JP5265343B2 - デカルトロボットクラスタツール構築 - Google Patents
デカルトロボットクラスタツール構築 Download PDFInfo
- Publication number
- JP5265343B2 JP5265343B2 JP2008507704A JP2008507704A JP5265343B2 JP 5265343 B2 JP5265343 B2 JP 5265343B2 JP 2008507704 A JP2008507704 A JP 2008507704A JP 2008507704 A JP2008507704 A JP 2008507704A JP 5265343 B2 JP5265343 B2 JP 5265343B2
- Authority
- JP
- Japan
- Prior art keywords
- robot
- assembly
- substrate
- processing
- transfer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67184—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67178—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Applications Claiming Priority (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US67384805P | 2005-04-22 | 2005-04-22 | |
US60/673,848 | 2005-04-22 | ||
US11/315,778 | 2005-12-22 | ||
US11/315,984 US7651306B2 (en) | 2004-12-22 | 2005-12-22 | Cartesian robot cluster tool architecture |
US11/315,873 | 2005-12-22 | ||
US11/315,873 US7374391B2 (en) | 2005-12-22 | 2005-12-22 | Substrate gripper for a substrate handling robot |
US11/315,984 | 2005-12-22 | ||
US11/315,778 US20060182535A1 (en) | 2004-12-22 | 2005-12-22 | Cartesian robot design |
PCT/US2006/013164 WO2006115745A1 (en) | 2005-04-22 | 2006-04-07 | Cartesian robot cluster tool architecture |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012195132A Division JP5329705B2 (ja) | 2005-04-22 | 2012-09-05 | デカルトロボットクラスタツール構築 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008538654A JP2008538654A (ja) | 2008-10-30 |
JP5265343B2 true JP5265343B2 (ja) | 2013-08-14 |
Family
ID=36676525
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008507704A Expired - Fee Related JP5265343B2 (ja) | 2005-04-22 | 2006-04-07 | デカルトロボットクラスタツール構築 |
JP2012195132A Expired - Fee Related JP5329705B2 (ja) | 2005-04-22 | 2012-09-05 | デカルトロボットクラスタツール構築 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012195132A Expired - Fee Related JP5329705B2 (ja) | 2005-04-22 | 2012-09-05 | デカルトロボットクラスタツール構築 |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP5265343B2 (zh) |
KR (1) | KR100960765B1 (zh) |
CN (3) | CN101164138B (zh) |
TW (1) | TWI345817B (zh) |
WO (1) | WO2006115745A1 (zh) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100265287B1 (ko) | 1998-04-21 | 2000-10-02 | 윤종용 | 반도체소자 제조용 식각설비의 멀티챔버 시스템 |
US7694688B2 (en) * | 2007-01-05 | 2010-04-13 | Applied Materials, Inc. | Wet clean system design |
US8636458B2 (en) * | 2007-06-06 | 2014-01-28 | Asml Netherlands B.V. | Integrated post-exposure bake track |
CN101332604B (zh) * | 2008-06-20 | 2010-06-09 | 哈尔滨工业大学 | 人机相互作用机械臂的控制方法 |
KR101803111B1 (ko) * | 2010-01-08 | 2017-11-29 | 케이엘에이-텐코 코포레이션 | 이중 트레이 캐리어 유닛 |
US9435826B2 (en) | 2012-05-08 | 2016-09-06 | Kla-Tencor Corporation | Variable spacing four-point probe pin device and method |
JP6182065B2 (ja) * | 2013-12-27 | 2017-08-16 | 東京エレクトロン株式会社 | 基板処理装置 |
JP2015207622A (ja) * | 2014-04-18 | 2015-11-19 | 株式会社ディスコ | 搬送機構 |
EP2947686A1 (en) * | 2014-05-19 | 2015-11-25 | Meyer Burger AG | Wafer processing method |
US9555545B2 (en) * | 2014-05-21 | 2017-01-31 | Bot & Dolly, Llc | Systems and methods for time-based parallel robotic operation |
JP6559976B2 (ja) * | 2015-03-03 | 2019-08-14 | 川崎重工業株式会社 | 基板搬送ロボットおよび基板処理システム |
KR102478317B1 (ko) | 2015-04-08 | 2022-12-16 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 시스템 |
JP6425639B2 (ja) * | 2015-04-08 | 2018-11-21 | 東京エレクトロン株式会社 | 基板処理システム |
TWI602131B (zh) * | 2016-05-26 | 2017-10-11 | 台灣積體電路製造股份有限公司 | 倉儲系統及倉儲系統控制方法 |
KR101885257B1 (ko) * | 2016-11-03 | 2018-08-03 | 포톤데이즈(주) | 다수 매거진 구조의 광소자 신뢰성 및 특성 검사 장치 |
EP3361316A1 (de) | 2017-02-14 | 2018-08-15 | VAT Holding AG | Pneumatische stifthubvorrichtung und pneumatischer hubzylinder |
TWI678277B (zh) * | 2017-03-21 | 2019-12-01 | 德律科技股份有限公司 | 障礙偵測方法及壓床防撞方法 |
JP6902379B2 (ja) * | 2017-03-31 | 2021-07-14 | 東京エレクトロン株式会社 | 処理システム |
CN114026680A (zh) * | 2019-02-14 | 2022-02-08 | 柿子技术公司 | 带有双连杆臂的线性机器人 |
CN112582318A (zh) * | 2019-09-30 | 2021-03-30 | 沈阳芯源微电子设备股份有限公司 | 涂胶显影设备 |
JP7536582B2 (ja) | 2020-10-01 | 2024-08-20 | ニデックインスツルメンツ株式会社 | 搬送システム |
US20230150120A1 (en) * | 2021-11-17 | 2023-05-18 | Kawasaki Jukogyo Kabushiki Kaisha | Substrate Conveying Robot and Substrate Conveying Robot System |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08222616A (ja) * | 1995-02-13 | 1996-08-30 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
US6318951B1 (en) * | 1999-07-09 | 2001-11-20 | Semitool, Inc. | Robots for microelectronic workpiece handling |
US6099643A (en) * | 1996-12-26 | 2000-08-08 | Dainippon Screen Mfg. Co., Ltd. | Apparatus for processing a substrate providing an efficient arrangement and atmospheric isolation of chemical treatment section |
JP2000012656A (ja) * | 1998-06-19 | 2000-01-14 | Hitachi Ltd | ハンドリング装置 |
US6167322A (en) * | 1998-07-10 | 2000-12-26 | Holbrooks; Orville Ray | Intelligent wafer handling system and method |
IL143467A (en) * | 1998-12-02 | 2005-05-17 | Newport Corp | Specimen holding robotic arm and effector |
US6322312B1 (en) * | 1999-03-18 | 2001-11-27 | Applied Materials, Inc. | Mechanical gripper for wafer handling robots |
JP3957445B2 (ja) * | 1999-07-02 | 2007-08-15 | 東京エレクトロン株式会社 | 基板処理装置および基板処理方法 |
US6293713B1 (en) * | 1999-07-02 | 2001-09-25 | Tokyo Electron Limited | Substrate processing apparatus |
JP4547524B2 (ja) * | 2000-12-05 | 2010-09-22 | 川崎重工業株式会社 | ワーク処理方法、ワーク処理装置およびロボット |
JP2003124300A (ja) * | 2001-10-15 | 2003-04-25 | Tadamoto Tamai | クランプ装置及び伸縮アーム |
JP2005048877A (ja) * | 2003-07-29 | 2005-02-24 | Sumitomo Denko Brake Systems Kk | ブレーキキャリパ装置 |
-
2006
- 2006-04-07 CN CN2006800133558A patent/CN101164138B/zh not_active Expired - Fee Related
- 2006-04-07 KR KR20077025316A patent/KR100960765B1/ko not_active IP Right Cessation
- 2006-04-07 WO PCT/US2006/013164 patent/WO2006115745A1/en active Application Filing
- 2006-04-07 CN CN 201110080003 patent/CN102176425B/zh not_active Expired - Fee Related
- 2006-04-07 JP JP2008507704A patent/JP5265343B2/ja not_active Expired - Fee Related
- 2006-04-07 CN CN201210342380.8A patent/CN102867764B/zh not_active Expired - Fee Related
- 2006-04-19 TW TW95114022A patent/TWI345817B/zh not_active IP Right Cessation
-
2012
- 2012-09-05 JP JP2012195132A patent/JP5329705B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
WO2006115745A1 (en) | 2006-11-02 |
TWI345817B (en) | 2011-07-21 |
JP5329705B2 (ja) | 2013-10-30 |
CN101164138B (zh) | 2012-10-17 |
JP2008538654A (ja) | 2008-10-30 |
JP2013030787A (ja) | 2013-02-07 |
CN102867764A (zh) | 2013-01-09 |
CN101164138A (zh) | 2008-04-16 |
TW200707621A (en) | 2007-02-16 |
KR20070120175A (ko) | 2007-12-21 |
KR100960765B1 (ko) | 2010-06-01 |
CN102867764B (zh) | 2015-06-17 |
CN102176425A (zh) | 2011-09-07 |
CN102176425B (zh) | 2013-02-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5265343B2 (ja) | デカルトロボットクラスタツール構築 | |
US7798764B2 (en) | Substrate processing sequence in a cartesian robot cluster tool | |
US7374391B2 (en) | Substrate gripper for a substrate handling robot | |
US7651306B2 (en) | Cartesian robot cluster tool architecture | |
US20060182535A1 (en) | Cartesian robot design | |
US20080166210A1 (en) | Supinating cartesian robot blade | |
JP6179910B2 (ja) | 異なる保持エンドエフェクタを有する基板搬送装置 | |
US7819079B2 (en) | Cartesian cluster tool configuration for lithography type processes | |
US20180141762A1 (en) | Semiconductor wafer handling and transport | |
US20080232947A1 (en) | Semiconductor wafer handling and transport | |
US20180117771A1 (en) | Wafer swapper | |
TWI760024B (zh) | 用於處理晶圓的設備以及處理晶圓的方法 | |
TW202405992A (zh) | 具有機器人的淺深度設備前端模組 | |
CN118511269A (zh) | 用于高产能的嵌套式大气机械臂 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090325 |
|
RD03 | Notification of appointment of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7423 Effective date: 20101130 |
|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20101210 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120605 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120905 |
|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20120925 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20121016 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130111 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130212 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130318 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130409 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130501 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5265343 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |