JP5027832B2 - 放射線検出モジュール及び放射線撮像装置 - Google Patents
放射線検出モジュール及び放射線撮像装置 Download PDFInfo
- Publication number
- JP5027832B2 JP5027832B2 JP2009034147A JP2009034147A JP5027832B2 JP 5027832 B2 JP5027832 B2 JP 5027832B2 JP 2009034147 A JP2009034147 A JP 2009034147A JP 2009034147 A JP2009034147 A JP 2009034147A JP 5027832 B2 JP5027832 B2 JP 5027832B2
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- radiation detection
- electrode
- support substrate
- detection module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
Landscapes
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009034147A JP5027832B2 (ja) | 2009-02-17 | 2009-02-17 | 放射線検出モジュール及び放射線撮像装置 |
| PCT/JP2010/052363 WO2010095657A1 (ja) | 2009-02-17 | 2010-02-17 | 放射線検出モジュール及び放射線撮像装置 |
| US13/201,914 US20110297837A1 (en) | 2009-02-17 | 2010-02-17 | Radiation detection module and radiation image-capturing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009034147A JP5027832B2 (ja) | 2009-02-17 | 2009-02-17 | 放射線検出モジュール及び放射線撮像装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010190665A JP2010190665A (ja) | 2010-09-02 |
| JP2010190665A5 JP2010190665A5 (enExample) | 2011-01-27 |
| JP5027832B2 true JP5027832B2 (ja) | 2012-09-19 |
Family
ID=42633937
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009034147A Expired - Fee Related JP5027832B2 (ja) | 2009-02-17 | 2009-02-17 | 放射線検出モジュール及び放射線撮像装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20110297837A1 (enExample) |
| JP (1) | JP5027832B2 (enExample) |
| WO (1) | WO2010095657A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012103036A (ja) * | 2010-11-08 | 2012-05-31 | Hitachi Consumer Electronics Co Ltd | 放射線検出器 |
| GB201113436D0 (en) | 2011-08-03 | 2011-09-21 | Isis Innovation | Semiconductor detector device |
| CN102592938B (zh) * | 2012-01-06 | 2016-03-30 | 同方威视技术股份有限公司 | 离子迁移管信号提取电路、方法以及离子迁移探测器 |
| DE102014222690B4 (de) | 2014-11-06 | 2024-10-02 | Siemens Healthineers Ag | Detektormodul für einen Röntgendetektor |
| JP6591908B2 (ja) * | 2016-02-18 | 2019-10-16 | 国立大学法人 東京大学 | 放射線検出装置 |
| CN108419026B (zh) * | 2018-05-31 | 2020-05-15 | 歌尔股份有限公司 | 相机曝光时间调整方法、装置及设备 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0816702B2 (ja) * | 1983-12-26 | 1996-02-21 | 株式会社島津製作所 | 半導体放射線位置検出装置 |
| US6621084B1 (en) * | 1998-09-24 | 2003-09-16 | Elgems Ltd. | Pixelated photon detector |
| IL143980A0 (en) * | 2001-06-25 | 2002-04-21 | Imarad Imaging Systems Ltd | Three dimensional radiation detection |
| JP2005109269A (ja) * | 2003-09-30 | 2005-04-21 | Hitachi Ltd | 半導体放射線検出器及び半導体放射線撮像装置 |
| US7212604B2 (en) * | 2005-06-29 | 2007-05-01 | General Electric Company | Multi-layer direct conversion computed tomography detector module |
| JP3858044B1 (ja) * | 2005-09-09 | 2006-12-13 | 株式会社日立製作所 | 放射線検出モジュール、プリント基板および陽電子放出型断層撮影装置 |
| US7525098B2 (en) * | 2006-04-05 | 2009-04-28 | Orbotech Ltd. | High resolution energy detector |
| JP4909847B2 (ja) * | 2006-09-29 | 2012-04-04 | 株式会社日立製作所 | 核医学診断装置 |
| US7606346B2 (en) * | 2007-01-04 | 2009-10-20 | General Electric Company | CT detector module construction |
| JP2008171881A (ja) * | 2007-01-09 | 2008-07-24 | Shimadzu Corp | 光または放射線検出器 |
| JP2008286560A (ja) * | 2007-05-15 | 2008-11-27 | Hitachi Ltd | 結晶素子組み立て体、そのための電気回路、それらを用いた核医学診断装置及び通電制御方法 |
| JP4313830B2 (ja) * | 2007-07-17 | 2009-08-12 | 株式会社日立製作所 | 半導体放射線検出器及び半導体放射線撮像装置 |
-
2009
- 2009-02-17 JP JP2009034147A patent/JP5027832B2/ja not_active Expired - Fee Related
-
2010
- 2010-02-17 WO PCT/JP2010/052363 patent/WO2010095657A1/ja not_active Ceased
- 2010-02-17 US US13/201,914 patent/US20110297837A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20110297837A1 (en) | 2011-12-08 |
| WO2010095657A1 (ja) | 2010-08-26 |
| JP2010190665A (ja) | 2010-09-02 |
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