HK1180394A1 - Particle diameter measurement device, and particle diameter measurement method - Google Patents

Particle diameter measurement device, and particle diameter measurement method

Info

Publication number
HK1180394A1
HK1180394A1 HK13107489.8A HK13107489A HK1180394A1 HK 1180394 A1 HK1180394 A1 HK 1180394A1 HK 13107489 A HK13107489 A HK 13107489A HK 1180394 A1 HK1180394 A1 HK 1180394A1
Authority
HK
Hong Kong
Prior art keywords
particle diameter
diameter measurement
measurement device
measurement method
particle
Prior art date
Application number
HK13107489.8A
Other languages
Chinese (zh)
Inventor
岩井俊昭
Original Assignee
艾斯特希斯株式會社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 艾斯特希斯株式會社 filed Critical 艾斯特希斯株式會社
Publication of HK1180394A1 publication Critical patent/HK1180394A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK13107489.8A 2010-08-27 2013-06-26 Particle diameter measurement device, and particle diameter measurement method HK1180394A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010191572A JP5662742B2 (en) 2010-08-27 2010-08-27 Particle size measuring apparatus and particle size measuring method
PCT/JP2011/069353 WO2012026600A1 (en) 2010-08-27 2011-08-26 Particle diameter measurement device, and particle diameter measurement method

Publications (1)

Publication Number Publication Date
HK1180394A1 true HK1180394A1 (en) 2013-10-18

Family

ID=45723589

Family Applications (1)

Application Number Title Priority Date Filing Date
HK13107489.8A HK1180394A1 (en) 2010-08-27 2013-06-26 Particle diameter measurement device, and particle diameter measurement method

Country Status (4)

Country Link
JP (1) JP5662742B2 (en)
CN (1) CN103069265B (en)
HK (1) HK1180394A1 (en)
WO (1) WO2012026600A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
JP6936229B2 (en) * 2015-09-23 2021-09-15 マルバーン パナリティカル リミテッド Particle characterization
GB201604460D0 (en) 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN107782645A (en) * 2017-12-12 2018-03-09 海宁智测光电科技有限公司 A kind of gas-solid rolling particles particle diameter on-line measurement apparatus and method
CN108444877B (en) * 2018-06-11 2024-02-23 浙江大学 Phase particle interference imaging method and device for measuring liquid drops
KR20220065021A (en) * 2019-12-27 2022-05-19 쇼와 덴코 가부시키가이샤 Fluorine gas production device and light scattering detector

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61153546A (en) * 1984-12-26 1986-07-12 Canon Inc Particle analyzer
CA1292628C (en) * 1986-02-12 1991-12-03 James Phinazee Sutton Iii In situ particle size measuring device
JPH0213829A (en) * 1988-06-30 1990-01-18 Canon Inc Particle measuring apparatus
JP2675895B2 (en) * 1990-04-25 1997-11-12 キヤノン株式会社 Sample processing method, sample measuring method, and sample measuring device
US5198369A (en) * 1990-04-25 1993-03-30 Canon Kabushiki Kaisha Sample measuring method using agglomeration reaction of microcarriers
US5037202A (en) * 1990-07-02 1991-08-06 International Business Machines Corporation Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field
CN2251721Y (en) * 1995-08-28 1997-04-09 周定益 Laser tester for investigating particle size
JPH11352048A (en) * 1998-06-04 1999-12-24 Toray Eng Co Ltd Device for measuring fine particles in liquid
JP2000325729A (en) * 1999-05-21 2000-11-28 Yokogawa Electric Corp Fine particle concentrator and fine particle analyser using that
JP4594810B2 (en) * 2005-06-27 2010-12-08 三井造船株式会社 Method for controlling position of particles in sample liquid and particle measuring apparatus

Also Published As

Publication number Publication date
JP2012047648A (en) 2012-03-08
WO2012026600A1 (en) 2012-03-01
CN103069265A (en) 2013-04-24
JP5662742B2 (en) 2015-02-04
CN103069265B (en) 2015-05-27

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20190824