JP5524845B2 - 静電クランプ、リソグラフィ装置および静電クランプを製造する方法 - Google Patents
静電クランプ、リソグラフィ装置および静電クランプを製造する方法 Download PDFInfo
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- JP5524845B2 JP5524845B2 JP2010525264A JP2010525264A JP5524845B2 JP 5524845 B2 JP5524845 B2 JP 5524845B2 JP 2010525264 A JP2010525264 A JP 2010525264A JP 2010525264 A JP2010525264 A JP 2010525264A JP 5524845 B2 JP5524845 B2 JP 5524845B2
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- 238000000034 method Methods 0.000 claims description 6
- 239000010453 quartz Substances 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 6
- 229920000106 Liquid crystal polymer Polymers 0.000 claims description 3
- 239000004977 Liquid-crystal polymers (LCPs) Substances 0.000 claims description 3
- 150000004767 nitrides Chemical class 0.000 claims 1
- 229910052755 nonmetal Inorganic materials 0.000 claims 1
- 239000004033 plastic Substances 0.000 claims 1
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- 230000006641 stabilisation Effects 0.000 description 9
- 238000011105 stabilization Methods 0.000 description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 6
- 229910010271 silicon carbide Inorganic materials 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 239000007788 liquid Substances 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 230000002093 peripheral effect Effects 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 238000007654 immersion Methods 0.000 description 4
- 238000001459 lithography Methods 0.000 description 4
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
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- 238000007796 conventional method Methods 0.000 description 2
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- 239000011521 glass Substances 0.000 description 2
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- 239000011159 matrix material Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 238000012876 topography Methods 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
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- 230000005381 magnetic domain Effects 0.000 description 1
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- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 229920000052 poly(p-xylylene) Polymers 0.000 description 1
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- 229920000647 polyepoxide Polymers 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/707—Chucks, e.g. chucking or un-chucking operations or structural details
- G03F7/70708—Chucks, e.g. chucking or un-chucking operations or structural details being electrostatic; Electrostatically deformable vacuum chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/6875—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N13/00—Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Jigs For Machine Tools (AREA)
Description
1.ステップモードでは、マスクテーブルMTおよび基板テーブルWTを基本的に静止状態に保ちつつ、放射ビームに付けられたパターン全体を一度にターゲット部分C上に投影する(すなわち、単一静的露光)。その後、基板テーブルWTは、Xおよび/またはY方向に移動され、それによって別のターゲット部分Cを露光することができる。ステップモードにおいては、露光フィールドの最大サイズによって、単一静的露光時に結像されるターゲット部分Cのサイズが限定される。
2.スキャンモードでは、マスクテーブルMTおよび基板テーブルWTを同期的にスキャンする一方で、放射ビームに付けられたパターンをターゲット部分C上に投影する(すなわち、単一動的露光)。マスクテーブルMTに対する基板テーブルWTの速度および方向は、投影システムPSの(縮小)拡大率および像反転特性によって決めることができる。スキャンモードにおいては、露光フィールドの最大サイズよって、単一動的露光時のターゲット部分の幅(非スキャン方向)が限定される一方、スキャン動作の長さによって、ターゲット部分の高さ(スキャン方向)が決まる。
3.別のモードでは、プログラマブルパターニングデバイスを保持した状態で、マスクテーブルMTを基本的に静止状態に保ち、また基板テーブルWTを動かす、またはスキャンする一方で、放射ビームに付けられているパターンをターゲット部分C上に投影する。このモードにおいては、通常、パルス放射源が採用されており、さらにプログラマブルパターニングデバイスは、基板テーブルWTの移動後ごとに、またはスキャン中の連続する放射パルスと放射パルスとの間に、必要に応じて更新される。この動作モードは、前述の型のプログラマブルミラーアレイといったプログラマブルパターニングデバイスを利用するマスクレスリソグラフィに容易に適用することができる。
Claims (9)
- 使用中、物体を保持する静電クランプであって、
複数の突出部が設けられたサポートと、
前記突出部の間に設けられた絶縁体に囲まれて配置された電極と、
温度制御システムと、を備え、
前記突出部の頂部は前記物体を保持する平面に形成されており、
前記サポートは、10×10−6/Kより少ない膨張係数を有する材料で形成されており、
前記突出部は前記サポートと同一の前記材料で形成されている、
静電クランプ。 - 前記サポートは、4×10−6/Kより少ない膨張係数を有する材料から形成されている、
請求項1に記載の静電クランプ。 - 前記温度制御システムは、水管を含む、
請求項1に記載の静電クランプ。 - 前記突出部が設けられた前記サポートは、非金属から形成されている、
請求項1〜3のいずれかに記載の静電クランプ。 - 前記絶縁体は誘電材料であり、該誘電材料は、プラスチック、石英、液晶ポリマー、又は、窒化ホウ素(borium nitride)である、
請求項1〜4のいずれかに記載の静電クランプ。 - 前記静電クランプには、前記物体と前記サポートとの間にバックフィルガスを供給するためにバックフィルガスシステムが設けられている、
請求項1〜5のいずれかに記載の静電クランプ。 - 前記静電クランプには電極制御装置に接続された内側電極および外側電極が設けられており、
前記電極制御装置は、前記物体の取り外し中に前記内側電極より前に前記外側電極を非活動化させ、それによって前記バックフィルガスが前記物体の取り外しの前に逃げることができるように構成されている、
請求項6に記載の静電クランプ。 - リソグラフィ装置において物体をサポートに静電的にクランプするように構成された静電クランプを製造する方法であって、
前記サポートに複数の突出部を設けることと、
絶縁体および/または誘電材料に囲われた電極を前記突出部の間に配置することと、
温度制御システムを設けることと、
を含み、
前記突出部の頂部を前記物体を保持する平面に形成し、
前記サポートを10×10−6/Kより少ない膨張係数を有する材料で形成し、
前記突出部を前記サポートと同一の前記材料で形成する、
方法。 - 請求項1〜7のいずれかに記載の静電クランプを備え、
放射ビームのビームパス内の物体を前記静電クランプにより静電的にクランプするように構成された、
リソグラフィ装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/902,501 | 2007-09-21 | ||
US11/902,501 US7940511B2 (en) | 2007-09-21 | 2007-09-21 | Electrostatic clamp, lithographic apparatus and method of manufacturing an electrostatic clamp |
PCT/EP2008/007916 WO2009036995A1 (en) | 2007-09-21 | 2008-09-19 | Electrostatic clamp, lithographic apparatus and method of manufacturing an electrostatic clamp |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010541196A JP2010541196A (ja) | 2010-12-24 |
JP2010541196A5 JP2010541196A5 (ja) | 2011-11-04 |
JP5524845B2 true JP5524845B2 (ja) | 2014-06-18 |
Family
ID=39929545
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010525264A Active JP5524845B2 (ja) | 2007-09-21 | 2008-09-19 | 静電クランプ、リソグラフィ装置および静電クランプを製造する方法 |
Country Status (8)
Country | Link |
---|---|
US (2) | US7940511B2 (ja) |
EP (1) | EP2208224B1 (ja) |
JP (1) | JP5524845B2 (ja) |
KR (1) | KR101533014B1 (ja) |
CN (1) | CN101803001B (ja) |
NL (1) | NL1035888A1 (ja) |
TW (1) | TWI446482B (ja) |
WO (1) | WO2009036995A1 (ja) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7940511B2 (en) * | 2007-09-21 | 2011-05-10 | Asml Netherlands B.V. | Electrostatic clamp, lithographic apparatus and method of manufacturing an electrostatic clamp |
JP2010161319A (ja) * | 2009-01-09 | 2010-07-22 | Nikon Corp | 静電吸着保持装置、露光装置及びデバイスの製造方法 |
JP5269128B2 (ja) * | 2010-03-12 | 2013-08-21 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置および方法 |
WO2012005294A1 (ja) * | 2010-07-09 | 2012-01-12 | 株式会社クリエイティブ テクノロジー | 静電チャック装置及びその製造方法 |
NL2007452A (en) * | 2010-12-08 | 2012-06-11 | Asml Holding Nv | Electrostatic clamp, lithographic apparatus and method of manufacturing an electrostatic clamp. |
NL2007768A (en) | 2010-12-14 | 2012-06-18 | Asml Netherlands Bv | Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder. |
EP2490073B1 (en) | 2011-02-18 | 2015-09-23 | ASML Netherlands BV | Substrate holder, lithographic apparatus, and method of manufacturing a substrate holder |
US9366973B2 (en) * | 2011-02-18 | 2016-06-14 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
EP2686736B1 (en) * | 2011-03-17 | 2014-12-17 | ASML Netherlands BV | Electrostatic clamp, lithographic apparatus, and device manufacturing method |
NL2008630A (en) * | 2011-04-27 | 2012-10-30 | Asml Netherlands Bv | Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder. |
NL2009487A (en) | 2011-10-14 | 2013-04-16 | Asml Netherlands Bv | Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder. |
EP3683627A1 (en) | 2012-02-03 | 2020-07-22 | ASML Netherlands B.V. | Substrate holder and lithographic apparatus |
EP2839506B1 (en) | 2012-02-29 | 2016-08-24 | ASML Netherlands B.V. | Electrostatic clamp |
WO2014012749A1 (en) | 2012-07-17 | 2014-01-23 | Asml Netherlands B.V. | Electrostatic clamp, lithographic apparatus and method |
US9104113B2 (en) | 2013-01-07 | 2015-08-11 | International Business Machines Corporation | Amplification method for photoresist exposure in semiconductor chip manufacturing |
US9541846B2 (en) | 2013-09-06 | 2017-01-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Homogeneous thermal equalization with active device |
US9101038B2 (en) | 2013-12-20 | 2015-08-04 | Lam Research Corporation | Electrostatic chuck including declamping electrode and method of declamping |
DE102014008031B4 (de) * | 2014-05-28 | 2020-06-25 | Berliner Glas Kgaa Herbert Kubatz Gmbh & Co. | Elektrostatische Haltevorrichtung mit einer Keramik-Elektrode und Verfahren zur Herstellung einer solchen Haltevorrichtung |
TWI656596B (zh) * | 2014-08-26 | 2019-04-11 | 荷蘭商Asml控股公司 | 靜電夾具及其製造方法 |
US10002782B2 (en) | 2014-10-17 | 2018-06-19 | Lam Research Corporation | ESC assembly including an electrically conductive gasket for uniform RF power delivery therethrough |
EP3262677A1 (en) * | 2015-02-23 | 2018-01-03 | M Cubed Technologies Inc. | Film electrode for electrostatic chuck |
JP6650345B2 (ja) * | 2016-05-26 | 2020-02-19 | 日本特殊陶業株式会社 | 基板保持装置及びその製造方法 |
US20180374736A1 (en) * | 2017-06-22 | 2018-12-27 | Applied Materials, Inc. | Electrostatic carrier for die bonding applications |
DE102018116463A1 (de) * | 2018-07-06 | 2020-01-09 | Berliner Glas Kgaa Herbert Kubatz Gmbh & Co. | Elektrostatische Haltevorrichtung und Verfahren zu deren Herstellung |
WO2020160938A1 (en) * | 2019-02-08 | 2020-08-13 | Asml Netherlands B.V. | Component for use in a lithographic apparatus, method of protecting a component and method of protecting tables in a lithographic apparatus |
DE102019108855B4 (de) * | 2019-04-04 | 2020-11-12 | Berliner Glas Kgaa Herbert Kubatz Gmbh & Co. | Elektrostatische Haltevorrichtung mit einer Schichtverbund-Elektrodeneinrichtung und Verfahren zu deren Herstellung |
NL2025510A (en) | 2019-05-24 | 2020-11-30 | Asml Holding Nv | Lithographic apparatus, substrate table, and method |
US11817293B2 (en) * | 2020-01-10 | 2023-11-14 | The Research Foundation For The State University Of New York | Photoresist layers of semiconductor components including electric fields, system, and methods of forming same |
US11875967B2 (en) | 2020-05-21 | 2024-01-16 | Applied Materials, Inc. | System apparatus and method for enhancing electrical clamping of substrates using photo-illumination |
US11538714B2 (en) * | 2020-05-21 | 2022-12-27 | Applied Materials, Inc. | System apparatus and method for enhancing electrical clamping of substrates using photo-illumination |
EP3923077A1 (en) * | 2020-06-11 | 2021-12-15 | ASML Netherlands B.V. | Object holder, electrostatic sheet and method for making an electrostatic sheet |
EP4053634A1 (en) * | 2021-03-02 | 2022-09-07 | ASML Netherlands B.V. | Substrate restraining system |
EP4105720A1 (en) * | 2021-06-16 | 2022-12-21 | ASML Netherlands B.V. | Substrate holder and method |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2106325A (en) | 1981-09-14 | 1983-04-07 | Philips Electronic Associated | Electrostatic chuck |
US5880924A (en) * | 1997-12-01 | 1999-03-09 | Applied Materials, Inc. | Electrostatic chuck capable of rapidly dechucking a substrate |
US6067222A (en) * | 1998-11-25 | 2000-05-23 | Applied Materials, Inc. | Substrate support apparatus and method for fabricating same |
JP2000340640A (ja) * | 1999-05-31 | 2000-12-08 | Toto Ltd | 非接触型静電吸着装置 |
JP2001244177A (ja) * | 2000-02-28 | 2001-09-07 | Nikon Corp | ステージ装置とホルダ、および走査型露光装置並びに露光装置 |
JP4467836B2 (ja) * | 2001-06-08 | 2010-05-26 | 株式会社アルバック | 成膜方法 |
DE10157487C1 (de) * | 2001-11-23 | 2003-06-18 | Sgl Carbon Ag | Faserverstärkter Verbundkörper für Schutzpanzerungen, seine Herstellung und Verwendungen |
US20030233977A1 (en) | 2002-06-20 | 2003-12-25 | Yeshwanth Narendar | Method for forming semiconductor processing components |
JP2004031594A (ja) * | 2002-06-25 | 2004-01-29 | Kyocera Corp | 静電チャックおよびその製造方法 |
US7092231B2 (en) * | 2002-08-23 | 2006-08-15 | Asml Netherlands B.V. | Chuck, lithographic apparatus and device manufacturing method |
JP4101017B2 (ja) * | 2002-10-24 | 2008-06-11 | 株式会社アルバック | 吸着装置及び吸着方法 |
JP4383042B2 (ja) * | 2002-12-18 | 2009-12-16 | 日本特殊陶業株式会社 | セラミックス焼結体及びその製造方法 |
JP4472372B2 (ja) * | 2003-02-03 | 2010-06-02 | 株式会社オクテック | プラズマ処理装置及びプラズマ処理装置用の電極板 |
KR100512745B1 (ko) * | 2003-07-24 | 2005-09-07 | 삼성전자주식회사 | 정전기 척 |
JP2005150370A (ja) * | 2003-11-14 | 2005-06-09 | Kyocera Corp | 静電チャック |
JP2005268720A (ja) * | 2004-03-22 | 2005-09-29 | Disco Abrasive Syst Ltd | エッチング装置 |
US7133120B2 (en) * | 2004-05-04 | 2006-11-07 | Asml Netherlands B.V. | Lithographic apparatus, article support member, and method |
US20070097346A1 (en) * | 2005-10-28 | 2007-05-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7564536B2 (en) | 2005-11-08 | 2009-07-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US20070139855A1 (en) * | 2005-12-21 | 2007-06-21 | Asml Netherlands B.V. | Lithographic apparatus and method of manufacturing an electrostatic clamp for a lithographic apparatus |
US7646581B2 (en) * | 2006-01-31 | 2010-01-12 | Sumitomo Osaka Cement Co., Ltd. | Electrostatic chuck |
US8325321B2 (en) * | 2006-07-28 | 2012-12-04 | Mapper Lithography Ip B.V. | Lithography system, method of heat dissipation and frame |
US7940511B2 (en) * | 2007-09-21 | 2011-05-10 | Asml Netherlands B.V. | Electrostatic clamp, lithographic apparatus and method of manufacturing an electrostatic clamp |
JP4974873B2 (ja) * | 2007-12-26 | 2012-07-11 | 新光電気工業株式会社 | 静電チャック及び基板温調固定装置 |
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CN101803001A (zh) | 2010-08-11 |
EP2208224B1 (en) | 2019-11-06 |
KR20100075517A (ko) | 2010-07-02 |
KR101533014B1 (ko) | 2015-07-01 |
US20090079525A1 (en) | 2009-03-26 |
EP2208224A1 (en) | 2010-07-21 |
US7940511B2 (en) | 2011-05-10 |
TW200929429A (en) | 2009-07-01 |
US8098475B2 (en) | 2012-01-17 |
NL1035888A1 (nl) | 2009-03-24 |
CN101803001B (zh) | 2012-11-07 |
TWI446482B (zh) | 2014-07-21 |
WO2009036995A1 (en) | 2009-03-26 |
US20110170085A1 (en) | 2011-07-14 |
JP2010541196A (ja) | 2010-12-24 |
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