JP5314239B2 - 光学式変位計、光学式変位測定方法、光学式変位測定プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 - Google Patents
光学式変位計、光学式変位測定方法、光学式変位測定プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 Download PDFInfo
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- JP5314239B2 JP5314239B2 JP2006274528A JP2006274528A JP5314239B2 JP 5314239 B2 JP5314239 B2 JP 5314239B2 JP 2006274528 A JP2006274528 A JP 2006274528A JP 2006274528 A JP2006274528 A JP 2006274528A JP 5314239 B2 JP5314239 B2 JP 5314239B2
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- light
- measurement
- shape
- optical displacement
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006274528A JP5314239B2 (ja) | 2006-10-05 | 2006-10-05 | 光学式変位計、光学式変位測定方法、光学式変位測定プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 |
| US11/973,036 US7489410B2 (en) | 2006-10-05 | 2007-10-05 | Optical displacement meter, optical displacement measuring method, optical displacement measuring program, computer-readable recording medium, and device that records the program |
| US12/346,929 US7667857B2 (en) | 2006-10-05 | 2008-12-31 | Optical displacement meter, optical displacement measuring method, optical displacement measuring program, computer-readable recording medium, and device that records the program |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006274528A JP5314239B2 (ja) | 2006-10-05 | 2006-10-05 | 光学式変位計、光学式変位測定方法、光学式変位測定プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008096119A JP2008096119A (ja) | 2008-04-24 |
| JP2008096119A5 JP2008096119A5 (enExample) | 2009-11-12 |
| JP5314239B2 true JP5314239B2 (ja) | 2013-10-16 |
Family
ID=39302804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006274528A Active JP5314239B2 (ja) | 2006-10-05 | 2006-10-05 | 光学式変位計、光学式変位測定方法、光学式変位測定プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US7489410B2 (enExample) |
| JP (1) | JP5314239B2 (enExample) |
Families Citing this family (53)
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| US8467042B2 (en) * | 2006-07-31 | 2013-06-18 | Hoya Corporation | Lens shape measuring apparatus and the method thereof, manufacturing method of spectacle lens, and manufacturing method of spectacles |
| JP5314239B2 (ja) * | 2006-10-05 | 2013-10-16 | 株式会社キーエンス | 光学式変位計、光学式変位測定方法、光学式変位測定プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 |
| JP5072336B2 (ja) * | 2006-12-07 | 2012-11-14 | 株式会社キーエンス | 光学式変位センサ及び光学式変位計 |
| US7764387B2 (en) * | 2007-03-02 | 2010-07-27 | Applied Kinetics, Inc. | Apparatus and method for measuring suspension and head assemblies in a stack |
| JP2010237054A (ja) * | 2009-03-31 | 2010-10-21 | Toyota Motor Corp | 組み付け精度測定方法および測定装置 |
| JP5374266B2 (ja) * | 2009-07-22 | 2013-12-25 | 株式会社シロク | 光学式位置検出装置 |
| EP2314987A1 (de) * | 2009-10-20 | 2011-04-27 | Siemens Aktiengesellschaft | Oberflächenanalyse zur Detektierung verschlossener Löcher und Vorrichtung |
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| JP5832927B2 (ja) * | 2012-02-17 | 2015-12-16 | 株式会社キーエンス | 光学式変位計 |
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| DE102012108902B4 (de) | 2012-09-21 | 2019-03-28 | SmartRay GmbH | Optischer Kopf sowie Düsenkopf mit einem optischen Kopf und Verfahren für deren Betrieb |
| US9248054B2 (en) | 2012-11-27 | 2016-02-02 | The Procter & Gamble Company | Methods and apparatus for making elastic laminates |
| US9295590B2 (en) | 2012-11-27 | 2016-03-29 | The Procter & Gamble Company | Method and apparatus for applying an elastic material to a moving substrate in a curved path |
| US9265672B2 (en) | 2012-11-27 | 2016-02-23 | The Procter & Gamble Company | Methods and apparatus for applying adhesives in patterns to an advancing substrate |
| JP6207282B2 (ja) * | 2013-07-31 | 2017-10-04 | 株式会社キーエンス | 画像処理装置、画像処理システム、検査方法およびプログラム |
| CN103557835B (zh) * | 2013-11-04 | 2016-01-06 | 福建新大陆自动识别技术有限公司 | 激光测距装置和方法 |
| US9531967B2 (en) | 2013-12-31 | 2016-12-27 | Faro Technologies, Inc. | Dynamic range of a line scanner having a photosensitive array that provides variable exposure |
| US9658061B2 (en) | 2013-12-31 | 2017-05-23 | Faro Technologies, Inc. | Line scanner that uses a color image sensor to improve dynamic range |
| US9999552B2 (en) | 2014-02-28 | 2018-06-19 | The Procter & Gamble Company | Methods for profiling surface topographies of absorbent structures in absorbent articles |
| US20150352589A1 (en) | 2014-06-05 | 2015-12-10 | The Procter & Gamble Company | Methods and Apparatus for Applying Adhesives in Patterns to an Advancing Substrate |
| JP6470506B2 (ja) * | 2014-06-09 | 2019-02-13 | 株式会社キーエンス | 検査装置 |
| KR102238741B1 (ko) * | 2015-01-06 | 2021-04-12 | 삼성디스플레이 주식회사 | 표시 패널의 발광 상태 측정 방법 및 표시 패널의 발광 상태 보정 방법 |
| CN105937886B (zh) * | 2015-03-04 | 2020-01-10 | 住友重机械工业株式会社 | 形状测量装置、加工装置及形状测量装置的校正方法 |
| JP6425586B2 (ja) | 2015-03-04 | 2018-11-21 | 株式会社キーエンス | 光学式変位計測システム、撮像条件最適化方法および撮像条件最適化プログラム |
| CN105444679B (zh) * | 2015-11-14 | 2019-02-15 | 上海砺晟光电技术有限公司 | 可抑制激光漂移和表面倾斜的对称式激光位移传感器 |
| US11217009B2 (en) | 2015-11-30 | 2022-01-04 | Photopotech LLC | Methods for collecting and processing image information to produce digital assets |
| US10778877B2 (en) * | 2015-11-30 | 2020-09-15 | Photopotech LLC | Image-capture device |
| JP6728842B2 (ja) * | 2016-03-24 | 2020-07-22 | オムロン株式会社 | 光学計測装置 |
| JP6737018B2 (ja) * | 2016-07-08 | 2020-08-05 | オムロン株式会社 | 光学計測装置 |
| JP6805263B2 (ja) * | 2016-10-25 | 2020-12-23 | 株式会社Fuji | 画像処理用部品形状データ作成システム及び画像処理用部品形状データ作成方法 |
| CN106862157B (zh) * | 2017-01-13 | 2019-07-30 | 深圳市金洲精工科技股份有限公司 | 轮廓仪及其镜片维护方法 |
| CA3061912A1 (en) * | 2017-05-08 | 2018-11-15 | PlantSnap, Inc. | Systems and methods for electronically identifying plant species |
| JP6789187B2 (ja) * | 2017-07-07 | 2020-11-25 | 東京エレクトロン株式会社 | 基板反り検出装置及び基板反り検出方法、並びにこれらを用いた基板処理装置及び基板処理方法 |
| US10352690B2 (en) | 2017-12-18 | 2019-07-16 | Industrial Technology Research Institute | Measuring apparatus |
| JP6880513B2 (ja) * | 2018-03-13 | 2021-06-02 | オムロン株式会社 | 光学計測装置及び光学計測方法 |
| JP7064404B2 (ja) * | 2018-08-13 | 2022-05-10 | 株式会社キーエンス | 光学式変位計 |
| WO2020037387A1 (en) * | 2018-08-18 | 2020-02-27 | Insfor - Innovative Solutions For Robotics Ltda. - Me | System for the inspection and monitoring of moving pipelines |
| US11707548B2 (en) | 2018-10-09 | 2023-07-25 | The Procter & Gamble Company | Absorbent article comprising a lotion resistant polymeric filler composition |
| US10430980B1 (en) * | 2018-10-22 | 2019-10-01 | North Inc. | Systems, devices, and methods for displaying visual symbols |
| JP7193308B2 (ja) * | 2018-11-09 | 2022-12-20 | 株式会社キーエンス | プロファイル測定装置 |
| JP7219059B2 (ja) * | 2018-11-09 | 2023-02-07 | 株式会社キーエンス | 変位測定装置 |
| JP7219057B2 (ja) * | 2018-11-09 | 2023-02-07 | 株式会社キーエンス | 変位測定装置 |
| JP7503412B2 (ja) * | 2020-04-10 | 2024-06-20 | 株式会社キーエンス | 光学式変位センサ |
| JP7560387B2 (ja) | 2021-03-09 | 2024-10-02 | 株式会社キーエンス | 光学式変位計測システム、処理装置、光学式変位計測方法および光学式変位計測プログラム |
| JP2023015886A (ja) * | 2021-07-20 | 2023-02-01 | 株式会社キーエンス | 形状検査装置、処理装置、高さ画像処理方法および高さ画像処理プログラム |
| CN113692215A (zh) * | 2021-07-30 | 2021-11-23 | 广州佳帆计算机有限公司 | 一种贴片元件位置可调整系统、方法及装置 |
| TWI882368B (zh) * | 2023-06-27 | 2025-05-01 | 盟立自動化股份有限公司 | 用於電阻尺的診斷方法及診斷系統 |
| JP2025033607A (ja) * | 2023-08-30 | 2025-03-13 | 株式会社キーエンス | 光学式変位計 |
| CN117433454B (zh) * | 2023-12-15 | 2024-03-22 | 成都匠泰建筑工程设计有限公司 | 一种景观园林面积计量设备 |
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| US6337742B2 (en) * | 1988-04-28 | 2002-01-08 | Pruftechnik Dieter Busch Ag | Device for ascertaining the relative position of a reference axis of an object relative to a reference beam, in particular a laser beam |
| JPH03209112A (ja) * | 1990-01-11 | 1991-09-12 | Nissan Motor Co Ltd | 3次元形状測定装置 |
| JPH045507A (ja) * | 1990-04-23 | 1992-01-09 | Mitsubishi Electric Corp | 形状測定装置 |
| JP2953154B2 (ja) * | 1991-11-29 | 1999-09-27 | 日本電気株式会社 | 形状合成方法 |
| US5668631A (en) * | 1993-12-20 | 1997-09-16 | Minolta Co., Ltd. | Measuring system with improved method of reading image data of an object |
| US5784168A (en) * | 1995-07-03 | 1998-07-21 | U.S. Philips Corporation | Position detection system for an object with at least five degrees of freedom |
| JP3525964B2 (ja) * | 1995-07-05 | 2004-05-10 | 株式会社エフ・エフ・シー | 物体の三次元形状計測方法 |
| US5789743A (en) * | 1996-07-03 | 1998-08-04 | U.S. Philips Corporation | Optical scanning device, and apparatus provided with such a device, employing scanning element having reflective measuring reference face |
| JPH1023311A (ja) * | 1996-07-05 | 1998-01-23 | Canon Inc | 画像情報入力方法及び装置 |
| JPH10105721A (ja) * | 1996-09-30 | 1998-04-24 | Honda Motor Co Ltd | 画像の位置検出方法 |
| JPH10267648A (ja) | 1997-03-28 | 1998-10-09 | Keyence Corp | 光学式変位計 |
| JP3377027B2 (ja) * | 1997-12-19 | 2003-02-17 | 日立プラント建設株式会社 | 非接触式立体形状計測装置 |
| JP4638077B2 (ja) * | 2000-05-22 | 2011-02-23 | 株式会社ミツトヨ | 走査型広域被検面形状解析装置 |
| JP4656745B2 (ja) * | 2001-03-09 | 2011-03-23 | 西松建設株式会社 | トンネル坑内の形状測定方法 |
| JP3575693B2 (ja) * | 2001-03-25 | 2004-10-13 | オムロン株式会社 | 光学式計測装置 |
| CH695914A5 (de) * | 2002-05-17 | 2006-10-13 | Hera Rotterdam Bv | Vorrichtung und Verfahren zur optischen Erfassung von Gegenständen. |
| JP4209709B2 (ja) * | 2003-03-20 | 2009-01-14 | 株式会社キーエンス | 変位計 |
| DE10313191A1 (de) * | 2003-03-25 | 2004-10-07 | Gutehoffnungshütte Radsatz Gmbh | Verfahren zur berührungslosen dynamischen Erfassung des Profils eines Festkörpers |
| JP4679073B2 (ja) * | 2004-05-18 | 2011-04-27 | 株式会社ブリヂストン | タイヤ凹凸図形の検査方法、および、タイヤ凹凸図形検査装置 |
| JP4430466B2 (ja) | 2004-06-22 | 2010-03-10 | 株式会社キーエンス | 光学式変位計 |
| GB2422015B (en) * | 2005-02-01 | 2007-02-28 | Taylor Hobson Ltd | A metrological instrument |
| JP5154134B2 (ja) * | 2006-10-05 | 2013-02-27 | 株式会社キーエンス | 光学式変位計、光学式変位測定方法、光学式変位測定プログラム |
| JP5314239B2 (ja) * | 2006-10-05 | 2013-10-16 | 株式会社キーエンス | 光学式変位計、光学式変位測定方法、光学式変位測定プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 |
-
2006
- 2006-10-05 JP JP2006274528A patent/JP5314239B2/ja active Active
-
2007
- 2007-10-05 US US11/973,036 patent/US7489410B2/en active Active
-
2008
- 2008-12-31 US US12/346,929 patent/US7667857B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7489410B2 (en) | 2009-02-10 |
| US20090141288A1 (en) | 2009-06-04 |
| US20080088856A1 (en) | 2008-04-17 |
| US7667857B2 (en) | 2010-02-23 |
| JP2008096119A (ja) | 2008-04-24 |
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