JP5327228B2 - 多重周回飛行時間型質量分析装置 - Google Patents
多重周回飛行時間型質量分析装置 Download PDFInfo
- Publication number
- JP5327228B2 JP5327228B2 JP2010536592A JP2010536592A JP5327228B2 JP 5327228 B2 JP5327228 B2 JP 5327228B2 JP 2010536592 A JP2010536592 A JP 2010536592A JP 2010536592 A JP2010536592 A JP 2010536592A JP 5327228 B2 JP5327228 B2 JP 5327228B2
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- Prior art keywords
- mass
- ions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
- H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2008/003200 WO2010052752A1 (fr) | 2008-11-05 | 2008-11-05 | Spectromètre de masse du type temps de vol à circulation multiple |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2010052752A1 JPWO2010052752A1 (ja) | 2012-03-29 |
JP5327228B2 true JP5327228B2 (ja) | 2013-10-30 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2010536592A Expired - Fee Related JP5327228B2 (ja) | 2008-11-05 | 2008-11-05 | 多重周回飛行時間型質量分析装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5327228B2 (fr) |
WO (1) | WO2010052752A1 (fr) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005116343A (ja) * | 2003-10-08 | 2005-04-28 | Shimadzu Corp | 質量分析方法及び質量分析装置 |
JP2006059739A (ja) * | 2004-08-23 | 2006-03-02 | Jeol Ltd | 質量分析方法 |
WO2008059246A2 (fr) * | 2006-11-14 | 2008-05-22 | Thermo Fisher Scientific (Bremen) Gmbh | Procédé de mise en œuvre d'un piège à ions a réflexions multiples |
-
2008
- 2008-11-05 WO PCT/JP2008/003200 patent/WO2010052752A1/fr active Application Filing
- 2008-11-05 JP JP2010536592A patent/JP5327228B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005116343A (ja) * | 2003-10-08 | 2005-04-28 | Shimadzu Corp | 質量分析方法及び質量分析装置 |
JP2006059739A (ja) * | 2004-08-23 | 2006-03-02 | Jeol Ltd | 質量分析方法 |
WO2008059246A2 (fr) * | 2006-11-14 | 2008-05-22 | Thermo Fisher Scientific (Bremen) Gmbh | Procédé de mise en œuvre d'un piège à ions a réflexions multiples |
Also Published As
Publication number | Publication date |
---|---|
JPWO2010052752A1 (ja) | 2012-03-29 |
WO2010052752A1 (fr) | 2010-05-14 |
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