JP5327228B2 - 多重周回飛行時間型質量分析装置 - Google Patents

多重周回飛行時間型質量分析装置 Download PDF

Info

Publication number
JP5327228B2
JP5327228B2 JP2010536592A JP2010536592A JP5327228B2 JP 5327228 B2 JP5327228 B2 JP 5327228B2 JP 2010536592 A JP2010536592 A JP 2010536592A JP 2010536592 A JP2010536592 A JP 2010536592A JP 5327228 B2 JP5327228 B2 JP 5327228B2
Authority
JP
Japan
Prior art keywords
mass
ions
analysis condition
flight
orbit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2010536592A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2010052752A1 (ja
Inventor
真一 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of JPWO2010052752A1 publication Critical patent/JPWO2010052752A1/ja
Application granted granted Critical
Publication of JP5327228B2 publication Critical patent/JP5327228B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/408Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2010536592A 2008-11-05 2008-11-05 多重周回飛行時間型質量分析装置 Expired - Fee Related JP5327228B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2008/003200 WO2010052752A1 (fr) 2008-11-05 2008-11-05 Spectromètre de masse du type temps de vol à circulation multiple

Publications (2)

Publication Number Publication Date
JPWO2010052752A1 JPWO2010052752A1 (ja) 2012-03-29
JP5327228B2 true JP5327228B2 (ja) 2013-10-30

Family

ID=42152569

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010536592A Expired - Fee Related JP5327228B2 (ja) 2008-11-05 2008-11-05 多重周回飛行時間型質量分析装置

Country Status (2)

Country Link
JP (1) JP5327228B2 (fr)
WO (1) WO2010052752A1 (fr)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005116343A (ja) * 2003-10-08 2005-04-28 Shimadzu Corp 質量分析方法及び質量分析装置
JP2006059739A (ja) * 2004-08-23 2006-03-02 Jeol Ltd 質量分析方法
WO2008059246A2 (fr) * 2006-11-14 2008-05-22 Thermo Fisher Scientific (Bremen) Gmbh Procédé de mise en œuvre d'un piège à ions a réflexions multiples

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005116343A (ja) * 2003-10-08 2005-04-28 Shimadzu Corp 質量分析方法及び質量分析装置
JP2006059739A (ja) * 2004-08-23 2006-03-02 Jeol Ltd 質量分析方法
WO2008059246A2 (fr) * 2006-11-14 2008-05-22 Thermo Fisher Scientific (Bremen) Gmbh Procédé de mise en œuvre d'un piège à ions a réflexions multiples

Also Published As

Publication number Publication date
JPWO2010052752A1 (ja) 2012-03-29
WO2010052752A1 (fr) 2010-05-14

Similar Documents

Publication Publication Date Title
JP5198260B2 (ja) 質量スペクトル測定における複数イオン注入
JP4182843B2 (ja) 飛行時間型質量分析装置
JP4033133B2 (ja) 質量分析装置
JP2003123685A (ja) 質量分析装置およびこれを用いる計測システム
JP5024387B2 (ja) 質量分析方法及び質量分析システム
JP4182853B2 (ja) 質量分析方法及び質量分析装置
JP2011119279A (ja) 質量分析装置およびこれを用いる計測システム
JP2006278145A (ja) 飛行時間型質量分析装置
WO2010038260A1 (fr) Spectromètre de masse de temps de vol multitours
JP2016536761A (ja) 標的化した質量分析
JP6627979B2 (ja) 質量分析装置
JP5136650B2 (ja) 質量分析装置
JP5126368B2 (ja) 質量分析方法
US8093555B2 (en) Mass spectrometer
JP6022383B2 (ja) 質量分析システム、及び方法
JP2008108739A (ja) 質量分析装置およびこれを用いる計測システム
JP5327228B2 (ja) 多重周回飛行時間型質量分析装置
JP6160472B2 (ja) 飛行時間型質量分析装置
JP2005322429A (ja) 質量分析装置
JP5972662B2 (ja) タンデム飛行時間型質量分析計
JP4273917B2 (ja) 質量分析装置
JP2006012747A (ja) 飛行時間型質量分析装置
JPH08287866A (ja) 質量分析方法およびその装置
Nagao et al. Development of a miniaturized multi-turn time-of-flight mass spectrometer with a pulsed fast atom bombardment ion source
JP2005116246A (ja) 質量分析装置

Legal Events

Date Code Title Description
A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130115

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130218

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130319

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130520

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130625

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130708

R151 Written notification of patent or utility model registration

Ref document number: 5327228

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

LAPS Cancellation because of no payment of annual fees