JP4986761B2 - 撮像装置 - Google Patents
撮像装置 Download PDFInfo
- Publication number
- JP4986761B2 JP4986761B2 JP2007203141A JP2007203141A JP4986761B2 JP 4986761 B2 JP4986761 B2 JP 4986761B2 JP 2007203141 A JP2007203141 A JP 2007203141A JP 2007203141 A JP2007203141 A JP 2007203141A JP 4986761 B2 JP4986761 B2 JP 4986761B2
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- JP
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- Prior art keywords
- photoelectric conversion
- photometric
- focus
- focus detection
- conversion unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 238000003384 imaging method Methods 0.000 title claims description 71
- 238000001514 detection method Methods 0.000 claims description 72
- 230000035945 sensitivity Effects 0.000 claims description 64
- 238000006243 chemical reaction Methods 0.000 claims description 56
- 238000012937 correction Methods 0.000 claims description 39
- 230000003287 optical effect Effects 0.000 claims description 28
- 238000005375 photometry Methods 0.000 claims description 21
- 239000000758 substrate Substances 0.000 claims description 9
- 239000004065 semiconductor Substances 0.000 claims description 7
- 230000003595 spectral effect Effects 0.000 description 46
- 230000002093 peripheral effect Effects 0.000 description 11
- 238000002834 transmittance Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- 230000004075 alteration Effects 0.000 description 4
- 230000000007 visual effect Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- 230000011514 reflex Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14645—Colour imagers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B17/00—Details of cameras or camera bodies; Accessories therefor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Focusing (AREA)
- Automatic Focus Adjustment (AREA)
- Exposure Control For Cameras (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Description
7 測光センサ
26 焦点検出ユニット
32 IRカットフィルタ
100 カメラマイクロコンピュータ
Claims (3)
- 焦点検出領域からの出力に基づいて生成された焦点検出情報を用いてフォーカス制御を行うフォーカス制御手段と、
前記焦点検出領域を含む撮像画面内の領域に対応する第1の領域で測光する第1の測光手段と、
前記第1の領域の外側であって、前記焦点検出領域を含まない領域に対応する第2の領域で測光する第2の測光手段と、
前記第1の測光手段又は前記第2の測光手段からの出力に基づいて生成された測光情報を用いて露出制御を行う露出制御手段とを有し、
前記第1の測光手段及び前記第2の測光手段は、前記撮像光学系からの光が入射してくる方向において互いに少なくとも一部が重なるように形成された複数の半導体層により構成され、
前記第1の測光手段は、前記半導体層のうち最も被写体側にある第1の層及び隣接する第2の層から成り可視光領域に主感度を有する第1の光電変換部と、前記第2の層及び隣接する第3の層から成り近赤外領域に主感度を有する第2の光電変換部を有し、
前記第2の測光手段は、前記第1の層を備えず、前記第1の光電変換部及び前記第2の光電変換部より広い波長領域で特定レベル以上の感度を有する第3の光電変換部を有し、
前記フォーカス制御手段は、前記焦点検出情報と、前記第1及び第2の光電変換部からの出力に基づいて生成されたフォーカス補正情報とを用いてフォーカス制御を行い、
前記露出制御手段は、前記第1の領域において、前記第1の光電変換部からの出力に基づいて生成された前記測光情報と、前記第1及び第2の光電変換部からの出力に基づいて生成された露出補正情報とを用いて前記露出制御を行い、
前記第2の領域において、前記第3の光電変換部からの出力に基づいて生成された前記測光情報と、前記露出補正情報の平均値とを用いて前記露出制御を行うことを特徴とする撮像装置。 - 前記フォーカス補正情報及び前記露出補正情報は、前記第1及び第2の光電変換部からの出力の比に基づいて生成されることを特徴とする請求項1に記載の撮像装置。
- 前記第1及び第2の光電変換部は、同一の半導体基板上に、該基板の厚さ方向にて互いに少なくとも一部が重なるように形成されていることを特徴とする請求項1又は2に記載の撮像装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007203141A JP4986761B2 (ja) | 2007-08-03 | 2007-08-03 | 撮像装置 |
US12/181,001 US7595475B2 (en) | 2007-08-03 | 2008-07-28 | Image-pickup apparatus having a focus controller and an exposure controller |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007203141A JP4986761B2 (ja) | 2007-08-03 | 2007-08-03 | 撮像装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009037139A JP2009037139A (ja) | 2009-02-19 |
JP2009037139A5 JP2009037139A5 (ja) | 2010-09-02 |
JP4986761B2 true JP4986761B2 (ja) | 2012-07-25 |
Family
ID=40337216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007203141A Expired - Fee Related JP4986761B2 (ja) | 2007-08-03 | 2007-08-03 | 撮像装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7595475B2 (ja) |
JP (1) | JP4986761B2 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5190537B2 (ja) * | 2009-02-23 | 2013-04-24 | パナソニック株式会社 | 撮像素子及びそれを備えた撮像装置 |
JP5436139B2 (ja) * | 2009-10-20 | 2014-03-05 | キヤノン株式会社 | 撮像装置 |
JP5464982B2 (ja) * | 2009-11-20 | 2014-04-09 | キヤノン株式会社 | 撮像装置および画像処理方法 |
JP6202866B2 (ja) * | 2013-04-11 | 2017-09-27 | キヤノン株式会社 | 撮像装置およびその制御プログラム |
JP6223055B2 (ja) * | 2013-08-12 | 2017-11-01 | キヤノン株式会社 | 光電変換装置 |
JP6529214B2 (ja) * | 2013-10-30 | 2019-06-12 | キヤノン株式会社 | 撮像装置 |
US10488262B2 (en) * | 2015-04-20 | 2019-11-26 | Sharp Kabushiki Kaisha | Integrated circuit and measuring device |
JP2019053315A (ja) * | 2018-11-19 | 2019-04-04 | 株式会社ニコン | 焦点調節装置および撮像装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3118849B2 (ja) * | 1991-03-06 | 2000-12-18 | 株式会社ニコン | 焦点検出装置 |
US5751354A (en) * | 1994-04-28 | 1998-05-12 | Canon Kabushiki Kaisha | Image sensing apparatus and method with exposure performed based on focus evaluation values |
JP2003241064A (ja) * | 2002-02-14 | 2003-08-27 | Pentax Corp | 焦点検出装置 |
JP2004309701A (ja) * | 2003-04-04 | 2004-11-04 | Olympus Corp | 測距測光用センサ及びカメラ |
JP2006071741A (ja) * | 2004-08-31 | 2006-03-16 | Olympus Corp | 焦点検出装置 |
JP4612869B2 (ja) * | 2005-06-08 | 2011-01-12 | キヤノン株式会社 | 焦点検出装置、撮像装置、および合焦方法 |
-
2007
- 2007-08-03 JP JP2007203141A patent/JP4986761B2/ja not_active Expired - Fee Related
-
2008
- 2008-07-28 US US12/181,001 patent/US7595475B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2009037139A (ja) | 2009-02-19 |
US20090032678A1 (en) | 2009-02-05 |
US7595475B2 (en) | 2009-09-29 |
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