JP5337243B2 - 表面特徴の適応型３次元走査システム - Google Patents

表面特徴の適応型３次元走査システム Download PDF

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JP5337243B2
JP5337243B2 JP2011521417A JP2011521417A JP5337243B2 JP 5337243 B2 JP5337243 B2 JP 5337243B2 JP 2011521417 A JP2011521417 A JP 2011521417A JP 2011521417 A JP2011521417 A JP 2011521417A JP 5337243 B2 JP5337243 B2 JP 5337243B2
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feature
image
dimensional
texture
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JP2011530071A5 (enExample
JP2011530071A (ja
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サン−ピエール，エリック
チュビク，ドラガン
エベール，パトリック
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Creaform Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
JP2011521417A 2008-08-06 2009-07-30 表面特徴の適応型３次元走査システム Active JP5337243B2 (ja)

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US8655408P 2008-08-06 2008-08-06
US61/086,554 2008-08-06
PCT/CA2009/001105 WO2010015086A1 (en) 2008-08-06 2009-07-30 System for adaptive three-dimensional scanning of surface characteristics

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JP2011530071A JP2011530071A (ja) 2011-12-15
JP2011530071A5 JP2011530071A5 (enExample) 2012-08-30
JP5337243B2 true JP5337243B2 (ja) 2013-11-06

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EP (1) EP2313737B1 (enExample)
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CN (1) CN102112845B (enExample)
CA (1) CA2731680C (enExample)
WO (1) WO2010015086A1 (enExample)

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