JP5551602B2 - マスター型複製方法 - Google Patents
マスター型複製方法 Download PDFInfo
- Publication number
- JP5551602B2 JP5551602B2 JP2010532264A JP2010532264A JP5551602B2 JP 5551602 B2 JP5551602 B2 JP 5551602B2 JP 2010532264 A JP2010532264 A JP 2010532264A JP 2010532264 A JP2010532264 A JP 2010532264A JP 5551602 B2 JP5551602 B2 JP 5551602B2
- Authority
- JP
- Japan
- Prior art keywords
- mold
- metal layer
- silicone
- daughter
- ductile metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 72
- 230000010076 replication Effects 0.000 title description 19
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 135
- 229920001296 polysiloxane Polymers 0.000 claims description 125
- 229910052751 metal Inorganic materials 0.000 claims description 94
- 239000002184 metal Substances 0.000 claims description 94
- 229910052759 nickel Inorganic materials 0.000 claims description 63
- 238000000151 deposition Methods 0.000 claims description 36
- 239000000758 substrate Substances 0.000 claims description 30
- 229910052709 silver Inorganic materials 0.000 claims description 22
- 239000004332 silver Substances 0.000 claims description 22
- 238000009713 electroplating Methods 0.000 claims description 11
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 2
- 229910052738 indium Inorganic materials 0.000 claims description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 2
- 230000003746 surface roughness Effects 0.000 claims description 2
- 229910052718 tin Inorganic materials 0.000 claims description 2
- 239000003054 catalyst Substances 0.000 description 34
- -1 polyethylene Polymers 0.000 description 33
- 230000008021 deposition Effects 0.000 description 26
- 239000000463 material Substances 0.000 description 25
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 24
- 239000000203 mixture Substances 0.000 description 22
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 21
- 238000001723 curing Methods 0.000 description 19
- 238000006243 chemical reaction Methods 0.000 description 18
- 150000001875 compounds Chemical class 0.000 description 18
- 230000008569 process Effects 0.000 description 17
- 239000010408 film Substances 0.000 description 15
- 238000006459 hydrosilylation reaction Methods 0.000 description 15
- 229920000642 polymer Polymers 0.000 description 15
- 229920002050 silicone resin Polymers 0.000 description 15
- 238000004544 sputter deposition Methods 0.000 description 14
- 229910052697 platinum Inorganic materials 0.000 description 13
- 230000005855 radiation Effects 0.000 description 12
- 229920005989 resin Polymers 0.000 description 11
- 239000011347 resin Substances 0.000 description 11
- 125000002091 cationic group Chemical group 0.000 description 10
- 239000011248 coating agent Substances 0.000 description 10
- 238000000576 coating method Methods 0.000 description 10
- 239000007789 gas Substances 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 10
- 239000004593 Epoxy Substances 0.000 description 9
- 239000002253 acid Substances 0.000 description 9
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 9
- 239000000243 solution Substances 0.000 description 9
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 9
- 239000004205 dimethyl polysiloxane Substances 0.000 description 8
- 229920001486 SU-8 photoresist Polymers 0.000 description 7
- 238000007259 addition reaction Methods 0.000 description 7
- 238000004049 embossing Methods 0.000 description 7
- 238000005240 physical vapour deposition Methods 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 6
- 238000009833 condensation Methods 0.000 description 6
- 230000005494 condensation Effects 0.000 description 6
- 238000010894 electron beam technology Methods 0.000 description 6
- 238000001704 evaporation Methods 0.000 description 6
- 230000008020 evaporation Effects 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 239000001257 hydrogen Substances 0.000 description 6
- 229910052739 hydrogen Inorganic materials 0.000 description 6
- 239000000178 monomer Substances 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 150000003839 salts Chemical group 0.000 description 6
- 229920001169 thermoplastic Polymers 0.000 description 6
- 229920002554 vinyl polymer Polymers 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 125000001931 aliphatic group Chemical group 0.000 description 5
- 125000003342 alkenyl group Chemical group 0.000 description 5
- 150000001450 anions Chemical class 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- 238000000465 moulding Methods 0.000 description 5
- 238000000206 photolithography Methods 0.000 description 5
- 150000003057 platinum Chemical class 0.000 description 5
- 125000005372 silanol group Chemical group 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 4
- 241001422033 Thestylus Species 0.000 description 4
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 4
- 239000002390 adhesive tape Substances 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 125000000524 functional group Chemical group 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- 239000002991 molded plastic Substances 0.000 description 4
- 239000002105 nanoparticle Substances 0.000 description 4
- KERTUBUCQCSNJU-UHFFFAOYSA-L nickel(2+);disulfamate Chemical compound [Ni+2].NS([O-])(=O)=O.NS([O-])(=O)=O KERTUBUCQCSNJU-UHFFFAOYSA-L 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 239000004416 thermosoftening plastic Substances 0.000 description 4
- 238000007740 vapor deposition Methods 0.000 description 4
- 229910001369 Brass Inorganic materials 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 230000002411 adverse Effects 0.000 description 3
- 125000000217 alkyl group Chemical group 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 230000001588 bifunctional effect Effects 0.000 description 3
- 239000010951 brass Substances 0.000 description 3
- 239000011951 cationic catalyst Substances 0.000 description 3
- 239000003431 cross linking reagent Substances 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 238000000313 electron-beam-induced deposition Methods 0.000 description 3
- 125000003700 epoxy group Chemical group 0.000 description 3
- 229910052736 halogen Inorganic materials 0.000 description 3
- 150000004678 hydrides Chemical class 0.000 description 3
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 238000001459 lithography Methods 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 239000002086 nanomaterial Substances 0.000 description 3
- 239000004038 photonic crystal Substances 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 229920003023 plastic Polymers 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 150000003058 platinum compounds Chemical class 0.000 description 3
- 239000004417 polycarbonate Substances 0.000 description 3
- 229920000515 polycarbonate Polymers 0.000 description 3
- 229920000573 polyethylene Polymers 0.000 description 3
- 229920000098 polyolefin Polymers 0.000 description 3
- 229920001155 polypropylene Polymers 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 150000003254 radicals Chemical class 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 239000011342 resin composition Substances 0.000 description 3
- SCPYDCQAZCOKTP-UHFFFAOYSA-N silanol Chemical compound [SiH3]O SCPYDCQAZCOKTP-UHFFFAOYSA-N 0.000 description 3
- 229920005573 silicon-containing polymer Polymers 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 229920005992 thermoplastic resin Polymers 0.000 description 3
- 239000012745 toughening agent Substances 0.000 description 3
- 239000011800 void material Substances 0.000 description 3
- 239000007848 Bronsted acid Substances 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical class S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 229910000990 Ni alloy Inorganic materials 0.000 description 2
- VEQPNABPJHWNSG-UHFFFAOYSA-N Nickel(2+) Chemical compound [Ni+2] VEQPNABPJHWNSG-UHFFFAOYSA-N 0.000 description 2
- 229910001096 P alloy Inorganic materials 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 229910018286 SbF 6 Inorganic materials 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 238000001015 X-ray lithography Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- 125000002723 alicyclic group Chemical group 0.000 description 2
- 229940045985 antineoplastic platinum compound Drugs 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 2
- 229920005601 base polymer Polymers 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 239000003060 catalysis inhibitor Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000012949 free radical photoinitiator Substances 0.000 description 2
- 150000002367 halogens Chemical group 0.000 description 2
- XMBWDFGMSWQBCA-UHFFFAOYSA-N hydrogen iodide Chemical compound I XMBWDFGMSWQBCA-UHFFFAOYSA-N 0.000 description 2
- 238000000608 laser ablation Methods 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 238000001127 nanoimprint lithography Methods 0.000 description 2
- 229910001453 nickel ion Inorganic materials 0.000 description 2
- 230000006911 nucleation Effects 0.000 description 2
- 238000010899 nucleation Methods 0.000 description 2
- 239000012788 optical film Substances 0.000 description 2
- 125000002524 organometallic group Chemical group 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 239000004926 polymethyl methacrylate Substances 0.000 description 2
- 239000004800 polyvinyl chloride Substances 0.000 description 2
- 229920000915 polyvinyl chloride Polymers 0.000 description 2
- 239000002243 precursor Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 229910052703 rhodium Inorganic materials 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- 150000004756 silanes Chemical class 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 239000012815 thermoplastic material Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- NHZSXFSNMONTQL-UHFFFAOYSA-N 1,3-dioxolane;oxetane Chemical group C1COC1.C1COCO1 NHZSXFSNMONTQL-UHFFFAOYSA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- GNFTZDOKVXKIBK-UHFFFAOYSA-N 3-(2-methoxyethoxy)benzohydrazide Chemical compound COCCOC1=CC=CC(C(=O)NN)=C1 GNFTZDOKVXKIBK-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 1
- 229910017008 AsF 6 Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- BCSYXDNNYLPNJO-UHFFFAOYSA-M C[Pt](C)(C)I Chemical compound C[Pt](C)(C)I BCSYXDNNYLPNJO-UHFFFAOYSA-M 0.000 description 1
- 229920008347 Cellulose acetate propionate Polymers 0.000 description 1
- 239000004970 Chain extender Substances 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 239000004971 Cross linker Substances 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229920002430 Fibre-reinforced plastic Polymers 0.000 description 1
- 239000002841 Lewis acid Substances 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004695 Polyether sulfone Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 239000004651 Radiation Curable Silicone Substances 0.000 description 1
- 229910018287 SbF 5 Inorganic materials 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000003377 acid catalyst Substances 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 150000008360 acrylonitriles Chemical class 0.000 description 1
- 238000013006 addition curing Methods 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 150000001336 alkenes Chemical class 0.000 description 1
- 125000003545 alkoxy group Chemical group 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 125000004103 aminoalkyl group Chemical group 0.000 description 1
- 150000003863 ammonium salts Chemical class 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-N carbonic acid Chemical compound OC(O)=O BVKZGUZCCUSVTD-UHFFFAOYSA-N 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 238000012663 cationic photopolymerization Methods 0.000 description 1
- 229920006217 cellulose acetate butyrate Polymers 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013005 condensation curing Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 150000004696 coordination complex Chemical class 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- IQDPCTBVSOQTNS-UHFFFAOYSA-N cyclobutane platinum Chemical compound C1CCC1.[Pt] IQDPCTBVSOQTNS-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000006735 epoxidation reaction Methods 0.000 description 1
- 125000001033 ether group Chemical group 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011151 fibre-reinforced plastic Substances 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 125000002485 formyl group Chemical class [H]C(*)=O 0.000 description 1
- 239000011953 free-radical catalyst Substances 0.000 description 1
- 229920001002 functional polymer Polymers 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 125000001183 hydrocarbyl group Chemical group 0.000 description 1
- 125000002768 hydroxyalkyl group Chemical group 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 238000000025 interference lithography Methods 0.000 description 1
- MGFYSGNNHQQTJW-UHFFFAOYSA-N iodonium Chemical compound [IH2+] MGFYSGNNHQQTJW-UHFFFAOYSA-N 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- IAPHXJRHXBQDQJ-WKMWQDDRSA-N jacobine Chemical compound C[C@@H]1O[C@]11C(=O)O[C@@H]([C@@H]23)CCN3CC=C2COC(=O)[C@](C)(O)[C@H](C)C1 IAPHXJRHXBQDQJ-WKMWQDDRSA-N 0.000 description 1
- IAPHXJRHXBQDQJ-ODLOZXJASA-N jacobine Natural products O=C1[C@@]2([C@H](C)O2)C[C@H](C)[C@](O)(C)C(=O)OCC=2[C@H]3N(CC=2)CC[C@H]3O1 IAPHXJRHXBQDQJ-ODLOZXJASA-N 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 150000002605 large molecules Chemical class 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 150000007517 lewis acids Chemical class 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 229920002521 macromolecule Polymers 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 150000002736 metal compounds Chemical class 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M methacrylate group Chemical group C(C(=C)C)(=O)[O-] CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 238000013008 moisture curing Methods 0.000 description 1
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 1
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 150000003961 organosilicon compounds Chemical class 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- ACVYVLVWPXVTIT-UHFFFAOYSA-M phosphinate Chemical compound [O-][PH2]=O ACVYVLVWPXVTIT-UHFFFAOYSA-M 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- AQSJGOWTSHOLKH-UHFFFAOYSA-N phosphite(3-) Chemical class [O-]P([O-])[O-] AQSJGOWTSHOLKH-UHFFFAOYSA-N 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- HRGDZIGMBDGFTC-UHFFFAOYSA-N platinum(2+) Chemical class [Pt+2] HRGDZIGMBDGFTC-UHFFFAOYSA-N 0.000 description 1
- 229920003050 poly-cycloolefin Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 229920002981 polyvinylidene fluoride Polymers 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 125000004368 propenyl group Chemical group C(=CC)* 0.000 description 1
- 239000003223 protective agent Substances 0.000 description 1
- 150000003222 pyridines Chemical class 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 238000003847 radiation curing Methods 0.000 description 1
- 238000010526 radical polymerization reaction Methods 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 230000003362 replicative effect Effects 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- FZHAPNGMFPVSLP-UHFFFAOYSA-N silanamine Chemical compound [SiH3]N FZHAPNGMFPVSLP-UHFFFAOYSA-N 0.000 description 1
- 229910052990 silicon hydride Inorganic materials 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 150000003384 small molecules Chemical class 0.000 description 1
- 239000007779 soft material Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000001494 step-and-flash imprint lithography Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 150000003460 sulfonic acids Chemical class 0.000 description 1
- 125000000472 sulfonyl group Chemical group *S(*)(=O)=O 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 230000008542 thermal sensitivity Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- MNTALGTVSQTALQ-UHFFFAOYSA-N trihydroxy(trimethylsilyloxy)silane Chemical compound C[Si](C)(C)O[Si](O)(O)O MNTALGTVSQTALQ-UHFFFAOYSA-N 0.000 description 1
- PZJJKWKADRNWSW-UHFFFAOYSA-N trimethoxysilicon Chemical group CO[Si](OC)OC PZJJKWKADRNWSW-UHFFFAOYSA-N 0.000 description 1
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 238000013022 venting Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
Description
a)その表面上に雄パターンを有するマスター型を提供するステップと、
b)雄パターンを有するマスター型を硬化性シリコーンに接触させ硬化させるステップと、
c)その表面上に雌パターンを有する硬化したシリコーン型(第1世代娘型)を取り外すステップと、
d)雌パターン化表面上に、先ず延性金属層を堆積させるステップと、
e)次いで雌パターン化表面上に金属ニッケル層を堆積させるステップと、
f)所望によりステップeの物品を基材に固定するステップと、
g)雌パターン化表面を有する電気めっきニッケル層を、パターン化表面がその表面上に延性金属層を有した状態で分離することにより、サブマスターを作製するステップとを含む。
a)その表面上に雄パターンを有するマスター型を提供するステップと、
b)マスター型を硬化性シリコーンに接触させ硬化させるステップと、
c)その表面上に雌パターンを有する硬化したシリコーン型(第1世代娘型)を取り外すステップと、
d)その表面上に雌パターンを有する硬化したシリコーン型を硬化性シリコーン及び離型剤に接触させるステップと、
e)その表面上に雄パターンを有する硬化した第2世代シリコーン型(第2世代娘型)を取り外すステップと、
f)雄パターン化表面上に、先ず延性金属層を堆積させるステップと、
g)次いで雄パターン化表面上に金属ニッケル層を堆積させるステップと、
h)所望によりステップgの物品を基材に固定するステップと、
i)雄パターン化表面を有する電気めっきニッケル層を、パターン化表面がその表面上に延性金属層を有した状態で分離することにより、サブマスターを作製するステップとを含む。
H2PO2−+H−−−−−−OH−+H2O+P(ニッケルとの合金)
ニッケル層を堆積させた後、同層はシリコーン娘型から分離され、パターン化表面と、このパターン化表面上の延性金属層とを有するサブマスター型が作製される。(シリコーン娘型上に堆積した)延性金属層は、堆積したニッケル層に選択的に付着し、同ニッケル層とともに移動することが観察されている。元のマスター型に対する忠実度を維持するために、ニッケル表面から延性金属層をエッチングしないことが好ましい。このようなエッチングは以後に複製されるいずれのパターン要素の寸法及び形状にも悪影響を及ぼすことが観察されている。
a)マスター型の製作のためのプロセス
反射光によるパターンの分解を避けるために、反射防止コーティング(ARC UV−112、ブリュワー・サイエンス(Brewer Science)(ミズーリ州、ロラ(Rolla))から入手可能)を、フォトレジスト適用前に、Siウェハー(モンコ・シリコーン・テクノロジーズ(Montco Silicon Technologies, Inc.)(ペンシルバニア州スプリングシティ(Spring City)から入手可能)の表面に適用した。15μm厚さの、SU−8フォトレジストの層(マイクロケム社(MicroChem Corp.)、マサチューセッツ州ニュートン(Newton)から入手可能)を、ARCコーティングされたSiウェハー上に、スピンコーティングし、続いて65℃の温度で2分間、次いで95℃で2分間焼成することにより、コーティングした。
ポリ(ジメチルシロキサン)(PDMS)及びその硬化剤(ダウコーニング(Dow Corning)社、ミシガン州ミッドランド(Midland)からSYLGARD 184シリコーンエラストマーキットとして入手可能)を、10:1の重量比で十分混合した。混合物中に捕捉された気泡を、低真空で30分間脱気することにより取り除いた。脱気した混合物をパターン化SU−8(a部より)上に注ぎ、更に30分間脱気し、次いで80℃のホットプレート上で1時間硬化させた。硬化後、シリコーン雌型をSU−8マスター型から剥離し、(マスター型に対して)雌のパターン要素を有する、所望のシリコーン第1世代娘型を得た。
第1世代雌型のパターン化表面に、電子ビーム蒸着(マーク(Mark)50、CHAインダストリーズ(CHA Industries)社、郵便番号CA94538フリーモント市ビジネスセンター通り4201番地(4201 Business Center Drive, Fremont, CA94538)から入手可能)により、厚さ75nmの銀層(延性金属層)を供給した。次いで、ステンレススチールの支持ディスクを娘型の非パターン化表面に、両面粘着テープによって貼り付けた。娘型の、銀被覆したパターン化表面上に、ニッケル層を堆積させた。温度54℃(130°F)及び電流密度20アンペア/平方フィート(ASF)で、スルファミン酸ニッケル浴を用いた。ニッケル堆積厚さは約0.50mm(20ミル)である。電解析出の完了後、銀層を有するニッケルサブマスターを、シリコーン娘型から分離した。
銀に代えて、10ナノメートルのニッケル層を、基本的に実施例1の要領によりシリコーン娘型に供給した。図3に、気相堆積したニッケル層の大規模な亀裂が示されている。
PDMS型上の亀裂のない銀層
基本的に実施例1の要領により、100ナノメートルの延性銀層を、結合層は用いずにシリコーン娘型上に、電子ビーム蒸着(マーク(Mark)50、CHAインダストリーズ(CHA Industries)社、カリフォルニア州フリーモント市ビジネスセンター通り4201番地(4201 Business Center Drive, Fremont, CA)から入手可能)によって堆積させた。ニッケルフィルムとは対照的に、銀フィルムには亀裂が全く観察されなかった。図5は堆積した銀層の、亀裂のない滑らかな表面を示している。
Claims (14)
- a)パターン化シリコーン娘型を提供するステップと、
b)前記娘型のパターン化表面上に先ず金、銀、錫又はインジウムから選ばれる延性金属層を10〜100ナノメートルの厚さに堆積させるステップと、
c)続いて延性金属層の表面上にニッケル金属層を0.2〜5ミリメートルの厚さに堆積させるステップと、
e)ニッケル金属層をその表面上に延性金属層を有した状態で前記娘型から分離することにより、パターン化表面を有するサブマスター型を作製するステップと
を含む成形型複製方法。 - ステップc)とステップe)の間に、ステップc)で得られる延性金属層とニッケル金属層をそのパターン化表面上に有する前記娘型を基材に固定するステップd)をさらに有する、請求項1に記載の方法。
- 延性金属層が、10ナノメートルより小さい2乗平均平方根表面粗さを有する、請求項1または2に記載の方法。
- 延性金属が少なくとも50%の破断点伸びを有する、請求項1または2に記載の方法。
- 延性金属が25キログラム重毎平方ミリメートル(kgf/mm2)以下のビッカース硬さを有する、請求項4に記載の方法。
- 前記サブマスター表面の個々のパターン要素が、横断面において独立した高さ及び幅寸法が100ナノメートル〜15,000マイクロメートルの寸法を有し、10ナノメートル〜15,000マイクロメートルのある要素から次の要素までのピーク間の距離である反復距離を有する、請求項1または2に記載の方法。
- 前記パターン化シリコーン娘型が、マスター型から調製された第1世代娘型である、請求項1または2に記載の方法。
- 前記サブマスター型が、
i)その表面上に雄パターンを有するマスター型を提供するステップと、
ii)マスター型を硬化性シリコーンと接触させ硬化させるステップと、
iii)その表面上に雌パターンを有する硬化シリコーン型を、マスター型から、取り外すステップと、
iv)硬化シリコーン型の雌パターン化表面上に、先ず延性金属層を堆積させるステップと、
v)続いて延性金属層の表面上にニッケル金属層を電気めっきするステップと、
vii)ニッケル金属層をその表面上に延性金属層を有した状態で雌パターン化表面を有する硬化シリコーン型から分離して、雄パターン化表面を有するサブマスター型を作製するステップと
によって調製される、請求項1または2に記載の方法。 - ステップv)とステップvii)の間に、ステップv)で得られる延性金属層とニッケル金属層を雌パターン化表面上に有する硬化シリコーン型を基材に固定するステップvi)をさらに有する、請求項8に記載の方法。
- パターン化シリコーン娘型が第1世代シリコーン娘型から調製された第2世代娘型であって、第1世代シリコーン娘型がマスター型から調製されたものである、請求項1または2に記載の方法。
- 前記サブマスター型が、
A)その表面上に雄パターンを有するマスター型を提供するステップと、
B)マスター型に硬化性シリコーンを接触させ硬化させるステップと、
C)その表面上に雌パターンを有する硬化シリコーン型を、マスター型から、取り外すステップと、
D)その表面上に雌パターンを有する硬化シリコーン型に硬化性シリコーンを接触させるステップと、
E)ステップD)で得られるその表面上に雄パターンを有する硬化シリコーン型を、ステップC)の雌パターンを有する硬化シリコーン型から、取り外すステップと、
F)ステップE)で得られる硬化シリコーン型の雄パターン化表面上に、先ず延性金属層を堆積させるステップと、
G)次いで延性金属層の表面上にニッケル金属層を堆積させるステップと、
I)ニッケル金属層をその表面上に延性金属層を有した状態で雄パターン化表面を有する硬化シリコーン型から分離して、雌パターン化表面を有するサブマスター型を作製するステップと
によって調製される、請求項1または2に記載の方法。 - ステップG)とステップI)の間に、ステップG)で得られる延性金属層とニッケル金属層を雄パターン化表面上に有する硬化シリコーン型を基材に固定するステップH)をさらに有する、請求項11に記載の方法。
- a)請求項1に記載のサブマスター型を提供するステップと、
b)サブマスター型に硬化性シリコーンを接触させ硬化させるステップと、
c)その表面上にパターンを有する硬化シリコーン型を取り外して、第2世代の娘型を作製するステップと、
を含む複製方法。 - ステップc)の後で、ステップb)〜c)を繰り返すステップd)を有する、請求項13に記載の複製方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US98461607P | 2007-11-01 | 2007-11-01 | |
US60/984,616 | 2007-11-01 | ||
PCT/US2008/081928 WO2009059089A1 (en) | 2007-11-01 | 2008-10-31 | Method for replicating master molds |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2011502817A JP2011502817A (ja) | 2011-01-27 |
JP2011502817A5 JP2011502817A5 (ja) | 2011-10-06 |
JP5551602B2 true JP5551602B2 (ja) | 2014-07-16 |
Family
ID=40239632
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010532264A Expired - Fee Related JP5551602B2 (ja) | 2007-11-01 | 2008-10-31 | マスター型複製方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20110104321A1 (ja) |
EP (1) | EP2212745A1 (ja) |
JP (1) | JP5551602B2 (ja) |
CN (1) | CN101910942B (ja) |
WO (1) | WO2009059089A1 (ja) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5405574B2 (ja) * | 2008-08-05 | 2014-02-05 | スモルテック アーベー | テンプレート、およびリソグラフィ用高アスペクト比テンプレートを製造する方法、ならびにナノスケールで基板を穿孔するためのテンプレートの使用 |
US20110120626A1 (en) * | 2009-11-20 | 2011-05-26 | Chung-Ping Lai | Method of producing ultra fine surfacing bulk substrate |
KR101423861B1 (ko) * | 2010-06-23 | 2014-07-25 | 닛뽕소다 가부시키가이샤 | 임프린트용 레플리카 몰드의 제조 방법 |
CN103003054B (zh) * | 2010-07-12 | 2014-11-19 | 旭硝子株式会社 | 压印模具用含TiO2石英玻璃基材及其制造方法 |
US8816211B2 (en) * | 2011-02-14 | 2014-08-26 | Eastman Kodak Company | Articles with photocurable and photocured compositions |
CN102193126B (zh) * | 2011-05-26 | 2012-08-29 | 中国科学院上海光学精密机械研究所 | 宽带低电场增强反射金属介电光栅 |
CN105093824B (zh) * | 2015-08-31 | 2019-05-07 | 西安交通大学 | 一种气电协同的大面积纳米压印光刻方法 |
US10688692B2 (en) * | 2015-11-22 | 2020-06-23 | Orbotech Ltd. | Control of surface properties of printed three-dimensional structures |
CN110997266B (zh) * | 2017-06-29 | 2022-04-26 | 埃肯有机硅法国简易股份公司 | 有机硅弹性体制模具的制造方法 |
WO2019040192A1 (en) * | 2017-08-24 | 2019-02-28 | Dow Global Technologies Llc | METHOD FOR MANUFACTURING OPTICAL WAVEGUIDE |
WO2019084770A1 (zh) * | 2017-10-31 | 2019-05-09 | 香港科技大学 | 具有表面微纳结构的金属薄膜模具的制备方法和金属薄膜模具中间体 |
EP3670440A1 (fr) | 2018-12-21 | 2020-06-24 | Rolex Sa | Procédé de fabrication d'un composant horloger |
EP3670441A1 (fr) * | 2018-12-21 | 2020-06-24 | Rolex Sa | Procédé de fabrication d'un composant horloger |
CN112776495B (zh) * | 2020-12-16 | 2022-03-18 | 维达力实业(赤壁)有限公司 | Uv转印模具的修复方法及uv转印模具 |
Family Cites Families (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2843555A (en) * | 1956-10-01 | 1958-07-15 | Gen Electric | Room temperature curing organopolysiloxane |
GB923710A (en) * | 1960-11-07 | 1963-04-18 | Ici Ltd | Production of organosilicon compounds |
US3220972A (en) * | 1962-07-02 | 1965-11-30 | Gen Electric | Organosilicon process using a chloroplatinic acid reaction product as the catalyst |
US3159662A (en) * | 1962-07-02 | 1964-12-01 | Gen Electric | Addition reaction |
US3410886A (en) * | 1965-10-23 | 1968-11-12 | Union Carbide Corp | Si-h to c=c or c=c addition in the presence of a nitrile-platinum (ii) halide complex |
US3313773A (en) * | 1965-12-03 | 1967-04-11 | Gen Electric | Platinum addition catalyst system |
AT278040B (de) * | 1966-12-16 | 1970-01-26 | Degussa | Verfahren zur Herstellung von Organosiliziumverbindungen |
DE1259888B (de) * | 1967-05-27 | 1968-02-01 | Bayer Ag | Verfahren zur Herstellung von Organosiliciumverbindungen |
US3814730A (en) * | 1970-08-06 | 1974-06-04 | Gen Electric | Platinum complexes of unsaturated siloxanes and platinum containing organopolysiloxanes |
US3715334A (en) * | 1970-11-27 | 1973-02-06 | Gen Electric | Platinum-vinylsiloxanes |
US3775452A (en) * | 1971-04-28 | 1973-11-27 | Gen Electric | Platinum complexes of unsaturated siloxanes and platinum containing organopolysiloxanes |
NL7207442A (ja) * | 1971-06-25 | 1972-12-28 | ||
DE2846621A1 (de) * | 1978-10-26 | 1980-05-08 | Wacker Chemie Gmbh | Verfahren zum anlagern von si-gebundenem wasserstoff an aliphatische mehrfachbindung |
US4288345A (en) * | 1980-02-06 | 1981-09-08 | General Electric Company | Platinum complex |
US4313988A (en) * | 1980-02-25 | 1982-02-02 | Minnesota Mining And Manufacturing Company | Epoxypolysiloxane release coatings for adhesive materials |
US5089536A (en) * | 1982-11-22 | 1992-02-18 | Minnesota Mining And Manufacturing Company | Energy polmerizable compositions containing organometallic initiators |
US4510094A (en) * | 1983-12-06 | 1985-04-09 | Minnesota Mining And Manufacturing Company | Platinum complex |
US4712092A (en) * | 1983-12-20 | 1987-12-08 | Aaron J. Gellman | Parallel encoded piezoelectric keyboard switch and array |
US4603215A (en) * | 1984-08-20 | 1986-07-29 | Dow Corning Corporation | Platinum (O) alkyne complexes |
FR2571732B1 (fr) * | 1984-10-15 | 1987-01-09 | Rhone Poulenc Spec Chim | Composition organopolysiloxanique de revetement utilisable notamment pour le traitement antiadherent et son procede d'application |
FR2575086B1 (fr) * | 1984-12-20 | 1987-02-20 | Rhone Poulenc Spec Chim | Complexe platine-alcenylcyclohexene comme catalyseur de reaction d'hydrosilylation et son procede de preparation |
US4705765A (en) * | 1985-12-19 | 1987-11-10 | General Electric Company | Hydrosilylation catalyst, method for making and use |
US4670531A (en) * | 1986-01-21 | 1987-06-02 | General Electric Company | Inhibited precious metal catalyzed organopolysiloxane compositions |
JPS62177187A (ja) * | 1986-01-30 | 1987-08-04 | Sumitomo Suriim Kk | 金属画像の形成方法 |
JP2595654B2 (ja) * | 1988-05-23 | 1997-04-02 | ソニー株式会社 | ディスクカートリッジ用シャッタ及びその製造方法 |
US4916169A (en) * | 1988-09-09 | 1990-04-10 | Minnesota Mining And Manufacturing Company | Visible radiation activated hydrosilation reaction |
US5091483A (en) * | 1989-09-22 | 1992-02-25 | Minnesota Mining And Manufacturing Company | Radiation-curable silicone elastomers and pressure sensitive adhesives |
US6376569B1 (en) * | 1990-12-13 | 2002-04-23 | 3M Innovative Properties Company | Hydrosilation reaction utilizing a (cyclopentadiene)(sigma-aliphatic) platinum complex and a free radical photoinitiator |
US5286815A (en) * | 1992-02-07 | 1994-02-15 | Minnesota Mining And Manufacturing Company | Moisture curable polysiloxane release coating compositions |
US5332797A (en) * | 1992-04-01 | 1994-07-26 | Minnesota Mining And Manufacturing Company | Silicone release compositions |
JP3976350B2 (ja) * | 1997-03-14 | 2007-09-19 | スリーエム カンパニー | 反応性シラン官能性を有する要求に応じて硬化する、湿分硬化性組成物 |
US5932150A (en) * | 1997-08-25 | 1999-08-03 | Holo-Source Corporation | Replication of diffraction images in oriented films |
US6788463B2 (en) * | 1998-01-13 | 2004-09-07 | 3M Innovative Properties Company | Post-formable multilayer optical films and methods of forming |
US6207247B1 (en) * | 1998-03-27 | 2001-03-27 | Nikon Corporation | Method for manufacturing a molding tool used for sustrate molding |
JP2004136692A (ja) * | 1998-03-27 | 2004-05-13 | Nikon Corp | 金属製第3成形型を大量に製造する方法、樹脂基板を製造する方法及び樹脂基板 |
US6814897B2 (en) * | 1998-03-27 | 2004-11-09 | Discovision Associates | Method for manufacturing a molding tool used for substrate molding |
US6098247A (en) * | 1998-07-22 | 2000-08-08 | Santelli, Jr.; Albert | Plastic extrusion having unitary thermoplastic rubber and thermoplastic sections |
US20050154567A1 (en) * | 1999-06-18 | 2005-07-14 | President And Fellows Of Harvard College | Three-dimensional microstructures |
US6663820B2 (en) * | 2001-03-14 | 2003-12-16 | The Procter & Gamble Company | Method of manufacturing microneedle structures using soft lithography and photolithography |
US6692680B2 (en) * | 2001-10-03 | 2004-02-17 | Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College | Reproduction of micromold inserts |
TW590999B (en) * | 2002-08-28 | 2004-06-11 | Alliance Fiber Optic Prod Inc | Mold for producing array optical fiber substrate with V-shaped grooves and method for producing the same |
JP4322096B2 (ja) * | 2003-11-14 | 2009-08-26 | Tdk株式会社 | レジストパターン形成方法並びに磁気記録媒体及び磁気ヘッドの製造方法 |
JP4628715B2 (ja) * | 2004-07-13 | 2011-02-09 | 信越化学工業株式会社 | 硬化性オルガノポリシロキサン組成物および注型成形用母型 |
US7891636B2 (en) * | 2007-08-27 | 2011-02-22 | 3M Innovative Properties Company | Silicone mold and use thereof |
AU2009270415B2 (en) * | 2008-07-18 | 2015-09-17 | Nntt Tech Inc | Articles of manufacture releasing an active ingredient |
-
2008
- 2008-10-31 EP EP08843712A patent/EP2212745A1/en not_active Withdrawn
- 2008-10-31 JP JP2010532264A patent/JP5551602B2/ja not_active Expired - Fee Related
- 2008-10-31 US US12/673,549 patent/US20110104321A1/en not_active Abandoned
- 2008-10-31 WO PCT/US2008/081928 patent/WO2009059089A1/en active Application Filing
- 2008-10-31 CN CN2008801226192A patent/CN101910942B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
WO2009059089A1 (en) | 2009-05-07 |
CN101910942A (zh) | 2010-12-08 |
CN101910942B (zh) | 2013-11-20 |
EP2212745A1 (en) | 2010-08-04 |
JP2011502817A (ja) | 2011-01-27 |
US20110104321A1 (en) | 2011-05-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5551602B2 (ja) | マスター型複製方法 | |
JP5175351B2 (ja) | シリコーン成形型及びその使用 | |
Lan et al. | UV-nanoimprint lithography: structure, materials and fabrication of flexible molds | |
JP6367226B2 (ja) | パターン化された構造化転写テープ | |
JP2003534651A (ja) | テンプレートの製作に関する方法およびその方法で製作されるテンプレート | |
CN116256829A (zh) | 一种近眼显示器衍射光栅波导的制备方法 | |
EP2163367A1 (en) | Form, microprocessed article, and their manufacturing methods | |
JP5419040B2 (ja) | 転写構造体の製造方法及びそれに用いる母型 | |
JP2008522038A (ja) | パターン化トポグラフィおよび自己組織化モノレイヤーを用いる微細加工 | |
CN1309784A (zh) | 具有脱模剂的表面 | |
CN1693182A (zh) | 深亚微米三维滚压模具及其制作方法 | |
CN109634055A (zh) | 一种低表面能镍纳米压印模板的制备方法 | |
JP5818306B2 (ja) | 転写構造体の製造方法及びそれに用いる母型 | |
JP5578513B2 (ja) | 金属微細構造体の製造方法並びに樹脂成形物の製造方法 | |
EP1930776A1 (en) | Process for producing 3-dimensional mold, process for producing microfabrication product, process for producing micropattern molding, 3-dimensional mold, microfabrication product, micropattern molding and optical device | |
JP2007156384A (ja) | 3次元モールドの製造方法、微細加工物の製造方法、微細パターン成形品の製造方法、3次元モールド、微細加工物、微細パターン成形品及び光学部品。 | |
Fu et al. | A titanium-nickel composite mold with low surface energy for thermal nanoimprint lithography | |
US7344990B2 (en) | Method of manufacturing micro-structure element by utilizing molding glass | |
Yin et al. | Tunable metallization by assembly of metal nanoparticles in polymer thin films by photo-or electron beam lithography | |
Kang et al. | Nanoimprint replication of nonplanar nanostructure fabricated by focused-ion-beam chemical vapor deposition | |
Kreindl et al. | Soft UV-NIL at the 12.5 nm Scale | |
Khan et al. | Nano Embedded Metal-mesh Transparent Electrodes (Nano-EMTEs) Fabricated by LEIT and TEIT Strategies | |
Duarte | Fabrication of carbon micro molds | |
Kooy et al. | Patterning of multi-leveled microstructures on flexible polymer substrate using roll-to-roll ultraviolet nanoimprint lithography | |
Ionascu et al. | Manufacturing technology of the scales used in the incremental reading systems |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110818 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20110818 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20120829 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20121218 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130318 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20130521 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130920 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20131001 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140107 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140328 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20140422 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140522 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5551602 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |