JP5549939B2 - 酸化チタン粒子、その製造方法、磁気メモリ及び電荷蓄積型メモリ - Google Patents
酸化チタン粒子、その製造方法、磁気メモリ及び電荷蓄積型メモリ Download PDFInfo
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- 239000002245 particle Substances 0.000 title claims description 151
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 title claims description 91
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 title claims description 91
- 230000005291 magnetic effect Effects 0.000 title claims description 33
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 238000003860 storage Methods 0.000 title claims description 12
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 94
- 239000012071 phase Substances 0.000 claims description 90
- 239000010936 titanium Substances 0.000 claims description 72
- 239000000377 silicon dioxide Substances 0.000 claims description 46
- 239000013078 crystal Substances 0.000 claims description 45
- -1 silane compound Chemical class 0.000 claims description 39
- 239000000243 solution Substances 0.000 claims description 28
- 239000000693 micelle Substances 0.000 claims description 25
- 229910052751 metal Inorganic materials 0.000 claims description 24
- 239000002184 metal Substances 0.000 claims description 24
- 230000005298 paramagnetic effect Effects 0.000 claims description 24
- 239000011259 mixed solution Substances 0.000 claims description 22
- 239000008346 aqueous phase Substances 0.000 claims description 11
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 claims description 10
- 230000003472 neutralizing effect Effects 0.000 claims description 9
- 239000000696 magnetic material Substances 0.000 claims description 8
- 239000003795 chemical substances by application Substances 0.000 claims description 6
- 238000010304 firing Methods 0.000 claims description 6
- 229910000077 silane Inorganic materials 0.000 claims description 6
- 239000011232 storage material Substances 0.000 claims description 6
- 239000002105 nanoparticle Substances 0.000 claims description 5
- 239000002994 raw material Substances 0.000 claims description 5
- 238000002156 mixing Methods 0.000 claims description 4
- 239000000203 mixture Substances 0.000 claims description 4
- 238000002441 X-ray diffraction Methods 0.000 description 22
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 12
- 230000007704 transition Effects 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 9
- 230000000704 physical effect Effects 0.000 description 8
- 238000003917 TEM image Methods 0.000 description 7
- LZZYPRNAOMGNLH-UHFFFAOYSA-M Cetrimonium bromide Chemical compound [Br-].CCCCCCCCCCCCCCCC[N+](C)(C)C LZZYPRNAOMGNLH-UHFFFAOYSA-M 0.000 description 6
- 239000010419 fine particle Substances 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 5
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N ammonia Natural products N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- 239000004094 surface-active agent Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 4
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 230000001747 exhibiting effect Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000003980 solgel method Methods 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 229910010413 TiO 2 Inorganic materials 0.000 description 2
- 235000011114 ammonium hydroxide Nutrition 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 230000000638 stimulation Effects 0.000 description 2
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonium chloride Substances [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
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- 238000010586 diagram Methods 0.000 description 1
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- 230000005684 electric field Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 238000005805 hydroxylation reaction Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
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- 230000003647 oxidation Effects 0.000 description 1
- 230000005408 paramagnetism Effects 0.000 description 1
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- 238000005245 sintering Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 1
- 230000005676 thermoelectric effect Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
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Description
Hitoshi SATO,他,JORNAL OF THE PHYSICAL SOCIETY OF JAPAN Vol.75,No.5,May,2006,pp.053702/1-4
図1は、微粒子構造体1を透過型電子顕微鏡(TEM)にて撮像したTEM像である。この微粒子構造体1は、アモルファス構造のシリカガラス2の中に、粒子径が例えば約10〜35nm程度のナノサイズからなる酸化チタン粒子3が分散して合成されている。
次に、このような酸化チタン粒子3の製造方法について以下説明する。本発明による酸化チタン粒子3は、以下のように逆ミセル法及びゾルーゲル法を組み合わせて製造することができる。具体的には、先ず始めにオクタンと1−ブタノールとからなる油相を有する溶液に、界面活性剤(例えば臭化セチルトリメチルアンモニウム(CTAB(C16H33N(CH3)3Br)))を溶解すると共に、塩化チタンを添加して溶解する。
上述した製造方法によって作製された本発明による酸化チタン粒子3は、実験によって、次のような特性を有することが明らかになった。
結晶構造がλ−Ti3O5となる0〜300Kの温度領域において、酸化チタン粒子3のXRDの測定を行った。ここで、図6は、酸化チタン粒子3のXRDパターンの解析結果であり、横軸に回折角を示し、縦軸に回折X線強度を示している。図6に示すように、XRDパターンは、SiO2(シリカ)を示すピークが現れていることから、酸化チタン粒子3がシリカ5を有していることについて確認できた。また、酸化チタン粒子3は、XRDパターンにおいてピークの現れた箇所が、α−Ti3O5のXRDパターン(図示せず)とは異なることから、結晶構造がα−Ti3O5ではないことが確認できた。
15K、300K、350K及び650Kの各温度時における酸化チタン粒子3についてXRDの測定を行った。これにより、図9に示すようなXRDパターンの解析結果が得られた。15Kの温度時における酸化チタン粒子3のXRDパターンでは、300Kの温度時における酸化チタン粒子3のXRDパターンと同じようなピークが現れていることから、結晶相がλ相のままであることが確認できた。
次に温度を変化させたときの酸化チタン粒子3の磁気特性について調べた。具体的にはSQUID(Superconducting Quantum Interference Device)を用いた磁束計を用いて、酸化チタン粒子3の磁化率を測定した。これにより、図11に示すような結果が得られた。図11から、酸化チタン粒子3は、0〜800Kの全ての温度範囲でパウリ常磁性であり、常磁性金属の状態が保たれていることが分かった。
以上の構成において、本発明による製造方法では、逆ミセル法に従って、塩化チタンを含む水相6を油相中に有する原料ミセル溶液を作製すると共に、アンモニアを含んだ水相7を油相中に有する中和剤ミセル溶液を作製し、これら原料ミセル溶液と中和剤ミセル溶液とを混合することにより、Ti(OH)4からなる水酸化チタン化合物粒子10を生成する。
このような酸化チタン粒子3は、当該酸化チタン粒子3の有する光特性や電気伝導特性、磁性特性を基に、以下のような用途に利用することができる。本発明による酸化チタン粒子3は、図12に示すように、温度が約460Kよりも低い室温のとき、常磁性金属の特性を有するλ相の結晶構造を有しており、例えば光や圧力、電磁、磁場等による外部刺激を与えることで、非磁性半導体の特性を有するβ相に結晶構造を変化させ、磁気特性を可変させることができる。
ことができるという特性を有しており、このような特性を用いて光スイッチングや、磁気メモリ、電荷蓄積型メモリ等に利用することができる。
なお、本発明は、本実施形態に限定されるものではなく、要は0〜800Kの温度領域で常磁性金属の状態を維持するTi3O5粒子からなる酸化チタン粒子を作製できればよく、本発明の要旨の範囲内で種々の変形実施が可能である。例えば、上述した実施の形態においては、Ti3O5粒子4の表面をシリカ5により被覆した酸化チタン粒子3を適用した場合について述べたが、本発明はこれに限らず、シリカ5で表面が被覆されていないTi3O5粒子4のみからなる酸化チタン粒子を適用してもよい。
Claims (7)
- Ti3O5の組成を有し、0〜800Kの温度領域で常磁性金属の状態を維持するナノサイズのTi3O5粒子からなる
ことを特徴とする酸化チタン粒子。 - 前記Ti3O5粒子は、
少なくとも500K以上の温度領域で常磁性金属状態の斜方晶系の結晶構造となり、少なくとも300K以下の温度領域で常磁性金属状態の単斜晶系の結晶構造となる
ことを特徴とする請求項1記載の酸化チタン粒子。 - 前記Ti3O5粒子の表面がシリカで被覆されている
ことを特徴とする請求項1又は2記載の酸化チタン粒子。 - 塩化チタンを含む水相を油相中に有する原料ミセル溶液と、中和剤を含む水相を油相中に有する中和剤ミセル溶液とを混合して作製した混合溶液内に、シラン化合物を添加して、前記混合溶液内の水酸化チタン化合物粒子の表面をシリカで被覆させたシリカ被覆水酸化チタン化合物粒子を生成し、
前記シリカ被覆水酸化チタン化合物粒子を前記混合溶液から分離した後、還元雰囲気下で所定の温度で焼成することにより前記Ti3O5粒子を生成する
ことを特徴とする請求項3記載の酸化チタン粒子。 - 塩化チタンを含む水相を油相中に有する原料ミセル溶液と、中和剤を含む水相を油相中に有する中和剤ミセル溶液とを混合することにより混合溶液を作製して、該混合溶液内で水酸化チタン化合物粒子を生成する工程と、
前記混合溶液内にシラン化合物を添加して前記水酸化チタン化合物粒子の表面をシリカで被覆したシリカ被覆水酸化チタン化合物粒子を生成する工程と、
前記シリカ被覆水酸化チタン化合物粒子を前記混合溶液から分離した後、還元雰囲気下で所定の温度で焼成することにより、Ti3O5粒子の表面をシリカで被覆させた酸化チタン粒子を生成する工程と
を備えることを特徴とする酸化チタン粒子の製造方法。 - 支持体上に磁性材料を固定してなる磁性層を備え、
前記磁性材料に、請求項1〜4のうちいずれか1項記載の酸化チタン粒子が使用されている
ことを特徴とする磁気メモリ。 - 支持体上に電荷蓄積材料を固定してなる電荷蓄積層を備え、
前記電荷蓄積材料に、請求項1〜4のうちいずれか1項記載の酸化チタン粒子が使用されている
ことを特徴とする電荷蓄積型メモリ。
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US8535816B2 (en) * | 2008-12-25 | 2013-09-17 | The University Of Tokyo | Fine structural body, method for manufacturing fine structural body, magnetic memory, charge storage memory and optical information recording medium |
JP5736664B2 (ja) * | 2010-04-30 | 2015-06-17 | 国立大学法人 東京大学 | 酸化チタン粒子、その製造方法、磁気メモリ、光情報記録媒体及び電荷蓄積型メモリ |
JP6080026B2 (ja) * | 2013-10-04 | 2017-02-15 | 国立大学法人 東京大学 | 蓄放熱材および蓄放熱システム |
US20190161359A1 (en) * | 2016-03-22 | 2019-05-30 | The University Of Tokyo | Metal-substituted titanium oxide, and method for producing metal-substituted titanium oxide sintered body |
CN109704753A (zh) * | 2019-01-18 | 2019-05-03 | 江苏师范大学 | 一种β相五氧化三钛晶体片的制备方法 |
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