JP4868190B2 - ナノ粒子計測装置 - Google Patents
ナノ粒子計測装置 Download PDFInfo
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- JP4868190B2 JP4868190B2 JP2009519105A JP2009519105A JP4868190B2 JP 4868190 B2 JP4868190 B2 JP 4868190B2 JP 2009519105 A JP2009519105 A JP 2009519105A JP 2009519105 A JP2009519105 A JP 2009519105A JP 4868190 B2 JP4868190 B2 JP 4868190B2
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4788—Diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0038—Investigating nanoparticles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
- G01N2015/0216—Investigating a scatter or diffraction pattern from fluctuations of diffraction pattern
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- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
2a,2b 電極
3 誘電体シート
3a スリット
3b 貫通孔
4 電源
5 照射光学系
6 検出光学系
6a ピンホール
6b 光検出器
7 データ収集・解析部
8 制御部
図1は本発明の実施の形態の全体構成図であり、光学的構成を表す模式図と電気的構成を表すブロック図とを併記して示す図である。
Claims (6)
- 媒体中に移動可能に粒子群を分散させてなる試料を保持するセルと、交流もしくは直流電圧を発生する電源と、上記セルの内側に略対向するように形成され、上記電源からの電圧が印加される一対の電極と、その一対の電極の間に配置され、当該電極間に電圧を印加することにより上記セル内に空間周期を有する電界を形成する誘電体シートと、上記セル内に向けて平行光束を照射する照射光学系と、その平行光束が上記セル内を透過することにより発生する回折光を検出する検出光学系と、上記電源から上記一対の電極への電圧の印加を制御する制御手段と、その電圧の印加と停止、もしくは変調による上記回折光の時間変化から、セル内の粒子群の拡散係数および/または粒子径を求めるデータ処理手段を備えていることを特徴とするナノ粒子計測装置。
- 上記セルが互いに対向する透明材料からなる壁体を備え、上記一対の電極は透明電極であって上記対向する壁体に形成され、上記誘電体シートはこれらの各壁体の間にこれらと平行に設けられているとともに、上記照射光学系は一方の透明電極を透過して上記セル内に平行光束を照射し、上記検出光学系は他方の透明電極を介して回折光を検出することを特徴とする請求項1に記載のナノ粒子計測装置。
- 上記セルが互いに対向する透明材料からなる壁体を備え、上記一対の電極は、その各壁体の端部に形成され、上記誘電体シートは上記各壁体の間にこれらと平行に設けられているとともに、上記照射光学系は一対の電極のいずれをも透過せずに一方の壁体を介して上記セル内に平行光束を照射し、上記検出光学系は一対の電極のいずれをも介さずに他方の壁体を介して回折光を検出することを特徴とする請求項1に記載のナノ粒子計測装置。
- 上記誘電体シートは、互いに平行な複数のスリットが形成されてなることを特徴とする請求項1、2または3のいずれか1項に記載のナノ粒子計測装置。
- 上記誘電体シートは、複数の貫通孔が一次元方向に形成されてなる孔列が、互いに平行に複数列形成されてなることを特徴とする請求項1、2または3のいずれか1項に記載のナノ粒子計測装置。
- 上記誘電体シートは、複数の貫通孔が形成され、かつ、その各孔が複数方向への列を形成する位置関係のもとに形成されてなることを特徴とする請求項1、2または3のいずれか1項に記載のナノ粒子計測装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/061919 WO2008152712A1 (ja) | 2007-06-13 | 2007-06-13 | ナノ粒子計測装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2008152712A1 JPWO2008152712A1 (ja) | 2010-08-26 |
JP4868190B2 true JP4868190B2 (ja) | 2012-02-01 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2009519105A Expired - Fee Related JP4868190B2 (ja) | 2007-06-13 | 2007-06-13 | ナノ粒子計測装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8274654B2 (ja) |
JP (1) | JP4868190B2 (ja) |
WO (1) | WO2008152712A1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4973728B2 (ja) * | 2007-05-18 | 2012-07-11 | 株式会社島津製作所 | 光学的測定方法および装置 |
WO2008155854A1 (ja) * | 2007-06-21 | 2008-12-24 | Shimadzu Corporation | 光学的測定の解析方法 |
JP4888673B2 (ja) * | 2007-08-08 | 2012-02-29 | 株式会社島津製作所 | 光学的測定装置およびその電極対 |
EP2589025A2 (fr) * | 2010-07-01 | 2013-05-08 | Thomson Licensing | Procede d'estimation de diffusion de la lumiere |
US8854621B1 (en) * | 2012-08-29 | 2014-10-07 | University Of South Florida | Systems and methods for determining nanoparticle dimensions |
CN106471415B (zh) * | 2014-04-30 | 2019-11-15 | 惠普发展公司,有限责任合伙企业 | 使用基于衍射的照明的成像装置和方法 |
EP3091347A1 (en) | 2015-05-04 | 2016-11-09 | The European Union, represented by the European Commission | Screening of nanoparticle properties |
PT109563B (pt) * | 2016-08-02 | 2020-09-23 | Hovione Farmaciencia Sa | Método para melhorar o desenvolvimento e validação de métodos analíticos e de preparação de amostras para medição precisa e reprodutível do tamanho de partículas |
JP7515391B2 (ja) | 2020-12-14 | 2024-07-12 | 浜松ホトニクス株式会社 | 微粒子捕捉方法及び微粒子捕捉装置 |
KR20240109084A (ko) * | 2023-01-03 | 2024-07-10 | 삼성전자주식회사 | 미세 입자 검출 장치 및 방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0356842A (ja) * | 1989-07-25 | 1991-03-12 | Akira Mizuno | 微粒子の分離方法およびその分離装置 |
WO2006025158A1 (ja) * | 2004-08-30 | 2006-03-09 | Shimadzu Corporation | 光学的測定装置および方法並びにナノ粒子測定方法および装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2639436B1 (fr) * | 1988-10-28 | 1994-07-01 | Schlumberger Ind Sa | Procede et dispositif de localisation de particules neutres, a haute resolution |
US5459406A (en) * | 1994-07-01 | 1995-10-17 | Cornell Research Foundation, Inc. | Guarded capacitance probes for measuring particle concentration and flow |
US6040573A (en) * | 1997-09-25 | 2000-03-21 | Indiana University Advanced Research & Technology Institute Inc. | Electric field generation for charged particle analyzers |
US6764583B2 (en) * | 2000-12-13 | 2004-07-20 | The Regents Of The University Of California | Using impedance measurements for detecting pathogens trapped in an electric field |
US8007332B2 (en) * | 2004-03-15 | 2011-08-30 | Sharp Laboratories Of America, Inc. | Fabrication of a semiconductor nanoparticle embedded insulating film electroluminescence device |
-
2007
- 2007-06-13 US US12/663,772 patent/US8274654B2/en not_active Expired - Fee Related
- 2007-06-13 JP JP2009519105A patent/JP4868190B2/ja not_active Expired - Fee Related
- 2007-06-13 WO PCT/JP2007/061919 patent/WO2008152712A1/ja active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0356842A (ja) * | 1989-07-25 | 1991-03-12 | Akira Mizuno | 微粒子の分離方法およびその分離装置 |
WO2006025158A1 (ja) * | 2004-08-30 | 2006-03-09 | Shimadzu Corporation | 光学的測定装置および方法並びにナノ粒子測定方法および装置 |
Also Published As
Publication number | Publication date |
---|---|
US8274654B2 (en) | 2012-09-25 |
US20100177311A1 (en) | 2010-07-15 |
JPWO2008152712A1 (ja) | 2010-08-26 |
WO2008152712A1 (ja) | 2008-12-18 |
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