JP5030940B2 - 電流を検知するための装置 - Google Patents

電流を検知するための装置 Download PDF

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Publication number
JP5030940B2
JP5030940B2 JP2008504131A JP2008504131A JP5030940B2 JP 5030940 B2 JP5030940 B2 JP 5030940B2 JP 2008504131 A JP2008504131 A JP 2008504131A JP 2008504131 A JP2008504131 A JP 2008504131A JP 5030940 B2 JP5030940 B2 JP 5030940B2
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Japan
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coupled
output
amplifier
input
phase
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JP2008504131A
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Japanese (ja)
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JP2008534962A (ja
JP2008534962A5 (enExample
Inventor
アトリス，ユーセフ・エイチ
ブラスウェル，ブラント
ガリティー，ダグラス・エイ
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NXP USA Inc
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NXP USA Inc
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Publication of JP2008534962A5 publication Critical patent/JP2008534962A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2008504131A 2005-04-01 2006-03-17 電流を検知するための装置 Active JP5030940B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/097,593 US7102365B1 (en) 2005-04-01 2005-04-01 Apparatus for current sensing
US11/097,593 2005-04-01
PCT/US2006/009951 WO2006107572A2 (en) 2005-04-01 2006-03-17 Apparatus for current sensing

Publications (3)

Publication Number Publication Date
JP2008534962A JP2008534962A (ja) 2008-08-28
JP2008534962A5 JP2008534962A5 (enExample) 2009-04-30
JP5030940B2 true JP5030940B2 (ja) 2012-09-19

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ID=36939453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008504131A Active JP5030940B2 (ja) 2005-04-01 2006-03-17 電流を検知するための装置

Country Status (5)

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US (2) US7102365B1 (enExample)
JP (1) JP5030940B2 (enExample)
CN (1) CN100580463C (enExample)
TW (1) TWI408378B (enExample)
WO (1) WO2006107572A2 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7714762B2 (en) * 2005-04-12 2010-05-11 Massachusetts Institute Of Technology Method and apparatus for current-mode ADC
JP5025171B2 (ja) * 2005-09-29 2012-09-12 エスケーハイニックス株式会社 差動増幅装置
US7964993B2 (en) * 2006-12-11 2011-06-21 Akros Silicon Inc. Network devices with solid state transformer and class AB output stage for active EMI suppression and termination of open-drain transmit drivers of a physical device
US7535391B1 (en) 2008-01-07 2009-05-19 Freescale Semiconductor, Inc. Analog-to-digital converter having random capacitor assignment and method thereof
US7589658B2 (en) * 2008-02-05 2009-09-15 Freescale Semiconductor, Inc. Analog-to-digital converter with variable gain and method thereof
US7969167B2 (en) * 2009-01-28 2011-06-28 Freescale Semiconductor, Inc. Capacitance-to-voltage interface circuit with shared capacitor bank for offsetting and analog-to-digital conversion
US7796079B2 (en) * 2009-01-28 2010-09-14 Freescale Semiconductor, Inc. Charge redistribution successive approximation analog-to-digital converter and related operating method
US8125231B2 (en) * 2009-01-28 2012-02-28 Freescale Semiconductor, Inc. Capacitance-to-voltage interface circuit, and related operating methods
US8096179B2 (en) * 2009-04-09 2012-01-17 Freescale Semiconductor, Inc. Sensor device with reduced parasitic-induced error
US9709603B2 (en) * 2014-03-31 2017-07-18 Microsemi Corporation Current sensing system and method
CN105891591B (zh) * 2016-04-08 2018-08-31 北京精密机电控制设备研究所 一种大功率储能逆变器电流检测控制系统
CN111448464A (zh) * 2017-12-09 2020-07-24 深圳市丹砂科技有限公司 用于生物医学测量的电流传感器
GB2583584B (en) * 2017-12-22 2021-04-28 Shenzhen Dansha Tech Co Ltd Current sensor for biomedical measurements
GB2569641B (en) * 2017-12-22 2020-09-09 Shenzhen Dansha Tech Co Ltd Current sensor for biomedical measurements
PL3899441T3 (pl) * 2018-12-20 2024-03-18 Apator Miitors Aps Przepływomierz ultradźwiękowy z przełączalnymi przetwornikami
WO2024258730A1 (en) * 2023-06-16 2024-12-19 Trustees Of Boston University Extended energy range particle detectors and uses thereof

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5517140A (en) * 1994-04-14 1996-05-14 Matsushita Electric Industrial Co., Ltd. Sample and hold circuit
US5574457A (en) * 1995-06-12 1996-11-12 Motorola, Inc. Switched capacitor gain stage
GB9708786D0 (en) * 1997-05-01 1997-06-25 Central Research Lab Ltd Elecrochemical sensing circuits
US5867054A (en) * 1997-07-31 1999-02-02 National Semiconductor Corporation Current sensing circuit
JP2001006384A (ja) * 1999-06-16 2001-01-12 Sharp Corp サンプル／ホールド回路とこれを用いた基準電圧発生回路
JP4330791B2 (ja) * 2000-12-27 2009-09-16 セイコーインスツル株式会社 半導体集積回路装置および半導体集積回路装置の制御方法
JP3628636B2 (ja) * 2001-07-30 2005-03-16 シャープ株式会社 スイッチトキャパシタ回路
US6617838B1 (en) * 2001-09-11 2003-09-09 Analog Devices, Inc. Current measurement circuit
JP4094436B2 (ja) * 2003-01-16 2008-06-04 セイコーインスツル株式会社 スイッチトキャパシタ増幅回路および電子機器

Also Published As

Publication number Publication date
JP2008534962A (ja) 2008-08-28
CN101142489A (zh) 2008-03-12
WO2006107572A3 (en) 2007-01-04
US7282929B2 (en) 2007-10-16
TW200643427A (en) 2006-12-16
US20060279293A1 (en) 2006-12-14
WO2006107572A2 (en) 2006-10-12
US7102365B1 (en) 2006-09-05
TWI408378B (zh) 2013-09-11
CN100580463C (zh) 2010-01-13

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