JP4980234B2 - 金属カルボニル前駆体から金属層を堆積する方法 - Google Patents
金属カルボニル前駆体から金属層を堆積する方法 Download PDFInfo
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- 229910052751 metal Inorganic materials 0.000 title claims description 207
- 239000002184 metal Substances 0.000 title claims description 207
- 238000000034 method Methods 0.000 title claims description 201
- 239000002243 precursor Substances 0.000 title claims description 188
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 title claims description 123
- 238000000151 deposition Methods 0.000 title claims description 76
- 239000007789 gas Substances 0.000 claims description 233
- 230000008569 process Effects 0.000 claims description 174
- 239000000758 substrate Substances 0.000 claims description 127
- 230000008021 deposition Effects 0.000 claims description 63
- 238000010790 dilution Methods 0.000 claims description 44
- 239000012895 dilution Substances 0.000 claims description 44
- 238000009826 distribution Methods 0.000 claims description 28
- 239000012159 carrier gas Substances 0.000 claims description 27
- 238000001704 evaporation Methods 0.000 claims description 25
- 230000008020 evaporation Effects 0.000 claims description 25
- 238000012545 processing Methods 0.000 claims description 17
- NQZFAUXPNWSLBI-UHFFFAOYSA-N carbon monoxide;ruthenium Chemical group [Ru].[Ru].[Ru].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-] NQZFAUXPNWSLBI-UHFFFAOYSA-N 0.000 claims description 10
- 238000010438 heat treatment Methods 0.000 claims description 10
- 239000010948 rhodium Substances 0.000 claims description 8
- 239000003085 diluting agent Substances 0.000 claims description 7
- 239000011651 chromium Substances 0.000 claims description 6
- 238000003113 dilution method Methods 0.000 claims description 6
- 239000007787 solid Substances 0.000 claims description 6
- 238000002230 thermal chemical vapour deposition Methods 0.000 claims description 5
- 238000009834 vaporization Methods 0.000 claims description 5
- 230000008016 vaporization Effects 0.000 claims description 5
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 claims description 4
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical group [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 4
- 239000011733 molybdenum Substances 0.000 claims description 4
- 229910052703 rhodium Inorganic materials 0.000 claims description 4
- 229910002091 carbon monoxide Inorganic materials 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- ZIZHEHXAMPQGEK-UHFFFAOYSA-N dirhenium decacarbonyl Chemical group [Re].[Re].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-] ZIZHEHXAMPQGEK-UHFFFAOYSA-N 0.000 claims description 3
- 238000002156 mixing Methods 0.000 claims description 3
- VUBLMKVEIPBYME-UHFFFAOYSA-N carbon monoxide;osmium Chemical group [Os].[Os].[Os].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-] VUBLMKVEIPBYME-UHFFFAOYSA-N 0.000 claims description 2
- FQNHWXHRAUXLFU-UHFFFAOYSA-N carbon monoxide;tungsten Chemical group [W].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-] FQNHWXHRAUXLFU-UHFFFAOYSA-N 0.000 claims description 2
- 229910017052 cobalt Inorganic materials 0.000 claims description 2
- 239000010941 cobalt Substances 0.000 claims description 2
- 239000000203 mixture Substances 0.000 claims 2
- 238000011144 upstream manufacturing Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 79
- 239000012808 vapor phase Substances 0.000 description 57
- 239000002994 raw material Substances 0.000 description 44
- 239000006185 dispersion Substances 0.000 description 36
- 239000012071 phase Substances 0.000 description 29
- 239000010949 copper Substances 0.000 description 17
- 239000000463 material Substances 0.000 description 15
- 239000006227 byproduct Substances 0.000 description 13
- 230000004888 barrier function Effects 0.000 description 10
- 239000010408 film Substances 0.000 description 8
- 238000000354 decomposition reaction Methods 0.000 description 7
- 239000012530 fluid Substances 0.000 description 6
- 238000001465 metallisation Methods 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 229910052707 ruthenium Inorganic materials 0.000 description 4
- 238000005979 thermal decomposition reaction Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000003989 dielectric material Substances 0.000 description 3
- 229910052734 helium Inorganic materials 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 229910052743 krypton Inorganic materials 0.000 description 3
- 229910052754 neon Inorganic materials 0.000 description 3
- 229910052715 tantalum Inorganic materials 0.000 description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000005234 chemical deposition Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 238000005137 deposition process Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 229910052756 noble gas Inorganic materials 0.000 description 2
- 230000002028 premature Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- ITWBWJFEJCHKSN-UHFFFAOYSA-N 1,4,7-triazonane Chemical compound C1CNCCNCCN1 ITWBWJFEJCHKSN-UHFFFAOYSA-N 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000005289 physical deposition Methods 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 239000011819 refractory material Substances 0.000 description 1
- 239000003870 refractory metal Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76843—Barrier, adhesion or liner layers formed in openings in a dielectric
- H01L21/76846—Layer combinations
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/16—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal carbonyl compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/28556—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by chemical means, e.g. CVD, LPCVD, PECVD, laser CVD
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- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
Description
Ru3(CO)12(ad)⇔ Ru3(CO)x(ad)+(12−x)CO(g) (1)
または、
Ru3(CO)x(ad)⇔ 3Ru(s)+xCO(g) (2)
ここで、これらの副生成物は、堆積システム1の内表面上に吸着(ad)、すなわち凝結する。その表面上に金属が堆積すると、基板間でプロセス再現性などの問題が生じる。また、たとえば、Ru3(CO)12は、堆積システムの内面に凝結する。すなわち、
Ru3(CO)12(g)⇔ Ru3(CO)x(ad) (3)
要するに、いくつかの金属カルボニル前駆体(たとえば、Ru3(CO)12)の蒸気圧が低く、かつ、そのプロセスウィンドウが狭いことから、基板25上の金属層の堆積速度は低くなる。
Claims (18)
- 基板上に金属層を堆積する方法であって:
堆積システムの処理チャンバ内に基板を供する工程;
前記処理チャンバの上流で金属カルボニル前駆体とCOガスを含む処理気体を生成する工程;
前記処理気体を前記処理チャンバへ輸送して導入する工程;
前記処理チャンバに希釈気体を加え、前記の処理チャンバ内の処理気体と混合させて、希釈処理気体を生成し、かつ前記処理チャンバ内のCOの分圧を減少させる工程;及び、
前記基板を前記希釈気体に曝露することで、熱化学気相成長によって前記基板上に金属層を堆積する工程;
を有する方法。 - 前記の処理気体を生成する工程は:
金属カルボニル前駆体を加熱することで該金属カルボニル前駆体の蒸気を生成する工程;及び、
前記COガスと前記金属カルボニル前駆体の蒸気とを混合させる工程;
を有する、
請求項1に記載の方法。 - 前記の混合させる工程は、前記金属カルボニル前駆体全体にわたるように前記COガスを流して、前記金属カルボニル前駆体を生成された状態で捕獲する工程を有する、請求項2に記載の方法。
- 前記の処理気体を生成する工程は、前記金属カルボニル前駆体全体にわたるようにキャリアガスを流す工程を有する、請求項2に記載の方法。
- 前記金属カルボニル前駆体の蒸気は、タングステンカルボニル、モリブデンカルボニル、コバルトカルボニル、ロジウムカルボニル、レニウムカルボニル、クロムカルボニル、ルテニウムカルボニル、若しくはオスミウムカルボニル、又は上記の混合物を有する、請求項1に記載の方法。
- 前記金属カルボニル前駆体の蒸気は、W(CO)6, Mo(CO)6, Co2(CO)8, Rh4(CO)12, Re2(CO)10, Cr(CO)6, Ru3(CO)12, 若しくはOs3(CO)12、又は上記の混合物を有する、請求項1に記載の方法。
- 前記の希釈気体を加える工程は:
前記基板の上方にて前記処理チャンバと結合する蒸気分配システムの蒸気分配プレナム内で前記処理気体に前記希釈気体を加える工程;及び、
前記希釈気体を、前記蒸気分配システムの蒸気分配プレートを介して、前記蒸気分配システムと前記基板との間に位置する処理領域へ流す工程;
を有する、
請求項1に記載の方法。 - 前記の希釈気体を加える工程は、前記処理気体が前記蒸気分配プレートを流れた後に、前記基板の上方にて前記処理チャンバと結合する蒸気分配システムの蒸気分配プレートと前記基板の間に位置する処理領域内で前記処理気体に前記希釈気体を加える工程を有する、請求項1に記載の方法。
- 前記の希釈気体を加える工程は、前記基板の上方にて前記処理チャンバと結合する蒸気分配システムの蒸気分配プレート内部で前記処理気体に前記希釈気体を加える工程を有する、請求項1に記載の方法。
- 前記の処理気体を生成する工程は、前記COガスに対する前記金属カルボニル前駆体の蒸気の相対濃度を利用することで、前記基板上での前記金属カルボニル前駆体の堆積速度を制御する工程を有する、請求項1に記載の方法。
- 堆積システムであって:
蒸気分配システムを有する処理チャンバ;
前記処理チャンバ内の前記蒸気分配システムの下に設けられていて、かつ基板を支持及び加熱するように備えられている、基板ホルダ;
金属カルボニル前駆体とCOガスを含む処理気体を生成し、かつ該処理気体を前記蒸気分配システムへ導入するように備えられている、前駆体供給システム;
前記処理チャンバと結合し、かつ前記の処理チャンバ内で処理気体に希釈ガスを加えることで、希釈処理気体を生成し、かつ前記処理チャンバ内のCOの分圧を減少させるように備えられている、希釈ガス源;
前記基板を前記希釈処理気体に晒している間に当該堆積システムを制御することで、熱化学気相成長法によって、前記基板上に金属層を堆積するように備えられている、制御装置;
を有する堆積システム。 - 前記前駆体供給システムが、金属カルボニル前駆体を加熱することで該金属カルボニル前駆体の蒸気を生成するように備えられている金属前駆体気化蒸発システム、及び、前記COガスと前記金属カルボニル前駆体の蒸気とを混合させるように備えられたCOガス源、を有する、請求項11に記載の堆積システム。
- 前記希釈ガス源は、前記金属カルボニル前駆体全体にわたるように前記COガスを流すことによって、前記COガスと前記金属カルボニル前駆体の蒸気とを混合させるように備えられている、請求項12に記載の堆積システム。
- 前記希釈ガス源は、前記蒸気分配システムの蒸気分配プレナム内で前記処理気体に前記希釈気体を加えるように備えられている、請求項11に記載の堆積システム。
- 前記希釈ガス源は、前記蒸気分配システムと前記基板の間で前記処理気体に前記希釈気体を加えるように備えられている、請求項11に記載の堆積システム。
- 前記希釈ガス源は、前記蒸気分配システムの蒸気分配プレート内部で前記処理気体に前記希釈気体を加えるように備えられている、請求項11に記載の堆積システム。
- 基板上に金属層を堆積する方法であって、
当該方法は:
堆積システムの処理チャンバ内に基板を供する工程であって、
前記処理チャンバは、該処理チャンバの流入口に隣接して設けられた蒸気分配システム、及び、前記蒸気分配システムと前記基板との間の処理領域を有し、
前記蒸気分配システムは、前記処理領域に隣接する蒸気分配プレート、及び、前記流入口と前記蒸気分配プレートとの間の蒸気分配プレナムを有する、
工程;
金属カルボニル前駆体と一酸化炭素(CO)ガスを含む処理気体を生成する工程;
を有し、
前記の処理気体を生成する工程は:
前駆体気化蒸発システム内の固体金属カルボニル前駆体を加熱することで、金属カルボニルの前駆体蒸気を生成する工程;
前記加熱中に前記の前駆体気化蒸発システム内の固体金属カルボニル前駆体と接するように前記COガスを流すことで、前記金属カルボニル前駆体蒸気を生成された状態で捕獲する工程;
前記処理気体を、前記前駆体気化蒸発システムから、前記処理チャンバの流入口へ輸送して、前記蒸気分配システムを介して、前記処理チャンバの処理領域へ導入する工程;
前記の処理チャンバ内の処理気体に希釈気体を加えることによって、希釈処理気体を生成する工程;及び、
前記基板を前記希釈処理気体に曝露することで、熱化学気相成長法によって前記基板上に金属層を堆積する工程;
によって行われる、方法。 - 前記金属カルボニル前駆体がルテニウムカルボニル前駆体で、かつ
前記金属層がルテニウム金属層である、
請求項17に記載の堆積方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/996,144 US7279421B2 (en) | 2004-11-23 | 2004-11-23 | Method and deposition system for increasing deposition rates of metal layers from metal-carbonyl precursors |
US10/996,144 | 2004-11-23 | ||
PCT/US2005/035429 WO2006057706A2 (en) | 2004-11-23 | 2005-10-03 | Method for deposition of metal layers from metal carbonyl precursors |
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KR101271895B1 (ko) | 2013-06-05 |
EP1815043A2 (en) | 2007-08-08 |
US20060110918A1 (en) | 2006-05-25 |
WO2006057706A2 (en) | 2006-06-01 |
JP2008520834A (ja) | 2008-06-19 |
KR20070083865A (ko) | 2007-08-24 |
US20080035062A1 (en) | 2008-02-14 |
CN101072894A (zh) | 2007-11-14 |
US7279421B2 (en) | 2007-10-09 |
CN101072894B (zh) | 2011-06-08 |
US7646084B2 (en) | 2010-01-12 |
WO2006057706A3 (en) | 2006-11-09 |
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