JP4877095B2 - 電流センサおよびその製造方法 - Google Patents
電流センサおよびその製造方法 Download PDFInfo
- Publication number
- JP4877095B2 JP4877095B2 JP2007166576A JP2007166576A JP4877095B2 JP 4877095 B2 JP4877095 B2 JP 4877095B2 JP 2007166576 A JP2007166576 A JP 2007166576A JP 2007166576 A JP2007166576 A JP 2007166576A JP 4877095 B2 JP4877095 B2 JP 4877095B2
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- JP
- Japan
- Prior art keywords
- magnetic field
- magnetoresistive
- elements
- current sensor
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000004519 manufacturing process Methods 0.000 title claims description 21
- 230000005291 magnetic effect Effects 0.000 claims description 257
- 230000005415 magnetization Effects 0.000 claims description 97
- 239000000758 substrate Substances 0.000 claims description 94
- 230000000694 effects Effects 0.000 claims description 74
- 238000001514 detection method Methods 0.000 claims description 59
- 230000006698 induction Effects 0.000 claims description 48
- 239000004020 conductor Substances 0.000 claims description 37
- 230000008859 change Effects 0.000 claims description 34
- 230000005294 ferromagnetic effect Effects 0.000 claims description 18
- 230000008878 coupling Effects 0.000 claims description 7
- 238000010168 coupling process Methods 0.000 claims description 7
- 238000005859 coupling reaction Methods 0.000 claims description 7
- 238000003475 lamination Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 161
- 239000010409 thin film Substances 0.000 description 51
- 239000010408 film Substances 0.000 description 39
- 238000000034 method Methods 0.000 description 15
- 238000004804 winding Methods 0.000 description 14
- 239000010949 copper Substances 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 230000007423 decrease Effects 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 6
- 239000013598 vector Substances 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 229920006395 saturated elastomer Polymers 0.000 description 5
- 230000005290 antiferromagnetic effect Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 125000006850 spacer group Chemical group 0.000 description 4
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 3
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 239000000696 magnetic material Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 229910003321 CoFe Inorganic materials 0.000 description 2
- 229910000914 Mn alloy Inorganic materials 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 230000004043 responsiveness Effects 0.000 description 2
- 229910001313 Cobalt-iron alloy Inorganic materials 0.000 description 1
- 240000006829 Ficus sundaica Species 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 239000002885 antiferromagnetic material Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- SHMWNGFNWYELHA-UHFFFAOYSA-N iridium manganese Chemical compound [Mn].[Ir] SHMWNGFNWYELHA-UHFFFAOYSA-N 0.000 description 1
- IGOJMROYPFZEOR-UHFFFAOYSA-N manganese platinum Chemical compound [Mn].[Pt] IGOJMROYPFZEOR-UHFFFAOYSA-N 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
- G01R15/205—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using magneto-resistance devices, e.g. field plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
- H01F17/0033—Printed inductances with the coil helically wound around a magnetic core
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Hall/Mr Elements (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007166576A JP4877095B2 (ja) | 2007-06-25 | 2007-06-25 | 電流センサおよびその製造方法 |
| US12/213,352 US7646196B2 (en) | 2007-06-25 | 2008-06-18 | Current sensor and method of manufacturing current sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007166576A JP4877095B2 (ja) | 2007-06-25 | 2007-06-25 | 電流センサおよびその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009002911A JP2009002911A (ja) | 2009-01-08 |
| JP2009002911A5 JP2009002911A5 (https=) | 2010-03-11 |
| JP4877095B2 true JP4877095B2 (ja) | 2012-02-15 |
Family
ID=40136230
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007166576A Active JP4877095B2 (ja) | 2007-06-25 | 2007-06-25 | 電流センサおよびその製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7646196B2 (https=) |
| JP (1) | JP4877095B2 (https=) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4361077B2 (ja) * | 2006-10-31 | 2009-11-11 | Tdk株式会社 | 磁気センサおよびその製造方法 |
| FR2941534B1 (fr) * | 2009-01-26 | 2011-12-23 | Commissariat Energie Atomique | Capteur de champ magnetique a jauge de contrainte suspendue |
| WO2010143718A1 (ja) * | 2009-06-12 | 2010-12-16 | アルプス・グリーンデバイス株式会社 | 磁気平衡式電流センサ |
| EP2442117B1 (en) * | 2009-06-12 | 2021-11-17 | Alps Alpine Co., Ltd. | Magnetic balance current sensor |
| JP5248421B2 (ja) | 2009-06-22 | 2013-07-31 | ブラザー工業株式会社 | 液体吐出装置 |
| WO2011013412A1 (ja) | 2009-07-27 | 2011-02-03 | 富士電機ホールディングス株式会社 | 非接触電流センサ |
| US9086444B2 (en) * | 2009-12-28 | 2015-07-21 | Tdk Corporation | Magnetic field detection device and current sensor |
| JP5012939B2 (ja) * | 2010-03-18 | 2012-08-29 | Tdk株式会社 | 電流センサ |
| US8975889B2 (en) * | 2011-01-24 | 2015-03-10 | Infineon Technologies Ag | Current difference sensors, systems and methods |
| FR2979790B1 (fr) * | 2011-09-07 | 2013-10-11 | Commissariat Energie Atomique | Capteur de courant |
| WO2013129276A1 (ja) * | 2012-03-02 | 2013-09-06 | Tdk株式会社 | 磁気センサ素子 |
| US9817078B2 (en) | 2012-05-10 | 2017-11-14 | Allegro Microsystems Llc | Methods and apparatus for magnetic sensor having integrated coil |
| US9372242B2 (en) * | 2012-05-11 | 2016-06-21 | Memsic, Inc. | Magnetometer with angled set/reset coil |
| US10145908B2 (en) | 2013-07-19 | 2018-12-04 | Allegro Microsystems, Llc | Method and apparatus for magnetic sensor producing a changing magnetic field |
| US10495699B2 (en) | 2013-07-19 | 2019-12-03 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target |
| US9529060B2 (en) | 2014-01-09 | 2016-12-27 | Allegro Microsystems, Llc | Magnetoresistance element with improved response to magnetic fields |
| US9823092B2 (en) | 2014-10-31 | 2017-11-21 | Allegro Microsystems, Llc | Magnetic field sensor providing a movement detector |
| JP6763887B2 (ja) | 2015-06-05 | 2020-09-30 | アレグロ・マイクロシステムズ・エルエルシー | 磁界に対する応答が改善されたスピンバルブ磁気抵抗効果素子 |
| US10012518B2 (en) | 2016-06-08 | 2018-07-03 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a proximity of an object |
| KR101891414B1 (ko) * | 2016-12-23 | 2018-08-23 | 전자부품연구원 | 센서의 외란 및 옵셋을 동시 보정할 수 있는 측정 방법 및 장치 |
| US10620279B2 (en) | 2017-05-19 | 2020-04-14 | Allegro Microsystems, Llc | Magnetoresistance element with increased operational range |
| US11022661B2 (en) | 2017-05-19 | 2021-06-01 | Allegro Microsystems, Llc | Magnetoresistance element with increased operational range |
| US10996289B2 (en) | 2017-05-26 | 2021-05-04 | Allegro Microsystems, Llc | Coil actuated position sensor with reflected magnetic field |
| US10837943B2 (en) | 2017-05-26 | 2020-11-17 | Allegro Microsystems, Llc | Magnetic field sensor with error calculation |
| US11428755B2 (en) | 2017-05-26 | 2022-08-30 | Allegro Microsystems, Llc | Coil actuated sensor with sensitivity detection |
| JP6471779B2 (ja) * | 2017-07-24 | 2019-02-20 | Tdk株式会社 | 送受信装置 |
| JP7020176B2 (ja) * | 2018-02-27 | 2022-02-16 | Tdk株式会社 | 磁気センサ |
| JP6597820B2 (ja) * | 2018-03-12 | 2019-10-30 | Tdk株式会社 | 磁気センサおよび位置検出装置 |
| US10823586B2 (en) | 2018-12-26 | 2020-11-03 | Allegro Microsystems, Llc | Magnetic field sensor having unequally spaced magnetic field sensing elements |
| US11237020B2 (en) | 2019-11-14 | 2022-02-01 | Allegro Microsystems, Llc | Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet |
| US11280637B2 (en) | 2019-11-14 | 2022-03-22 | Allegro Microsystems, Llc | High performance magnetic angle sensor |
| US11372029B2 (en) * | 2019-12-11 | 2022-06-28 | Tdk Corporation | Magnetic field detection apparatus and current detection apparatus |
| US11262422B2 (en) | 2020-05-08 | 2022-03-01 | Allegro Microsystems, Llc | Stray-field-immune coil-activated position sensor |
| US11493361B2 (en) | 2021-02-26 | 2022-11-08 | Allegro Microsystems, Llc | Stray field immune coil-activated sensor |
| US20240369600A1 (en) * | 2021-08-20 | 2024-11-07 | Suzhou Littelfuse Ovs Co., Ltd. | Battery system and hybrid current sensor therefor |
| US11578997B1 (en) | 2021-08-24 | 2023-02-14 | Allegro Microsystems, Llc | Angle sensor using eddy currents |
| KR20230079985A (ko) * | 2021-11-29 | 2023-06-07 | 한국전자기술연구원 | 자기 결합형 자가 진단 장치 |
| US11719771B1 (en) | 2022-06-02 | 2023-08-08 | Allegro Microsystems, Llc | Magnetoresistive sensor having seed layer hysteresis suppression |
| US12320870B2 (en) | 2022-07-19 | 2025-06-03 | Allegro Microsystems, Llc | Controlling out-of-plane anisotropy in an MR sensor with free layer dusting |
| US12359904B2 (en) | 2023-01-26 | 2025-07-15 | Allegro Microsystems, Llc | Method of manufacturing angle sensors including magnetoresistance elements including different types of antiferromagnetic materials |
| US12352832B2 (en) | 2023-01-30 | 2025-07-08 | Allegro Microsystems, Llc | Reducing angle error in angle sensor due to orthogonality drift over magnetic-field |
| US12523717B2 (en) | 2024-02-15 | 2026-01-13 | Allegro Microsystems, Llc | Closed loop magnetic field sensor with current control |
| CN119626738A (zh) * | 2024-11-14 | 2025-03-14 | 西安交通大学 | 贴片阻尼电阻式宽频自积分罗氏线圈电流互感器及方法 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH670004A5 (https=) | 1986-02-10 | 1989-04-28 | Landis & Gyr Ag | |
| DE4300605C2 (de) * | 1993-01-13 | 1994-12-15 | Lust Electronic Systeme Gmbh | Sensorchip |
| US5561368A (en) * | 1994-11-04 | 1996-10-01 | International Business Machines Corporation | Bridge circuit magnetic field sensor having spin valve magnetoresistive elements formed on common substrate |
| US6064552A (en) * | 1997-03-18 | 2000-05-16 | Kabushiki Kaisha Toshiba | Magnetoresistive head having magnetic yoke and giant magnetoresistive element such that a first electrode is formed on the giant magnetoresistive element which in turn is formed on the magnetic yoke which acts as a second electrode |
| JP4028971B2 (ja) * | 2001-08-28 | 2008-01-09 | アルプス電気株式会社 | 磁気センサの組立方法 |
| JP4433820B2 (ja) * | 2004-02-20 | 2010-03-17 | Tdk株式会社 | 磁気検出素子およびその形成方法ならびに磁気センサ、電流計 |
| JP4360998B2 (ja) * | 2004-10-01 | 2009-11-11 | Tdk株式会社 | 電流センサ |
| JP4298691B2 (ja) * | 2005-09-30 | 2009-07-22 | Tdk株式会社 | 電流センサおよびその製造方法 |
| JP4361077B2 (ja) * | 2006-10-31 | 2009-11-11 | Tdk株式会社 | 磁気センサおよびその製造方法 |
-
2007
- 2007-06-25 JP JP2007166576A patent/JP4877095B2/ja active Active
-
2008
- 2008-06-18 US US12/213,352 patent/US7646196B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US7646196B2 (en) | 2010-01-12 |
| JP2009002911A (ja) | 2009-01-08 |
| US20080316655A1 (en) | 2008-12-25 |
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