JP5263204B2 - Ｘ線検査装置およびｘ線検査方法 - Google Patents

Ｘ線検査装置およびｘ線検査方法 Download PDF

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Publication number
JP5263204B2
JP5263204B2 JP2010057524A JP2010057524A JP5263204B2 JP 5263204 B2 JP5263204 B2 JP 5263204B2 JP 2010057524 A JP2010057524 A JP 2010057524A JP 2010057524 A JP2010057524 A JP 2010057524A JP 5263204 B2 JP5263204 B2 JP 5263204B2
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ray
ray detector
imaging
detector
inspection
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JP2010133982A5 (enExample
JP2010133982A (ja
Inventor
真之 益田
訓之 加藤
信治 杉田
剛 松波
泰 佐々木
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Omron Corp
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Omron Corp
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JP2010057524A 2010-03-15 2010-03-15 Ｘ線検査装置およびｘ線検査方法 Active JP5263204B2 (ja)

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JP2010057524A JP5263204B2 (ja) 2010-03-15 2010-03-15 Ｘ線検査装置およびｘ線検査方法

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JP2010057524A JP5263204B2 (ja) 2010-03-15 2010-03-15 Ｘ線検査装置およびｘ線検査方法

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JP2007337572A Division JP5167810B2 (ja) 2007-12-27 2007-12-27 Ｘ線検査装置

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JP2010133982A JP2010133982A (ja) 2010-06-17
JP2010133982A5 JP2010133982A5 (enExample) 2012-10-11
JP5263204B2 true JP5263204B2 (ja) 2013-08-14

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015072338A1 (ja) 2013-11-14 2015-05-21 オムロン株式会社 データ構造、ライブラリ作成装置、電子機器分析装置、ライブラリ提供システム

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9561008B2 (en) 2010-12-28 2017-02-07 General Electric Company Method of displaying image
KR102097508B1 (ko) * 2018-04-11 2020-04-06 한국원자력연구원 비파괴 검사 장치

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03186710A (ja) * 1989-12-18 1991-08-14 Hitachi Ltd Ｘ線断層撮影方法とその装置並びにｘ線発生用ターゲット
JPH0855887A (ja) * 1994-08-10 1996-02-27 Toshiba Corp ラミノグラフ
JPH11133200A (ja) * 1997-10-30 1999-05-21 Nippon Telegr & Teleph Corp <Ntt> Ｘ線走査顕微方法及び顕微鏡
JPH11326242A (ja) * 1998-05-18 1999-11-26 Matsushita Electric Ind Co Ltd Ｘ線検査装置
JP2000046760A (ja) * 1998-05-29 2000-02-18 Shimadzu Corp Ｘ線断層面検査装置
JP4590702B2 (ja) * 2000-08-31 2010-12-01 パナソニック株式会社 Ｘ線検査装置
JP2006162335A (ja) * 2004-12-03 2006-06-22 Nagoya Electric Works Co Ltd Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015072338A1 (ja) 2013-11-14 2015-05-21 オムロン株式会社 データ構造、ライブラリ作成装置、電子機器分析装置、ライブラリ提供システム

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