TW200707621A - Cartesian robot cluster tool architecture - Google Patents
Cartesian robot cluster tool architectureInfo
- Publication number
- TW200707621A TW200707621A TW095114022A TW95114022A TW200707621A TW 200707621 A TW200707621 A TW 200707621A TW 095114022 A TW095114022 A TW 095114022A TW 95114022 A TW95114022 A TW 95114022A TW 200707621 A TW200707621 A TW 200707621A
- Authority
- TW
- Taiwan
- Prior art keywords
- processing
- cluster tool
- substrate
- racks
- various
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67184—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67178—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Abstract
A method and apparatus for processing substrates using a multi-chamber processing system that has an increased throughput, increased system reliability, improved device yield performance, a more repeatable wafer processing history, and a reduced footprint. The various embodiments of the cluster tool may utilize two or more robots that are configured in a parallel processing configuration to transfer substrates between the various processing chambers retained in the processing racks so that a desired processing sequence can be performed. In one aspect, the parallel processing configuration contains two or more robot assemblies that are adapted to move in vertical and horizontal directions, to access the various processing chambers retained in the processing racks. In one embodiment, a robot blade is adapted to restrain a substrate so that the accelerations experienced by the substrate during a transferring process will not cause the substrate position to change on the robot blade.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US67384805P | 2005-04-22 | 2005-04-22 | |
US11/315,984 US7651306B2 (en) | 2004-12-22 | 2005-12-22 | Cartesian robot cluster tool architecture |
US11/315,873 US7374391B2 (en) | 2005-12-22 | 2005-12-22 | Substrate gripper for a substrate handling robot |
US11/315,778 US20060182535A1 (en) | 2004-12-22 | 2005-12-22 | Cartesian robot design |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200707621A true TW200707621A (en) | 2007-02-16 |
TWI345817B TWI345817B (en) | 2011-07-21 |
Family
ID=36676525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95114022A TWI345817B (en) | 2005-04-22 | 2006-04-19 | Cartesian robot cluster tool architecture |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP5265343B2 (en) |
KR (1) | KR100960765B1 (en) |
CN (3) | CN101164138B (en) |
TW (1) | TWI345817B (en) |
WO (1) | WO2006115745A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI727579B (en) * | 2019-09-30 | 2021-05-11 | 大陸商瀋陽芯源微電子設備股份有限公司 | Photoresist coating and development apparatus |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100265287B1 (en) | 1998-04-21 | 2000-10-02 | 윤종용 | Multi-chamber system for etching equipment for manufacturing semiconductor device |
US7694688B2 (en) * | 2007-01-05 | 2010-04-13 | Applied Materials, Inc. | Wet clean system design |
US8636458B2 (en) * | 2007-06-06 | 2014-01-28 | Asml Netherlands B.V. | Integrated post-exposure bake track |
CN101332604B (en) * | 2008-06-20 | 2010-06-09 | 哈尔滨工业大学 | Control method of man machine interaction mechanical arm |
KR101803111B1 (en) * | 2010-01-08 | 2017-11-29 | 케이엘에이-텐코 코포레이션 | Dual tray carrier unit |
US9435826B2 (en) | 2012-05-08 | 2016-09-06 | Kla-Tencor Corporation | Variable spacing four-point probe pin device and method |
JP6182065B2 (en) * | 2013-12-27 | 2017-08-16 | 東京エレクトロン株式会社 | Substrate processing equipment |
JP2015207622A (en) * | 2014-04-18 | 2015-11-19 | 株式会社ディスコ | Carrying mechanism |
EP2947686A1 (en) * | 2014-05-19 | 2015-11-25 | Meyer Burger AG | Wafer processing method |
US9555545B2 (en) * | 2014-05-21 | 2017-01-31 | Bot & Dolly, Llc | Systems and methods for time-based parallel robotic operation |
JP6559976B2 (en) * | 2015-03-03 | 2019-08-14 | 川崎重工業株式会社 | Substrate transfer robot and substrate processing system |
KR102478317B1 (en) | 2015-04-08 | 2022-12-16 | 도쿄엘렉트론가부시키가이샤 | Substrate processing system |
JP6425639B2 (en) * | 2015-04-08 | 2018-11-21 | 東京エレクトロン株式会社 | Substrate processing system |
TWI602131B (en) * | 2016-05-26 | 2017-10-11 | 台灣積體電路製造股份有限公司 | Storage system and method for controlling the storage system |
KR101885257B1 (en) * | 2016-11-03 | 2018-08-03 | 포톤데이즈(주) | An Apparatus for Testing Optical Properties and Reliabilities of Photonic Devices with a Structure of a Plural of Magazines |
EP3361316A1 (en) | 2017-02-14 | 2018-08-15 | VAT Holding AG | Pneumatic pin lifting device and pneumatic lifting cylinder |
TWI678277B (en) * | 2017-03-21 | 2019-12-01 | 德律科技股份有限公司 | Barrier detection method and anti-collision method of pressing bed |
JP6902379B2 (en) * | 2017-03-31 | 2021-07-14 | 東京エレクトロン株式会社 | Processing system |
CN114026680A (en) * | 2019-02-14 | 2022-02-08 | 柿子技术公司 | Linear robot with double-link arm |
JP7536582B2 (en) | 2020-10-01 | 2024-08-20 | ニデックインスツルメンツ株式会社 | Transport System |
US20230150120A1 (en) * | 2021-11-17 | 2023-05-18 | Kawasaki Jukogyo Kabushiki Kaisha | Substrate Conveying Robot and Substrate Conveying Robot System |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08222616A (en) * | 1995-02-13 | 1996-08-30 | Dainippon Screen Mfg Co Ltd | Substrate processor |
US6318951B1 (en) * | 1999-07-09 | 2001-11-20 | Semitool, Inc. | Robots for microelectronic workpiece handling |
US6099643A (en) * | 1996-12-26 | 2000-08-08 | Dainippon Screen Mfg. Co., Ltd. | Apparatus for processing a substrate providing an efficient arrangement and atmospheric isolation of chemical treatment section |
JP2000012656A (en) * | 1998-06-19 | 2000-01-14 | Hitachi Ltd | Handling device |
US6167322A (en) * | 1998-07-10 | 2000-12-26 | Holbrooks; Orville Ray | Intelligent wafer handling system and method |
IL143467A (en) * | 1998-12-02 | 2005-05-17 | Newport Corp | Specimen holding robotic arm and effector |
US6322312B1 (en) * | 1999-03-18 | 2001-11-27 | Applied Materials, Inc. | Mechanical gripper for wafer handling robots |
JP3957445B2 (en) * | 1999-07-02 | 2007-08-15 | 東京エレクトロン株式会社 | Substrate processing apparatus and substrate processing method |
US6293713B1 (en) * | 1999-07-02 | 2001-09-25 | Tokyo Electron Limited | Substrate processing apparatus |
JP4547524B2 (en) * | 2000-12-05 | 2010-09-22 | 川崎重工業株式会社 | Work processing method, work processing apparatus and robot |
JP2003124300A (en) * | 2001-10-15 | 2003-04-25 | Tadamoto Tamai | Clamp device and expansion arm |
JP2005048877A (en) * | 2003-07-29 | 2005-02-24 | Sumitomo Denko Brake Systems Kk | Brake caliper device |
-
2006
- 2006-04-07 CN CN2006800133558A patent/CN101164138B/en not_active Expired - Fee Related
- 2006-04-07 KR KR20077025316A patent/KR100960765B1/en not_active IP Right Cessation
- 2006-04-07 WO PCT/US2006/013164 patent/WO2006115745A1/en active Application Filing
- 2006-04-07 CN CN 201110080003 patent/CN102176425B/en not_active Expired - Fee Related
- 2006-04-07 JP JP2008507704A patent/JP5265343B2/en not_active Expired - Fee Related
- 2006-04-07 CN CN201210342380.8A patent/CN102867764B/en not_active Expired - Fee Related
- 2006-04-19 TW TW95114022A patent/TWI345817B/en not_active IP Right Cessation
-
2012
- 2012-09-05 JP JP2012195132A patent/JP5329705B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI727579B (en) * | 2019-09-30 | 2021-05-11 | 大陸商瀋陽芯源微電子設備股份有限公司 | Photoresist coating and development apparatus |
Also Published As
Publication number | Publication date |
---|---|
WO2006115745A1 (en) | 2006-11-02 |
TWI345817B (en) | 2011-07-21 |
JP5329705B2 (en) | 2013-10-30 |
CN101164138B (en) | 2012-10-17 |
JP2008538654A (en) | 2008-10-30 |
JP2013030787A (en) | 2013-02-07 |
CN102867764A (en) | 2013-01-09 |
CN101164138A (en) | 2008-04-16 |
JP5265343B2 (en) | 2013-08-14 |
KR20070120175A (en) | 2007-12-21 |
KR100960765B1 (en) | 2010-06-01 |
CN102867764B (en) | 2015-06-17 |
CN102176425A (en) | 2011-09-07 |
CN102176425B (en) | 2013-02-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |