JP5436436B2 - ヒートシンクアセンブリを有する検査装置 - Google Patents

ヒートシンクアセンブリを有する検査装置 Download PDF

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Publication number
JP5436436B2
JP5436436B2 JP2010531093A JP2010531093A JP5436436B2 JP 5436436 B2 JP5436436 B2 JP 5436436B2 JP 2010531093 A JP2010531093 A JP 2010531093A JP 2010531093 A JP2010531093 A JP 2010531093A JP 5436436 B2 JP5436436 B2 JP 5436436B2
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JP
Japan
Prior art keywords
heat sink
sink member
light source
fin
source bank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2010531093A
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English (en)
Japanese (ja)
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JP2011502278A (ja
JP2011502278A5 (enExample
Inventor
スコット，ジョシュア・リン
バークル，マージョリー・エル
デルモニコ，ジェームズ・ジェイ
カーペン，トーマス・ダブリュー
ロペス，ジョセフ・ヴィー
Original Assignee
ジーイー・インスペクション・テクノロジーズ，エルピー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication of JP2011502278A publication Critical patent/JP2011502278A/ja
Publication of JP2011502278A5 publication Critical patent/JP2011502278A5/ja
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Expired - Fee Related legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/24—Instruments or systems for viewing the inside of hollow bodies, e.g. fibrescopes
    • G02B23/2476—Non-optical details, e.g. housings, mountings, supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/043—Analysing solids in the interior, e.g. by shear waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/32—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise
    • G01N29/326—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise compensating for temperature variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/022—Casings
    • G01N2201/0221—Portable; cableless; compact; hand-held
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/023—Controlling conditions in casing
    • G01N2201/0231—Thermostating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G01N2201/0612—Laser diodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0634—Diffuse illumination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0693—Battery powered circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0694—Microprocessor controlled supply
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/08—Optical fibres; light guides
    • G01N2201/0826—Fibre array at source, distributing
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B2205/00—Adjustment of optical system relative to image or object surface other than for focusing
    • G03B2205/0046—Movement of one or more optical elements for zooming
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B2205/00—Adjustment of optical system relative to image or object surface other than for focusing
    • G03B2205/0053—Driving means for the movement of one or more optical element
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Optics & Photonics (AREA)
  • Astronomy & Astrophysics (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Radiation Pyrometers (AREA)
  • Endoscopes (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Instruments For Viewing The Inside Of Hollow Bodies (AREA)
JP2010531093A 2007-10-26 2008-08-26 ヒートシンクアセンブリを有する検査装置 Expired - Fee Related JP5436436B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/925,085 US8767060B2 (en) 2007-10-26 2007-10-26 Inspection apparatus having heat sink assembly
US11/925,085 2007-10-26
PCT/US2008/074270 WO2009055137A1 (en) 2007-10-26 2008-08-26 Inspection apparatus having heat sink assembly

Publications (3)

Publication Number Publication Date
JP2011502278A JP2011502278A (ja) 2011-01-20
JP2011502278A5 JP2011502278A5 (enExample) 2012-09-20
JP5436436B2 true JP5436436B2 (ja) 2014-03-05

Family

ID=40070743

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010531093A Expired - Fee Related JP5436436B2 (ja) 2007-10-26 2008-08-26 ヒートシンクアセンブリを有する検査装置

Country Status (5)

Country Link
US (1) US8767060B2 (enExample)
EP (1) EP2212734A1 (enExample)
JP (1) JP5436436B2 (enExample)
CN (1) CN101910910B (enExample)
WO (1) WO2009055137A1 (enExample)

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JP5519211B2 (ja) * 2009-08-10 2014-06-11 オリンパス株式会社 内視鏡装置
JP5484863B2 (ja) * 2009-11-06 2014-05-07 オリンパス株式会社 内視鏡装置
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US8730316B2 (en) * 2011-02-24 2014-05-20 General Electric Company Cable apparatus
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US9307672B2 (en) * 2013-08-26 2016-04-05 General Electric Company Active cooling of inspection or testing devices
CN109106318A (zh) * 2013-12-13 2019-01-01 集成内镜公司 使用导热透镜托架的医学成像设备
CN104747929A (zh) * 2013-12-26 2015-07-01 广东卓耐普智能股份有限公司 一种集成驱动led光源
WO2016170654A1 (ja) * 2015-04-23 2016-10-27 オリンパス株式会社 照明装置、内視鏡及び内視鏡システム
JP6130455B2 (ja) * 2015-09-02 2017-05-17 ファナック株式会社 複数のモータ駆動装置を備えるモータ駆動装置組立体、およびヒートシンクを備えたモータ駆動装置
US10905398B2 (en) * 2016-01-04 2021-02-02 General Electric Company Ultrasound transducer array with separated acoustic and electric module
DE102016111960A1 (de) * 2016-06-30 2018-01-04 Karl Storz Gmbh & Co. Kg Vorrichtung für die Videoendoskopie
US10575714B2 (en) * 2016-07-14 2020-03-03 Intuitive Surgical Operations, Inc. Compact binocular image capture device
US10302598B2 (en) 2016-10-24 2019-05-28 General Electric Company Corrosion and crack detection for fastener nuts
JP7017455B2 (ja) * 2018-03-30 2022-02-08 オリンパス株式会社 内視鏡装置
CN108770301A (zh) * 2018-06-22 2018-11-06 芜湖纯元光电设备技术有限公司 一种仪器仪表散热装置
AT17021U1 (enExample) * 2019-11-29 2021-02-15 Walter Werkzeuge Salzburg Gmbh
US10835106B1 (en) * 2020-02-21 2020-11-17 Ambu A/S Portable monitor
US10980397B1 (en) 2020-02-21 2021-04-20 Ambu A/S Video processing device
CN113358650B (zh) * 2021-06-01 2024-04-16 浙江大学 一种96孔微孔板阅读仪
DE102023131275A1 (de) * 2023-11-10 2025-05-15 Heine Optotechnik Gmbh & Co. Kg Untersuchungsgerät für optische medizinische Untersuchungen

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CN101910910A (zh) 2010-12-08
CN101910910B (zh) 2012-11-07
WO2009055137A1 (en) 2009-04-30

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