JP4927884B2 - Glass substrate etching apparatus and glass thin plate produced by the etching apparatus - Google Patents

Glass substrate etching apparatus and glass thin plate produced by the etching apparatus Download PDF

Info

Publication number
JP4927884B2
JP4927884B2 JP2009003958A JP2009003958A JP4927884B2 JP 4927884 B2 JP4927884 B2 JP 4927884B2 JP 2009003958 A JP2009003958 A JP 2009003958A JP 2009003958 A JP2009003958 A JP 2009003958A JP 4927884 B2 JP4927884 B2 JP 4927884B2
Authority
JP
Japan
Prior art keywords
glass substrate
etching
nozzle
etching solution
etching apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2009003958A
Other languages
Japanese (ja)
Other versions
JP2009161429A (en
Inventor
ヒョン−グン,パク
ソン−ウ,コ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Econy Co ltd
Hyoung Guen park
Sung Woo ko
Original Assignee
Econy Co ltd
Hyoung Guen park
Sung Woo ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=40023668&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP4927884(B2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Econy Co ltd, Hyoung Guen park, Sung Woo ko filed Critical Econy Co ltd
Publication of JP2009161429A publication Critical patent/JP2009161429A/en
Application granted granted Critical
Publication of JP4927884B2 publication Critical patent/JP4927884B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67075Apparatus for fluid treatment for etching for wet etching
    • H01L21/6708Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133302Rigid substrates, e.g. inorganic substrates

Description

本発明は硝子基板をエッチングして硝子基板の厚さを薄くする硝子基板のエッチング装置に関することとして、もっと詳しくは前記の硝子基板が少なくとも一つ以上配列されて、前記の硝子基板の下部には前記の硝子基板と地面が傾きを形成するようにして前記の硝子基板の固定と脱去ができるようにする固定部材を具備し、前記の硝子基板の上部にはエッチング液が下方に噴射される噴射部材を備えていることを特徴とする硝子基板のエッチング装置と前記の装置によって製造された硝子薄板に関するのである。   The present invention relates to a glass substrate etching apparatus that etches a glass substrate to reduce the thickness of the glass substrate. More specifically, at least one of the glass substrates is arranged, and a lower portion of the glass substrate is disposed at the bottom of the glass substrate. A fixing member is provided for fixing and removing the glass substrate so that the glass substrate and the ground form an inclination, and an etching solution is sprayed downward on the glass substrate. The present invention relates to a glass substrate etching apparatus including an injection member and a glass thin plate manufactured by the apparatus.

現代社会が高度に情報化して行くによって光エレクトロニクス(photoelectronics)関連部品及び機器が著しく進歩して普及されている。その中で、画像を表示するディスプレー装置はテレビ装置用、パソコンのモニター装置用などに対する研究が加速化された。これによって前記のディスプレー装置に必須な基板に使われる硝子薄板と前記の薄板の製造方法に対する研究も共に加速化された。   As modern society becomes highly information-oriented, photoelectronics-related parts and devices have been remarkably advanced and spread. Among them, research on display devices for displaying images was accelerated for television devices and personal computer monitor devices. As a result, the research on the glass thin plate used for the substrate essential for the display apparatus and the method for producing the thin plate has been accelerated.

従来にディスプレーパネルを軽量に薄型化する技術には大きく機械研磨法と化学的湿式エッチング法(wet−etching)がある。ディスプレー開発初期には非常に薄いスリムパネルが要求されなくて機械研磨法をたくさん使ったが最近は超スリム製品が要求されながら生産性が優秀な化学的湿式エッチング法(wet−etching)を使い始めた。   Conventionally, techniques for thinning a display panel in light weight include a mechanical polishing method and a chemical wet etching method (wet-etching). In the early stages of display development, a very thin slim panel was not required, and many mechanical polishing methods were used. Recently, however, the chemical wet etching method (wet-etching), which has excellent productivity while requiring an ultra slim product, has begun. It was.

前記の化学的湿式エッチング法(wet−etching)の中でTFT−LCD用パネルスリムの製造方法に最も先に適用されたことはデイッピング法であり、それより一段進化したのがスプレー法とジェットフロー法であるが前記のデイッピング法の類似の原理が適用されたのである。ただ巨視的なエッチング液の供給と反応生成物の拡散、除去の原理が違うだけである。   Among the above-mentioned chemical wet etching methods (wet-etching), the dipping method was the first to be applied to the TFT-LCD panel slim manufacturing method, and the spray method and the jet flow were further advanced. But the similar principle of the above dapping method was applied. The only difference is the supply of macroscopic etching solution and the diffusion and removal of reaction products.

前記の化学的湿式エッチング法に対して簡単に説明すると、前記の湿式エッチング法はエッチング液の撹拌完了の後エッチング液の主要の構成成分である[H]、[HF]と[HF2]と硝子基板の主要の成分であるO−Si−O(SiO)の間の化学反応を利用したことで前記の化学反応式は下のようである。 The chemical wet etching method will be briefly described. In the wet etching method, after the stirring of the etching solution is completed, [H + ], [HF] and [HF2 ] which are main components of the etching solution. The above chemical reaction formula is as follows by using a chemical reaction between O—Si—O (SiO 2 ) which is a main component of the glass substrate.

Figure 0004927884
Figure 0004927884

前記の弗素酸(HF)を含んでいるエッチング液を利用して行なう硝子基板がエッチングされる段階は下記のように五つの段階で区分することができるし、前記の五つの段階がエッチングの特性を左右する。前記の五つの段階はi)硝子基板近所の拡散層の内にエッチング液の拡散、ii)エッチング液の成分が硝子基板の表面に吸着、iii)エッチング液の成分と硝子基板との化学反応、iv)化学反応の後に作られた反応生成物が硝子基板から離脱、v)反応生成物が硝子基板近所の拡散階の外に除去される段階である。   The step of etching the glass substrate using the etchant containing fluoric acid (HF) can be divided into the following five steps. The above five steps are etching characteristics. Influences. The five stages are i) diffusion of the etching solution in the diffusion layer near the glass substrate, ii) the component of the etching solution is adsorbed on the surface of the glass substrate, iii) the chemical reaction between the component of the etching solution and the glass substrate, iv) The reaction product produced after the chemical reaction is detached from the glass substrate, and v) The reaction product is removed out of the diffusion floor near the glass substrate.

前記の化学原理を利用している湿式エッチング法であるデイッピング法、スプレー法、ジェットフロー法に対する技術をよく見ると次のようである。前記のデイッピング法はエッチング槽(etching bath)の中にエッチング液を満たして前記のエッチング液に硝子基板をつけた後エアバブル(air bubble)をエッチング槽の底で発生させる。前記のエアバブルによって硝子基板の表面でエッチング液の流れ現象が発生するようにするのである。ここで前記のエアバブルはエッチング液の拡散と反応生成物の離脱及び拡散層の外への除去などエッチング液あるいは生成物の運動論に関係する。前記のエアバブルはエッチング液及び反応生成物の運動エネルギーを大きくして接触、拡散及び離脱を早く発生するように手伝ってくれるようになる。   The technologies for the dipping method, the spray method, and the jet flow method, which are wet etching methods using the above chemical principle, are as follows. In the dipping method, an etching bath is filled with an etching solution, a glass substrate is attached to the etching solution, and then an air bubble is generated at the bottom of the etching bath. The air bubble causes the etching liquid to flow on the surface of the glass substrate. Here, the air bubbles relate to the kinetics of the etching solution or product such as the diffusion of the etching solution, the separation of the reaction product, and the removal from the diffusion layer. The air bubbles increase the kinetic energy of the etching solution and the reaction product, thereby helping to quickly generate contact, diffusion and separation.

すなわち、硝子基板に新液を速かに供給して生成物を基板表面から速かに抜き取って来る役目をするようになる。前記のような原理で動作する前記のデイッピング法の長所はエッチング液がエッチング槽にぎっしりと満たしているのでカセットに基板をさし込んでいっぺんに数枚を投入することができて生産性が高いというのである。前記のデイッピング法の短所は反応生成物が続いてエッチング槽の中に残っていてこのような反応生成物が基板の表面に付くなど表面の品質に悪影響を及ぼすことである。前記のような理由で前記の硝子基板の蝕刻量を多くして前記の硝子基板の厚さを薄くしにくくて、前記の硝子基板をエッチングするために使われるエッチング液の使用量が多いという短所がある。   That is, the new liquid is quickly supplied to the glass substrate and the product is quickly extracted from the substrate surface. The advantage of the dipping method that operates on the principle as described above is that the etching solution is fully filled in the etching tank, so that the substrate can be inserted into the cassette and several sheets can be put in at once and the productivity is high. It is. The disadvantage of the dipping method is that the reaction product continues to remain in the etching tank and the reaction product adheres to the surface of the substrate, which adversely affects the surface quality. Due to the above reasons, it is difficult to reduce the thickness of the glass substrate by increasing the etching amount of the glass substrate, and there is a disadvantage that a large amount of etching solution is used to etch the glass substrate. There is.

前記のようなデイッピング法の短所を補うために開発されたのがスプレー法である。前記のスプレー法は品質的な側面でデイッピング法より進歩された方法である。図1を参考すれば前記のスプレー法はノズル11からエッチング液12が噴射されて硝子基板13に撤かれるのである。エッチングの原理を通じるエッチングの段階は先にデイッピング法で言及したことと等しい。しかし、前記のスプレー法はスプレーという道具を使って硝子基板に垂直にエッチング液が入射されるのでエッチング液の運動エネルギーが非常に大きくて、新液の供給と生成物の除去をもっと迅速で均一にすることができる。また、前記のスプレー法がデイッピング法より優秀な表面の品質を具現することができるし、同じ温度でエッチレ―ト(etch rate)が少し高いのである。   The spray method has been developed to compensate for the disadvantages of the dipping method as described above. The above-mentioned spray method is an advanced method from the dipping method in terms of quality. Referring to FIG. 1, in the spray method, the etching liquid 12 is sprayed from the nozzle 11 and removed from the glass substrate 13. The stage of etching through the principle of etching is equivalent to that mentioned in the dipping method above. However, in the above spray method, the etching solution is injected perpendicularly onto the glass substrate using a tool called spray, so the kinetic energy of the etching solution is very large, and the supply of the new solution and the removal of the product are more rapid and uniform. Can be. In addition, the above-mentioned spray method can realize surface quality superior to the dipping method, and the etch rate is slightly higher at the same temperature.

前記のスプレー法は反応生成物を手軽く取り除いてエッチング液が続いて液タンクとエッチング空間を循環するから大容量のタンクを使うことができる。また、前記のスプレー法は反応生成物の処理などを通じて持続的に使うことができて表面の品質を優秀な状態で維持することができるし、エッチング液の使用量を節減することができる長所がある。しかし、前記のスプレー法による場合硝子基板を一枚ずつ処理しなければならないので生産性が著しく低下される問題点がある。   In the spray method, the reaction product is easily removed and the etching solution is circulated between the solution tank and the etching space, so that a large-capacity tank can be used. In addition, the spray method can be used continuously through treatment of reaction products, etc., so that the surface quality can be maintained in an excellent state, and the amount of etching solution used can be reduced. is there. However, in the case of the spray method described above, the glass substrates must be processed one by one.

前記のような従来技術の問題点を解決するためにジェットフロー(jet flow)法が開発されたが、前記のジェットフロー法はデイッピング法とスプレー法の混合だと見られる。前記のジェットフロー法はエッチング槽にエッチング液を満たして硝子基板を沈積させた後、一方でエッチング液の流れを力強く発生させてデイッピング法でエアバブルの役目をするようにする。また、エッチング槽にエッチング液を続けて供給してエッチング槽を超えるエッチング液はまた回収して使った。しかし、前記のジェットフロー法は生産性を進めることができる方法や初期の投資費用がたくさん所要される問題点がある。   In order to solve the above-mentioned problems of the prior art, a jet flow method has been developed, and the jet flow method seems to be a mixture of a dipping method and a spray method. In the jet flow method, after an etching bath is filled with an etching solution and a glass substrate is deposited, a flow of the etching solution is generated strongly to serve as an air bubble by a dipping method. Further, the etching solution was continuously supplied to the etching tank, and the etching solution exceeding the etching tank was recovered and used. However, the above-described jet flow method has a problem in that it can increase productivity and requires a lot of initial investment costs.

本発明は前記のような問題点を解決するために提案されたこととして、本発明による硝子基板のエッチング装置は少なくとも一つ以上の硝子基板が配列されて、前記の硝子基板の下部には前記の硝子基板と地面が傾きを形成するようにして前記の硝子基板の固定と脱去ができるようにする固定部材を具備するようにして、前記の硝子基板の上部にはエッチング液が下方に噴射される噴射部材が具備されていることを特徴にして硝子基板をもっと薄ら薄板で容易く製造することができる硝子基板のエッチング装置と前記の装置によって製造されて品質が向上された硝子薄板を提供するのに目的がある。   The present invention has been proposed in order to solve the above-described problems. In the glass substrate etching apparatus according to the present invention, at least one glass substrate is arranged, and the glass substrate is disposed below the glass substrate. The glass substrate and the ground are inclined so that the glass substrate can be fixed and removed, and an etching solution is sprayed downward on the glass substrate. A glass substrate etching apparatus capable of easily manufacturing a glass substrate with a thinner thin plate and a glass thin plate with improved quality produced by the above apparatus, characterized in that the injection member is provided. There is a purpose to do.

前記のような目的を果たすための本発明による硝子基板のエッチング装置は前記の硝子基板は少なくとも一つ以上配列されて、前記の硝子基板の下部には前記の硝子基板と地面が傾きを形成するようにして前記の硝子基板の固定と脱去ができるようにする固定部材を具備し、前記の硝子基板の上部にはエッチング液が下方に噴射される噴射部材を備えていることを特徴とする。   In an apparatus for etching a glass substrate according to the present invention for achieving the above-described object, at least one of the glass substrates is arranged, and the glass substrate and the ground form an inclination below the glass substrate. In this manner, the glass substrate is provided with a fixing member that allows the glass substrate to be fixed and removed, and an upper portion of the glass substrate is provided with an injection member for injecting an etching solution downward. .

好ましくは、前記の噴射部材は少なくとも一つ以上のノズルとノズルヘッドを備えて構成されて、前記のノズルでエッチング液がスプレーで噴射されることを特徴とする。   Preferably, the spray member includes at least one nozzle and a nozzle head, and the etchant is sprayed by the nozzle.

好ましくは、前記の硝子基板とノズル端の間の間隔はノズルの配置間隔とノズルのエッチング液の噴射の角度によって決まることを特徴とする。   Preferably, the distance between the glass substrate and the nozzle end is determined by an arrangement interval of the nozzles and an injection angle of the nozzle etching liquid.

好ましくは、前記の硝子基板とノズルの垂直貫通した垂直面と成す傾きは0°ないし45°の間であることを特徴とする。   Preferably, the inclination formed between the glass substrate and the vertically penetrating vertical surface of the nozzle is between 0 ° and 45 °.

好ましくは、前記の固定部材に複数個が配列される硝子基板の間のピッチは5mmないし300mmであるのを特徴とする。   Preferably, a pitch between a plurality of glass substrates arranged on the fixing member is 5 mm to 300 mm.

好ましくは、前記の噴射部材と繋がれるエッチング液貯蔵槽を追加に備えて、前記の固定部材の下端にはノズルから噴射されたエッチング液と硝子基板の反応物が収集される反応物貯蔵槽を備えて、前記の反応物貯蔵槽で前記のエッチング液貯蔵槽に未反応されたエッチング液が流入されて循環されることを特徴とする。   Preferably, an etching solution storage tank connected to the spray member is additionally provided, and a reactant storage tank in which a reaction product of the etchant sprayed from the nozzle and the glass substrate is collected at a lower end of the fixing member. In addition, an unreacted etchant is introduced into the etchant storage tank and circulated in the reactant storage tank.

好ましくは、前記の反応物貯蔵槽には前記の反応物と前記の未反応エッチング液を分離するためにフィルター部材を備えることを特徴とする。   Preferably, the reactant storage tank includes a filter member for separating the reactant and the unreacted etching solution.

好ましくは、前記のエッチング液は弗素酸であり、前記のエッチング液の水素イオン、弗素酸及び二弗素酸の濃度によって硝子基板のエッチング率が変化することを特徴とする。   Preferably, the etching solution is fluoric acid, and the etching rate of the glass substrate varies depending on the concentration of hydrogen ions, fluoric acid, and difluoric acid in the etching solution.

好ましくは、前記の固定部材は前記の硝子基板を固定して反応物が反応物貯蔵槽によく抜けるようにするための硝子基板接触部材を形成することを特徴とする。   Preferably, the fixing member forms a glass substrate contact member for fixing the glass substrate so that the reactants can easily escape to the reactant storage tank.

そして、前記のような目的を果たすための本発明による硝子基板は硝子基板のエッチング装置によって製造されて0.3ないし1mmの厚さであり、1000×1200mmないし1100×1300mm面積のTFT−LCDの硝子薄板であることを特徴とする。 A glass substrate according to the present invention for achieving the above-mentioned object is manufactured by a glass substrate etching apparatus and has a thickness of 0.3 to 1 mm, and has a TFT area of 1000 × 1200 mm 2 to 1100 × 1300 mm 2. It is a glass thin plate of LCD.

前述のとおりに前記のような本発明による硝子基板のエッチング装置によれば、硝子基板をもっと容易く薄ら薄板で製造することができるようになることで生産性が向上されるし、前記の硝子基板のエッチング装置は硝子基板に添ってエッチング液を流れるようにすることで表面の品質向上、0.3mm以下の超スリム蝕刻可能及び1000×1200mm以上の大面積超スリム蝕刻が可能になるようにするなどの長所を皆持っていて経済性を進める效果がある。 As described above, according to the glass substrate etching apparatus of the present invention as described above, the glass substrate can be more easily manufactured with a thin plate, thereby improving the productivity. The substrate etching apparatus allows the etching solution to flow along the glass substrate to improve the surface quality, enable ultra-slim etching of 0.3 mm or less, and large-area ultra-slim etching of 1000 × 1200 mm 2 or more. Has all the advantages such as making it more economical.

図1は従来技術を通じて硝子基板のエッチングして蝕刻することを示 した製造工程を示す図面である。FIG. 1 is a view showing a manufacturing process showing that a glass substrate is etched and etched through a conventional technique. 図2は本発明の第1実施例による硝子基板のエッチング装置の斜視図である。FIG. 2 is a perspective view of the glass substrate etching apparatus according to the first embodiment of the present invention. 図3は本発明の第1実施例による硝子のエッチング蝕刻の製造工程を示す図面である。FIG. 3 is a view showing a manufacturing process of etching etching of glass according to the first embodiment of the present invention. 図4は本発明のノズルの垂直貫通する垂直面と基板の幾何学的配置構成を示した側面図及び正面図である。4A and 4B are a side view and a front view showing the geometrical arrangement of the vertical surface and substrate of the nozzle according to the present invention. 図5は従来技術と本発明との硝子のエッチング方法を比べる比較図である。FIG. 5 is a comparative diagram comparing the glass etching method of the prior art and the present invention. 図6は硝子基板の表面に供給されるエッチング液の量とエッチレ―ト及び表面の品質との関係を示したグラフである。FIG. 6 is a graph showing the relationship between the amount of the etchant supplied to the surface of the glass substrate, the etch rate, and the surface quality. 図7は基板の表面に供給されるエッチング液の量と基板上下の厚さの差を示したグラフである。FIG. 7 is a graph showing the difference between the amount of etching solution supplied to the surface of the substrate and the thickness above and below the substrate. 図8は硝子基板の間隔による蝕刻厚さの差の分布の実施例を示した図面である。FIG. 8 is a view showing an example of the distribution of the difference in etching thickness depending on the distance between the glass substrates. 図9は本発明の第1実施例による硝子基板とノズルの幾何学的関係を示す図面である。FIG. 9 is a view showing the geometric relationship between the glass substrate and the nozzle according to the first embodiment of the present invention. 図10は本発明の第2実施例による硝子基板と固定部材との幾何学的関係を示した図面である。FIG. 10 is a view illustrating a geometric relationship between a glass substrate and a fixing member according to a second embodiment of the present invention.

以下、添付された図面を参照して本発明の実施例を詳しく説明しようとする。   Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

添付図面の中で図1は従来技術を通じて硝子基板をエッチングして蝕刻することを現わした製造工程を示す図面であり、図2は本発明の第1実施例による硝子基板のエッチング装置の斜視図であり、図3は本発明の第1実施例による硝子のエッチング蝕刻製造工程を示す図面である。   In the accompanying drawings, FIG. 1 shows a manufacturing process showing that a glass substrate is etched and etched through the prior art, and FIG. 2 is a perspective view of the glass substrate etching apparatus according to the first embodiment of the present invention. FIG. 3 is a view showing a glass etching etching manufacturing process according to the first embodiment of the present invention.

そして、図4は本発明のノズルと基板の幾何学的配置構成を示した側面図及び正面図であり、図5は従来技術と本発明との硝子のエッチング方法を比べる比較図であり、図6は硝子基板の表面に供給されるエッチング液の量とエッチレ―ト及び表面の品質との関係を示したグラフである。   4 is a side view and a front view showing the geometric arrangement of the nozzle and the substrate according to the present invention, and FIG. 5 is a comparative view comparing the glass etching method between the prior art and the present invention. 6 is a graph showing the relationship between the amount of the etching solution supplied to the surface of the glass substrate, the etch rate, and the surface quality.

また、図7は基板の表面に供給されるエッチング液の量と基板上下の厚さの差を示したグラフであり、図8は硝子基板の間隔による蝕刻の厚さの差の分布実施例を示した図面であり、図9は本発明の第1実施例による硝子基板とノズルを垂直に貫く垂直面と成す幾何学的関係を示す図面である。   FIG. 7 is a graph showing the difference between the amount of the etching solution supplied to the surface of the substrate and the thickness above and below the substrate. FIG. 8 shows an example of the distribution of the difference in etching thickness depending on the distance between the glass substrates. FIG. 9 is a view showing a geometrical relationship between the glass substrate and a vertical plane penetrating the nozzle vertically according to the first embodiment of the present invention.

さらに、図10は本発明の第2実施例による硝子基板と固定部材との幾何学的関係を示した図面である。   FIG. 10 is a view showing a geometrical relationship between the glass substrate and the fixing member according to the second embodiment of the present invention.

図2と図3を参考すれば、本発明は前記の硝子基板300の表面をエッチングして硝子基板300の厚さを薄くする硝子基板のエッチング装置100に関するのである。前記のエッチング装置100は硝子基板300とエッチング液を下方に噴射する噴射部材101及び前記の硝子基板300を固定する固定部材200を備えて構成される。   Referring to FIGS. 2 and 3, the present invention relates to a glass substrate etching apparatus 100 that etches the surface of the glass substrate 300 to reduce the thickness of the glass substrate 300. The etching apparatus 100 includes a glass substrate 300, an injection member 101 that injects an etching solution downward, and a fixing member 200 that fixes the glass substrate 300.

前記の硝子基板300は少なくとも一つ以上が配列されなければならない。前記の硝子基板300が前記のエッチング装置に数個が投入されるようにしていっぺんに数個の薄ら硝子基板を製造することができるのである。また、前記の硝子基板300は硅素(Si)または酸化硅素(SiO)が含まれてエッチング液の弗素酸(HF)によって蝕刻されるべきである。しかし、前記のエッチング液104によって前記の硝子基板300は違えて配列することができることであり、ここに限定しない。 At least one glass substrate 300 must be arranged. It is possible to manufacture several thin glass substrates at a time by putting several glass substrates 300 into the etching apparatus. Further, the glass substrate 300 contains silicon (Si) or silicon oxide (SiO 2 ) and should be etched by fluoric acid (HF) as an etchant. However, the glass substrate 300 can be arranged differently by the etching solution 104, and the present invention is not limited to this.

そして、前記の硝子基板300の下部には硝子基板300と地面が傾きを形成するようにして前記の硝子基板300を固定させることができる固定部材200を形成する。この時、基板はエッチング液の供給装置と正確に90°を成す必要はない。前記の固定部材200は材質が高分子樹脂や有機物質などからなることで硝子基板300を固定することと同時に硝子基板300との接触面を最小化しなければならない。なぜなら、前記の硝子基板300にエッチング液が噴射されて隙間なく応じなければならないからである。しかし、前記の固定部材200は前記の硝子基板300を固定することができることなら前記の高分子樹脂などに限定しない。   Then, a fixing member 200 that can fix the glass substrate 300 is formed below the glass substrate 300 so that the glass substrate 300 and the ground form an inclination. At this time, the substrate does not have to be exactly 90 ° with the etching solution supply device. The fixing member 200 is made of a polymer resin, an organic substance or the like, so that the glass substrate 300 is fixed and at the same time the contact surface with the glass substrate 300 must be minimized. This is because the etching solution must be sprayed onto the glass substrate 300 to respond without any gaps. However, the fixing member 200 is not limited to the polymer resin and the like as long as the glass substrate 300 can be fixed.

また、前記の固定部材200は前記の硝子基板300を数個固定させることができるように間隔を置いて溝を形成することができるし、前記の硝子基板300の幅と前記の固定部材200との幅が等しく挟まれるようにして固定することができるし、固定部材200と最小の面積を置いて固定する。   In addition, the fixing member 200 can be formed with a gap so that several glass substrates 300 can be fixed. The width of the glass substrate 300 and the fixing member 200 Can be fixed so as to be sandwiched equally, and the fixing member 200 is fixed with a minimum area.

そして、前記の固定部材200は硝子基板300を数個挟んで固定することができて前記の固定部材200を硝子基板300が挟まれた一体にしてエッチングゾーン(etching zone)に投入して前記の硝子基板300をエッチングした後に前記の一体を取り出す方式である。前記のように固定部材200のエッチングゾーンに投入と排出が容易いのでいっぺんに数枚の硝子基板300をエッチングすることができる。本発明は前記のように場合によって一つの硝子基板300または多数の硝子基板300をエッチング処理することができるので效果的である。また、本発明はスプレー法を適用しながらデイッピング法よりもっと多い硝子基板300をエッチングすることができて非常に生産的で経済的である。   The fixing member 200 can fix several glass substrates 300, and the fixing member 200 is integrated into the etching zone with the glass substrate 300 interposed therebetween. In this method, the glass substrate 300 is removed after the glass substrate 300 is etched. As described above, the glass substrate 300 can be etched at a time because it can be easily put into and discharged from the etching zone of the fixing member 200. As described above, the present invention is effective because one glass substrate 300 or a plurality of glass substrates 300 can be etched according to circumstances. Further, the present invention can etch more glass substrates 300 than the dipping method while applying the spray method, and is very productive and economical.

それに前記の固定部材200は硝子基板300が受ける外力がほとんどないからフレキシブル(flexible)に具現することができる。図10を参考すれば、前記の固定部材200としてニッパー202を備えて硝子基板300を固定することができる。前記の固定部材200が硝子基板300と持続的に接触していれば反応生成物が前記の固定部材200に積もって染みなどの表面の品質不良が発生するようになるためである。本発明では固定部材200の基板の種類や工程によって固定部材200を備えることができて設計自由度が非常に大きいという長所を持つ。その理由は硝子基板300の上部で基板の表面に沿ってエッチング液104が噴射されるので外力の影響を最小に減らすことができるためである。   In addition, since the fixing member 200 has almost no external force applied to the glass substrate 300, the fixing member 200 can be implemented flexibly. Referring to FIG. 10, the glass substrate 300 can be fixed by providing a nipper 202 as the fixing member 200. This is because if the fixing member 200 is in continuous contact with the glass substrate 300, the reaction product accumulates on the fixing member 200 and a surface quality defect such as a stain occurs. The present invention has an advantage that the fixing member 200 can be provided according to the type and process of the substrate of the fixing member 200 and the design freedom is very large. The reason is that the etching liquid 104 is sprayed along the surface of the substrate above the glass substrate 300, so that the influence of external force can be reduced to the minimum.

前記の硝子基板300の上部でエッチング液104が噴射される噴射部材101が具備されている。前記の硝子基板300の上部に備えられてエッチング液104を上から下へ液を供給してくれるので硝子基板300が受ける外力はほとんど発生しない。硝子基板300が受ける外力が小さいので重力に対する支持構造物の設計が非常に容易いからである。前記のような理由によって、前記の硝子基板300を0.1mm以下でとても薄くすることと4世代以上の 1100×1250mm以上の大面積の蝕刻をするとき非常に有利である。 An injection member 101 for injecting an etching solution 104 is provided on the glass substrate 300. Since the etching solution 104 is supplied from the top to the bottom provided on the glass substrate 300, almost no external force is received by the glass substrate 300. This is because the external force received by the glass substrate 300 is small, so that it is very easy to design a support structure against gravity. For the above reasons, it is very advantageous to make the glass substrate 300 very thin at 0.1 mm or less and to etch a large area of 1100 × 1250 mm 2 or more for 4 generations or more.

前記の噴射部材101は少なくとも一つ以上のノズル103とノズルヘッド102を備えて構成されて、前記のノズル103でエッチング液がスプレー形態に噴射される。前記のノズルヘッド102は一つ以上が形成されて構成されて一つのノズルヘッド102にノズル103が少なくとも一つ以上が形成されている。   The spray member 101 includes at least one nozzle 103 and a nozzle head 102, and the etching liquid is sprayed by the nozzle 103 in a spray form. One or more nozzle heads 102 are formed, and at least one nozzle 103 is formed on one nozzle head 102.

図5を参考すれば、前記のスプレー式で噴射させる理由は少ない量でも広い面積を蝕刻することができるし、蝕刻の厚さを一定に調節することができるためである。前記の硝子基板300の上部に噴射部材101が形成されることによってエッチング液104の噴射の時に硝子基板300が受ける圧力を最小化するようになる。また、上部で重力によって落ちるエッチング液104は硝子基板300の上部あるいは中央、下部に接触した後表面の張力によって硝子基板300に付いて下部に自然に流れながら硝子基板300の表面をエッチングさせる。これに比べて従来技術のスプレー法は硝子基板13に直接的にエッチング液12が噴射されながら噴射の時の硝子基板13が受けた圧力が大きい。   Referring to FIG. 5, the reason why the spraying is performed is that a large area can be etched even with a small amount, and the thickness of the etching can be adjusted to be constant. By forming the spray member 101 on the glass substrate 300, the pressure applied to the glass substrate 300 when the etching solution 104 is sprayed is minimized. Further, the etching liquid 104 that falls due to gravity at the upper part contacts the upper part, the center, or the lower part of the glass substrate 300 and then attaches to the glass substrate 300 by the tension of the surface, and naturally etches the surface of the glass substrate 300 while flowing downward. Compared with this, in the spray method of the prior art, the pressure received by the glass substrate 13 at the time of spraying is large while the etching solution 12 is sprayed directly onto the glass substrate 13.

図4を参考すれば、前記の硝子基板300とノズル103の端の間の間隔はノズル103の配置間隔とノズル103のエッチング液104の噴射角度によって決まる。前記の硝子基板300とノズル103の端の間の間隔は前記のように決まってエッチング液104に露出されない部分が発生しないようにする。本発明の前記の硝子基板300とノズル103の端の間の間隔である hはノズル間の間隔をNp、ノズルヘッドの間隔をHp及びノズル噴射角度をθで示せば次のようなパラメーター(parameter)を定義することができる。   Referring to FIG. 4, the interval between the glass substrate 300 and the end of the nozzle 103 is determined by the arrangement interval of the nozzle 103 and the spray angle of the etching solution 104 of the nozzle 103. The distance between the glass substrate 300 and the end of the nozzle 103 is determined as described above so that a portion not exposed to the etching solution 104 does not occur. The distance h between the glass substrate 300 of the present invention and the end of the nozzle 103 is represented by the following parameter (parameter) if the distance between the nozzles is represented by Np, the distance between the nozzle heads by Hp and the nozzle injection angle by θ. ) Can be defined.

〔数学式1〕

Figure 0004927884
[Mathematical formula 1]
Figure 0004927884

ノズル103と硝子基板300の間の間隔は数学式1の条件をすべて満足する幾何学的な特性を持たなければならない。 図4の上側から見る時前記の硝子基板300の最外郭の支店と最外郭ノズル103の間の間隔をdと言えば、下記の数学式2を満足するとエッチング液104に露出されない部分が発生しない。   The distance between the nozzle 103 and the glass substrate 300 must have a geometric characteristic that satisfies all the conditions of Equation 1. When the distance between the outermost branch of the glass substrate 300 and the outermost nozzle 103 is d when viewed from the upper side of FIG. 4, a portion that is not exposed to the etching solution 104 does not occur if the following mathematical formula 2 is satisfied. .

〔数学式2〕

Figure 0004927884
[Mathematical formula 2]
Figure 0004927884

そして、図4の上側から見る時硝子基板300の一面と最外郭のノズル103の間の間隔をdと言えば、d’は下記の数学式3のように示すことができるし、下記の数学式を満足しなければならない。   When the distance between one surface of the glass substrate 300 and the outermost nozzle 103 when viewed from the upper side of FIG. 4 is d, d ′ can be expressed by the following mathematical formula 3, and Must satisfy the formula.

〔数学式3〕

Figure 0004927884
[Mathematical formula 3]
Figure 0004927884

前記の硝子基板300とノズルの垂直貫通する垂直面と成す傾きは0°ないし45°の間で形成される。図9を参考すれば、前記の硝子基板300は前記のノズル103を垂直に貫く垂直面と成す各が0°の時が最も好ましい。しかし、前記のようにすればエッチングの空間内部でノズルの噴射及び液が固体との衝突などでベーパー(vapor)が発生して液体ではない気体によってもエッチングの蝕刻が発生するので前記の硝子基板300とノズル103の垂直で貫く垂直面と成す各が30°に傾いた場合上下の厚さの差がほとんど発生しない。しかし、前記の傾きが47°に傾いた時には反応生成物の円滑な除去が成り立たなくて硝子基板300の下部の厚さが厚くなる場合が発生する。従って、前記のような傾きの範囲内で前記の傾きが形成されることが好ましい。   The inclination between the glass substrate 300 and the vertical plane through which the nozzle passes is formed between 0 ° and 45 °. Referring to FIG. 9, it is most preferable that the glass substrate 300 is 0 ° each of which forms a vertical plane that penetrates the nozzle 103 vertically. However, in the above-described manner, since the vapor is generated due to the injection of the nozzle and the collision of the liquid with the solid in the etching space, the etching etching is generated even by the gas that is not liquid. When each of 300 and the vertical plane that penetrates through the nozzle 103 is inclined at 30 °, there is almost no difference in thickness between the upper and lower sides. However, when the tilt is 47 °, the reaction product cannot be removed smoothly, and the thickness of the lower portion of the glass substrate 300 may increase. Therefore, it is preferable that the inclination is formed within the range of the inclination as described above.

前記の固定部材200に複数個配列される硝子基板300の間のピッチは5mmないし300mmにしなければならない。前記の硝子基板300の間のピッチを前記のようにすることは多くの数の基板を蝕刻して硝子基板300のエッチングの時に生産性を高めるようにするのである。実際において同じ空間に基板を40mmのピッチで配列することと8mmのピッチで配列することは生産性が5倍の差があることで生産性を左右する非常に重要な因子である。前記の硝子基板300の配列のピッチを減らすことは生産性の向上を持って来るが、ノズルの配列のピッチを小さくするためにはノズルが付いているノズルヘッド102のピッチも小くならなければならない。前記のノズルヘッド102のピッチが小くなれば配管径を小さくしなければならないのにこういう場合ノズル103に十分な液を供給しにくいから規格品ではない部品を使わなければならないので投資費がたくさん必要となる問題点が発生するようになる。また、前記のノズル103の維持補修がとても難しくなる短所も発生する。   The pitch between the glass substrates 300 arranged on the fixing member 200 must be 5 mm to 300 mm. By setting the pitch between the glass substrates 300 as described above, a large number of substrates are etched so that productivity is improved when the glass substrate 300 is etched. Actually, arranging the substrates in the same space at a pitch of 40 mm and arranging them at a pitch of 8 mm is a very important factor that affects the productivity because the productivity is five times different. Reducing the pitch of the glass substrate 300 may improve productivity, but in order to reduce the pitch of the nozzle array, the pitch of the nozzle head 102 with the nozzles must also be reduced. Don't be. If the pitch of the nozzle head 102 is reduced, the pipe diameter must be reduced, but in such a case, it is difficult to supply a sufficient amount of liquid to the nozzle 103. Therefore, it is necessary to use non-standard parts, resulting in a large investment cost. Necessary problems will occur. In addition, there is a disadvantage that it is very difficult to maintain and repair the nozzle 103.

従って、前記の硝子基板300の間のピッチは前記の距離範囲の内で成り立つのが好ましい。また、一回に投入される基板の数はエッチング工程の全体の蝕刻量を意味するのでエッチング装置特に、タンク用量とノズルで噴射される噴射の圧力を均一に維持することができる配管及びポンプ用量スペック(spec)などを考慮しなければならない。   Therefore, it is preferable that the pitch between the glass substrates 300 is established within the distance range. Also, since the number of substrates that are put in at one time means the total etching amount of the etching process, the etching apparatus, in particular, the piping amount and the pumping amount that can maintain the tank dose and the injection pressure injected by the nozzle uniformly. The spec must be taken into account.

前記の噴射部材101にはエッチング液貯蔵槽が具備されているし、前記のエッチング液貯蔵槽と前記の反応物貯蔵槽はお互いに繋がれて備えられている。前記のエッチング液貯蔵槽には弗素酸があり、本発明の工程によって前記の弗素酸イオンの濃度と量を調節する。   The spray member 101 includes an etching solution storage tank, and the etching solution storage tank and the reactant storage tank are connected to each other. The etching solution storage tank contains fluoric acid, and the concentration and amount of the fluoric acid ions are adjusted by the process of the present invention.

前記の固定部材200の下端にはノズル103から噴射されたエッチング液104と硝子基板300の反応物が収集される反応物貯蔵槽が備られて、前記の反応物貯蔵槽でエッチング液貯蔵槽に未反応されたエッチング液が流入されて循環される。前記のエッチング液104と硝子基板300が反応をして応じた反応物たちは反応物貯蔵槽に速かに抜けるようになる。前記の反応物貯蔵槽とエッチング液貯蔵槽は繋がれているとか同じ空間を使って未反応のエッチング液を循環にする。前記の反応物の中で未反応のエッチング液はまたエッチング液貯蔵槽に流入されるように形成されて、新液の供給と生成物の迅速な除去が可能で表面品質の特性を進める。前記の反応物貯蔵槽には前記の反応物と前記の未反応エッチング液104を分離するためにフィルター部材を含むことができる。   The lower end of the fixing member 200 is provided with a reactant storage tank in which the reactants of the etching solution 104 and the glass substrate 300 sprayed from the nozzle 103 are collected, and the reactant storage tank serves as an etchant storage tank. Unreacted etchant is introduced and circulated. The reactants reacting with the etching solution 104 and the glass substrate 300 are quickly discharged into the reactant storage tank. The reactant storage tank and the etchant storage tank are connected or the same space is used to circulate the unreacted etchant. The unreacted etchant among the reactants is also formed so as to flow into the etchant storage tank, so that a new solution can be supplied and a product can be quickly removed to promote surface quality characteristics. The reactant storage tank may include a filter member for separating the reactant and the unreacted etchant 104.

前記のエッチング液104は弗素酸(HF)であり、前記のエッチング液104の水素イオン(H)、弗素酸(HF)及び二弗素酸(HF)の濃度によって硝子基板のエッチング率が変化される。前記の水素イオン(H)、弗素酸(HF)及び二弗素酸(HF)の濃度によってエッチレ―トが変化することを言うことであり、前記の硝子基板300の表面に供給される液の量とは比例的な関係を持っていない。 The etching solution 104 is fluoric acid (HF), and the etching rate of the glass substrate varies depending on the concentration of hydrogen ions (H + ), fluoric acid (HF) and difluoric acid (HF 2 ) in the etching solution 104. Is done. This means that the etch rate changes depending on the concentration of the hydrogen ions (H + ), fluoric acid (HF) and difluoric acid (HF 2 ), and the liquid supplied to the surface of the glass substrate 300. It has no proportional relationship with the amount of.

図6を参考すれば、前記のエッチング液104の一定以上の液の量さえ供給すればエッチレ―ト及び表面の品質を確保することができる。前記のエッチング液104の液の量とエッチレ―ト及び表面の品質は比例関係を持っていないので前記のエッチング液104は必要以上の液の量だけ供給すればいいのである。また、図6と図7を参考すれば、前記の硝子基板300の上部で液を供給しても基板の下部で必要な量以上のエッチング液成分が含まれれば硝子基板300の上部302と下部303の厚さの差及び品質の差が発生しない。すなわち、必要以上のエッチング液がいつも硝子基板300の表面と接触していればエッチレ―トの確保はもちろん優秀な表面の品質を確保することができる。   Referring to FIG. 6, the etch rate and the surface quality can be ensured as long as the amount of the etchant 104 above a certain level is supplied. Since the amount of the etchant 104 is not proportional to the etch rate and the surface quality, the etchant 104 may be supplied in an amount greater than necessary. 6 and 7, even if the liquid is supplied to the upper portion of the glass substrate 300, the upper portion 302 and the lower portion of the glass substrate 300 may be included if the etching solution contains a necessary amount or more in the lower portion of the substrate. No difference in thickness and quality in 303 occurs. That is, if the etching solution more than necessary is always in contact with the surface of the glass substrate 300, it is possible to secure not only the etch rate but also the excellent surface quality.

図10を参考すれば、本発明の前記の固定部材200は前記の硝子基板300を固定して反応物が反応物貯蔵槽によく抜けるようにするための硝子基板接触部材201を形成している。前記の硝子基板接触部材201は円形の構造物として、耐不酸材料、PVC、ピーク(PEEK:poly ether ether ketone)、テフロン(登録商標)などになっている。前記の硝子基板接触部材201は前記の材質と形態に限定するのではなくて硝子基板300をよりよく固定してエッチング液104と反応物がよく流れ出すようにできることならここに限定しない。また、前記の硝子基板接触部材201は硝子基板300と点接触をして反応生成物が最大によく流れるようにして側面は基板の厚さより大きい間隔を持つ。   Referring to FIG. 10, the fixing member 200 of the present invention forms the glass substrate contact member 201 for fixing the glass substrate 300 so that the reactants can easily escape into the reactant storage tank. . The glass substrate contact member 201 is made of a non-acid-resistant material, PVC, PEEK (poly ether ether), Teflon (registered trademark), or the like as a circular structure. The glass substrate contact member 201 is not limited to the above-described material and form, but is not limited to this as long as the glass substrate 300 can be fixed better and the etching solution 104 and the reactant can flow out well. Further, the glass substrate contact member 201 is in point contact with the glass substrate 300 so that the reaction product flows most maximally, and the side surface has a larger interval than the thickness of the substrate.

前記に記載している硝子のエッチング装置によって製造された硝子基板は0.3ないし1mmの厚さを持って、もっと薄くは0.1mm以下の厚さで製造することができる。そして、前記の硝子のエッチング装置は前記の厚さになった1000×1200mmないし1100×1300mm面積のTFT−LCD硝子基板を製造することができる。 The glass substrate manufactured by the glass etching apparatus described above has a thickness of 0.3 to 1 mm, and can be manufactured to a thickness of 0.1 mm or less. The etching apparatus of the glass can be produced a TFT-LCD glass substrate 1100 × 1300 mm 2 area to 1000 × 1200 mm 2 not become a thickness of the.

以下、本発明の好ましい実施例の中で一つとして硝子基板300の配列間隔の変化による硝子基板300の上部と下部の厚さの差をよく見る。また、他の実施例として前記のノズル103の間隔と硝子基板300の間隔による硝子基板300の上部と下部の厚さの差をよく見ようとする。   Hereinafter, as one of the preferred embodiments of the present invention, the difference in thickness between the upper and lower portions of the glass substrate 300 due to the change in the arrangement interval of the glass substrates 300 will be closely observed. In another embodiment, the difference between the upper and lower thicknesses of the glass substrate 300 due to the distance between the nozzles 103 and the glass substrate 300 will be often observed.

〔第1実施例〕
エッチング液が一定量以上になると硝子基板の上下の厚さの差がほとんど発生しないことを調べるために上部のノズルは横縦のピッチ50mmで配したし、ガラス ピッチを無限大、90mm、30mmに変化させて基板の表面に供給されるエッチング液の量を変化させた。この時使ったノズルの噴出量は分当たり0.1〜2リットルであり、エッチングの基板は370×470(mm)×0.63mm(厚さ)で300μmを蝕刻した場合である。
[First embodiment]
In order to investigate that the difference in thickness between the top and bottom of the glass substrate hardly occurs when the etching solution exceeds a certain amount, the upper nozzles are arranged with a horizontal and vertical pitch of 50 mm, and the glass pitch is infinite, 90 mm, and 30 mm. The amount of the etching solution supplied to the surface of the substrate was changed. The nozzle ejection amount used at this time is 0.1 to 2 liters per minute, and the etching substrate is 370 × 470 (mm) × 0.63 mm (thickness) and 300 μm is etched.

Figure 0004927884
Figure 0004927884

前記の表1と図8を参考すれば、前記の基板に必要以上のエッチング液を供給すれば求めるスペックを得ることができる。上下均一な厚さ分布を得ようとしたら上部で供給するエッチング液の量を増加させるし、生産性を高めようとしたら上部で供給するエッチング液の量を増加させてガラスの配列ピッチを減らせば同じ空間で多くの数の硝子基板を蝕刻し出すことができることを分かる。   Referring to Table 1 and FIG. 8, the required specifications can be obtained by supplying more etching liquid than necessary to the substrate. If you want to obtain a uniform thickness distribution, increase the amount of etching solution supplied at the top, and increase the amount of etching solution supplied at the top to increase productivity, reduce the glass array pitch. It can be seen that a large number of glass substrates can be etched out in the same space.

〔第2実施例〕
現在LCD基板の厚さのユニフォーミティー スペック(uniformity spec)は±20μm水準であり、このスペックを満足するためにノズル及び基板配列の間隔を変化させてこれによる硝子基板の上部302と下部303の厚さの差を調べた。前記のTFT−LCDノン-アルカリ ガラス(NEG OA−21あるいはSCP E2K)など低密度ガラスの590×670sizeの合着パネル(1.26mmの厚さ)を0.6mmに蝕刻した場合の実施例である。
[Second Embodiment]
At present, the uniformity specification of the thickness of the LCD substrate is ± 20 μm, and in order to satisfy this specification, the distance between the nozzle and the substrate arrangement is changed, and the thickness of the upper portion 302 and the lower portion 303 of the glass substrate is thereby changed. I investigated the difference. In the embodiment when a 590 × 670 size bonding panel (1.26 mm thickness) of low density glass such as TFT-LCD non-alkali glass (NEG OA-21 or SCP E2K) is etched to 0.6 mm. is there.

Figure 0004927884
Figure 0004927884

本発明の第2実施例で使われたノズルの噴出量は分当たり0.3リットルである。実際において同じ空間に基板を40mmのピッチで配列することと8mmのピッチで配列することは生産性が5倍の差があることで生産性を左右する非常に重要な因子である。基板配列のピッチを減らすことは生産性の向上を持って来るが、ノズル配列のピッチを小さくするためにはノズルが付いているノズルヘッドのピッチも小くならなければならない。ヘッド ピッチが小くなれば配管径を小さくしなければならないのにこういう場合ノズルに十分な液を供給しにくいので規格品ではない部品を使わなければならないので投資費用がたくさん所要される短所が発生するようになって、維持補修がとても難しくなる短所も発生する。一回に投入される基板の数はエッチング工程の全体の蝕刻量を意味するのでエッチング装置特に、タンクの用量とノズルで噴射される噴射圧力を均一に維持することができる配管及びポンプ用量のスペックなどを考慮しなければならない。ディスプレーなどの品質を満足するためには表面に一定量以上の液を供給してくれなければならないのに、本実験によると、
ノズルの分当たり噴出量 = Nozzle [m/min];分当たり噴出量
基板(glass)の配列のピッチ = Gpitch[m];基板の配列ディメンション、
ノズルの配列の横ピッチ = Nhpitch[m];ノズルの配列の横ピッチ ディメンション、
ノズルの配列の縦ピッチ = Nvpitch[m];ノズルの配列の縦ピッチ ディメンションと言えばCの値段は下記の数学式4のようである。
The ejection amount of the nozzle used in the second embodiment of the present invention is 0.3 liter per minute. Actually, arranging the substrates in the same space at a pitch of 40 mm and arranging them at a pitch of 8 mm is a very important factor that affects the productivity because the productivity is five times different. Reducing the pitch of the substrate arrangement brings an improvement in productivity, but in order to reduce the pitch of the nozzle arrangement, the pitch of the nozzle head with the nozzle must also be reduced. If the head pitch is reduced, the pipe diameter must be reduced, but in this case, it is difficult to supply sufficient liquid to the nozzle, so it is necessary to use non-standard parts, resulting in a disadvantage that requires a lot of investment costs. As a result, there are disadvantages that make maintenance and repair very difficult. Since the number of substrates that are loaded at one time means the total etching amount of the etching process, the specifications of the etching apparatus, particularly the piping and pump dosage that can maintain the tank dosage and the jetting pressure jetted by the nozzle uniformly. And so on. According to this experiment, we had to supply a certain amount of liquid to the surface to satisfy the quality of the display.
Nozzle ejection volume per nozzle = Nozzle [m 3 / min]; ejection volume per minute pitch of substrate array = Gpitch [m]; array dimension of substrate,
Horizontal pitch of nozzle array = Nhitch [m]; horizontal pitch dimension of nozzle array,
Vertical pitch of nozzle array = Nvpitch [m]; Vertical pitch of nozzle array The price of C f is expressed by Equation 4 below.

〔数学式4〕

Figure 0004927884
[Formula 4]
Figure 0004927884

本発明で任意の変数化したCはクリティカル ファクター(critical factors)で、これは修飾展開において基板のピッチだけを考慮して長さを考慮しなくてディメンション(dimension)がm/minになったが実際の意味はm/minである。基板の長さは重要ではない因子だからである。 In the present invention, an arbitrary variable C f is a critical factor, which is a dimension of m 2 / min without considering the length in the modification development only considering the pitch of the substrate. However, the actual meaning is m 3 / min. This is because the length of the substrate is not an important factor.

本の実験でノズルの分当たり噴出量は0.3リットルくらいに使ってあった。下記の表3はノズルと硝子基板の間隔によるCの値段を示した。 In this experiment, the nozzle ejected about 0.3 liters per minute. Table 3 below shows the price of C f depending on the distance between the nozzle and the glass substrate.

Figure 0004927884
Figure 0004927884

前記の表3をよく見ると、ノズルのピッチ50mm(0.05m)、基板(glass)のピッチ8mm(0.008m)の場合に基板上下の厚さの差が35〜50μmの水準で一部のスペックの中に入って来るが同時に数枚を蝕刻するからエッチングの前の基板の厚さの差が10〜15μm水準でエッチングの前の厚さの差くらいの余裕を確保しなければならないからノズルのピッチ50mmに基板の配列ピッチ8mmは実際適用に難しい幾何学的配置である。   Looking at Table 3 above, when the nozzle pitch is 50 mm (0.05 m) and the substrate pitch is 8 mm (0.008 m), the difference in thickness between the top and bottom of the substrate is partially at a level of 35 to 50 μm. Although it comes into the specifications of the film, since several sheets are etched at the same time, the difference in the thickness of the substrate before etching must be 10-15 μm, so that a margin as much as the difference in thickness before etching must be secured. A nozzle arrangement pitch of 50 mm and a substrate arrangement pitch of 8 mm is a difficult geometric arrangement for practical application.

一方、本発明は硝子基板を薄くする方法の中で化学的エッチング法と係わったのである。既存のデイッピング法は大面積の全面に対して均一なエッチングと正確な厚さの制御が大変だという問題点があった。また、従来の技術のスプレー法は両方でスプレーで液を供給してくれるから液の噴射圧力とともに気体の流動を起こして大面積の基板を重力に対して支持するのが構造的に非常に難しいという問題点があった。   On the other hand, the present invention is related to the chemical etching method among the methods for thinning the glass substrate. The existing dipping method has a problem that uniform etching and accurate thickness control are difficult on the entire surface of a large area. In addition, since the spray method of the prior art supplies both liquids by spraying, it is structurally very difficult to support a large area substrate against gravity by causing gas flow along with the liquid injection pressure. There was a problem.

前記の問題点を解決するために本発明はエッチング液を硝子基板の上部で噴射することとして外力を最小化したのである。また、前記の硝子基板を 1.26mmあるいは1.0mm厚さのTFT−LCD合着パネルをエッチング蝕刻して例えば厚さ1.0mm以下(0.9 mm、0.8mm、0.6mmなど)の薄膜で製造することができる。本発明のエッチング装置は前記のTFT−LCD、OLEDなどディスプレ―の合着パネルは勿論、合着の前の硝子基板及びシリコン・ウエハーなどに対するスリムエッチングができる。 さらに本発明のエッチング装置は 表面の品質を進めることとともに生産性が優秀で生産性対比投資費用が低い工程技術である。   In order to solve the above problems, the present invention minimizes external force by spraying an etching solution on the glass substrate. Further, the glass substrate is etched by etching a 1.26 mm or 1.0 mm thick TFT-LCD bonding panel, for example, 1.0 mm or less (0.9 mm, 0.8 mm, 0.6 mm, etc.) The thin film can be manufactured. The etching apparatus of the present invention can perform slim etching on a glass substrate, a silicon wafer, and the like before bonding, as well as a display bonding panel such as TFT-LCD and OLED. Furthermore, the etching apparatus of the present invention is a process technology that promotes surface quality and has excellent productivity and low investment cost relative to productivity.

前述のとおりに前記のような本発明による硝子基板のエッチング装置によれば、硝子基板をもっと容易く薄ら薄板で製造することができるようになることで生産性が向上されるし、前記の硝子基板のエッチング装置は硝子基板に添ってエッチング液を流れるようにすることで表面の品質向上、0.3mm以下の超スリム蝕刻可能及び1000×1200mm以上の大面積超スリム蝕刻が可能になるようにするなどの長所を皆持っていて経済性を進める效果がある。 As described above, according to the glass substrate etching apparatus of the present invention as described above, the glass substrate can be more easily manufactured with a thin plate, thereby improving the productivity. The substrate etching apparatus allows the etching solution to flow along the glass substrate to improve the surface quality, enable ultra-slim etching of 0.3 mm or less, and large-area ultra-slim etching of 1000 × 1200 mm 2 or more. Has all the advantages such as making it more economical.

本発明は図面に図示された一実施例を参照に説明されたが、これは例示的なことに過ぎなくて、本技術分野の通常の知識を持った者なら今後にも多様な変形及び均等な他の実施例ができるという点を理解するのである。したがって、本発明の真正な技術的保護範囲は添付された登録請求範囲の技術的思想によって決まらなければならないのである。
Although the present invention has been described with reference to one embodiment illustrated in the drawings, this is merely illustrative, and various modifications and equivalents will occur to those skilled in the art in the future. It is understood that other embodiments are possible. Therefore, the true technical protection scope of the present invention must be determined by the technical concept of the attached claims.

Claims (8)

硝子基板をエッチングして硝子基板の厚さを薄くする硝子基板のエッチング装置において、
前記硝子基板が少なくとも一つ以上配列されて、前記硝子基板の下部には前記硝子基板と地面が傾きを形成するようにして、前記硝子基板の固定と脱去ができるようにする固定部材を具備し、前記硝子基板の上部にはエッチング液が所定の噴射角度で硝子基板の基板表面に向けられ、スプレーで下方に噴射される少なくとも一つ以上のノズルとノズルヘッドを備えて構成されている噴射部材を備えていることを特徴とする硝子基板のエッチング装置。
In a glass substrate etching apparatus that reduces the thickness of the glass substrate by etching the glass substrate,
At least one glass substrate is arranged, and a fixing member is provided at a lower portion of the glass substrate so that the glass substrate and the ground form an inclination so that the glass substrate can be fixed and removed. Further, the upper part of the glass substrate is provided with at least one nozzle and a nozzle head which are directed to the substrate surface of the glass substrate at a predetermined spray angle and sprayed downward by a spray. An apparatus for etching a glass substrate comprising a member.
前記硝子基板とノズル端の間の間隔はノズルの配置間隔とノズルのエッチング液の噴射角度によって決まることを特徴とする請求項1に記載の硝子基板のエッチング装置。   2. The glass substrate etching apparatus according to claim 1, wherein an interval between the glass substrate and a nozzle end is determined by an arrangement interval of nozzles and an injection angle of an etching solution of the nozzle. 前記硝子基板とノズルの垂直貫通した垂直面と成す傾きは0°ないし45°の間であることを特徴とする請求項1に記載の硝子基板のエッチング装置。   2. The glass substrate etching apparatus according to claim 1, wherein an inclination formed between the glass substrate and a vertically penetrating vertical surface of the nozzle is between 0 ° and 45 °. 前記固定部材に複数個が配列される硝子基板の間のピッチは5mmないし300mmであるのを特徴とする請求項1に記載の硝子基板のエッチング装置。   2. The glass substrate etching apparatus according to claim 1, wherein a pitch between a plurality of glass substrates arranged on the fixing member is 5 mm to 300 mm. 3. 前記噴射部材と繋がれるエッチング液貯蔵槽を追加に備えて、前記固定部材の下端にはノズルから噴射されたエッチング液と硝子基板の反応物が収集される反応物貯蔵槽を備えて、前記反応物貯蔵槽で前記エッチング液貯蔵槽に未反応されたエッチング液が流入されて循環されることを特徴とする請求項1に記載の硝子基板のエッチング装置。   An etching solution storage tank connected to the spray member is additionally provided, and a reaction product storage tank for collecting a reaction product of the etchant sprayed from the nozzle and the glass substrate is collected at a lower end of the fixing member, and the reaction is performed. 2. The glass substrate etching apparatus according to claim 1, wherein an unreacted etching solution is introduced into the etching solution storage tank and circulated in the material storage tank. 前記反応物貯蔵槽には前記反応物と前記未反応エッチング液を分離するためにフィルター部材を備えることを特徴とする請求項5に記載の硝子基板のエッチング装置。   6. The glass substrate etching apparatus according to claim 5, wherein the reactant storage tank includes a filter member for separating the reactant and the unreacted etching solution. 前記エッチング液は弗素酸であり、前記エッチング液の水素イオン、弗素酸及び二弗素酸の濃度によって硝子基板のエッチング率が変化することを特徴とする請求項1に記載の硝子基板のエッチング装置。   2. The glass substrate etching apparatus according to claim 1, wherein the etching solution is fluoric acid, and the etching rate of the glass substrate varies depending on the concentration of hydrogen ions, fluoric acid and difluoric acid in the etching solution. 前記固定部材は前記硝子基板を固定して反応物が反応物貯蔵槽によく抜けるようにするための硝子基板接触部材を形成することを特徴とする請求項1に記載の硝子基板のエッチング装置。   2. The glass substrate etching apparatus according to claim 1, wherein the fixing member forms a glass substrate contact member for fixing the glass substrate and allowing reactants to easily escape into the reactant storage tank. 3.
JP2009003958A 2008-01-09 2009-01-09 Glass substrate etching apparatus and glass thin plate produced by the etching apparatus Active JP4927884B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2008-0002456 2008-01-09
KR1020080002456A KR100860294B1 (en) 2008-01-09 2008-01-09 An apparatus for etching a glass wafer, and a glass sheet manufactured by the same

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011262953A Division JP5421979B2 (en) 2008-01-09 2011-11-30 Glass substrate etching apparatus and glass substrate manufactured by the etching apparatus

Publications (2)

Publication Number Publication Date
JP2009161429A JP2009161429A (en) 2009-07-23
JP4927884B2 true JP4927884B2 (en) 2012-05-09

Family

ID=40023668

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2009003958A Active JP4927884B2 (en) 2008-01-09 2009-01-09 Glass substrate etching apparatus and glass thin plate produced by the etching apparatus
JP2011262953A Active JP5421979B2 (en) 2008-01-09 2011-11-30 Glass substrate etching apparatus and glass substrate manufactured by the etching apparatus

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2011262953A Active JP5421979B2 (en) 2008-01-09 2011-11-30 Glass substrate etching apparatus and glass substrate manufactured by the etching apparatus

Country Status (4)

Country Link
JP (2) JP4927884B2 (en)
KR (1) KR100860294B1 (en)
CN (3) CN102674701A (en)
TW (1) TWI400205B (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100946215B1 (en) 2009-08-17 2010-03-08 주식회사 지디 Spray nozzle system for etching a glass
CN101630635B (en) * 2009-08-25 2011-11-30 满纳韩宏电子科技(南京)有限公司 glass substrate etching device
KR101037171B1 (en) * 2009-09-29 2011-05-26 주식회사 이코니 An apparatus for etching a glass wafer having the function of removing residual etching solution
KR101108974B1 (en) * 2009-09-29 2012-01-31 주식회사 이코니 An apparatus for etching a glass wafer having the function of removing residual etching solution
KR101007306B1 (en) * 2010-02-23 2011-01-13 주식회사 엠엠테크 Substrate etching device
KR101195374B1 (en) 2010-07-29 2012-10-29 주식회사 엠엠테크 top-down spray type substrate etching device
KR101026744B1 (en) 2010-09-29 2011-04-08 주식회사 아바텍 Apparatus for etching a glass substrate
KR101168701B1 (en) 2010-11-15 2012-07-30 (주)에프아이에스 Eching Apparatus With Guide Blade
KR101182200B1 (en) * 2010-11-18 2012-09-14 (주) 청심이엔지 Substrate slimming apparatus
KR101092471B1 (en) 2010-11-26 2011-12-13 주식회사 지디 Glass etching device for spraying etching liquid from the top
JP5730241B2 (en) * 2011-05-11 2015-06-03 Hoya株式会社 Manufacturing method of cover glass for electronic device and glass substrate holder for cover glass for electronic device
KR101068113B1 (en) 2011-05-31 2011-09-27 주식회사 아바텍 Apparatus for etching a glass substrate
KR101277161B1 (en) * 2011-07-08 2013-06-20 주식회사 엠엠테크 Slimming system for glass
KR101151296B1 (en) * 2012-02-03 2012-06-08 주식회사 엠엠테크 Apparatus for etching substrate
KR101323152B1 (en) * 2012-02-08 2013-11-04 신동수 A thickness monitoring system in etching process of glass substrate
CN102659321B (en) * 2012-05-14 2015-03-18 汕头市拓捷科技有限公司 Equipment and method for single-surface thinning of multiple pieces of glass
KR102094943B1 (en) * 2013-03-22 2020-03-31 삼성디스플레이 주식회사 Etching apparatus
KR101466005B1 (en) * 2013-06-28 2014-11-27 주식회사 위스코하이텍 Apparatus for etching substrate
KR101489241B1 (en) * 2013-10-01 2015-02-04 주식회사 이코니 Slim etching method for a glass substrate comprising the pre-treatment process
CN105366953A (en) * 2015-11-30 2016-03-02 武汉华星光电技术有限公司 Spraying device
CN107698168A (en) * 2017-09-07 2018-02-16 凯盛科技股份有限公司 A kind of anti-fragmentation thinning single surface etching bearing basket tool
KR102625138B1 (en) * 2020-10-22 2024-01-15 (주) 엔피홀딩스 Rollable glass, rollable display device including the same and method for preparing rollable glass
CN113979643A (en) * 2020-12-31 2022-01-28 安徽金龙浩光电科技有限公司 Preparation process of glass with glittering sand effect
WO2023278223A1 (en) * 2021-07-01 2023-01-05 Corning Incorporated Methods of etching glass-based sheets

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2103548B (en) * 1981-08-20 1985-01-30 Glaverbel Method of reducing light reflection from glass surfaces
JP2551123B2 (en) * 1988-11-04 1996-11-06 富士通株式会社 Continuous surface treatment equipment
JP3597639B2 (en) * 1996-06-05 2004-12-08 大日本スクリーン製造株式会社 Substrate processing apparatus and substrate processing method
JPH09330661A (en) * 1996-06-07 1997-12-22 Mitsubishi Electric Corp Forming method of graphite film
US6214127B1 (en) * 1998-02-04 2001-04-10 Micron Technology, Inc. Methods of processing electronic device workpieces and methods of positioning electronic device workpieces within a workpiece carrier
JP3686011B2 (en) * 2001-06-11 2005-08-24 住友精密工業株式会社 Substrate processing equipment
JP3737782B2 (en) * 2002-06-18 2006-01-25 淀川ヒューテック株式会社 Manufacturing method of thin liquid crystal display element
KR100699336B1 (en) * 2003-06-03 2007-03-26 다이닛뽕스크린 세이조오 가부시키가이샤 Method and apparatus for etching a substrate
JP4398262B2 (en) * 2004-01-08 2010-01-13 大日本スクリーン製造株式会社 Substrate processing equipment
JP4071220B2 (en) * 2004-03-17 2008-04-02 西山ステンレスケミカル株式会社 Manufacturing method of glass substrate
JP4737709B2 (en) * 2004-03-22 2011-08-03 日本電気硝子株式会社 Method for producing glass for display substrate
KR100773786B1 (en) 2005-08-12 2007-11-12 (주)지원테크 Apparatus of etching a glass substrate
KR100741291B1 (en) * 2006-02-14 2007-07-23 에버테크노 주식회사 Liquid crystal display glass slimming apparatus
KR20070105699A (en) * 2006-04-27 2007-10-31 삼성전자주식회사 Etching apparatus for glass plate and method of glass etching using the same
KR20080008729A (en) * 2006-07-21 2008-01-24 삼성전자주식회사 Method for manufacturing flat panel display and apparatus for shaving outer surface of glass substrate for their use
KR200431530Y1 (en) 2006-08-23 2006-11-23 김성삼 writing instrument fixing device
KR100865767B1 (en) * 2007-03-15 2008-10-28 우진선행기술 주식회사 Device for slimming of plate and method for slimming of plate

Also Published As

Publication number Publication date
TW200932695A (en) 2009-08-01
JP2012051801A (en) 2012-03-15
JP2009161429A (en) 2009-07-23
CN102674701A (en) 2012-09-19
CN101481217B (en) 2012-05-09
JP5421979B2 (en) 2014-02-19
KR100860294B1 (en) 2008-09-25
TWI400205B (en) 2013-07-01
CN102674700A (en) 2012-09-19
CN101481217A (en) 2009-07-15

Similar Documents

Publication Publication Date Title
JP4927884B2 (en) Glass substrate etching apparatus and glass thin plate produced by the etching apparatus
JP2012051801A5 (en)
TWI394727B (en) Substrate slimming apparatus and method of slimming substrate
KR101068113B1 (en) Apparatus for etching a glass substrate
KR101108974B1 (en) An apparatus for etching a glass wafer having the function of removing residual etching solution
CN1264626A (en) Soup treatment appts.
KR100732019B1 (en) Apparatus of etching a glass substrate
KR101304103B1 (en) Method for manufacturing ultra-thin type glass plate
KR20080008729A (en) Method for manufacturing flat panel display and apparatus for shaving outer surface of glass substrate for their use
EP0762482B1 (en) Apparatus for etching wafer
KR101195374B1 (en) top-down spray type substrate etching device
KR101339002B1 (en) Apparatus and method of etching substrate
KR20060079069A (en) Liquid crystal dispensing apparatus
KR101068114B1 (en) Apparatus for etching a glass substrate
US20080083427A1 (en) Post etch residue removal from substrates
KR101063752B1 (en) Shower head of chemical vapor deposition apparatus
KR101026744B1 (en) Apparatus for etching a glass substrate
JP2006189791A (en) Liquid crystal jetting device and method for manufacturing liquid crystal display using the same
KR101391078B1 (en) Apparatus for etching a glass substrate
KR101368193B1 (en) Etching apparatus for glass substrate
CN103508675B (en) Bubble generator for glass etching device
KR100732016B1 (en) Apparatus of etching a glass substrate
KR101491069B1 (en) Apparatus for etching substrate
CN102651430B (en) Method for chemically processing substrate
KR101388563B1 (en) Apparatus for etching glass wafer

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090422

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20110526

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110531

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20110816

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20110819

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20111111

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20111114

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20111130

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120117

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120118

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120207

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120209

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150217

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4927884

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20120302

A072 Dismissal of procedure [no reply to invitation to correct request for examination]

Free format text: JAPANESE INTERMEDIATE CODE: A072

Effective date: 20120710

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313117

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250