JP5132054B2 - オンチップ回路パッド構造 - Google Patents
オンチップ回路パッド構造 Download PDFInfo
- Publication number
- JP5132054B2 JP5132054B2 JP2005363798A JP2005363798A JP5132054B2 JP 5132054 B2 JP5132054 B2 JP 5132054B2 JP 2005363798 A JP2005363798 A JP 2005363798A JP 2005363798 A JP2005363798 A JP 2005363798A JP 5132054 B2 JP5132054 B2 JP 5132054B2
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- circuit
- pad
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- substrate
- transmission line
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- 239000000758 substrate Substances 0.000 claims description 54
- 230000005540 biological transmission Effects 0.000 claims description 31
- 230000003071 parasitic effect Effects 0.000 claims description 14
- 239000003990 capacitor Substances 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 239000004065 semiconductor Substances 0.000 description 10
- 238000000034 method Methods 0.000 description 6
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 3
- 238000004806 packaging method and process Methods 0.000 description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
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- H05K2201/09781—Dummy conductors, i.e. not used for normal transport of current; Dummy electrodes of components
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
- Microwave Amplifiers (AREA)
Description
110、210、310、350、410、450、510、550:回路パッド
114、214:給電ライン
120、212、312、352:シールド
220、320、360:伝送ライン・スタブ
230、330、370:コンデンサ
342、344、346、442、444、446、542、544、546:接地パッド
481、482、483、484、485、486:ワイヤ要素
581、583、585:接地ボール
4000、5000:リードフレーム
4800、4810:接続パッド
Claims (9)
- 基板と、
前記基板上の回路パッドと、
前記回路パッドの下方のシールドと、
前記回路パッドに取り付けられた分路伝送ライン・スタブと、
を備え、
前記分路伝送ライン・スタブが、コンデンサを介して、または直線ビアによって前記シールドに接続されて寄生容量が調整されたことを特徴とするデバイス。 - 前記基板が損失性基板からなる、請求項1に記載のデバイス。
- 前記デバイスがミリメートル波アプリケーションに用いられる、請求項1に記載のデバイス。
- 寄生容量を無くするように調整された、請求項1に記載のデバイス。
- 前記分路伝送ライン・スタブが前記シールドに短絡されている、請求項4に記載のデバイス。
- 前記回路パッドへの給電ラインをさらに含み、前記給電ラインは、オフチップ負荷インピーダンスと同じ特性ライン・インピーダンスを有する、請求項1に記載のデバイス。
- 第2の基板、前記第2の基板上の第2の回路パッド、前記第2の回路パッドの下方の第2のシールド、および該第2の回路パッドに取り付けられた第2の分路伝送ライン・スタブをさらに含み、前記デバイスが左右対称のパッド構造からなる、請求項1に記載のデバイス。
- 集積チップと、
前記集積チップ上の接地パッドと、
前記集積チップ上の回路パッドと、
前記回路パッドの下方のシールドと、
前記回路パッドに取り付けられ、コンデンサを介して、または直線ビアによって前記シールドに接続されて寄生容量を調整する分路伝送ライン・スタブと、
前記集積チップ上の前記回路パッド及び前記接地パッドに接続されたリードフレームと、
を備えることを特徴とする集積回路パッケージ。 - 前記リードフレームは、ワイヤ・ボンディング及びフリップ・チップ型ボール・ボンディングの一方によって、前記回路パッド及び前記接地パッドに接続される、請求項8に記載の集積回路パッケージ。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/029,518 | 2005-01-05 | ||
US11/029,518 US7566952B2 (en) | 2005-01-05 | 2005-01-05 | On-chip circuit pad structure |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006191027A JP2006191027A (ja) | 2006-07-20 |
JP5132054B2 true JP5132054B2 (ja) | 2013-01-30 |
Family
ID=36639463
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005363798A Expired - Fee Related JP5132054B2 (ja) | 2005-01-05 | 2005-12-16 | オンチップ回路パッド構造 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7566952B2 (ja) |
JP (1) | JP5132054B2 (ja) |
CN (1) | CN100463153C (ja) |
TW (1) | TW200633097A (ja) |
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KR101623224B1 (ko) | 2008-09-12 | 2016-05-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제조 방법 |
KR100950511B1 (ko) | 2009-09-22 | 2010-03-30 | 테세라 리써치 엘엘씨 | 와이어 본딩 및 도전성 기준 소자에 의해 제어되는 임피던스를 포함하는 마이크로전자 어셈블리 |
KR100935854B1 (ko) | 2009-09-22 | 2010-01-08 | 테세라 리써치 엘엘씨 | 와이어 본딩 및 기준 와이어 본딩에 의해 제어되는 임피던스를 가진 마이크로전자 어셈블리 |
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CN101932189B (zh) * | 2009-06-25 | 2012-09-05 | 北京普源精电科技有限公司 | 一种测量设备及其放大电路、阻抗部件和多层印刷电路板 |
WO2011078857A1 (en) * | 2009-12-22 | 2011-06-30 | Cornell University | Electrical prism: a high quality factor filter for millimeter-wave and terahertz frequencies |
US8581377B2 (en) * | 2010-09-16 | 2013-11-12 | Tessera, Inc. | TSOP with impedance control |
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CN108447852B (zh) * | 2018-04-19 | 2024-06-21 | 加特兰微电子科技(上海)有限公司 | 一种毫米波芯片封装结构及印刷电路板 |
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2005
- 2005-01-05 US US11/029,518 patent/US7566952B2/en not_active Expired - Fee Related
- 2005-12-16 JP JP2005363798A patent/JP5132054B2/ja not_active Expired - Fee Related
-
2006
- 2006-01-03 TW TW095100166A patent/TW200633097A/zh unknown
- 2006-01-04 CN CNB2006100003202A patent/CN100463153C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US7566952B2 (en) | 2009-07-28 |
JP2006191027A (ja) | 2006-07-20 |
TW200633097A (en) | 2006-09-16 |
CN100463153C (zh) | 2009-02-18 |
CN1819167A (zh) | 2006-08-16 |
US20060145308A1 (en) | 2006-07-06 |
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