JP5104196B2 - 分析結果管理の方法および装置 - Google Patents

分析結果管理の方法および装置 Download PDF

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Publication number
JP5104196B2
JP5104196B2 JP2007273294A JP2007273294A JP5104196B2 JP 5104196 B2 JP5104196 B2 JP 5104196B2 JP 2007273294 A JP2007273294 A JP 2007273294A JP 2007273294 A JP2007273294 A JP 2007273294A JP 5104196 B2 JP5104196 B2 JP 5104196B2
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reagent
analysis
information
sample
determination support
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Japanese (ja)
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JP2008032751A (ja
JP2008032751A5 (enExample
Inventor
隆一郎 児玉
智憲 三村
岳生 相薗
孝史 野口
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Hitachi Ltd
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Hitachi Ltd
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JP2007273294A 2007-10-22 2007-10-22 分析結果管理の方法および装置 Expired - Lifetime JP5104196B2 (ja)

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JP2007273294A JP5104196B2 (ja) 2007-10-22 2007-10-22 分析結果管理の方法および装置

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JP2007273294A JP5104196B2 (ja) 2007-10-22 2007-10-22 分析結果管理の方法および装置

Related Parent Applications (1)

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JP2005277038A Division JP4103910B2 (ja) 2005-09-26 2005-09-26 分析結果管理の方法および装置

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JP2008032751A JP2008032751A (ja) 2008-02-14
JP2008032751A5 JP2008032751A5 (enExample) 2008-06-26
JP5104196B2 true JP5104196B2 (ja) 2012-12-19

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JP2007273294A Expired - Lifetime JP5104196B2 (ja) 2007-10-22 2007-10-22 分析結果管理の方法および装置

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250151448A (ko) 2023-05-17 2025-10-21 주식회사 히타치하이테크 자동 분석 시스템

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5397981B2 (ja) * 2008-09-26 2014-01-22 ベックマン コールター， インコーポレイテッド 自動分析装置および分析精度管理表示方法
JP5820498B2 (ja) * 2014-04-03 2015-11-24 シスメックス株式会社 検体検査装置
JP6875137B2 (ja) * 2017-01-31 2021-05-19 シスメックス株式会社 精度管理方法、精度管理システム、管理装置、分析装置および精度管理異常判定方法
JP7420010B2 (ja) * 2020-08-20 2024-01-23 株式会社島津製作所 分析システム
WO2025197925A1 (ja) * 2024-03-19 2025-09-25 積水メディカル株式会社 情報提示装置、情報提示方法、およびプログラム

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2525063B2 (ja) * 1990-03-03 1996-08-14 株式会社日立製作所 自動分析方法
JP3204697B2 (ja) * 1991-10-16 2001-09-04 オリンパス光学工業株式会社 自動分析方法
JPH05288756A (ja) * 1992-04-13 1993-11-02 Hitachi Ltd 自動分析装置及び自動分析システム
JP3420791B2 (ja) * 1993-03-29 2003-06-30 オリンパス光学工業株式会社 分析装置
JP3226750B2 (ja) * 1995-03-03 2001-11-05 大和コンピューターサービス株式会社 検査システム
JPH08262033A (ja) * 1995-03-20 1996-10-11 Pfu Ltd 判定処理システム
JP2000258422A (ja) * 1999-03-08 2000-09-22 Hitachi Ltd 分析装置
JP2001084325A (ja) * 1999-09-16 2001-03-30 Hitachi Micro Software Syst Co Ltd 検体集配支援システムおよびプログラムを記録した記録媒体
JP4718658B2 (ja) * 1999-10-29 2011-07-06 株式会社東芝 医用レポートシステム
JP2001229291A (ja) * 1999-11-30 2001-08-24 Sysmex Corp サポート方法、精度管理方法及びその装置
EP1107159B1 (en) * 1999-11-30 2009-04-29 Sysmex Corporation Quality control method and device therefor
JP3799387B2 (ja) * 2001-05-18 2006-07-19 株式会社シノテスト インターネットを利用した精度管理方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250151448A (ko) 2023-05-17 2025-10-21 주식회사 히타치하이테크 자동 분석 시스템

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JP2008032751A (ja) 2008-02-14

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