JP5690044B2 - エネルギ識別データを自在にまとめる検出器及び、ctイメージング・システム - Google Patents
エネルギ識別データを自在にまとめる検出器及び、ctイメージング・システム Download PDFInfo
- Publication number
- JP5690044B2 JP5690044B2 JP2008240109A JP2008240109A JP5690044B2 JP 5690044 B2 JP5690044 B2 JP 5690044B2 JP 2008240109 A JP2008240109 A JP 2008240109A JP 2008240109 A JP2008240109 A JP 2008240109A JP 5690044 B2 JP5690044 B2 JP 5690044B2
- Authority
- JP
- Japan
- Prior art keywords
- detector
- pixel
- charge
- pixels
- array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000013170 computed tomography imaging Methods 0.000 title claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 43
- 239000000463 material Substances 0.000 claims description 39
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 12
- 229910052710 silicon Inorganic materials 0.000 claims description 12
- 239000010703 silicon Substances 0.000 claims description 12
- 238000003384 imaging method Methods 0.000 claims description 11
- 230000005611 electricity Effects 0.000 claims 1
- 230000004907 flux Effects 0.000 description 46
- 238000002591 computed tomography Methods 0.000 description 29
- 239000000758 substrate Substances 0.000 description 26
- 239000004065 semiconductor Substances 0.000 description 16
- 238000000034 method Methods 0.000 description 9
- 239000000853 adhesive Substances 0.000 description 8
- 230000001070 adhesive effect Effects 0.000 description 8
- 239000004020 conductor Substances 0.000 description 8
- 230000008878 coupling Effects 0.000 description 6
- 238000010168 coupling process Methods 0.000 description 6
- 238000005859 coupling reaction Methods 0.000 description 6
- 239000013078 crystal Substances 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 5
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 4
- 230000002238 attenuated effect Effects 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 3
- 229910010293 ceramic material Inorganic materials 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000003822 epoxy resin Substances 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 238000001465 metallisation Methods 0.000 description 3
- 229920000647 polyepoxide Polymers 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- FRWYFWZENXDZMU-UHFFFAOYSA-N 2-iodoquinoline Chemical compound C1=CC=CC2=NC(I)=CC=C21 FRWYFWZENXDZMU-UHFFFAOYSA-N 0.000 description 2
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- LTPBRCUWZOMYOC-UHFFFAOYSA-N beryllium oxide Inorganic materials O=[Be] LTPBRCUWZOMYOC-UHFFFAOYSA-N 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 239000002872 contrast media Substances 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000002059 diagnostic imaging Methods 0.000 description 2
- 229910052740 iodine Inorganic materials 0.000 description 2
- 239000011630 iodine Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000011156 metal matrix composite Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- CVOFKRWYWCSDMA-UHFFFAOYSA-N 2-chloro-n-(2,6-diethylphenyl)-n-(methoxymethyl)acetamide;2,6-dinitro-n,n-dipropyl-4-(trifluoromethyl)aniline Chemical compound CCC1=CC=CC(CC)=C1N(COC)C(=O)CCl.CCCN(CCC)C1=C([N+]([O-])=O)C=C(C(F)(F)F)C=C1[N+]([O-])=O CVOFKRWYWCSDMA-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- 238000000441 X-ray spectroscopy Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 201000010099 disease Diseases 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000007170 pathology Effects 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000002311 subsequent effect Effects 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
12 ガントリ
14 X線源
16 X線のビーム
17 レール
18 検出器アセンブリ又はコリメータ
19 コリメート用ブレード又はプレート
20 複数の検出器
22 患者
24 回転中心
26 制御機構
28 X線制御器
30 ガントリ・モータ制御器
32 取得システム(DAS)
34 画像再構成器
36 コンピュータ
38 大容量記憶装置
40 コンソールを介した操作者
42 付設されている表示器
44 テーブル・モータ制御器
46 電動テーブル
48 ガントリ開口
50 ピクセル素子
51 パック
52 ピン
53 背面照射型ダイオード・アレイ
54 多層基材
55 スペーサ
56 軟質回路
57 面
59 複数のダイオード
60 半導体層
62 アノード又は接点
64 2Dアレイ
65 直接変換物質
66 隣接した高電圧電極
78 パターン
80、82、84、86 読み出し線
90、92、94 スイッチ
100、102、104 第一のノード
106、108、110 第二のノード
120、122、124、126 読み出し線
130、132、134、136 電荷共有領域
200 ピクセルのアレイ
201 角
202 第一のピクセル
204 複数のピクセル
208 大きい単一ピクセル
209 第一のDAS
210、212 電線
211 DAS IC
220 ピクセル
222 第一のピクセル
224 複数のピクセル
228 大きい単一ピクセル
230、232 電線
300 FETスイッチ
302 絶縁層
304 シリコンの表面
306 ゲート制御
308 接点材料
310 第一の伝導性物質
312 伝導性経路又はバイア
314 第二の伝導性物質
316 パッド又は接点
400 検出器モジュール
402 直接変換層
404 電子的にピクセル化された構造又はアノード
406 高電圧電極
408 2Dアレイ
410、420 隆起接着
412 内挿基板
414 パターン
415 軟質回路
416 アレイ
418 接着パッド
422 基材
424 DAS読み出し装置又は集積回路
444 検出器の一部
450 内挿基板
452 スイッチング素子
460 検出器
462 内挿基板
464 接着パッドのアレイ
466 軟質回路
468 一致アレイ
470 隆起接着
472 基材
474 スイッチング素子
510 小荷物/手荷物検査システム
512 回転ガントリ
514 開口
516 高周波電磁エネルギ源
518 検出器アセンブリ
520 コンベヤ・システム
522 コンベヤ・ベルト
524 構造
526 小荷物又は手荷物
Claims (5)
- 上面と底面とを有し、X線の受光時に電荷を発生するように構成されている直接変換物質(65)と、
該直接変換物質(65)の前記底面に結合し、2Dアレイとして配置され、前記直接変換物質(65)において発生された電荷を収集するように構成されている複数の金属化アノード(62)と、
少なくとも1個の読み出し装置(32、424)と、
前記直接変換物質(65)の前記底面に沿って配置され、前記複数の金属化アノード(62)から前記少なくとも1個の読み出し装置(424)へ前記電荷を送るように構成されている複数の電気経路(120、122、124、126)を有する再分配層(414、450、466)と、
前記直接変換物質(65)の前記底面に沿って配置され、前記再分配層(414、450、466)と前記複数の金属化アノード(62)との間に配置されたシリコン層(412、462)と、
を備えた撮像検出器(20)であって、
前記再分配層(414、450、466)は、前記シリコン層(412、462)と前記少なくとも1個の読み出し装置(32、424)との間に配置されており前記電気経路を内部に有している軟質回路を備え、
前記シリコン層(412、462)は、前記複数の金属化アノード(62)と前記少なくとも1個の読み出し装置(32、424)との間の前記複数の電気経路(120、122、124、126)に結合され、少なくとも1つのバイアを備える複数のスイッチ(90、92、94)を備え、
前記複数のスイッチ(90、92、94)の各々が、
前記シリコン層(412、462)に埋め込まれており、
前記複数の金属化アノード(62)の1個に電気的に結合された入力線と、
前記少なくとも1個の読み出し装置(32、424)の入力チャンネル及び前記複数の金属化アノード(62)に電気的に結合された第一の出力ノード(104)と、
前記複数のスイッチ(90、92、94)の少なくとも1個の他のスイッチに電気的に結合された第二の出力ノード(110)とを含んでいる、
撮像検出器(20)。 - 前記少なくとも1個の他のスイッチは、前記複数の金属化アノード(62)の隣接する金属化アノード又は少なくとも1個の読み出し装置(32、424)に電気的に結合されている、請求項1に記載の検出器(20)。
- 前記複数のスイッチはFETである、請求項1または2に記載の検出器(20)。
- 前記電荷は、前記複数の金属化アノードと前記少なくとも1個の読み出し装置との間でディザされすなわちインタリーブされて異なるDAS ICへ導かれる、請求項1乃至3のいずれかに記載の検出器(20)。
- 請求項1乃至4のいずれかに記載の検出器(20)と、
前記検出器(20)に向かってX線のビーム(16)を投射するX線源(14)と、
を備える、CTイメージング・システム(10)。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/861,826 | 2007-09-26 | ||
US11/861,826 US7916836B2 (en) | 2007-09-26 | 2007-09-26 | Method and apparatus for flexibly binning energy discriminating data |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009078143A JP2009078143A (ja) | 2009-04-16 |
JP5690044B2 true JP5690044B2 (ja) | 2015-03-25 |
Family
ID=40471592
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008240109A Active JP5690044B2 (ja) | 2007-09-26 | 2008-09-19 | エネルギ識別データを自在にまとめる検出器及び、ctイメージング・システム |
Country Status (2)
Country | Link |
---|---|
US (1) | US7916836B2 (ja) |
JP (1) | JP5690044B2 (ja) |
Families Citing this family (51)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010038877A1 (ja) * | 2008-10-03 | 2010-04-08 | 株式会社 東芝 | 放射線検出装置及び放射線撮影装置 |
US20100327173A1 (en) * | 2009-06-29 | 2010-12-30 | Charles Gerard Woychik | Integrated Direct Conversion Detector Module |
EP2459069B1 (en) * | 2009-07-29 | 2013-06-19 | Koninklijke Philips Electronics N.V. | X-ray examination device and method |
US8563938B2 (en) * | 2009-12-03 | 2013-10-22 | General Electric Company | Detector assembly of a digital X-ray detector |
JP2011221290A (ja) * | 2010-04-09 | 2011-11-04 | Olympus Corp | 撮像装置及びカメラ |
RU2578252C2 (ru) * | 2011-01-17 | 2016-03-27 | Конинклейке Филипс Электроникс Н.В. | Пиксель детектора со счетом фотонов, который имеет анод, содержащий два или более поочередно выбираемых и раздельных под-анода |
US20120193545A1 (en) * | 2011-01-31 | 2012-08-02 | General Electric Company | Detector systems with anode incidence face and methods of fabricating the same |
DE102011077859B4 (de) | 2011-06-21 | 2014-01-23 | Siemens Aktiengesellschaft | Quantenzählender Strahlungsdetektor |
US9612606B2 (en) * | 2012-05-15 | 2017-04-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bandgap reference circuit |
WO2013191001A1 (ja) * | 2012-06-20 | 2013-12-27 | 株式会社日立メディコ | X線ct装置 |
US9510792B2 (en) * | 2013-05-17 | 2016-12-06 | Toshiba Medical Systems Corporation | Apparatus and method for collimating X-rays in spectral computer tomography imaging |
WO2014196479A1 (ja) | 2013-06-06 | 2014-12-11 | 株式会社 東芝 | フォトンカウンティング装置 |
JP6415867B2 (ja) | 2013-06-20 | 2018-10-31 | キヤノンメディカルシステムズ株式会社 | X線ct装置及び医用画像診断装置 |
JP6618667B2 (ja) * | 2013-10-18 | 2019-12-11 | キヤノンメディカルシステムズ株式会社 | X線ct装置 |
EP2871496B1 (en) | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
US10117628B2 (en) * | 2014-10-01 | 2018-11-06 | Toshiba Medical Systems Corporation | Photon counting apparatus |
US10463324B2 (en) * | 2014-10-06 | 2019-11-05 | Canon Medical Systems Corporation | Photon-counting detector with count-rate dependent multiplexing |
WO2016059830A1 (ja) * | 2014-10-16 | 2016-04-21 | 株式会社 日立メディコ | 放射線検出器、放射線撮像装置、コンピュータ断層撮影装置および放射線検出方法 |
JP6126758B1 (ja) | 2014-10-31 | 2017-05-10 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 放射線信号を検出するためのセンサ装置及び画像化システム |
US10126254B2 (en) | 2014-12-18 | 2018-11-13 | Toshiba Medical Systems Corporation | Non-uniform photon-counting detector array on a fourth-generation ring to achieve uniform noise and spectral performance in Z-direction |
US9907517B2 (en) | 2015-02-20 | 2018-03-06 | Toshiba Medical Systems Corporation | X-ray computed tomography apparatus and X-ray detector |
US9757085B2 (en) * | 2015-02-25 | 2017-09-12 | Toshiba Medical Systems Corporation | Method for identifying and processing detector polarization in photon-counting spectral X-ray detectors |
CN107533146B (zh) | 2015-04-07 | 2019-06-18 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器 |
DE102015208905A1 (de) | 2015-05-13 | 2016-11-17 | Siemens Healthcare Gmbh | Verfahren zum Erzeugen eines Bildes |
WO2017009736A1 (en) * | 2015-07-13 | 2017-01-19 | Koninklijke Philips N.V. | High energy resolution / high x-ray flux photon counting detector |
US10117626B2 (en) | 2015-09-29 | 2018-11-06 | General Electric Company | Apparatus and method for pile-up correction in photon-counting detector |
JP6456854B2 (ja) | 2016-01-12 | 2019-01-23 | 株式会社日立製作所 | 放射線撮像装置 |
US10571579B2 (en) * | 2016-01-22 | 2020-02-25 | General Electric Company | Dual-mode radiation detector |
JP6870920B2 (ja) | 2016-05-19 | 2021-05-12 | キヤノンメディカルシステムズ株式会社 | X線ct装置及びx線検出装置 |
US10868074B2 (en) | 2016-07-14 | 2020-12-15 | Koninklijke Philips N.V. | Detector module, detector, imaging apparatus and method of manufacturing a detector module |
US10398394B2 (en) | 2017-01-06 | 2019-09-03 | General Electric Company | Energy-discriminating photon-counting detector and the use thereof |
JP6822859B2 (ja) * | 2017-01-24 | 2021-01-27 | キヤノンメディカルシステムズ株式会社 | 検出装置及び検出方法 |
US10162066B2 (en) | 2017-02-06 | 2018-12-25 | General Electric Company | Coincidence-enabling photon-counting detector |
JP6873739B2 (ja) | 2017-02-24 | 2021-05-19 | キヤノンメディカルシステムズ株式会社 | X線コンピュータ断層撮影装置およびx線検出器 |
JP7179479B2 (ja) * | 2017-04-13 | 2022-11-29 | キヤノンメディカルシステムズ株式会社 | X線ct装置 |
WO2019053173A1 (en) | 2017-09-18 | 2019-03-21 | Asml Netherlands B.V. | USER PROGRAMMABLE DETECTOR NETWORK |
CN116417313A (zh) * | 2017-09-18 | 2023-07-11 | Asml荷兰有限公司 | 针对射束图像系统的开关矩阵设计 |
US10324202B1 (en) * | 2018-01-02 | 2019-06-18 | General Electric Company | Systems and methods for collecting radiation detection |
EP3508887A1 (en) * | 2018-01-09 | 2019-07-10 | Koninklijke Philips N.V. | Charge sharing calibration method and system |
DE102018200845B4 (de) * | 2018-01-19 | 2021-05-06 | Siemens Healthcare Gmbh | Montageverfahren für die Herstellung eines Röntgendetektors, Röntgendetektor und Röntgengerät |
JP2019164088A (ja) * | 2018-03-20 | 2019-09-26 | 株式会社イシダ | X線検査装置 |
EP3605044B1 (en) | 2018-08-02 | 2023-07-26 | Bruker Nano GmbH | Detector, methods for operating a detector and detector pixel circuit |
JP7166833B2 (ja) * | 2018-08-03 | 2022-11-08 | キヤノンメディカルシステムズ株式会社 | 放射線検出器及び放射線検出器モジュール |
KR102567134B1 (ko) * | 2018-10-01 | 2023-08-16 | 삼성전자주식회사 | 엑스선 조사량 측정 장치, 이를 포함하는 반도체 메모리 장치 및 반도체 메모리 장치의 테스트 방법 |
JP2019072506A (ja) * | 2018-12-11 | 2019-05-16 | キヤノンメディカルシステムズ株式会社 | X線ct装置 |
US11547378B2 (en) * | 2019-07-11 | 2023-01-10 | Canon Medical Systems Corporation | Apparatus and method combining deep learning (DL) with an X-ray computed tomography (CT) scanner having a multi-resolution detector |
EP4150380A1 (en) * | 2020-05-13 | 2023-03-22 | Dectris AG | Radiation detector and method of manufacture thereof |
US11229413B1 (en) | 2020-07-02 | 2022-01-25 | Canon Medical Systems Corporation | X-ray CT apparatus with adaptive photon counting detectors |
CN113876344B (zh) | 2020-07-02 | 2024-06-18 | 佳能医疗系统株式会社 | X射线ct装置以及方法 |
US11092701B1 (en) | 2020-07-07 | 2021-08-17 | GE Precision Healthcare LLC | Systems and methods for improved medical imaging |
US11320545B2 (en) | 2020-07-07 | 2022-05-03 | GE Precision Healthcare LLC | Systems and methods for improved medical imaging |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5464984A (en) * | 1985-12-11 | 1995-11-07 | General Imaging Corporation | X-ray imaging system and solid state detector therefor |
US5352897A (en) * | 1992-03-16 | 1994-10-04 | Olympus Optical Co., Ltd. | Device for detecting X-rays |
US5336879A (en) * | 1993-05-28 | 1994-08-09 | David Sarnoff Research Center, Inc. | Pixel array having image forming pixel elements integral with peripheral circuit elements |
US6744912B2 (en) * | 1996-11-29 | 2004-06-01 | Varian Medical Systems Technologies, Inc. | Multiple mode digital X-ray imaging system |
US6522715B2 (en) * | 2000-12-29 | 2003-02-18 | Ge Medical Systems Global Technology Company Llc | High density flex interconnect for CT detectors |
US20020085665A1 (en) * | 2000-12-29 | 2002-07-04 | Hoffman David M. | High density flex interconnect for CT detectors |
FI119173B (fi) * | 2001-11-23 | 2008-08-29 | Planmed Oy | Anturijärjestely ja menetelmä digitaalisessa pyyhkäisykuvantamisessa |
US7223981B1 (en) * | 2002-12-04 | 2007-05-29 | Aguila Technologies Inc. | Gamma ray detector modules |
US20050286682A1 (en) * | 2004-06-29 | 2005-12-29 | General Electric Company | Detector for radiation imaging systems |
US7260174B2 (en) * | 2004-09-13 | 2007-08-21 | General Electric Company | Direct conversion energy discriminating CT detector with over-ranging correction |
US7606347B2 (en) * | 2004-09-13 | 2009-10-20 | General Electric Company | Photon counting x-ray detector with overrange logic control |
US7283609B2 (en) * | 2005-11-10 | 2007-10-16 | General Electric Company | CT detector photodiode having multiple charge storage devices |
US7488945B2 (en) * | 2005-11-30 | 2009-02-10 | General Electric Company | Subpixel routing and processing for an imaging system or the like |
IL191154A0 (en) * | 2007-05-04 | 2008-12-29 | Gen Electric | Photon counting x-ray detector with overrange logic control |
-
2007
- 2007-09-26 US US11/861,826 patent/US7916836B2/en active Active
-
2008
- 2008-09-19 JP JP2008240109A patent/JP5690044B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
US20090080601A1 (en) | 2009-03-26 |
JP2009078143A (ja) | 2009-04-16 |
US7916836B2 (en) | 2011-03-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5690044B2 (ja) | エネルギ識別データを自在にまとめる検出器及び、ctイメージング・システム | |
US7606347B2 (en) | Photon counting x-ray detector with overrange logic control | |
US7034313B2 (en) | CT detector fabrication process | |
US7634060B2 (en) | Direct conversion energy discriminating CT detector with over-ranging correction | |
US7696483B2 (en) | High DQE photon counting detector using statistical recovery of pile-up events | |
JP5215722B2 (ja) | オーバーレンジ論理制御を伴う光子計数x線検出器 | |
US7127027B2 (en) | Direct conversion energy discriminating CT detector | |
US7403589B1 (en) | Photon counting CT detector using solid-state photomultiplier and scintillator | |
US7512210B2 (en) | Hybrid energy discriminating charge integrating CT detector | |
US7634061B1 (en) | High resolution imaging system | |
US7606346B2 (en) | CT detector module construction | |
JP6043474B2 (ja) | タイル構成可能な多面検出器を備える容積測定計算機式断層写真法システム | |
JP5951261B2 (ja) | タイル構成可能なパッケージング構造によるマルチ・スライスct検出器 | |
US6292528B1 (en) | Computer tomograph detector | |
US20080175347A1 (en) | Method and apparatus to reduce charge sharing in pixellated energy discriminating detectors | |
CN101138502A (zh) | 可平铺多层探测器 | |
US9318518B2 (en) | Photon counting detector pixel having an anode including two or more alternatively selectable and separate sub-anodes | |
EP3346295B1 (en) | Radiation detector having pixelated anode strip-electrodes | |
US7935933B2 (en) | Detector for an x-ray imaging system | |
US20240241272A1 (en) | Flat panel x-ray detector for computed tomography |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20110214 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20110907 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120905 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130321 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130326 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130524 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140218 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140422 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20140610 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20141009 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20141021 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20150106 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20150130 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5690044 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |