JP5075142B2 - デュアルモードガス電界イオン源 - Google Patents

デュアルモードガス電界イオン源 Download PDF

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JP5075142B2
JP5075142B2 JP2009027512A JP2009027512A JP5075142B2 JP 5075142 B2 JP5075142 B2 JP 5075142B2 JP 2009027512 A JP2009027512 A JP 2009027512A JP 2009027512 A JP2009027512 A JP 2009027512A JP 5075142 B2 JP5075142 B2 JP 5075142B2
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Japan
Prior art keywords
gas
ion beam
emitter
ions
housing
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JP2009027512A
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English (en)
Japanese (ja)
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JP2009187950A (ja
JP2009187950A5 (enExample
Inventor
フロシェン ユルゲン
Original Assignee
アイシーティー インテグレーテッド サーキット テスティング ゲゼルシャフト フィーア ハルプライタープリーフテヒニック エム ベー ハー
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Publication of JP2009187950A publication Critical patent/JP2009187950A/ja
Publication of JP2009187950A5 publication Critical patent/JP2009187950A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/08—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/26—Ion sources; Ion guns using surface ionisation, e.g. field effect ion sources, thermionic ion sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • H01J37/241—High voltage power supply or regulation circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • H01J37/243—Beam current control or regulation circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/002—Cooling arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/006—Details of gas supplies, e.g. in an ion source, to a beam line, to a specimen or to a workpiece
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06—Sources
    • H01J2237/061—Construction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06—Sources
    • H01J2237/08—Ion sources
    • H01J2237/0802—Field ionization sources
    • H01J2237/0807—Gas field ion sources [GFIS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06—Sources
    • H01J2237/08—Ion sources
    • H01J2237/0822—Multiple sources
    • H01J2237/0827—Multiple sources for producing different ions sequentially
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Electron Sources, Ion Sources (AREA)
JP2009027512A 2008-02-08 2009-02-09 デュアルモードガス電界イオン源 Active JP5075142B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US2734408P 2008-02-08 2008-02-08
US61/027,344 2008-02-08
EP08101447.4 2008-02-08
EP08101447.4A EP2088613B1 (en) 2008-02-08 2008-02-08 Use of a dual mode gas field ion source

Publications (3)

Publication Number Publication Date
JP2009187950A JP2009187950A (ja) 2009-08-20
JP2009187950A5 JP2009187950A5 (enExample) 2012-01-12
JP5075142B2 true JP5075142B2 (ja) 2012-11-14

Family

ID=39485198

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009027512A Active JP5075142B2 (ja) 2008-02-08 2009-02-09 デュアルモードガス電界イオン源

Country Status (3)

Country Link
US (1) US7968855B2 (enExample)
EP (1) EP2088613B1 (enExample)
JP (1) JP5075142B2 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8110814B2 (en) * 2003-10-16 2012-02-07 Alis Corporation Ion sources, systems and methods
WO2010025211A2 (en) * 2008-08-29 2010-03-04 Carl Zeiss Smt Inc. Ion beam stabilization
US8981322B2 (en) 2009-02-04 2015-03-17 Tel Epion Inc. Multiple nozzle gas cluster ion beam system
JP5383419B2 (ja) 2009-10-14 2014-01-08 株式会社日立ハイテクノロジーズ イオンビーム装置
JP2011171009A (ja) * 2010-02-16 2011-09-01 Sii Nanotechnology Inc 集束イオンビーム装置
JP5448971B2 (ja) * 2010-03-29 2014-03-19 株式会社日立ハイテクサイエンス 荷電粒子ビーム装置、チップ再生方法、及び試料観察方法
JP2011210492A (ja) 2010-03-29 2011-10-20 Sii Nanotechnology Inc 集束イオンビーム装置
US8173980B2 (en) 2010-05-05 2012-05-08 Tel Epion Inc. Gas cluster ion beam system with cleaning apparatus
US8338806B2 (en) * 2010-05-05 2012-12-25 Tel Epion Inc. Gas cluster ion beam system with rapid gas switching apparatus
EP2400506A1 (en) * 2010-06-23 2011-12-28 GSI Helmholtzzentrum für Schwerionenforschung GmbH Particle beam generating device
WO2012031049A2 (en) * 2010-08-31 2012-03-08 Fei Company Navigation and sample processing using an ion source containing both low-mass and high-mass species
JP5809890B2 (ja) * 2011-09-05 2015-11-11 株式会社日立ハイテクノロジーズ イオンビーム装置
WO2013150861A1 (ja) * 2012-04-03 2013-10-10 株式会社 日立ハイテクノロジーズ ガス電界電離イオン源およびイオンビーム装置
JP6238978B2 (ja) * 2012-06-29 2017-11-29 エフ・イ−・アイ・カンパニー 多種イオン源
JP6230282B2 (ja) * 2012-07-12 2017-11-15 キヤノン株式会社 質量分析装置
US8859982B2 (en) * 2012-09-14 2014-10-14 Kla-Tencor Corporation Dual-lens-gun electron beam apparatus and methods for high-resolution imaging with both high and low beam currents
JP5591378B2 (ja) * 2013-05-27 2014-09-17 株式会社日立ハイテクノロジーズ ガス電界電離イオン源、イオンビーム装置
US9530611B2 (en) 2013-07-08 2016-12-27 Carl Zeiss Microscopy, Llc Charged particle beam system and method of operating a charged particle beam system
JP6373096B2 (ja) * 2013-07-08 2018-08-15 カール ツァイス マイクロスコーピー エルエルシー 荷電粒子ビームシステム及びその作動方法
US9540725B2 (en) 2014-05-14 2017-01-10 Tel Epion Inc. Method and apparatus for beam deflection in a gas cluster ion beam system
JP6328023B2 (ja) * 2014-10-08 2018-05-23 株式会社日立ハイテクノロジーズ イオンビーム装置
US10354830B2 (en) 2016-04-06 2019-07-16 Carl Zeiss Microscopy, Llc Charged particle beam system
US9899181B1 (en) 2017-01-12 2018-02-20 Fei Company Collision ionization ion source
US9941094B1 (en) 2017-02-01 2018-04-10 Fei Company Innovative source assembly for ion beam production
JP6909618B2 (ja) * 2017-04-19 2021-07-28 株式会社日立ハイテクサイエンス イオンビーム装置
WO2021053704A1 (ja) * 2019-09-17 2021-03-25 株式会社日立ハイテク イオンビーム装置
US11534626B2 (en) * 2021-03-31 2022-12-27 Varian Medical Systems Particle Therapy Gmbh & Co. Kg Asymmetric dual-mode ionization systems and methods

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0618109B2 (ja) * 1987-08-19 1994-03-09 沖電気工業株式会社 液体金属イオン源の清浄化方法
JPH0237649A (ja) * 1988-07-26 1990-02-07 Sony Corp 電界電離型イオン源
JPH0261941A (ja) * 1988-08-26 1990-03-01 Sony Corp 電界電離型イオン源
US7554097B2 (en) * 2003-10-16 2009-06-30 Alis Corporation Ion sources, systems and methods
EP2019412B1 (en) * 2006-12-18 2016-08-24 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Gas field ion source for multiple applications

Also Published As

Publication number Publication date
EP2088613B1 (en) 2015-10-14
JP2009187950A (ja) 2009-08-20
EP2088613A1 (en) 2009-08-12
US20090200484A1 (en) 2009-08-13
US7968855B2 (en) 2011-06-28

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