JP5341488B2 - テラヘルツ波を測定するための装置及び方法 - Google Patents

テラヘルツ波を測定するための装置及び方法 Download PDF

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Publication number
JP5341488B2
JP5341488B2 JP2008300302A JP2008300302A JP5341488B2 JP 5341488 B2 JP5341488 B2 JP 5341488B2 JP 2008300302 A JP2008300302 A JP 2008300302A JP 2008300302 A JP2008300302 A JP 2008300302A JP 5341488 B2 JP5341488 B2 JP 5341488B2
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Japan
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terahertz
unit
pulse
frequency
information
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Japanese (ja)
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JP2009192524A5 (enExample
JP2009192524A (ja
Inventor
崇史 片桐
健明 井辻
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Canon Inc
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Canon Inc
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Priority to JP2008300302A priority Critical patent/JP5341488B2/ja
Priority to PCT/JP2009/051019 priority patent/WO2009091078A1/en
Priority to US12/742,905 priority patent/US8207501B2/en
Publication of JP2009192524A publication Critical patent/JP2009192524A/ja
Publication of JP2009192524A5 publication Critical patent/JP2009192524A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2008300302A 2008-01-18 2008-11-26 テラヘルツ波を測定するための装置及び方法 Expired - Fee Related JP5341488B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2008300302A JP5341488B2 (ja) 2008-01-18 2008-11-26 テラヘルツ波を測定するための装置及び方法
PCT/JP2009/051019 WO2009091078A1 (en) 2008-01-18 2009-01-16 Apparatus and method for measuring terahertz wave
US12/742,905 US8207501B2 (en) 2008-01-18 2009-01-16 Apparatus and method for measuring terahertz wave

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008009896 2008-01-18
JP2008009896 2008-01-18
JP2008300302A JP5341488B2 (ja) 2008-01-18 2008-11-26 テラヘルツ波を測定するための装置及び方法

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JP2009192524A JP2009192524A (ja) 2009-08-27
JP2009192524A5 JP2009192524A5 (enExample) 2012-01-26
JP5341488B2 true JP5341488B2 (ja) 2013-11-13

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JP2008300302A Expired - Fee Related JP5341488B2 (ja) 2008-01-18 2008-11-26 テラヘルツ波を測定するための装置及び方法

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US (1) US8207501B2 (enExample)
JP (1) JP5341488B2 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5632599B2 (ja) 2009-09-07 2014-11-26 キヤノン株式会社 発振器
US8053733B2 (en) * 2009-09-30 2011-11-08 Advantest Corporation Electromagnetic wave measuring apparatus
JP5502564B2 (ja) * 2010-03-31 2014-05-28 浜松ホトニクス株式会社 電磁波検出装置
JP5609654B2 (ja) * 2011-01-07 2014-10-22 株式会社村田製作所 被測定物の測定方法
JP5735824B2 (ja) 2011-03-04 2015-06-17 キヤノン株式会社 情報取得装置及び情報取得方法
KR101341706B1 (ko) 2012-01-30 2013-12-16 한국과학기술원 전광물질을 이용한 테라헤르츠 광섬유 일점 검출장치 및 그 제조 방법
KR102278849B1 (ko) * 2013-12-17 2021-07-20 루나 이노베이션스 인코퍼레이티드 전자기 방사선을 송신하고 수신하는 시스템
WO2016022757A1 (en) * 2014-08-06 2016-02-11 University Of Massachusetts Single channel terahertz endoscopy
US10092209B2 (en) * 2014-10-03 2018-10-09 Advantest Corporation Non-invasive in situ glucose level sensing using electromagnetic radiation
CN104296884B (zh) 2014-10-22 2017-12-12 上海交通大学 超高速光采样时钟的多通道失配测量方法及测量补偿装置
JP6483453B2 (ja) * 2015-01-30 2019-03-13 国立大学法人横浜国立大学 テラヘルツ電場波形検出装置
JP7362409B2 (ja) 2019-10-17 2023-10-17 キヤノン株式会社 照明装置およびカメラシステム
CN115298876A (zh) * 2020-03-26 2022-11-04 三洋电机株式会社 非水电解质二次电池
CN111537466B (zh) * 2020-05-15 2022-07-05 西安理工大学 一种用于检测细胞和生物大分子的瞬态THz光谱仪
CN112558334A (zh) * 2020-12-01 2021-03-26 中国科学院上海光学精密机械研究所 一种超快光开关及光调制的结构
JP2023157737A (ja) 2022-04-15 2023-10-26 キヤノン株式会社 アンテナ装置、通信装置、及び、撮像システム

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01176920A (ja) * 1987-12-31 1989-07-13 Hamamatsu Photonics Kk 分光計測装置
US5144374A (en) * 1990-04-27 1992-09-01 Cselt - Centro Studi E Laboratori Telecommunicazioni S.P.A. Optical spectroscopy system
US5710430A (en) * 1995-02-15 1998-01-20 Lucent Technologies Inc. Method and apparatus for terahertz imaging
US5623145A (en) * 1995-02-15 1997-04-22 Lucent Technologies Inc. Method and apparatus for terahertz imaging
JP4136858B2 (ja) 2003-09-12 2008-08-20 キヤノン株式会社 位置検出装置、及び情報入力装置
JP4217646B2 (ja) 2004-03-26 2009-02-04 キヤノン株式会社 認証方法及び認証装置
JP4878180B2 (ja) 2005-03-24 2012-02-15 キヤノン株式会社 電磁波を用いる検査装置
JP4898472B2 (ja) 2006-04-11 2012-03-14 キヤノン株式会社 検査装置
US8067739B2 (en) 2007-06-22 2011-11-29 Canon Kabushiki Kaisha Photoconductive element for generation and detection of terahertz wave
JP4975000B2 (ja) 2007-12-07 2012-07-11 キヤノン株式会社 電磁波発生素子、電磁波集積素子、及び電磁波検出装置
JP5328319B2 (ja) 2008-01-29 2013-10-30 キヤノン株式会社 テラヘルツ波を用いた検査装置及び検査方法
JP4834718B2 (ja) 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置

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US8207501B2 (en) 2012-06-26
US20100288928A1 (en) 2010-11-18
JP2009192524A (ja) 2009-08-27

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