CN101517397B - 利用太赫兹波获取物体信息的信息获取设备和信息获取方法 - Google Patents

利用太赫兹波获取物体信息的信息获取设备和信息获取方法 Download PDF

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CN101517397B
CN101517397B CN2007800358202A CN200780035820A CN101517397B CN 101517397 B CN101517397 B CN 101517397B CN 2007800358202 A CN2007800358202 A CN 2007800358202A CN 200780035820 A CN200780035820 A CN 200780035820A CN 101517397 B CN101517397 B CN 101517397B
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terahertz
time
pulse
delay
information
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CN101517397A (zh
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尾内敏彦
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN2007800358202A 2006-12-18 2007-12-12 利用太赫兹波获取物体信息的信息获取设备和信息获取方法 Expired - Fee Related CN101517397B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP339295/2006 2006-12-18
JP2006339295A JP5037929B2 (ja) 2006-12-18 2006-12-18 テラヘルツ波を用いた対象物の情報取得装置及び方法
PCT/JP2007/074353 WO2008075696A1 (en) 2006-12-18 2007-12-12 Information acquisition apparatus and information acquisition method using terahertz wave for acquiring information on object

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CN101517397A CN101517397A (zh) 2009-08-26
CN101517397B true CN101517397B (zh) 2013-07-31

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US (1) US7858940B2 (enExample)
EP (1) EP2069760A1 (enExample)
JP (1) JP5037929B2 (enExample)
CN (1) CN101517397B (enExample)
WO (1) WO2008075696A1 (enExample)

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JP5967867B2 (ja) 2010-06-03 2016-08-10 キヤノン株式会社 テラヘルツ波発生素子、テラヘルツ波検出素子、及びテラヘルツ時間領域分光装置
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US9035258B2 (en) 2011-01-08 2015-05-19 Canon Kabushiki Kaisha Tomography apparatus and electromagnetic pulse transmitting apparatus
CN102175636B (zh) * 2011-03-18 2012-12-26 上海理工大学 一种中草药检测鉴别的系统和方法
JP5824284B2 (ja) * 2011-08-19 2015-11-25 株式会社Ｓｃｒｅｅｎホールディングス 電磁波パルス測定装置
JP2013217909A (ja) * 2012-03-11 2013-10-24 Canon Inc 屈折率算出方法及び装置、屈折率算出用物質、及びトモグラフィ装置
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JP5994416B2 (ja) * 2012-06-18 2016-09-21 ニプロ株式会社 テラヘルツパルス波を用いた粉末中の異物検出装置および異物検出方法
CN103033282B (zh) * 2012-10-29 2014-08-13 大连理工大学 一种检测磁约束聚变装置偏滤器石墨瓦瞬态温度的方法
JP2014122875A (ja) * 2012-11-26 2014-07-03 Canon Inc 層状物体の測定装置および方法
CN104345031A (zh) * 2013-07-31 2015-02-11 深圳先进技术研究院 一种扫描太赫兹时域光谱的光学装置、控制装置和系统
CN103776795B (zh) * 2013-12-31 2016-05-18 西北大学 一种球面波泵浦的太赫兹-斯托克斯双光子纠缠成像装置
EP2899498B1 (en) * 2014-01-28 2020-03-11 ABB Schweiz AG Sensor system and method for characterizing a coated body
US9404853B1 (en) * 2014-04-25 2016-08-02 Joseph R. Demers Terahertz spectrometer with phase modulation
CN103954584A (zh) * 2014-05-14 2014-07-30 中国石油大学(北京) 一种油气浓度检测装置及方法
JP6363511B2 (ja) 2015-01-08 2018-07-25 浜松ホトニクス株式会社 テラヘルツ波時間波形取得装置
US9733193B2 (en) * 2015-03-12 2017-08-15 Proton Products International Limited Measurement of industrial products manufactured by extrusion techniques
CN105158196B (zh) * 2015-05-12 2017-09-29 上海理工大学 一种太赫兹波3d图像获取方法及系统
CN105115936A (zh) * 2015-09-17 2015-12-02 大恒新纪元科技股份有限公司 一种基于太赫兹光谱技术的全成分颗粒剂中草药青果的检测方法
WO2017101988A1 (en) * 2015-12-15 2017-06-22 Trimble Ab Surveying instrument with optical stage compensating for temperature variations
US10571390B2 (en) * 2015-12-21 2020-02-25 The Boeing Company Composite inspection
CN105509817B (zh) * 2016-02-01 2017-09-22 中国工程物理研究院流体物理研究所 一种太赫兹波多普勒干涉测量仪及方法
JP6428728B2 (ja) * 2016-08-23 2018-11-28 ニプロ株式会社 テラヘルツパルス波を用いた粉末中の異物検出装置および異物検出方法
JP6843600B2 (ja) * 2016-11-28 2021-03-17 キヤノン株式会社 画像取得装置、これを用いた画像取得方法及び照射装置
WO2018105332A1 (ja) * 2016-12-06 2018-06-14 パイオニア株式会社 検査装置、検査方法、コンピュータプログラム及び記録媒体
CN106599594B (zh) * 2016-12-22 2019-08-13 白云绮 基于太赫兹量子波信息的人体数字化模型及疾病诊疗系统
EP3660489A4 (en) * 2017-08-31 2021-04-14 Pioneer Corporation OPTICAL MEASURING DEVICE, MEASURING PROCESS, PROGRAM AND RECORDING MEDIA
DE102018204525A1 (de) * 2018-03-23 2019-09-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Erfassung von Objekten
US10571393B2 (en) * 2018-04-13 2020-02-25 Tsinghua University Terahertz gas detection method and device based on Gregory double reflection antenna
DE102018129246B4 (de) * 2018-11-21 2020-10-15 Infineon Technologies Ag Interferenzdetektierung und -minderung für lidarsysteme
CN109959938A (zh) * 2019-04-10 2019-07-02 中国计量大学 基于合成孔径聚焦的聚乙烯材料太赫兹时域光谱成像方法
JP7659342B2 (ja) * 2020-08-12 2025-04-09 ダス－ナノ テック エス．エル． コーティング特徴の非接触決定
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JP7167211B2 (ja) * 2021-02-24 2022-11-08 キヤノン株式会社 画像取得装置、これを用いた画像取得方法及び照射装置
CN114279999B (zh) * 2021-07-30 2023-06-20 中国航空工业集团公司北京长城航空测控技术研究所 一种去锁相太赫兹时域光谱系统

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Publication number Publication date
JP5037929B2 (ja) 2012-10-03
WO2008075696A1 (en) 2008-06-26
CN101517397A (zh) 2009-08-26
EP2069760A1 (en) 2009-06-17
US7858940B2 (en) 2010-12-28
JP2008151618A (ja) 2008-07-03
US20100148069A1 (en) 2010-06-17

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