JP5037929B2 - テラヘルツ波を用いた対象物の情報取得装置及び方法 - Google Patents

テラヘルツ波を用いた対象物の情報取得装置及び方法 Download PDF

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Publication number
JP5037929B2
JP5037929B2 JP2006339295A JP2006339295A JP5037929B2 JP 5037929 B2 JP5037929 B2 JP 5037929B2 JP 2006339295 A JP2006339295 A JP 2006339295A JP 2006339295 A JP2006339295 A JP 2006339295A JP 5037929 B2 JP5037929 B2 JP 5037929B2
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delay
terahertz wave
time
pulse
information
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JP2008151618A5 (enExample
JP2008151618A (ja
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敏彦 尾内
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Canon Inc
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Canon Inc
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Priority to JP2006339295A priority Critical patent/JP5037929B2/ja
Priority to US12/090,446 priority patent/US7858940B2/en
Priority to PCT/JP2007/074353 priority patent/WO2008075696A1/en
Priority to CN2007800358202A priority patent/CN101517397B/zh
Priority to EP20070850839 priority patent/EP2069760A1/en
Publication of JP2008151618A publication Critical patent/JP2008151618A/ja
Publication of JP2008151618A5 publication Critical patent/JP2008151618A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2006339295A 2006-12-18 2006-12-18 テラヘルツ波を用いた対象物の情報取得装置及び方法 Expired - Fee Related JP5037929B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2006339295A JP5037929B2 (ja) 2006-12-18 2006-12-18 テラヘルツ波を用いた対象物の情報取得装置及び方法
US12/090,446 US7858940B2 (en) 2006-12-18 2007-12-12 Information acquisition apparatus and information aquisition method using terahertz wave for acquiring information on object
PCT/JP2007/074353 WO2008075696A1 (en) 2006-12-18 2007-12-12 Information acquisition apparatus and information acquisition method using terahertz wave for acquiring information on object
CN2007800358202A CN101517397B (zh) 2006-12-18 2007-12-12 利用太赫兹波获取物体信息的信息获取设备和信息获取方法
EP20070850839 EP2069760A1 (en) 2006-12-18 2007-12-12 Information acquisition apparatus and information acquisition method using terahertz wave for acquiring information on object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006339295A JP5037929B2 (ja) 2006-12-18 2006-12-18 テラヘルツ波を用いた対象物の情報取得装置及び方法

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JP2008151618A JP2008151618A (ja) 2008-07-03
JP2008151618A5 JP2008151618A5 (enExample) 2010-02-18
JP5037929B2 true JP5037929B2 (ja) 2012-10-03

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US (1) US7858940B2 (enExample)
EP (1) EP2069760A1 (enExample)
JP (1) JP5037929B2 (enExample)
CN (1) CN101517397B (enExample)
WO (1) WO2008075696A1 (enExample)

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JP5609580B2 (ja) * 2010-11-18 2014-10-22 横河電機株式会社 レーザガス分析計
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CN102175636B (zh) * 2011-03-18 2012-12-26 上海理工大学 一种中草药检测鉴别的系统和方法
JP5824284B2 (ja) * 2011-08-19 2015-11-25 株式会社Ｓｃｒｅｅｎホールディングス 電磁波パルス測定装置
JP2013217909A (ja) * 2012-03-11 2013-10-24 Canon Inc 屈折率算出方法及び装置、屈折率算出用物質、及びトモグラフィ装置
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CN103776795B (zh) * 2013-12-31 2016-05-18 西北大学 一种球面波泵浦的太赫兹-斯托克斯双光子纠缠成像装置
EP2899498B1 (en) * 2014-01-28 2020-03-11 ABB Schweiz AG Sensor system and method for characterizing a coated body
US9404853B1 (en) * 2014-04-25 2016-08-02 Joseph R. Demers Terahertz spectrometer with phase modulation
CN103954584A (zh) * 2014-05-14 2014-07-30 中国石油大学(北京) 一种油气浓度检测装置及方法
JP6363511B2 (ja) * 2015-01-08 2018-07-25 浜松ホトニクス株式会社 テラヘルツ波時間波形取得装置
US9733193B2 (en) * 2015-03-12 2017-08-15 Proton Products International Limited Measurement of industrial products manufactured by extrusion techniques
CN105158196B (zh) * 2015-05-12 2017-09-29 上海理工大学 一种太赫兹波3d图像获取方法及系统
CN105115936A (zh) * 2015-09-17 2015-12-02 大恒新纪元科技股份有限公司 一种基于太赫兹光谱技术的全成分颗粒剂中草药青果的检测方法
WO2017101988A1 (en) 2015-12-15 2017-06-22 Trimble Ab Surveying instrument with optical stage compensating for temperature variations
US10571390B2 (en) * 2015-12-21 2020-02-25 The Boeing Company Composite inspection
CN105509817B (zh) * 2016-02-01 2017-09-22 中国工程物理研究院流体物理研究所 一种太赫兹波多普勒干涉测量仪及方法
JP6428728B2 (ja) * 2016-08-23 2018-11-28 ニプロ株式会社 テラヘルツパルス波を用いた粉末中の異物検出装置および異物検出方法
JP6843600B2 (ja) * 2016-11-28 2021-03-17 キヤノン株式会社 画像取得装置、これを用いた画像取得方法及び照射装置
US11099001B2 (en) * 2016-12-06 2021-08-24 Pioneer Corporation Inspection apparatus, inspection method, computer program and recording medium
CN106599594B (zh) * 2016-12-22 2019-08-13 白云绮 基于太赫兹量子波信息的人体数字化模型及疾病诊疗系统
WO2019044600A1 (ja) * 2017-08-31 2019-03-07 パイオニア株式会社 光学測定装置、測定方法、プログラム及び記録媒体
DE102018204525A1 (de) * 2018-03-23 2019-09-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Erfassung von Objekten
US10571393B2 (en) * 2018-04-13 2020-02-25 Tsinghua University Terahertz gas detection method and device based on Gregory double reflection antenna
DE102018129246B4 (de) * 2018-11-21 2020-10-15 Infineon Technologies Ag Interferenzdetektierung und -minderung für lidarsysteme
CN109959938A (zh) * 2019-04-10 2019-07-02 中国计量大学 基于合成孔径聚焦的聚乙烯材料太赫兹时域光谱成像方法
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Publication number Publication date
CN101517397B (zh) 2013-07-31
US20100148069A1 (en) 2010-06-17
US7858940B2 (en) 2010-12-28
EP2069760A1 (en) 2009-06-17
WO2008075696A1 (en) 2008-06-26
JP2008151618A (ja) 2008-07-03
CN101517397A (zh) 2009-08-26

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