 (zh)
WO (1) WO2012026600A1 (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
JP6936229B2 (ja) 2015-09-23 2021-09-15 マルバーン パナリティカル リミテッド 粒子特性評価
GB201604460D0 (en) 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN107782645A (zh) * 2017-12-12 2018-03-09 海宁智测光电科技有限公司 一种气固两相流颗粒粒径在线测量装置与方法
CN108444877B (zh) * 2018-06-11 2024-02-23 浙江大学 一种用于测量液滴的相位粒子干涉成像方法及装置
WO2021131578A1 (ja) * 2019-12-27 2021-07-01 昭和電工株式会社 フッ素ガス製造装置及び光散乱検出器

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61153546A (ja) * 1984-12-26 1986-07-12 Canon Inc 粒子解析装置
CA1292628C (en) * 1986-02-12 1991-12-03 James Phinazee Sutton Iii In situ particle size measuring device
JPH0213829A (ja) * 1988-06-30 1990-01-18 Canon Inc 粒子測定装置
JP2675895B2 (ja) * 1990-04-25 1997-11-12 キヤノン株式会社 検体処理方法及び検体測定方法及び検体測定装置
US5198369A (en) * 1990-04-25 1993-03-30 Canon Kabushiki Kaisha Sample measuring method using agglomeration reaction of microcarriers
US5037202A (en) * 1990-07-02 1991-08-06 International Business Machines Corporation Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field
CN2251721Y (zh) * 1995-08-28 1997-04-09 周定益 激光粒度测试仪
JPH11352048A (ja) * 1998-06-04 1999-12-24 Toray Eng Co Ltd 液中微粒子測定装置
JP2000325729A (ja) * 1999-05-21 2000-11-28 Yokogawa Electric Corp 微粒子濃縮装置及びこれを用いた微粒子分析装置
JP4594810B2 (ja) * 2005-06-27 2010-12-08 三井造船株式会社 試料液中粒子の位置制御方法および粒子測定装置

Also Published As

Publication number Publication date
CN103069265A (zh) 2013-04-24
WO2012026600A1 (ja) 2012-03-01
CN103069265B (zh) 2015-05-27
JP2012047648A (ja) 2012-03-08
JP5662742B2 (ja) 2015-02-04

Similar Documents

Publication Publication Date Title
IL225213A0 (en) Fish sorting device and method
IL216964A0 (en) Analyte monitoring device and methods
HK1179063A1 (zh) 發送裝置及方法
PL2533901T3 (pl) Proces powlekania i urządzenie do powlekania
EP2602994A4 (en) RECEIVING DEVICE, RECEIVING METHOD, AND PROGRAM THEREOF
EP2624548A4 (en) RECEIVING DEVICE, RECEIVER METHOD AND PROGRAM THEREFOR
EP2613528A4 (en) RECEIVING DEVICE, RECEIVING METHOD, AND PROGRAM THEREOF
EP2579065A4 (en) DEVICE AND METHOD FOR MEASURING A POSITION
EP2614770A4 (en) BIOMAGNETISM MEASUREMENT DEVICE, BIOMAGNETISM MEASUREMENT SYSTEM, AND BIOMAGNETIC MEASUREMENT METHOD
EP2617508A4 (en) METHOD FOR DETERMINING WELDING CONDITIONS, AND WELDING DEVICE
EP2657714A4 (en) Full-charge detection device, and full-charge detection method
PL2536501T3 (pl) Urządzenie powlekające i technologia
EP2573493A4 (en) DRYING METHOD AND DRYING DEVICE
EP2534450A4 (en) ANGLE MEASURING DEVICE AND METHOD
EP2573510A4 (en) MOLDING DEVICE AND SHAPING METHOD
EP2680011A4 (en) Measurement device and measurement method
EP2656205A4 (en) DEVICE, SYSTEM AND METHOD FOR OPERATING FLOW OPTIMIZATION
ZA201207230B (en) Pelletizing device and method
EP2555188A4 (en) BANDWIDTH EXTENSION DEVICE AND BANDWIDTH EXTENSION METHOD
EP2540224A4 (en) ANALYSIS DEVICE, ANALYSIS PROCEDURE AND ANALYSIS SYSTEM
HK1180394A1 (zh) 粒徑測量裝置與粒徑測量方法
PL2552649T3 (pl) Urządzenie montażowe i sposób montażu
GB201004121D0 (en) Detector device, inspection apparatus and method
EP2586748A4 (en) DEVICE FOR PRODUCING FRESH WATER AND METHOD FOR PRODUCING FRESH WATER
EP2548615A4 (en) DETERMINATION DEVICE AND DETERMINATION METHOD

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20190824