JP4868597B2 - エッジ検出装置 - Google Patents

エッジ検出装置 Download PDF

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Publication number
JP4868597B2
JP4868597B2 JP2007253661A JP2007253661A JP4868597B2 JP 4868597 B2 JP4868597 B2 JP 4868597B2 JP 2007253661 A JP2007253661 A JP 2007253661A JP 2007253661 A JP2007253661 A JP 2007253661A JP 4868597 B2 JP4868597 B2 JP 4868597B2
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JP
Japan
Prior art keywords
light
line sensor
edge position
transparent body
edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2007253661A
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English (en)
Japanese (ja)
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JP2009085679A (ja
Inventor
喜彦 岡山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Azbil Corp
Original Assignee
Azbil Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Azbil Corp filed Critical Azbil Corp
Priority to JP2007253661A priority Critical patent/JP4868597B2/ja
Priority to TW097135902A priority patent/TW200921040A/zh
Priority to CN2008101685706A priority patent/CN101398292B/zh
Priority to KR1020080094602A priority patent/KR101009598B1/ko
Publication of JP2009085679A publication Critical patent/JP2009085679A/ja
Application granted granted Critical
Publication of JP4868597B2 publication Critical patent/JP4868597B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1876Diffractive Fresnel lenses; Zone plates; Kinoforms
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/521Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0181Memory or computer-assisted visual determination

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2007253661A 2007-09-28 2007-09-28 エッジ検出装置 Active JP4868597B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2007253661A JP4868597B2 (ja) 2007-09-28 2007-09-28 エッジ検出装置
TW097135902A TW200921040A (en) 2007-09-28 2008-09-18 Edge detection device
CN2008101685706A CN101398292B (zh) 2007-09-28 2008-09-25 边缘检测装置
KR1020080094602A KR101009598B1 (ko) 2007-09-28 2008-09-26 에지검출장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007253661A JP4868597B2 (ja) 2007-09-28 2007-09-28 エッジ検出装置

Publications (2)

Publication Number Publication Date
JP2009085679A JP2009085679A (ja) 2009-04-23
JP4868597B2 true JP4868597B2 (ja) 2012-02-01

Family

ID=40517008

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007253661A Active JP4868597B2 (ja) 2007-09-28 2007-09-28 エッジ検出装置

Country Status (4)

Country Link
JP (1) JP4868597B2 (ko)
KR (1) KR101009598B1 (ko)
CN (1) CN101398292B (ko)
TW (1) TW200921040A (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI481852B (zh) * 2012-03-22 2015-04-21 Hiti Digital Inc 用來偵測透光介質邊緣之偵測裝置與偵測方法
TWI464385B (zh) * 2012-03-22 2014-12-11 Hiti Digital Inc 用來偵測透光光柵結構之偵測裝置與偵測方法
CN103884277A (zh) * 2014-03-10 2014-06-25 杭州电子科技大学 非透明介质的边缘检测装置
JP6329091B2 (ja) * 2015-02-19 2018-05-23 アズビル株式会社 エッジ検出装置
CN108548501A (zh) * 2018-05-31 2018-09-18 广州贝晓德传动配套有限公司 材料边缘位置检测装置
CN111768422B (zh) * 2020-01-16 2024-10-18 北京沃东天骏信息技术有限公司 边缘检测的处理方法、装置、设备及存储介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3858994B2 (ja) * 2002-11-28 2006-12-20 株式会社山武 位置検出方法および装置
JP2004226372A (ja) * 2003-01-27 2004-08-12 Yamatake Corp 位置検出方法および装置
JP4775946B2 (ja) * 2005-08-30 2011-09-21 株式会社山武 エッジ検出装置

Also Published As

Publication number Publication date
TW200921040A (en) 2009-05-16
CN101398292A (zh) 2009-04-01
KR20090033097A (ko) 2009-04-01
CN101398292B (zh) 2010-12-15
TWI379068B (ko) 2012-12-11
JP2009085679A (ja) 2009-04-23
KR101009598B1 (ko) 2011-01-20

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