JP5138156B2 - 計算機式断層写真法(ct)検出器の製造方法 - Google Patents
計算機式断層写真法(ct)検出器の製造方法 Download PDFInfo
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- JP5138156B2 JP5138156B2 JP2005134870A JP2005134870A JP5138156B2 JP 5138156 B2 JP5138156 B2 JP 5138156B2 JP 2005134870 A JP2005134870 A JP 2005134870A JP 2005134870 A JP2005134870 A JP 2005134870A JP 5138156 B2 JP5138156 B2 JP 5138156B2
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- 238000004519 manufacturing process Methods 0.000 title claims description 10
- 238000003325 tomography Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 claims description 85
- 239000000463 material Substances 0.000 claims description 28
- 238000000034 method Methods 0.000 claims description 27
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 claims description 23
- 238000006243 chemical reaction Methods 0.000 claims description 22
- 238000003384 imaging method Methods 0.000 claims description 19
- 230000005855 radiation Effects 0.000 claims description 15
- 238000012512 characterization method Methods 0.000 claims description 2
- 238000001451 molecular beam epitaxy Methods 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 100
- 238000002591 computed tomography Methods 0.000 description 28
- 230000004907 flux Effects 0.000 description 14
- 238000003491 array Methods 0.000 description 11
- 238000001465 metallisation Methods 0.000 description 11
- 239000000758 substrate Substances 0.000 description 10
- 239000010408 film Substances 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 230000007246 mechanism Effects 0.000 description 5
- 239000002356 single layer Substances 0.000 description 5
- 230000002238 attenuated effect Effects 0.000 description 4
- 239000002131 composite material Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 238000013170 computed tomography imaging Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 239000002872 contrast media Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000002059 diagnostic imaging Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- CVOFKRWYWCSDMA-UHFFFAOYSA-N 2-chloro-n-(2,6-diethylphenyl)-n-(methoxymethyl)acetamide;2,6-dinitro-n,n-dipropyl-4-(trifluoromethyl)aniline Chemical compound CCC1=CC=CC(CC)=C1N(COC)C(=O)CCl.CCCN(CCC)C1=C([N+]([O-])=O)C=C(C(F)(F)F)C=C1[N+]([O-])=O CVOFKRWYWCSDMA-UHFFFAOYSA-N 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 201000010099 disease Diseases 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 239000002355 dual-layer Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- 239000011104 metalized film Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/242—Stacked detectors, e.g. for depth information
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Light Receiving Elements (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
この定義から、厚みL=0.3cm及び電場Vを1000V/cmとし、μeを約1000とすると、100万個の最大計数速度を達成することができる。換言すると、3mm厚のCZT半導体層の計数速度は、100万個/秒の範囲の計数速度性能であり得る。しかしながら、後述するように、単一の比較的厚い層ではなく多数の層を備えた直接変換型半導体検出器を構築することにより、計数速度性能を高めることができる。
12、128 ガントリ
14 X線源
16 X線ビーム
18、134 検出器アセンブリ
20、20a、20b、20c、20d 検出器
22 患者
24 回転中心
26 制御機構
42 表示器
46 モータ式テーブル
48、130 ガントリ開口
50 検出器素子
52 セル型アレイ
54、56 スイッチ・アレイ
58 可撓性電気インタフェイス
60 検出器フレーム
62 装着用ブラケット(図4)
62 第一の半導体層(図6)
64 第二の半導体層
65 検出器素子(電気接点)
66、68、80、82、87、89、91、118 高電圧電極
67、69、78 二次元接点アレイ
74、76、84、86、88、90、96、98、100、102 半導体層
92、94 導電路
93、95、116 収集接点アレイ
104、106、108 高電圧印加用導電層
110、112 信号収集接点を含む層
114 半導体物質
120 孔
122 信号供給経路
124 収集接点
126 小荷物/手荷物検査システム
132 高周波電磁エネルギ源
136 コンベヤ・システム
138 コンベヤ・ベルト
140 支持構造
142 小荷物又は手荷物
Claims (11)
- 放射線撮像用の直接変換型検出器を製造する方法であって、
X線(16)を電気信号へ直接変換するように設計されている半導体物質の複数の層(62、64)を設けるステップと、
前記複数の層(62、64)の少なくとも1つに、複数の孔(120)を形成するステップと、
前記複数の孔(120)に導電路(122)を形成するステップと、
半導体物質の各々の層(62、64)の少なくともX線入射面に導電性フィルム層を固着させるステップと、
前記半導体物質の複数の層(62、64)を、各々の層が少なくとも2層の導電性フィルム層に挟まれて接触するようにして積層体として構成するステップと、
を備え、
前記少なくとも2層の導電性フィルム層の一方から前記半導体層に電圧を印加する電圧電極層が形成され、
前記少なくとも2層の導電性フィルム層の他方から前記半導体層から電気信号を収集する電気接点が形成され、
前記導電路(122)は、前記電圧電極層と接触しないように配置される、
方法。 - 前記固着させるステップは、半導体物質の各々の層(62、64)の少なくともX線入射面を金属化して前記導電性フィルム層を形成するステップを含んでいる、請求項1に記載の方法。
- 前記設けるステップは、テルル化カドミウム亜鉛(CZT)層から半導体物質の各々の層(62、64)を成長させるステップを含んでいる、請求項1または2に記載の方法。
- 前記成長させるステップは、各々のテルル化カドミウム亜鉛層を成長させるために分子ビーム・エピタキシを用いるステップを含んでいる、請求項3に記載の方法。
- 1層の半導体物質(62、64)の前記X線入射面に対する裏面に導電性フィルムを固着させるステップをさらに含んでいる請求項1乃至4のいずれかに記載の方法。
- 前記複数の層を積層体として構成するステップは、前記複数の層を、導電性フィルムの2面の表面を有する前記層(64)がX線源(14)から最も遠い側に配置されるようにして互いに接合するステップを含んでいる、請求項5に記載の方法。
- 前記構成するステップは、前記複数の層(62、64)を、各々の層(62、64)が高電圧(HV)接続フィルム層(66、68)及び信号収集フィルム層に接触するようにして、互いに対して配置するステップを含んでいる、請求項1乃至6のいずれかに記載の方法。
- 前記導電路(122)を形成するステップは、
前記積層体の前記複数の層(62、64)を接合するために前記複数の孔(120)を金属化するステップと、
を含んでいる、請求項1乃至7のいずれかに記載の方法。 - 前記複数の層は、少なくとも3層の半導体層(96、98、100)を含んでいる、請求項1乃至8のいずれかに記載の方法。
- 前記検出器は、解剖学的詳細及び組織特徴評価を与える単一の画像になるように処理され得る電気信号へX線を直接変換するように構成されている、請求項1乃至9のいずれかに記載の方法。
- 前記半導体物質の複数の層(62、64)のうち、X線により近く配置される半導体物質の層(62)が、前記X線により遠く配置される半導体物質の層(62)よりも薄い厚さを有している、請求項1乃至10のいずれかに記載の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/842,978 US6953935B1 (en) | 2004-05-11 | 2004-05-11 | CT detector fabrication process |
US10/842,978 | 2004-05-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006013451A JP2006013451A (ja) | 2006-01-12 |
JP5138156B2 true JP5138156B2 (ja) | 2013-02-06 |
Family
ID=35057275
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Application Number | Title | Priority Date | Filing Date |
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JP2005134870A Active JP5138156B2 (ja) | 2004-05-11 | 2005-05-06 | 計算機式断層写真法(ct)検出器の製造方法 |
Country Status (4)
Country | Link |
---|---|
US (2) | US6953935B1 (ja) |
JP (1) | JP5138156B2 (ja) |
CN (1) | CN100486524C (ja) |
DE (1) | DE102005022496A1 (ja) |
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-
2004
- 2004-05-11 US US10/842,978 patent/US6953935B1/en not_active Expired - Lifetime
-
2005
- 2005-05-06 JP JP2005134870A patent/JP5138156B2/ja active Active
- 2005-05-08 CN CN200510071428.6A patent/CN100486524C/zh active Active
- 2005-05-11 DE DE102005022496A patent/DE102005022496A1/de not_active Withdrawn
- 2005-06-09 US US11/160,112 patent/US7034313B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
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US6953935B1 (en) | 2005-10-11 |
CN100486524C (zh) | 2009-05-13 |
US20050253079A1 (en) | 2005-11-17 |
CN1695558A (zh) | 2005-11-16 |
JP2006013451A (ja) | 2006-01-12 |
US7034313B2 (en) | 2006-04-25 |
DE102005022496A1 (de) | 2005-12-01 |
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