JP5336325B2 - 画像処理方法 - Google Patents
画像処理方法 Download PDFInfo
- Publication number
- JP5336325B2 JP5336325B2 JP2009250092A JP2009250092A JP5336325B2 JP 5336325 B2 JP5336325 B2 JP 5336325B2 JP 2009250092 A JP2009250092 A JP 2009250092A JP 2009250092 A JP2009250092 A JP 2009250092A JP 5336325 B2 JP5336325 B2 JP 5336325B2
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- imaging
- image data
- dimensional
- value
- dimensional image
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- 238000003672 processing method Methods 0.000 title claims description 22
- 238000003384 imaging method Methods 0.000 claims description 100
- 238000005286 illumination Methods 0.000 claims description 58
- 238000000605 extraction Methods 0.000 claims description 25
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 230000007717 exclusion Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 25
- 238000012545 processing Methods 0.000 description 16
- 230000000875 corresponding effect Effects 0.000 description 13
- 238000004519 manufacturing process Methods 0.000 description 7
- 238000003860 storage Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 239000013598 vector Substances 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000010191 image analysis Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000003708 edge detection Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- -1 silver halide Chemical class 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009250092A JP5336325B2 (ja) | 2009-10-30 | 2009-10-30 | 画像処理方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009250092A JP5336325B2 (ja) | 2009-10-30 | 2009-10-30 | 画像処理方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011095131A JP2011095131A (ja) | 2011-05-12 |
| JP2011095131A5 JP2011095131A5 (enExample) | 2012-05-17 |
| JP5336325B2 true JP5336325B2 (ja) | 2013-11-06 |
Family
ID=44112206
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009250092A Expired - Fee Related JP5336325B2 (ja) | 2009-10-30 | 2009-10-30 | 画像処理方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5336325B2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101327433B1 (ko) | 2011-12-08 | 2013-11-11 | 주식회사 엔티리서치 | 역구배를 가지는 대상물체의 입체형상 측정 장치 |
| US9542733B2 (en) | 2012-01-10 | 2017-01-10 | Konica Minolta, Inc. | Image processing method, imaging processing apparatus and image processing program for correcting density values between at least two images |
| RU2635280C2 (ru) * | 2012-03-01 | 2017-11-09 | Ниссан Мотор Ко., Лтд. | Устройство обнаружения трехмерных объектов |
| JP7093680B2 (ja) * | 2018-06-01 | 2022-06-30 | 日立Ｇｅニュークリア・エナジー株式会社 | 構造物差分抽出装置、構造物差分抽出方法およびプログラム |
| US12192632B2 (en) | 2020-05-21 | 2025-01-07 | Nec Corporation | Installation assistance apparatus, installation assistance method, and non-transitory computer-readable storage medium |
| WO2021258273A1 (zh) * | 2020-06-23 | 2021-12-30 | 广东省航空航天装备技术研究所 | 基于三维成像的加工方法、装置、设备及存储介质 |
| CN115393568A (zh) * | 2022-06-13 | 2022-11-25 | 浙江大学 | 一种基于侧向多视角成像的水果三维点云重建装置 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04329344A (ja) * | 1991-05-01 | 1992-11-18 | Elmo Co Ltd | 実装基板検査装置 |
| JP4337203B2 (ja) * | 2000-01-24 | 2009-09-30 | ソニー株式会社 | 距離画像生成装置および距離画像生成方法、並びにプログラム提供媒体 |
| JP2003150940A (ja) * | 2001-11-16 | 2003-05-23 | Komatsu Ltd | ステレオ画像処理装置 |
| JP2006132947A (ja) * | 2004-11-02 | 2006-05-25 | Hitachi High-Technologies Corp | 検査装置および検査方法 |
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2009
- 2009-10-30 JP JP2009250092A patent/JP5336325B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011095131A (ja) | 2011-05-12 |
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