JP5263204B2 - Ｘ線検査装置およびｘ線検査方法 - Google Patents
Ｘ線検査装置およびｘ線検査方法 Download PDFInfo
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- JP5263204B2 JP5263204B2 JP2010057524A JP2010057524A JP5263204B2 JP 5263204 B2 JP5263204 B2 JP 5263204B2 JP 2010057524 A JP2010057524 A JP 2010057524A JP 2010057524 A JP2010057524 A JP 2010057524A JP 5263204 B2 JP5263204 B2 JP 5263204B2
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010057524A JP5263204B2 (ja) | 2010-03-15 | 2010-03-15 | Ｘ線検査装置およびｘ線検査方法 |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010057524A JP5263204B2 (ja) | 2010-03-15 | 2010-03-15 | Ｘ線検査装置およびｘ線検査方法 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007337572A Division JP5167810B2 (ja) | 2007-12-27 | 2007-12-27 | Ｘ線検査装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010133982A JP2010133982A (ja) | 2010-06-17 |
| JP2010133982A5 JP2010133982A5 (enExample) | 2012-10-11 |
| JP5263204B2 true JP5263204B2 (ja) | 2013-08-14 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010057524A Active JP5263204B2 (ja) | 2010-03-15 | 2010-03-15 | Ｘ線検査装置およびｘ線検査方法 |
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| Country | Link |
|---|---|
| JP (1) | JP5263204B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015072338A1 (ja) | 2013-11-14 | 2015-05-21 | オムロン株式会社 | データ構造、ライブラリ作成装置、電子機器分析装置、ライブラリ提供システム |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9561008B2 (en) | 2010-12-28 | 2017-02-07 | General Electric Company | Method of displaying image |
| KR102097508B1 (ko) * | 2018-04-11 | 2020-04-06 | 한국원자력연구원 | 비파괴 검사 장치 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03186710A (ja) * | 1989-12-18 | 1991-08-14 | Hitachi Ltd | Ｘ線断層撮影方法とその装置並びにｘ線発生用ターゲット |
| JPH0855887A (ja) * | 1994-08-10 | 1996-02-27 | Toshiba Corp | ラミノグラフ |
| JPH11133200A (ja) * | 1997-10-30 | 1999-05-21 | Nippon Telegr & Teleph Corp <Ntt> | Ｘ線走査顕微方法及び顕微鏡 |
| JPH11326242A (ja) * | 1998-05-18 | 1999-11-26 | Matsushita Electric Ind Co Ltd | Ｘ線検査装置 |
| JP2000046760A (ja) * | 1998-05-29 | 2000-02-18 | Shimadzu Corp | Ｘ線断層面検査装置 |
| JP4590702B2 (ja) * | 2000-08-31 | 2010-12-01 | パナソニック株式会社 | Ｘ線検査装置 |
| JP2006162335A (ja) * | 2004-12-03 | 2006-06-22 | Nagoya Electric Works Co Ltd | Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム |
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2010
- 2010-03-15 JP JP2010057524A patent/JP5263204B2/ja active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015072338A1 (ja) | 2013-11-14 | 2015-05-21 | オムロン株式会社 | データ構造、ライブラリ作成装置、電子機器分析装置、ライブラリ提供システム |
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| Publication number | Publication date |
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| JP2010133982A (ja) | 2010-06-17 |
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