JP5642541B2 - 物体の光電子工学的検知、及び位置特定のための方法、及びシステム - Google Patents
物体の光電子工学的検知、及び位置特定のための方法、及びシステム Download PDFInfo
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- JP5642541B2 JP5642541B2 JP2010512170A JP2010512170A JP5642541B2 JP 5642541 B2 JP5642541 B2 JP 5642541B2 JP 2010512170 A JP2010512170 A JP 2010512170A JP 2010512170 A JP2010512170 A JP 2010512170A JP 5642541 B2 JP5642541 B2 JP 5642541B2
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/20—Analysis of motion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S5/00—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations
- G01S5/16—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations using electromagnetic waves other than radio waves
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
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- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/763,752 | 2007-06-15 | ||
| US11/763,752 US8237099B2 (en) | 2007-06-15 | 2007-06-15 | Method and system for optoelectronic detection and location of objects |
| PCT/US2008/007280 WO2008156608A2 (en) | 2007-06-15 | 2008-06-11 | Method and system for optoelectronic detection and location of objects |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014129880A Division JP6054917B2 (ja) | 2007-06-15 | 2014-06-25 | 物体の光電子工学的検知、及び位置特定のための方法、及びシステム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010530070A JP2010530070A (ja) | 2010-09-02 |
| JP2010530070A5 JP2010530070A5 (enExample) | 2011-07-28 |
| JP5642541B2 true JP5642541B2 (ja) | 2014-12-17 |
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Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010512170A Expired - Fee Related JP5642541B2 (ja) | 2007-06-15 | 2008-06-11 | 物体の光電子工学的検知、及び位置特定のための方法、及びシステム |
| JP2014129880A Active JP6054917B2 (ja) | 2007-06-15 | 2014-06-25 | 物体の光電子工学的検知、及び位置特定のための方法、及びシステム |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014129880A Active JP6054917B2 (ja) | 2007-06-15 | 2014-06-25 | 物体の光電子工学的検知、及び位置特定のための方法、及びシステム |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8237099B2 (enExample) |
| EP (2) | EP2158500B1 (enExample) |
| JP (2) | JP5642541B2 (enExample) |
| WO (1) | WO2008156608A2 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2677946B2 (ja) | 1992-11-04 | 1997-11-17 | 豊国工業株式会社 | 穀物用貯溜槽の攪拌装置 |
| JP2014222235A (ja) * | 2007-06-15 | 2014-11-27 | コグネックス・コーポレイション | 物体の光電子工学的検知、及び位置特定のための方法、及びシステム |
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| US9092841B2 (en) * | 2004-06-09 | 2015-07-28 | Cognex Technology And Investment Llc | Method and apparatus for visual detection and inspection of objects |
| US8127247B2 (en) | 2004-06-09 | 2012-02-28 | Cognex Corporation | Human-machine-interface and method for manipulating data in a machine vision system |
| US8243986B2 (en) * | 2004-06-09 | 2012-08-14 | Cognex Technology And Investment Corporation | Method and apparatus for automatic visual event detection |
| US8891852B2 (en) | 2004-06-09 | 2014-11-18 | Cognex Technology And Investment Corporation | Method and apparatus for configuring and testing a machine vision detector |
| US20050276445A1 (en) * | 2004-06-09 | 2005-12-15 | Silver William M | Method and apparatus for automatic visual detection, recording, and retrieval of events |
| US9659769B1 (en) | 2004-10-22 | 2017-05-23 | Novellus Systems, Inc. | Tensile dielectric films using UV curing |
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| US8454750B1 (en) | 2005-04-26 | 2013-06-04 | Novellus Systems, Inc. | Multi-station sequential curing of dielectric films |
| US8889233B1 (en) | 2005-04-26 | 2014-11-18 | Novellus Systems, Inc. | Method for reducing stress in porous dielectric films |
| US8980769B1 (en) | 2005-04-26 | 2015-03-17 | Novellus Systems, Inc. | Multi-station sequential curing of dielectric films |
| US10037905B2 (en) | 2009-11-12 | 2018-07-31 | Novellus Systems, Inc. | UV and reducing treatment for K recovery and surface clean in semiconductor processing |
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| US8238639B2 (en) * | 2008-04-09 | 2012-08-07 | Cognex Corporation | Method and system for dynamic feature detection |
| US9050623B1 (en) | 2008-09-12 | 2015-06-09 | Novellus Systems, Inc. | Progressive UV cure |
| US20100199475A1 (en) * | 2009-02-06 | 2010-08-12 | Tremblay Robert J | System and method for utilizing a linear sensor |
| FI20115326A0 (fi) * | 2011-04-05 | 2011-04-05 | Zenrobotics Oy | Menetelmä sensorin mittausten mitätöimiseksi poimintatoiminnon jälkeen robottijärjestelmässä |
| US9651499B2 (en) | 2011-12-20 | 2017-05-16 | Cognex Corporation | Configurable image trigger for a vision system and method for using the same |
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| DE102015107730B4 (de) | 2015-05-18 | 2020-07-23 | Hmgeb Holding B.V. | Blisterband-Inspektionsvorrichtung |
| CN106002826B (zh) * | 2016-07-11 | 2018-04-10 | 京东方科技集团股份有限公司 | 灯条组装装置以及利用其进行灯条组装的方法 |
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| US9734376B2 (en) | 2007-11-13 | 2017-08-15 | Cognex Corporation | System and method for reading patterns using multiple image frames |
| US8204281B2 (en) * | 2007-12-14 | 2012-06-19 | Validity Sensors, Inc. | System and method to remove artifacts from fingerprint sensor scans |
| US8238639B2 (en) * | 2008-04-09 | 2012-08-07 | Cognex Corporation | Method and system for dynamic feature detection |
| US8464950B2 (en) | 2008-12-22 | 2013-06-18 | Cognex Corporation | Fast vision system |
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2007
- 2007-06-15 US US11/763,752 patent/US8237099B2/en not_active Expired - Fee Related
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2008
- 2008-06-11 JP JP2010512170A patent/JP5642541B2/ja not_active Expired - Fee Related
- 2008-06-11 WO PCT/US2008/007280 patent/WO2008156608A2/en not_active Ceased
- 2008-06-11 EP EP08779633.0A patent/EP2158500B1/en active Active
- 2008-06-11 EP EP12181715.9A patent/EP2528041B1/en active Active
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2012
- 2012-07-26 US US13/558,828 patent/US8927917B2/en active Active
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2014
- 2014-06-25 JP JP2014129880A patent/JP6054917B2/ja active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2677946B2 (ja) | 1992-11-04 | 1997-11-17 | 豊国工業株式会社 | 穀物用貯溜槽の攪拌装置 |
| JP2014222235A (ja) * | 2007-06-15 | 2014-11-27 | コグネックス・コーポレイション | 物体の光電子工学的検知、及び位置特定のための方法、及びシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008156608A2 (en) | 2008-12-24 |
| EP2528041A1 (en) | 2012-11-28 |
| US8237099B2 (en) | 2012-08-07 |
| JP2010530070A (ja) | 2010-09-02 |
| JP2014222235A (ja) | 2014-11-27 |
| US8927917B2 (en) | 2015-01-06 |
| EP2158500B1 (en) | 2014-04-30 |
| EP2528041B1 (en) | 2014-05-14 |
| JP6054917B2 (ja) | 2016-12-27 |
| EP2158500A2 (en) | 2010-03-03 |
| US20080309920A1 (en) | 2008-12-18 |
| WO2008156608A3 (en) | 2009-02-19 |
| US20130039536A1 (en) | 2013-02-14 |
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