CN102112845B - 用于表面特征自适应性三维扫描的系统 - Google Patents

用于表面特征自适应性三维扫描的系统 Download PDF

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CN102112845B
CN102112845B CN2009801298320A CN200980129832A CN102112845B CN 102112845 B CN102112845 B CN 102112845B CN 2009801298320 A CN2009801298320 A CN 2009801298320A CN 200980129832 A CN200980129832 A CN 200980129832A CN 102112845 B CN102112845 B CN 102112845B
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camera
feature
image
texture
surface points
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CN102112845A (zh
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埃里克·圣-皮埃尔
德拉甘·图比克
帕特里克·赫伯特
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Creaform Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
CN2009801298320A 2008-08-06 2009-07-30 用于表面特征自适应性三维扫描的系统 Active CN102112845B (zh)

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US8655408P 2008-08-06 2008-08-06
US61/086,554 2008-08-06
PCT/CA2009/001105 WO2010015086A1 (en) 2008-08-06 2009-07-30 System for adaptive three-dimensional scanning of surface characteristics

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CN102112845B true CN102112845B (zh) 2013-09-11

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US (1) US8284240B2 (enExample)
EP (1) EP2313737B1 (enExample)
JP (1) JP5337243B2 (enExample)
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CA (1) CA2731680C (enExample)
WO (1) WO2010015086A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
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WO2017173744A1 (zh) 2016-04-08 2017-10-12 杭州先临三维科技股份有限公司 一种多测量模式的三维测量系统及测量方法

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