JP5256745B2 - 三次元形状計測装置 - Google Patents

三次元形状計測装置 Download PDF

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Publication number
JP5256745B2
JP5256745B2 JP2008007827A JP2008007827A JP5256745B2 JP 5256745 B2 JP5256745 B2 JP 5256745B2 JP 2008007827 A JP2008007827 A JP 2008007827A JP 2008007827 A JP2008007827 A JP 2008007827A JP 5256745 B2 JP5256745 B2 JP 5256745B2
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dimensional shape
unit
shape measuring
measuring apparatus
luminance
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Japanese (ja)
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JP2009168658A5 (zh
JP2009168658A (ja
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洋文 有馬
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Nikon Corp
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Nikon Corp
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JP2008007827A 2008-01-17 2008-01-17 三次元形状計測装置 Active JP5256745B2 (ja)

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JP2008007827A JP5256745B2 (ja) 2008-01-17 2008-01-17 三次元形状計測装置

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JP2008007827A JP5256745B2 (ja) 2008-01-17 2008-01-17 三次元形状計測装置

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JP2009168658A JP2009168658A (ja) 2009-07-30
JP2009168658A5 JP2009168658A5 (zh) 2011-05-12
JP5256745B2 true JP5256745B2 (ja) 2013-08-07

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110645912A (zh) * 2019-10-11 2020-01-03 哈尔滨理工大学 一种机器视觉全景测量系统及测量方法
JP7334153B2 (ja) 2017-11-30 2023-08-28 ライカ マイクロシステムズ リミテッド シャンハイ モーター化されたミクロトームのコントロール

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9267784B2 (en) * 2013-07-15 2016-02-23 Faro Technologies, Inc. Laser line probe having improved high dynamic range
JP6267486B2 (ja) * 2013-10-30 2018-01-24 キヤノン株式会社 画像処理装置、画像処理方法
EP2869023B1 (en) 2013-10-30 2018-06-13 Canon Kabushiki Kaisha Image processing apparatus, image processing method and corresponding computer program
US9531967B2 (en) 2013-12-31 2016-12-27 Faro Technologies, Inc. Dynamic range of a line scanner having a photosensitive array that provides variable exposure
US9658061B2 (en) 2013-12-31 2017-05-23 Faro Technologies, Inc. Line scanner that uses a color image sensor to improve dynamic range
JP2017083234A (ja) 2015-10-26 2017-05-18 オムロン株式会社 三次元形状計測装置、三次元形状計測システム、プログラム、コンピュータ読み取り可能な記録媒体、および三次元形状計測方法
JP6604514B2 (ja) * 2016-02-26 2019-11-13 株式会社東京精密 表面形状測定装置及び表面形状測定方法
JP6770254B2 (ja) * 2018-02-07 2020-10-14 オムロン株式会社 ３次元測定装置、３次元測定方法及び３次元測定プログラム
US11054546B2 (en) 2018-07-16 2021-07-06 Faro Technologies, Inc. Laser scanner with enhanced dymanic range imaging
CN110567375A (zh) * 2019-10-11 2019-12-13 哈尔滨理工大学 一种多工件并行视觉测量的精密滑台

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0526638A (ja) * 1991-07-23 1993-02-02 Mitsubishi Heavy Ind Ltd 三次元形状認識装置
JPH05340727A (ja) * 1992-06-05 1993-12-21 Yunisun:Kk 三次元形状計測装置
JPH08201023A (ja) * 1995-01-31 1996-08-09 Minolta Co Ltd 三次元計測装置
JPH10124646A (ja) * 1996-10-17 1998-05-15 Minolta Co Ltd ３次元計測装置
JPH10103937A (ja) * 1996-09-27 1998-04-24 Nachi Fujikoshi Corp レーザー光の光軸傾斜測定方法及びその装置
JP3873401B2 (ja) * 1996-11-19 2007-01-24 コニカミノルタセンシング株式会社 ３次元計測システム
JPH11125508A (ja) * 1997-10-21 1999-05-11 Toyota Central Res & Dev Lab Inc 断面形状測定方法
JP3575693B2 (ja) * 2001-03-25 2004-10-13 オムロン株式会社 光学式計測装置
JP2007271519A (ja) * 2006-03-31 2007-10-18 Sunx Ltd 変位センサ及び形状測定システム
JP2007327875A (ja) * 2006-06-08 2007-12-20 Mitsubishi Heavy Ind Ltd 位置検出装置および天秤装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7334153B2 (ja) 2017-11-30 2023-08-28 ライカ マイクロシステムズ リミテッド シャンハイ モーター化されたミクロトームのコントロール
CN110645912A (zh) * 2019-10-11 2020-01-03 哈尔滨理工大学 一种机器视觉全景测量系统及测量方法

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