JP5022600B2 - セラミックシンチレータとそれを用いた放射線検出器および放射線検査装置 - Google Patents
セラミックシンチレータとそれを用いた放射線検出器および放射線検査装置 Download PDFInfo
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- JP5022600B2 JP5022600B2 JP2005514114A JP2005514114A JP5022600B2 JP 5022600 B2 JP5022600 B2 JP 5022600B2 JP 2005514114 A JP2005514114 A JP 2005514114A JP 2005514114 A JP2005514114 A JP 2005514114A JP 5022600 B2 JP5022600 B2 JP 5022600B2
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- 239000000919 ceramic Substances 0.000 title claims description 102
- 230000005855 radiation Effects 0.000 title claims description 39
- 238000007689 inspection Methods 0.000 title claims description 18
- BAYVXZGXVIYBON-UHFFFAOYSA-N [P].O=S.[Lu] Chemical compound [P].O=S.[Lu] BAYVXZGXVIYBON-UHFFFAOYSA-N 0.000 claims description 83
- 229910052783 alkali metal Inorganic materials 0.000 claims description 39
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 31
- 150000001340 alkali metals Chemical class 0.000 claims description 29
- 229910052698 phosphorus Inorganic materials 0.000 claims description 24
- 239000011574 phosphorus Substances 0.000 claims description 24
- 239000000203 mixture Substances 0.000 claims description 19
- 229910052777 Praseodymium Inorganic materials 0.000 claims description 14
- 229910052771 Terbium Inorganic materials 0.000 claims description 14
- 229910052693 Europium Inorganic materials 0.000 claims description 13
- 239000012190 activator Substances 0.000 claims description 9
- FPMWYYKZGBBCRR-UHFFFAOYSA-N [P].O=S.[Gd] Chemical compound [P].O=S.[Gd] FPMWYYKZGBBCRR-UHFFFAOYSA-N 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 229910052700 potassium Inorganic materials 0.000 claims description 3
- 229910052708 sodium Inorganic materials 0.000 claims description 3
- 239000000843 powder Substances 0.000 description 45
- 239000011734 sodium Substances 0.000 description 21
- 238000001514 detection method Methods 0.000 description 16
- 239000002994 raw material Substances 0.000 description 16
- 230000035945 sensitivity Effects 0.000 description 14
- 230000000052 comparative effect Effects 0.000 description 13
- BAZGIOYKWQZSCP-UHFFFAOYSA-N lutetium sulfur monoxide Chemical compound [Lu].O=S BAZGIOYKWQZSCP-UHFFFAOYSA-N 0.000 description 13
- 238000011156 evaluation Methods 0.000 description 12
- 238000010521 absorption reaction Methods 0.000 description 11
- 238000000465 moulding Methods 0.000 description 10
- 229910052761 rare earth metal Inorganic materials 0.000 description 10
- 239000003513 alkali Substances 0.000 description 9
- 238000005245 sintering Methods 0.000 description 7
- 230000004907 flux Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 239000011148 porous material Substances 0.000 description 6
- UAHZTKVCYHJBJQ-UHFFFAOYSA-N [P].S=O Chemical compound [P].S=O UAHZTKVCYHJBJQ-UHFFFAOYSA-N 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- 150000002910 rare earth metals Chemical class 0.000 description 5
- -1 rare earth oxysulfide Chemical class 0.000 description 5
- 229910052765 Lutetium Inorganic materials 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 238000004040 coloring Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 229910003443 lutetium oxide Inorganic materials 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- MPARYNQUYZOBJM-UHFFFAOYSA-N oxo(oxolutetiooxy)lutetium Chemical compound O=[Lu]O[Lu]=O MPARYNQUYZOBJM-UHFFFAOYSA-N 0.000 description 4
- 229910052688 Gadolinium Inorganic materials 0.000 description 3
- MCVAAHQLXUXWLC-UHFFFAOYSA-N [O-2].[O-2].[S-2].[Gd+3].[Gd+3] Chemical compound [O-2].[O-2].[S-2].[Gd+3].[Gd+3] MCVAAHQLXUXWLC-UHFFFAOYSA-N 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- 229910052792 caesium Inorganic materials 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 238000007716 flux method Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 229910052746 lanthanum Inorganic materials 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000011224 oxide ceramic Substances 0.000 description 3
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 3
- 229910052701 rubidium Inorganic materials 0.000 description 3
- 229910052727 yttrium Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- GEHPUONHDHWJIN-UHFFFAOYSA-M [O-2].[OH-].O.P.[Lu+3] Chemical compound [O-2].[OH-].O.P.[Lu+3] GEHPUONHDHWJIN-UHFFFAOYSA-M 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 2
- 230000003081 coactivator Effects 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 2
- 238000003745 diagnosis Methods 0.000 description 2
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 2
- 238000010304 firing Methods 0.000 description 2
- 230000001771 impaired effect Effects 0.000 description 2
- 229910052744 lithium Inorganic materials 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 2
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000007088 Archimedes method Methods 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 229910052775 Thulium Inorganic materials 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 229910000288 alkali metal carbonate Inorganic materials 0.000 description 1
- 229910000318 alkali metal phosphate Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- 239000002775 capsule Substances 0.000 description 1
- 238000009694 cold isostatic pressing Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 229910001938 gadolinium oxide Inorganic materials 0.000 description 1
- 229940075613 gadolinium oxide Drugs 0.000 description 1
- CMIHHWBVHJVIGI-UHFFFAOYSA-N gadolinium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[Gd+3].[Gd+3] CMIHHWBVHJVIGI-UHFFFAOYSA-N 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- UPIZSELIQBYSMU-UHFFFAOYSA-N lanthanum;sulfur monoxide Chemical compound [La].S=O UPIZSELIQBYSMU-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000011812 mixed powder Substances 0.000 description 1
- MMKQUGHLEMYQSG-UHFFFAOYSA-N oxygen(2-);praseodymium(3+) Chemical compound [O-2].[O-2].[O-2].[Pr+3].[Pr+3] MMKQUGHLEMYQSG-UHFFFAOYSA-N 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910003447 praseodymium oxide Inorganic materials 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 230000000638 stimulation Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
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Description
一般式:(Lu1-aMa)2O2S
(式中、MはPr、TbおよびEuから選ばれる少なくとも1種の元素を示し、aは
0.0001≦a≦0.2を満足する数である)
で表される組成を有する酸硫化ルテチウム蛍光体の焼結体を具備するセラミックシンチレータであって、前記酸硫化ルテチウム蛍光体の焼結体は、5ppm以上15ppm以下の範囲のLi、KおよびNaから選ばれる少なくとも1種のアルカリ金属元素と、5ppm以上30ppm以下の範囲のリンとを含有すると共に、99.5%以上の相対密度を有し、放射線の照射面の形状が幅0.1〜1.0mm×長さ0.1〜3.0mmであると共に、放射線の照射方向の厚さが1.0〜2.0mmであることを特徴としている。
発明を実施するための形態
一般式:(Lu1−aMa)2O2S …(1)
(式中、MはPr、TbおよびEuから選ばれる少なくとも1種の元素を示し、aは0.0001≦a≦0.2を満足する数である)
で実質的に表される組成を有することが好ましい。なお、Luの一部は他の希土類元素(Y、LaおよびGdから選ばれる少なくとも1種の元素等)で置換してもよいが、その際の置換量は30mol%以下とすることが好ましい。
セラミックシンチレータの原料として、(Lu0.999Pr0.001)2O2Sの組成を有し、かつ質量比で105ppmのPを含むと共に、アルカリ金属元素として12ppmのNaを含む酸硫化ルテチウム蛍光体粉末を用意した。この酸硫化ルテチウム蛍光体粉末を用いる以外は、上記した実施例1と同一条件の成形およびHIP処理によって、酸硫化ルテチウム蛍光体の焼結体からなるシンチレータチップを作製した。このシンチレータチップのP含有量は49ppm、Na含有量は11ppm、相対密度は99.8%であった。このようなセラミックシンチレータを後述する特性評価に供した。
セラミックシンチレータの原料として、(Lu0.999Pr0.001)2O2Sの組成を有し、かつ質量比で45ppmのPを含むと共に、アルカリ金属元素として69ppmのNaを含む酸硫化ルテチウム蛍光体粉末を用意した。この酸硫化ルテチウム蛍光体粉末を用いる以外は、上記した実施例1と同一条件の成形およびHIP処理によって、酸硫化ルテチウム蛍光体の焼結体からなるシンチレータチップを作製した。このシンチレータチップのP含有量は16ppm、Na含有量は54ppm、相対密度は99.8%であった。このようなセラミックシンチレータを後述する特性評価に供した。
セラミックシンチレータの原料として、(Lu0.999Pr0.001)2O2Sの組成を有し、かつ質量比で5ppmのPを含むと共に、アルカリ金属元素として3ppmのNaを含む酸硫化ルテチウム蛍光体粉末を用意した。この酸硫化ルテチウム蛍光体粉末を用いる以外は、上記した実施例1と同一条件の成形およびHIP処理によって、酸硫化ルテチウム蛍光体の焼結体からなるシンチレータチップを作製した。このシンチレータチップのP含有量は3ppm、Na含有量は2ppm、相対密度は99.2%であった。このようなセラミックシンチレータを後述する特性評価に供した。
セラミックシンチレータの原料として、(Lu0.95Eu0.05)2O2Sの組成を有し、かつ質量比で45ppmのPを含むと共に、アルカリ金属元素として69ppmのNaを含む酸硫化ルテチウム蛍光体粉末を用意した。この酸硫化ルテチウム蛍光体粉末を用いる以外は、上記した実施例1と同一条件の成形およびHIP処理によって、酸硫化ルテチウム蛍光体の焼結体からなるシンチレータチップを作製した。このシンチレータチップのP含有量は16ppm、Na含有量は54ppm、相対密度は99.6%であった。このようなセラミックシンチレータを後述する特性評価に供した。
Claims (5)
- Pr、TbおよびEuから選ばれる少なくとも1種の元素を付活剤として含有し、
一般式:(Lu1-aMa)2O2S
(式中、MはPr、TbおよびEuから選ばれる少なくとも1種の元素を示し、aは0.0001≦a≦0.2を満足する数である)
で表される組成を有する酸硫化ルテチウム蛍光体の焼結体を具備するセラミックシンチレータであって、
前記酸硫化ルテチウム蛍光体の焼結体は、5ppm以上15ppm以下の範囲のLi、KおよびNaから選ばれる少なくとも1種のアルカリ金属元素と、5ppm以上30ppm以下の範囲のリンとを含有すると共に、99.5%以上の相対密度を有し、
放射線の照射面の形状が幅0.1〜1.0mm×長さ0.1〜3.0mmであると共に、放射線の照射方向の厚さが1.0〜2.0mmであることを特徴とするセラミックシンチレータ。 - 請求項1記載のセラミックシンチレータにおいて、
(Gd 0.999 Pr 0.001 )O 2 Sの組成を有する酸硫化ガドリニウム蛍光体の焼結体を長さ3mm×幅1mm×厚さ2mmの形状に加工して作製したセラミックシンチレータに管電圧が120kVpのX線を照射したときの光出力を100としたとき、前記酸硫化ルテチウム蛍光体の焼結体を長さ3mm×幅1mm×厚さ1.5mmの形状に加工して作製したセラミックシンチレータの光出力は105以上であることを特徴とするセラミックシンチレータ。 - 請求項1または請求項2記載のセラミックシンチレータを具備し、入射した放射線に応じて前記セラミックシンチレータを発光させる蛍光発生手段と、
前記蛍光発生手段からの光を受けて、前記光の出力を電気的出力に変換する光電変換手段と
を具備することを特徴とする放射線検出器。 - 被検体に向けて放射線を照射する放射線源と、
前記被査体を透過した放射線を検出する、請求項3記載の放射線検出器と
を具備することを特徴とする放射線検査装置。 - 請求項4記載の放射線検査装置において、
X線CT装置であることを特徴とする放射線検査装置。
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EP2321667B1 (en) * | 2008-08-07 | 2019-12-18 | Koninklijke Philips N.V. | Scintillating material |
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US9175216B2 (en) | 2008-12-30 | 2015-11-03 | Saint-Gobain Ceramics & Plastics, Inc. | Ceramic scintillator body and scintillation device |
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US8877093B2 (en) | 2008-12-30 | 2014-11-04 | Saint-Gobain Ceramics & Plastics, Inc. | Ceramic scintillator body and scintillation device |
US8872119B2 (en) | 2008-12-30 | 2014-10-28 | Saint-Gobain Ceramics & Plastics, Inc. | Ceramic scintillator body and scintillation device |
US8323530B2 (en) | 2009-09-18 | 2012-12-04 | Mitsui Mining & Smelting Co., Ltd. | Phosphor for scintillator |
JPWO2012026585A1 (ja) * | 2010-08-27 | 2013-10-28 | 株式会社トクヤマ | フッ化物結晶、放射線検出用シンチレーター及び放射線検出器 |
WO2012034220A1 (en) | 2010-09-14 | 2012-03-22 | Abdelmounaime Faouzi Zerrouk | Depth-of-interaction scintillation detectors |
EP2836628A4 (en) * | 2012-04-13 | 2016-01-06 | Zecotek Photonics Inc | OXYORTHOSILICATE SCINTILLERS BASED ON MULTI-DOPED LUTETIUM WITH ENHANCED PHOTONIC PROPERTIES |
JP6896425B2 (ja) * | 2014-09-25 | 2021-06-30 | 株式会社東芝 | シンチレータ、シンチレータアレイ、放射線検出器、および放射線検査装置 |
WO2017078051A1 (ja) * | 2015-11-02 | 2017-05-11 | 株式会社 東芝 | シンチレータ、シンチレータアレイ、放射線検出器、および放射線検査装置 |
EP3412753B1 (en) * | 2016-02-02 | 2020-11-25 | Kabushiki Kaisha Toshiba | Method for producing a phosphor |
JPWO2018105611A1 (ja) * | 2016-12-06 | 2019-10-31 | 株式会社東芝 | シンチレータアレイ、シンチレータアレイを製造する方法、放射線検出器、および放射線検査装置 |
EP4080522A4 (en) * | 2019-12-19 | 2023-08-16 | Kabushiki Kaisha Toshiba | FLUORINE PLATE, X-RAY DETECTOR AND X-RAY INSPECTION DEVICE |
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