JP4936310B2 - Iii族窒化物系化合物半導体の製造装置 - Google Patents
Iii族窒化物系化合物半導体の製造装置 Download PDFInfo
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- JP4936310B2 JP4936310B2 JP2006106860A JP2006106860A JP4936310B2 JP 4936310 B2 JP4936310 B2 JP 4936310B2 JP 2006106860 A JP2006106860 A JP 2006106860A JP 2006106860 A JP2006106860 A JP 2006106860A JP 4936310 B2 JP4936310 B2 JP 4936310B2
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- Prior art keywords
- reaction vessel
- nitrogen
- group iii
- compound semiconductor
- iii nitride
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000004519 manufacturing process Methods 0.000 title claims description 17
- 239000004065 semiconductor Substances 0.000 title claims description 17
- -1 nitride compound Chemical class 0.000 title claims description 15
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 79
- 229910052757 nitrogen Inorganic materials 0.000 claims description 37
- 238000010438 heat treatment Methods 0.000 claims description 33
- 239000007789 gas Substances 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 13
- 239000002184 metal Substances 0.000 claims description 13
- 239000000155 melt Substances 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 2
- 150000004767 nitrides Chemical class 0.000 claims description 2
- 239000011734 sodium Substances 0.000 description 8
- 239000013078 crystal Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 238000007716 flux method Methods 0.000 description 6
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 5
- 230000004907 flux Effects 0.000 description 5
- 229910052733 gallium Inorganic materials 0.000 description 5
- 229910052708 sodium Inorganic materials 0.000 description 5
- 229910002601 GaN Inorganic materials 0.000 description 4
- 229910001873 dinitrogen Inorganic materials 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 3
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 3
- 239000000203 mixture Substances 0.000 description 2
- 238000002109 crystal growth method Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910017464 nitrogen compound Inorganic materials 0.000 description 1
- 150000002830 nitrogen compounds Chemical class 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B9/00—Single-crystal growth from melt solutions using molten solvents
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/90—Apparatus characterized by composition or treatment thereof, e.g. surface finish, surface coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Description
150:外套部を有する反応容器
200:外部容器
10:供給管
10a、10b:供給管10の被加熱部
11:排出管
31a、31b、31c:加熱装置
32:第2の加熱装置
50:反応容器の外套部
Claims (1)
- III族窒化物系化合物半導体の製造装置であって、
III族金属とそれとは異なる金属とを溶融した状態で保持する反応容器と、
前記反応容器と、前記反応容器を加熱する加熱装置とを内部に有する外部容器と、
前記外部容器の外側から前記反応容器内に少なくとも窒素を含む気体を供給するための供給管とを有し、
前記反応容器はその外周に設けられ、前記供給管に接続され、前記反応容器の内部に至る外套部を有し、
前記少なくとも窒素を含む気体は、前記外套部を通過する間に加熱された後、前記反応容器内部のIII族金属とそれとは異なる金属との前記溶融物に導かれることを特徴とするIII族窒化物系化合物半導体の製造装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006106860A JP4936310B2 (ja) | 2006-04-07 | 2006-04-07 | Iii族窒化物系化合物半導体の製造装置 |
US12/225,550 US8123856B2 (en) | 2006-04-07 | 2007-04-05 | Method and apparatus for producing group III nitride based compound semiconductor |
PCT/JP2007/058023 WO2007117032A1 (en) | 2006-04-07 | 2007-04-05 | Method and apparatus for producing group iii nitride based compound semiconductor |
DE112007000867T DE112007000867B4 (de) | 2006-04-07 | 2007-04-05 | Vorrichtung zum Herstellen eines Gruppe III-Nitrid basierten Verbindungshalbleiters |
CN2007800116167A CN101415867B (zh) | 2006-04-07 | 2007-04-05 | 用于制造第ⅲ族氮化物基化合物半导体的方法和设备 |
Applications Claiming Priority (1)
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---|---|---|---|
JP2006106860A JP4936310B2 (ja) | 2006-04-07 | 2006-04-07 | Iii族窒化物系化合物半導体の製造装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007277058A JP2007277058A (ja) | 2007-10-25 |
JP2007277058A5 JP2007277058A5 (ja) | 2009-02-26 |
JP4936310B2 true JP4936310B2 (ja) | 2012-05-23 |
Family
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JP2006106860A Active JP4936310B2 (ja) | 2006-04-07 | 2006-04-07 | Iii族窒化物系化合物半導体の製造装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8123856B2 (ja) |
JP (1) | JP4936310B2 (ja) |
CN (1) | CN101415867B (ja) |
DE (1) | DE112007000867B4 (ja) |
WO (1) | WO2007117032A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010254495A (ja) * | 2009-04-22 | 2010-11-11 | Ihi Corp | 基板製造装置 |
CN104131351B (zh) * | 2014-07-29 | 2017-12-15 | 北京大学东莞光电研究院 | 一种制备氮化物单晶体材料的工业化装置及方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4011828B2 (ja) * | 1999-06-09 | 2007-11-21 | 株式会社リコー | Iii族窒化物結晶の結晶成長方法及びiii族窒化物結晶の製造方法 |
JP2003313099A (ja) * | 2002-04-22 | 2003-11-06 | Ricoh Co Ltd | Iii族窒化物結晶成長装置 |
US6770135B2 (en) | 2001-12-24 | 2004-08-03 | Crystal Is, Inc. | Method and apparatus for producing large, single-crystals of aluminum nitride |
US7220311B2 (en) * | 2002-11-08 | 2007-05-22 | Ricoh Company, Ltd. | Group III nitride crystal, crystal growth process and crystal growth apparatus of group III nitride |
JP4560287B2 (ja) * | 2002-11-08 | 2010-10-13 | 株式会社リコー | Iii族窒化物の結晶製造方法 |
JP4493427B2 (ja) * | 2003-07-29 | 2010-06-30 | 日本碍子株式会社 | Iii族窒化物単結晶の製造方法 |
JP4534631B2 (ja) * | 2003-10-31 | 2010-09-01 | 住友電気工業株式会社 | Iii族窒化物結晶の製造方法 |
JP4560307B2 (ja) * | 2004-03-01 | 2010-10-13 | 株式会社リコー | Iii族窒化物の結晶製造方法 |
JP4819677B2 (ja) * | 2004-03-31 | 2011-11-24 | パナソニック株式会社 | Iii族元素窒化物結晶の製造方法、それに用いる製造装置、およびそれらにより得られた半導体素子 |
WO2005103341A1 (ja) * | 2004-04-27 | 2005-11-03 | Matsushita Electric Industrial Co., Ltd. | Iii族元素窒化物結晶製造装置およびiii族元素窒化物結晶製造方法 |
JP4847713B2 (ja) | 2005-05-09 | 2011-12-28 | 高圧ガス保安協会 | ジメチルエーテル測定装置および方法 |
-
2006
- 2006-04-07 JP JP2006106860A patent/JP4936310B2/ja active Active
-
2007
- 2007-04-05 WO PCT/JP2007/058023 patent/WO2007117032A1/en active Application Filing
- 2007-04-05 DE DE112007000867T patent/DE112007000867B4/de active Active
- 2007-04-05 US US12/225,550 patent/US8123856B2/en active Active
- 2007-04-05 CN CN2007800116167A patent/CN101415867B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
DE112007000867T5 (de) | 2009-05-20 |
US8123856B2 (en) | 2012-02-28 |
US20090173273A1 (en) | 2009-07-09 |
DE112007000867B4 (de) | 2012-03-22 |
CN101415867B (zh) | 2012-03-28 |
WO2007117032A1 (en) | 2007-10-18 |
CN101415867A (zh) | 2009-04-22 |
JP2007277058A (ja) | 2007-10-25 |
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