JP5008673B2 - 試験装置および制御方法 - Google Patents

試験装置および制御方法 Download PDF

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Publication number
JP5008673B2
JP5008673B2 JP2008538600A JP2008538600A JP5008673B2 JP 5008673 B2 JP5008673 B2 JP 5008673B2 JP 2008538600 A JP2008538600 A JP 2008538600A JP 2008538600 A JP2008538600 A JP 2008538600A JP 5008673 B2 JP5008673 B2 JP 5008673B2
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JP
Japan
Prior art keywords
unit
test
control
command
control processor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008538600A
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English (en)
Japanese (ja)
Other versions
JPWO2008044421A1 (ja
Inventor
徳雄 熊木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/546,929 external-priority patent/US7502708B2/en
Priority claimed from US11/546,926 external-priority patent/US7340364B1/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of JPWO2008044421A1 publication Critical patent/JPWO2008044421A1/ja
Application granted granted Critical
Publication of JP5008673B2 publication Critical patent/JP5008673B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
JP2008538600A 2006-10-12 2007-09-12 試験装置および制御方法 Expired - Fee Related JP5008673B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US11/546,929 2006-10-12
US11/546,929 US7502708B2 (en) 2006-10-12 2006-10-12 Test apparatus, and control method
US11/546,926 US7340364B1 (en) 2003-02-26 2006-10-12 Test apparatus, and control method
US11/546,926 2006-10-12
PCT/JP2007/067764 WO2008044421A1 (fr) 2006-10-12 2007-09-12 Testeur et procédé de commande

Publications (2)

Publication Number Publication Date
JPWO2008044421A1 JPWO2008044421A1 (ja) 2010-02-04
JP5008673B2 true JP5008673B2 (ja) 2012-08-22

Family

ID=39282630

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008538600A Expired - Fee Related JP5008673B2 (ja) 2006-10-12 2007-09-12 試験装置および制御方法

Country Status (4)

Country Link
JP (1) JP5008673B2 (ko)
KR (1) KR20090077822A (ko)
TW (1) TW200817702A (ko)
WO (1) WO2008044421A1 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5080580B2 (ja) * 2007-08-27 2012-11-21 株式会社アドバンテスト システム、中継装置、および試験装置
JP4674273B2 (ja) 2008-05-30 2011-04-20 株式会社アドバンテスト 試験装置および情報処理システム
JP4772920B2 (ja) * 2008-05-30 2011-09-14 株式会社アドバンテスト 試験装置および送信装置
US8179154B2 (en) * 2008-10-30 2012-05-15 Advantest Corporation Device, test apparatus and test method
TWI399551B (zh) * 2009-06-26 2013-06-21 Senao Networks Inc Burner device and burner method
US8706439B2 (en) 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method
US8656229B2 (en) * 2012-06-05 2014-02-18 Litepoint Corporation System and method for execution of user-defined instrument command sequences using multiple hardware and analysis modules
KR20150127914A (ko) 2014-05-07 2015-11-18 에스케이하이닉스 주식회사 복수의 프로세서들을 포함하는 반도체 장치 및 그것의 동작 방법

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6447148U (ko) * 1987-09-16 1989-03-23
JP2004163351A (ja) * 2002-11-15 2004-06-10 Shibasoku:Kk 試験装置、試験装置による試験方法
US7340364B1 (en) * 2003-02-26 2008-03-04 Advantest Corporation Test apparatus, and control method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6447148U (ko) * 1987-09-16 1989-03-23
JP2004163351A (ja) * 2002-11-15 2004-06-10 Shibasoku:Kk 試験装置、試験装置による試験方法
US7340364B1 (en) * 2003-02-26 2008-03-04 Advantest Corporation Test apparatus, and control method

Also Published As

Publication number Publication date
WO2008044421A1 (fr) 2008-04-17
TW200817702A (en) 2008-04-16
KR20090077822A (ko) 2009-07-15
JPWO2008044421A1 (ja) 2010-02-04

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