JP4863193B2 - Semiconductor light emitting device - Google Patents

Semiconductor light emitting device Download PDF

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JP4863193B2
JP4863193B2 JP2005251614A JP2005251614A JP4863193B2 JP 4863193 B2 JP4863193 B2 JP 4863193B2 JP 2005251614 A JP2005251614 A JP 2005251614A JP 2005251614 A JP2005251614 A JP 2005251614A JP 4863193 B2 JP4863193 B2 JP 4863193B2
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semiconductor light
light emitting
hole
emitting element
inner peripheral
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JP2007067190A (en
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晴志 渡辺
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Stanley Electric Co Ltd
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Stanley Electric Co Ltd
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Priority to CN 200610115708 priority patent/CN1925179B/en
Priority to KR1020060076098A priority patent/KR101252676B1/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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Description

本発明は半導体発光装置に関するものであり、詳しくは、基板に設けられた凹部の内部に半導体発光素子を実装し、該半導体発光素子を樹脂封止した半導体発光装置に関する。   The present invention relates to a semiconductor light emitting device, and more particularly, to a semiconductor light emitting device in which a semiconductor light emitting element is mounted inside a recess provided in a substrate and the semiconductor light emitting element is sealed with a resin.

半導体発光装置については、例えば図7及び図8に示すような構造のものがある。図7は平面図、図8は図7のA−A断面図である。それは、絶縁体50の表面側の対向する両端部に一対の回路パターン51a、51bが形成され、各回路パターン51a、51bは縁部から側面側を経て裏面側に回り込んだ状態に形成されている。また、絶縁体50の表面側の略中央部には凹部52が設けられ、凹部52の内底面53全面及び全内周面54には回路パターンが形成されて絶縁体50の表面側に形成された一対の回路パターン51a、51bの一方の回路パターン51aに接続され、他方の回路パターン51bは絶縁体50の略中央部に向かって延びている。   As the semiconductor light emitting device, for example, there is a structure as shown in FIGS. 7 is a plan view, and FIG. 8 is a cross-sectional view taken along line AA of FIG. That is, a pair of circuit patterns 51a and 51b are formed at opposite end portions on the surface side of the insulator 50, and each circuit pattern 51a and 51b is formed so as to wrap around from the edge to the back surface side through the side surface side. Yes. In addition, a recess 52 is provided in a substantially central portion on the surface side of the insulator 50, and a circuit pattern is formed on the entire inner bottom surface 53 and the entire inner peripheral surface 54 of the recess 52 so as to be formed on the surface side of the insulator 50. The other circuit pattern 51b is connected to one circuit pattern 51a of the pair of circuit patterns 51a and 51b.

そして、凹部52の内底面53には導電性接着剤55を介して半導体発光素子56が載置され、該半導体発光素子56の下側電極と凹部52の内底面53に形成された回路パターン51aとが接続されて電気的導通が図られている。半導体発光素子56の上側電極はボンディングワイヤ57を介して基板の略中央部に向かって延びた回路パターン51bに接続され、電気的導通が図られている。   A semiconductor light emitting element 56 is placed on the inner bottom surface 53 of the recess 52 via a conductive adhesive 55, and a circuit pattern 51 a formed on the lower electrode of the semiconductor light emitting element 56 and the inner bottom surface 53 of the recess 52. Are connected to achieve electrical continuity. The upper electrode of the semiconductor light emitting element 56 is connected to a circuit pattern 51b extending toward a substantially central portion of the substrate via a bonding wire 57, thereby achieving electrical conduction.

更に、半導体発光素子56及びボンディングワイヤ57が透光性樹脂58によって覆われるように樹脂封止され、半導体発光素子56を水分、塵埃及びガス等の外部環境から保護し、且つボンディングワイヤ57を振動及び衝撃等の機械的応力から保護するようにしたものである(例えば、特許文献1参照。)。
特開平7−202271号公報
Further, the semiconductor light emitting element 56 and the bonding wire 57 are sealed with resin so as to be covered with the translucent resin 58, so that the semiconductor light emitting element 56 is protected from the external environment such as moisture, dust and gas, and the bonding wire 57 is vibrated. And protection from mechanical stress such as impact (for example, see Patent Document 1).
JP-A-7-202271

ところで、上記表面実装型の半導体発光装置は他の表面実装型の回路部品と混在させて使用される場合が多く、電子機器の部品実装基板には半田リフローによる表面実装が一般的に行なわれる。その場合、表面実装型の半導体発光装置は一般的に極めて小型であるために半導体発光装置全体が半田リフローによる加熱温度とほぼ同じ温度まで上昇する。   By the way, the surface-mounted semiconductor light emitting device is often used in combination with other surface-mounted circuit components, and surface mounting by solder reflow is generally performed on a component mounting board of an electronic device. In that case, since the surface-mount type semiconductor light emitting device is generally extremely small, the entire semiconductor light emitting device rises to substantially the same temperature as the heating temperature by solder reflow.

そのとき、半導体発光素子及びボンディングワイヤを封止した透光性樹脂と凹部の内底面に形成された回路パターンとの熱膨張係数の差等に起因する応力によって両者の接触界面で剥離が生じる。すると、剥離した透光性樹脂によって導電性接着剤及び半導体発光素子を回路パターンの上方に持ち上げる力が働き、導電性接着剤が回路パターンから剥離して光学的特性劣化及び電気的特性不良を生じる可能性がある。   At that time, peeling occurs at the contact interface between the translucent resin sealing the semiconductor light emitting element and the bonding wire and the stress caused by the difference in thermal expansion coefficient between the circuit pattern formed on the inner bottom surface of the recess. Then, the peeled translucent resin acts to lift the conductive adhesive and the semiconductor light emitting element above the circuit pattern, and the conductive adhesive peels off the circuit pattern, resulting in optical characteristic deterioration and electrical characteristic failure. there is a possibility.

また、部品実装基板に半導体発光装置を実装した後においても、半導体発光装置の点滅の繰り返しによる温度変化によって透光性樹脂が膨張収縮を繰り返し、そのときの樹脂応力も上記同様の作用をおよぼして光学的特性劣化及び電気的特性不良を生じる可能性がある。   Even after the semiconductor light emitting device is mounted on the component mounting board, the translucent resin repeatedly expands and contracts due to temperature changes caused by repeated flashing of the semiconductor light emitting device, and the resin stress at that time also has the same effect as described above. There is a possibility that optical characteristic deterioration and electrical characteristic defect may occur.

そこで、本発明は上記問題に鑑みて創案なされたもので、その目的とするところは、高温の実装環境下及び温度変化の大きい使用環境下における封止樹脂の熱応力の影響を低減し、回路パターンと該回路パターンと半導体発光素子とを電気的に接続する導電性接着剤との界面剥離を抑制することによって光学的特性劣化および電気的特性不良を生じない信頼性の高い半導体発光装置を提供する。   Therefore, the present invention was devised in view of the above problems, and the object of the present invention is to reduce the influence of the thermal stress of the sealing resin under a high-temperature mounting environment and under a use environment with a large temperature change. Providing a highly reliable semiconductor light-emitting device that does not cause optical property deterioration and electrical property failure by suppressing interface peeling between a pattern and a conductive adhesive that electrically connects the circuit pattern and the semiconductor light-emitting element To do.

上記課題を解決するために、本発明の請求項1に記載された発明は、少なくとも1個の半導体発光素子と、前記半導体発光素子を実装する凹部の内底部を形成する半導体発光素子実装基板と、前記凹部の内周部を構成する第一の貫通孔を有する絶縁基板と、前記凹部の内周部を構成する第二の貫通孔を有し、前記第一の貫通孔と前記第二の貫通孔の夫々の中心を結ぶ線が前記半導体発光素子実装基板に略垂直になるように前記半導体発光素子基板と前記絶縁基板との間に配置して前記両基板を貼り合わせる接着シートと、前記第一の貫通孔及び前記第二の貫通孔によって構成された前記凹部の内周部の一部を覆う金属反射面と、前記凹部の内底部に形成され、前記半導体発光素子を実装する金属パターンと、前記凹部内に実装された前記半導体発光素子を封止する封止樹脂部と、を有する半導体発光装置であって、前記第一の貫通孔及び第二の貫通孔は、第二の貫通孔から第一の貫通孔の開口に向かって夫々の中心を結ぶ線に対して略同一角度で外側に傾斜した面で形成されていると共に連続する面で形成され、少なくとも前記第二の貫通孔の内周面の一部は、封止樹脂部に露出していると共に、前記半導体発光素子を中心として対称に2個づつ設けられていることを特徴とするものである。 In order to solve the above-mentioned problem, the invention described in claim 1 of the present invention includes at least one semiconductor light emitting element, and a semiconductor light emitting element mounting substrate for forming an inner bottom portion of a recess for mounting the semiconductor light emitting element. An insulating substrate having a first through-hole constituting the inner peripheral portion of the concave portion, and a second through-hole constituting the inner peripheral portion of the concave portion, the first through-hole and the second An adhesive sheet that is disposed between the semiconductor light emitting element substrate and the insulating substrate so that a line connecting the respective centers of the through holes is substantially perpendicular to the semiconductor light emitting element mounting substrate; A metal reflecting surface that covers a part of the inner peripheral portion of the concave portion constituted by the first through hole and the second through hole, and a metal pattern that is formed on the inner bottom portion of the concave portion and mounts the semiconductor light emitting element And the semiconductor mounted in the recess A semiconductor light-emitting device having a sealing resin portion for sealing the light emitting device, the first through hole and the second through-hole, toward the second through-hole to the opening of the first through hole Formed with a surface inclined outward at substantially the same angle with respect to a line connecting the respective centers, and formed with a continuous surface, and at least a part of the inner peripheral surface of the second through hole is sealed In addition to being exposed to the resin portion, two are provided symmetrically around the semiconductor light emitting element .

本発明の半導体発光装置は、半導体発光装置を構成するベース基板に、少なくとも一方の基板を絶縁基板とする2枚の基板を接着シートを介して貼り合わせたものを採用し、絶縁基板及び接着シートを貫通する凹部を設けて凹部の内底部及び内周部に金属パターンを形成した。そして、凹部の内周面を形成する金属パターンの一部を除去して接着シートの一部、あるいは接着シート及び絶縁基板の夫々の一部を凹部内に露出させ、凹部内に実装された半導体発光素子を封止する封止樹脂と凹部内に露出させた接着シートの一部、あるいは接着シート及び絶縁基板の夫々の一部とが密着して界面を形成するようにした。   The semiconductor light-emitting device of the present invention employs a base substrate constituting the semiconductor light-emitting device in which two substrates each having at least one substrate as an insulating substrate are bonded together via an adhesive sheet. The metal pattern was formed in the inner bottom part and inner peripheral part of the recessed part which provided the recessed part which penetrated. Then, a part of the metal pattern that forms the inner peripheral surface of the recess is removed to expose a part of the adhesive sheet, or a part of the adhesive sheet and the insulating substrate, and the semiconductor mounted in the recess. A sealing resin for sealing the light emitting element and a part of the adhesive sheet exposed in the recess or each part of the adhesive sheet and the insulating substrate are in close contact to form an interface.

その結果、封止樹脂と金属パターンとの接触界面よりも、封止樹脂と露出した接着シートの一部、あるいは接着シート及び絶縁基板の夫々の一部との接触界面の方が密着力が強く、高温の実装環境下及び温度変化の大きい使用環境下において封止樹脂の熱応力の影響を受けたとしても、凹部の内底面に形成された金属パターンと、該金属パターンに半導体発光素子を固定する接着剤あるいは導電性接着剤との界面剥離を抑制することができる。   As a result, the adhesive force is stronger at the contact interface between the sealing resin and a part of the exposed adhesive sheet or between the adhesive sheet and each of the insulating substrate than the contact interface between the sealing resin and the metal pattern. Even under the influence of the thermal stress of the sealing resin under high temperature mounting environment and usage environment where temperature change is large, the metal pattern formed on the inner bottom surface of the recess and the semiconductor light emitting element fixed to the metal pattern It is possible to suppress interfacial peeling from the adhesive or conductive adhesive.

よって、凹部の内底面に形成された金属パターンと、該金属パターンに半導体発光素子を固定する接着剤あるいは導電性接着剤との界面剥離を抑制することによって光学的特性劣化および電気的特性不良を生じない信頼性の高い半導体発光装置を実現することができる。   Therefore, by suppressing the interface peeling between the metal pattern formed on the inner bottom surface of the recess and the adhesive or conductive adhesive for fixing the semiconductor light emitting element to the metal pattern, optical characteristic deterioration and electrical characteristic failure are prevented. A highly reliable semiconductor light emitting device that does not occur can be realized.

以下、この発明の好適な実施形態を図1から図6を参照しながら、詳細に説明する(同一部分については同じ符号を付す)。尚、以下に述べる実施形態は、本発明の好適な具体例であるから、技術的に好ましい種々の限定が付されているが、本発明の範囲は、以下の説明において特に本発明を限定する旨の記載がない限り、これらの実施形態に限られるものではない。   Hereinafter, preferred embodiments of the present invention will be described in detail with reference to FIG. 1 to FIG. 6 (the same parts are given the same reference numerals). The embodiments described below are preferable specific examples of the present invention, and thus various technically preferable limitations are given. However, the scope of the present invention particularly limits the present invention in the following description. Unless stated to the effect, the present invention is not limited to these embodiments.

図1は本発明の半導体発光装置に係わる実施形態を示す斜視図、図2は図1のA−A断面図である。   FIG. 1 is a perspective view showing an embodiment of the semiconductor light emitting device of the present invention, and FIG. 2 is a cross-sectional view taken along the line AA of FIG.

2枚の絶縁基板1a、1bを接着シート2を挟んで貼り合わせることによってベース基板3が形成されている。接着シート2には中央部に略円形状の貫通孔4aが設けられており、接着シートと接する一方の絶縁基板1aにも略円形状の貫通孔4bが設けられている。接着シート2の貫通孔4aと絶縁基板1aの貫通孔4bとは夫々の中心が絶縁基板1aに垂直な略同一直線上に位置している。つまり、ベース基板3の中央部には、接着シート2と接し、貫通孔を有しない絶縁基板1bを内底部5とし、接着シート2の貫通孔4a及び絶縁基板1aの貫通孔4bの夫々の内周面6a、6bを内周部とし、絶縁基板1aの貫通孔4bの一方を開口7とする凹部8が形成されている。   A base substrate 3 is formed by bonding two insulating substrates 1a and 1b with an adhesive sheet 2 interposed therebetween. The adhesive sheet 2 is provided with a substantially circular through hole 4a at the center, and the insulating substrate 1a in contact with the adhesive sheet is also provided with a substantially circular through hole 4b. The centers of the through hole 4a of the adhesive sheet 2 and the through hole 4b of the insulating substrate 1a are located on substantially the same straight line perpendicular to the insulating substrate 1a. That is, the insulating substrate 1b that is in contact with the adhesive sheet 2 and does not have a through-hole is the inner bottom portion 5 at the center of the base substrate 3, and each of the through-hole 4a of the adhesive sheet 2 and the through-hole 4b of the insulating substrate 1a. A recess 8 is formed in which the peripheral surfaces 6a and 6b are inner peripheral portions and one of the through holes 4b of the insulating substrate 1a is an opening 7.

この場合、接着シート2の貫通孔4a及び絶縁基板1aの貫通孔4bの夫々の内周面6a、6bは、接着シート2の貫通孔4aから絶縁基板1aの貫通孔4bの開口7に向かって貫通孔4a及び貫通孔4bの中心軸Xに対して略同一角度で外側に傾斜した面で構成されていると共に、両内周面6a、6bは連続する面を形成している。   In this case, the inner peripheral surfaces 6a and 6b of the through hole 4a of the adhesive sheet 2 and the through hole 4b of the insulating substrate 1a are directed from the through hole 4a of the adhesive sheet 2 toward the opening 7 of the through hole 4b of the insulating substrate 1a. The inner circumferential surface 6a, 6b forms a continuous surface, and is configured by a surface inclined outward at substantially the same angle with respect to the central axis X of the through hole 4a and the through hole 4b.

上記構成のベース基板3には、表面側の対向する両縁部に一対の金属パターン9a、9bが形成されており、夫々の金属パターン9a、9bはベース基板3の縁部から側面側を経て裏面側に回り込んだ状態に形成されている。更に、ベース基板3の両縁部に形成された金属パターン9a、9bは夫々互いに対向するように内側に向かって延びており、そのうちの一方の金属パターン9aはベース基板3に形成された凹部8の内周部10を経て内底部5まで延びており、凹部8の内周面11及び内底面12を形成している。また、他方の金属パターン9bは凹部8の手前まで伸びている。   A pair of metal patterns 9a and 9b are formed on both opposing edge portions on the front surface side of the base substrate 3 having the above configuration, and each metal pattern 9a and 9b passes from the edge portion of the base substrate 3 to the side surface side. It is formed so as to wrap around to the back side. Further, the metal patterns 9a and 9b formed on both edges of the base substrate 3 extend inward so as to face each other, and one of the metal patterns 9a is a recess 8 formed on the base substrate 3. The inner peripheral portion 10 extends to the inner bottom portion 5, and the inner peripheral surface 11 and the inner bottom surface 12 of the concave portion 8 are formed. The other metal pattern 9 b extends to the front of the recess 8.

そして、凹部8の内底面12を形成する金属パターン9a上に導電性接着剤13を介して半導体発光素子14が載置され、半導体発光素子14の下側電極と金属パターン9aとの電気的導通が図られている。一方、半導体発光素子14の上側電極はボンディングワイヤ15を介して金属パターン9bに接続され、半導体発光素子14の上側電極と金属パターン9bとの電気的導通が図られている。   Then, the semiconductor light emitting element 14 is placed on the metal pattern 9a that forms the inner bottom surface 12 of the recess 8 via the conductive adhesive 13, and electrical conduction between the lower electrode of the semiconductor light emitting element 14 and the metal pattern 9a is performed. Is planned. On the other hand, the upper electrode of the semiconductor light emitting element 14 is connected to the metal pattern 9b via the bonding wire 15, and electrical connection between the upper electrode of the semiconductor light emitting element 14 and the metal pattern 9b is achieved.

更に、半導体発光素子14及びボンディングワイヤ15が透光性樹脂16によって覆われるように封止されている。透光性樹脂16は半導体発光素子14を水分、塵埃及びガス等の外部環境から保護し、且つボンディングワイヤ15を振動及び衝撃等の機械的応力から保護する。また、透光性樹脂16は半導体発光素子14の光出射面とで界面を形成しており、半導体発光素子14の発光光を半導体発光素子14の光出射面から透光性樹脂16内に効率良く出射させる機能も有している。   Further, the semiconductor light emitting element 14 and the bonding wire 15 are sealed so as to be covered with the translucent resin 16. The translucent resin 16 protects the semiconductor light emitting element 14 from an external environment such as moisture, dust, and gas, and protects the bonding wire 15 from mechanical stress such as vibration and impact. Further, the translucent resin 16 forms an interface with the light emitting surface of the semiconductor light emitting element 14, and the emitted light of the semiconductor light emitting element 14 is efficiently transmitted from the light emitting surface of the semiconductor light emitting element 14 into the translucent resin 16. It also has a function to emit well.

ところで、凹部8の内周部10には該内周部10を覆うようにベース基板3の縁部から延びる金属パターン9aが内周面11を形成しているが、内周部11全面ではなく、絶縁基板1aの貫通孔4bの内周面6b及び接着シート2の貫通孔4aの内周面6aの夫々に金属パターン9aが形成されない部分が設けられている。具体的な方法としては、凹部8内周部10の全面に金属パター9aンを形成した後に、エッチングによって部分的に金属パターン9aを取り除くものである。   By the way, a metal pattern 9 a extending from the edge of the base substrate 3 is formed on the inner peripheral portion 10 of the recess 8 so as to cover the inner peripheral portion 10, but not the entire inner peripheral portion 11. A portion where the metal pattern 9a is not formed is provided on each of the inner peripheral surface 6b of the through hole 4b of the insulating substrate 1a and the inner peripheral surface 6a of the through hole 4a of the adhesive sheet 2. As a specific method, after the metal pattern 9a is formed on the entire inner peripheral portion 10 of the recess 8, the metal pattern 9a is partially removed by etching.

この場合、接着シート2の貫通孔4aの内周面6aにおいて、金属パターン9aが取り除かれた部分は、前記内周面6aの上端部から下端部に至るまでではなく、上端部から下端部に至る途中までである。つまり、内周面6aの下方は金属パターン9aが取り除かれないで残っている。   In this case, in the inner peripheral surface 6a of the through hole 4a of the adhesive sheet 2, the portion where the metal pattern 9a is removed does not extend from the upper end portion to the lower end portion of the inner peripheral surface 6a but from the upper end portion to the lower end portion. Halfway. That is, the metal pattern 9a remains without being removed under the inner peripheral surface 6a.

上記のような、内底面及び内周面を有する凹部内に充填された透光性樹脂は、内底面及び内周面の一部を構成する金属パターン、及び、内周面の金属パターンが除去されて露出した接着シート2の貫通孔4a及び絶縁基板1aの貫通孔4bの夫々の内周面6a、6bと密着して界面を形成することになる。   As described above, the translucent resin filled in the concave portion having the inner bottom surface and the inner peripheral surface removes the metal pattern constituting the inner bottom surface and a part of the inner peripheral surface, and the metal pattern on the inner peripheral surface. The exposed through holes 4a of the adhesive sheet 2 and the through holes 4b of the insulating substrate 1a are in close contact with the inner peripheral surfaces 6a and 6b to form an interface.

このとき、透光性樹脂に対する密着力は金属パターンよりも露出した接着シート及び絶縁基板の方が強力である。従って、高温の実装環境下及び実使用状態に於いて透光性樹脂による熱応力が加わったとしても、半導体発光素子が実装された凹部の内周部全面が金属パターンで覆われた場合よりも接着シート及び絶縁基板が露出している場合の方が、剥離を抑制する作用が極めて強く働く。   At this time, the adhesive sheet and insulating substrate exposed to the light-transmitting resin are stronger than the metal pattern. Therefore, even when thermal stress due to the light-transmitting resin is applied in a high-temperature mounting environment and in an actual usage state, the entire inner peripheral portion of the concave portion where the semiconductor light emitting element is mounted is covered with a metal pattern. In the case where the adhesive sheet and the insulating substrate are exposed, the effect of suppressing peeling works extremely strongly.

その結果、透光性樹脂によって導電性接着剤及び半導体発光素子を凹部内底面の金属パターン上方に持ち上げる力が加わることがなく、凹部内底面の金属パターン上に塗布された導電性接着剤の金属パターンからの剥離が抑制され、実装時及び長期間の使用に対して光学的特性劣化及び電気的特性不良を生じない信頼性の高い半導体発光装置を実現することができる。   As a result, the translucent resin does not apply a force for lifting the conductive adhesive and the semiconductor light emitting element above the metal pattern on the bottom surface of the recess, and the metal of the conductive adhesive applied on the metal pattern on the bottom surface of the recess. Separation from the pattern is suppressed, and a highly reliable semiconductor light-emitting device that does not cause deterioration of optical characteristics and poor electrical characteristics during mounting and long-term use can be realized.

なお、凹部内周面の金属パターン9aが取り除かれて接着シート2の貫通孔4aの内周面6a及び絶縁基板1aの貫通孔4bの内周面6bが露出する部分は、少なくとも1箇所に任意の形状で設けられることが望ましいが、更に望ましくは凹部の中央部に位置する半導体発光素子を挟んで対称な位置に略同一形状で2箇所設けられ、その配置要領で2箇所以上設けられることである。それは、透光性樹脂と露出部との密着分布が偏らないようにすることによって、より確実な剥離抑制を図ることができるためである。本実施形態では半導体発光素子を挟んだ4箇所に露出部を設けている。   In addition, the metal pattern 9a on the inner peripheral surface of the concave portion is removed, and the inner peripheral surface 6a of the through hole 4a of the adhesive sheet 2 and the inner peripheral surface 6b of the through hole 4b of the insulating substrate 1a are exposed at least in one place. It is desirable to be provided in the shape of, but more desirably, two locations with substantially the same shape are provided at symmetrical positions across the semiconductor light emitting element located in the central portion of the recess, and two or more locations are provided in the arrangement procedure. is there. This is because peeling can be more reliably suppressed by preventing the adhesion distribution between the translucent resin and the exposed portion from being biased. In the present embodiment, exposed portions are provided at four locations across the semiconductor light emitting element.

本実施形態においては、接着シート2の貫通孔4a及び絶縁基板1aの貫通孔4bの夫々の内周面6a、6bによって形成される凹部内周部は、接着シート2の貫通孔4aから絶縁基板1aの貫通孔4bの開口7に向かって貫通孔4a及び貫通孔4bの中心軸Xに対して略同一角度で外側に傾斜した面で構成されていると共に、両内周面6a、6bは連続する面を形成している。   In the present embodiment, the recess inner peripheral portion formed by the inner peripheral surfaces 6a and 6b of the through hole 4a of the adhesive sheet 2 and the through hole 4b of the insulating substrate 1a is separated from the through hole 4a of the adhesive sheet 2 by the insulating substrate. The inner peripheral surfaces 6a and 6b are continuous with each other and are configured to face outwardly at substantially the same angle with respect to the central axis X of the through-hole 4a and the through-hole 4b toward the opening 7 of the through-hole 4b of 1a. The surface to be formed is formed.

それにより、半導体発光素子から略横方向に出射された光を凹部内周面の金属パターンで反射させて上方に向け、できるだけ多くの光を外部に放出させるような光学的効果と、露出した接着シート及び絶縁基板と透光性樹脂との密着力により剥離を抑制する機械的効果の両方の効果を発揮する。   As a result, the light emitted from the semiconductor light emitting element in a substantially lateral direction is reflected by the metal pattern on the inner peripheral surface of the recess and directed upward, and the optical effect that emits as much light as possible to the outside, and the exposed adhesion It exhibits both the mechanical effect of suppressing peeling by the adhesion between the sheet and the insulating substrate and the translucent resin.

従って、除去された後に残る金属パターンの面積、露出部の形状、面積、配置数等は半導体発光装置に求められる上記光学的、機械的特性を考慮して決定される。   Accordingly, the area of the metal pattern remaining after the removal, the shape, the area, the number of arrangement of the exposed portions, and the like are determined in consideration of the optical and mechanical characteristics required for the semiconductor light emitting device.

ここまでは、凹部内に実装される半導体発光素子が、該半導体発光素子を駆動するための電極が半導体発光素子の上側と下側の両面に配置された構造のものを対象に説明してきたが、半導体発光素子には電極が一方の側のみに配置されたものがある。但し、電極と対向する面側にも接合・固定用の金属膜が形成されていることが一般的である。   Up to this point, the semiconductor light emitting device mounted in the recess has been described for a structure in which electrodes for driving the semiconductor light emitting device are arranged on both the upper and lower sides of the semiconductor light emitting device. Some semiconductor light emitting devices have electrodes disposed only on one side. However, it is common that a metal film for bonding / fixing is also formed on the side facing the electrode.

この様な構造の半導体発光素子を実装した半導体発光装置は図3及び図4に示すような構成となる。図3は斜視図、図4は図3のA−A断面図である。   A semiconductor light emitting device in which the semiconductor light emitting element having such a structure is mounted has a configuration as shown in FIGS. 3 is a perspective view, and FIG. 4 is a cross-sectional view taken along line AA of FIG.

本構成の半導体発光装置は、ベース基板に形成される金属パターンの構成が異なる以外は、上記図1及び図2の半導体発光装置と同様である。   The semiconductor light emitting device of this configuration is the same as the semiconductor light emitting device of FIGS. 1 and 2 except that the configuration of the metal pattern formed on the base substrate is different.

上記図1及び図2との金属パターン構成の具体的な違いは以下のようなものである。それは、ベース基板3の表面側の対向する両縁部に形成された一対の金属パターン9a、9bの夫々は内側に向かって延び、凹部8の手前で止まっている。また、凹部8の内周面11及び内底面12を形成する金属パターン9cは一体化されている。つまり、金属パターンはベース基板3の縁部から内側に延びた夫々の金属パターン9a,9b及び凹部8の内周面11及び内底面12を一体に形成する金属パターン9cの夫々分離・独立した3箇所の金属パターンから成っている。   Specific differences in the metal pattern configuration from FIGS. 1 and 2 are as follows. Each of the pair of metal patterns 9 a and 9 b formed on the opposite edges on the surface side of the base substrate 3 extends inward and stops before the recess 8. Moreover, the metal pattern 9c which forms the inner peripheral surface 11 and the inner bottom surface 12 of the recessed part 8 is integrated. In other words, the metal patterns are separated and independent 3 of the metal patterns 9 a and 9 b extending inward from the edge of the base substrate 3 and the metal pattern 9 c integrally forming the inner peripheral surface 11 and the inner bottom surface 12 of the recess 8. It consists of a metal pattern of places.

そして、分離・独立して形成された凹部8内底面12の金属パターン9c上に接着剤17を介して半導体発光素子14が載置され、半導体発光素子14の上面に配置された2つの電極が、夫々ボンディングワイヤ15を介して分離・独立して内側に延びた2つの金属パターン9a、9bに接続されている。   Then, the semiconductor light emitting element 14 is placed on the metal pattern 9c on the inner bottom surface 12 of the recess 8 formed separately and independently via the adhesive 17, and the two electrodes arranged on the upper surface of the semiconductor light emitting element 14 are formed. These are connected to two metal patterns 9a and 9b that are separated and independently extended inward through bonding wires 15, respectively.

また、絶縁基板1aの貫通孔4bの内周面6b及び接着シート2の貫通孔4aの内周面6aの夫々に金属パターン9aをエッチングによって取り除いた部分があり、特に接着シート2の貫通孔4aの内周面6aにおいて、金属パターン9aが取り除かれた部分は、前記内周面6aの上端部から下端部に至るまでである。つまり、内周面6aの上端部から下端部まで金属パターン9aが取り除かれている。   Further, there are portions where the metal pattern 9a is removed by etching on the inner peripheral surface 6b of the through hole 4b of the insulating substrate 1a and the inner peripheral surface 6a of the through hole 4a of the adhesive sheet 2, and in particular, the through hole 4a of the adhesive sheet 2 is removed. In the inner peripheral surface 6a, the portion where the metal pattern 9a is removed is from the upper end portion to the lower end portion of the inner peripheral surface 6a. That is, the metal pattern 9a is removed from the upper end portion to the lower end portion of the inner peripheral surface 6a.

また、上記実施形態における凹部8が、該凹部8の内周部10が接着シート2の貫通孔4aから絶縁基板1aの貫通孔4bの開口7に向かって貫通孔4a及び貫通孔4bの中心軸Xに対して略同一角度で外側に傾斜した面で構成されていたが、これに限られるものではなく、例えば、内周面が貫通孔の中心軸Xに対して平行な面で構成されてもよい。   Further, the concave portion 8 in the above embodiment is configured such that the inner peripheral portion 10 of the concave portion 8 is the central axis of the through hole 4a and the through hole 4b from the through hole 4a of the adhesive sheet 2 toward the opening 7 of the through hole 4b of the insulating substrate 1a. However, the present invention is not limited to this. For example, the inner peripheral surface is formed of a surface parallel to the central axis X of the through hole. Also good.

この場合も、凹部8内周面11の金属パターン9cが取り除かれて接着シート2の貫通孔4aの内周面6a及び絶縁基板1aの貫通孔4bの内周面6bが露出する部分は、少なくとも1箇所以上任意の形状で設けられることが望ましく、更に望ましくは凹部8の中央部に位置する半導体発光素子14を挟んで対称な位置に略同一形状で2箇所設けられた配置方法で1箇所位以上設けられることである、ということは言うまでもない。   Also in this case, the metal pattern 9c on the inner peripheral surface 11 of the recess 8 is removed, and the inner peripheral surface 6a of the through hole 4a of the adhesive sheet 2 and the inner peripheral surface 6b of the through hole 4b of the insulating substrate 1a are exposed at least. It is desirable to provide at least one place in an arbitrary shape, and more desirably, one place by an arrangement method in which two places are provided in substantially the same shape at symmetrical positions across the semiconductor light emitting element 14 located in the central portion of the recess 8. Needless to say, it is provided as described above.

以上は、凹部8の内周部10を形成する接着シート2の貫通孔4aの内周面6a及び絶縁基板1aの貫通孔4bの内周面6bの夫々の一部を金属パターンから露出するようにしているが、接着シート2の貫通孔4aの内周面6aのみの一部を金属パターンから露出させ、絶縁基板1aの貫通孔4bの内周面6bは全面金属パターンで覆うことも可能である。その場合、透光性樹脂と接着シート2の貫通孔4aの内周面6aの露出部との界面で密着力が確保されて剥離を抑制する機械的効果を発揮すると共に、絶縁基板1aの貫通孔4bの内周面6b全面を覆う金属反射面によって半導体発光素子から略横方向に出射された光を有効に外部に放出させるような光学的効果も同時に齎すものである。   As described above, a part of each of the inner peripheral surface 6a of the through hole 4a of the adhesive sheet 2 forming the inner peripheral portion 10 of the recess 8 and the inner peripheral surface 6b of the through hole 4b of the insulating substrate 1a is exposed from the metal pattern. However, only a part of the inner peripheral surface 6a of the through hole 4a of the adhesive sheet 2 is exposed from the metal pattern, and the inner peripheral surface 6b of the through hole 4b of the insulating substrate 1a can be entirely covered with the metal pattern. is there. In that case, the adhesive force is secured at the interface between the translucent resin and the exposed portion of the inner peripheral surface 6a of the through-hole 4a of the adhesive sheet 2 to exhibit a mechanical effect to suppress peeling and the penetration of the insulating substrate 1a. At the same time, an optical effect of effectively emitting light emitted from the semiconductor light emitting element in a substantially lateral direction to the outside by the metal reflecting surface covering the entire inner peripheral surface 6b of the hole 4b is also exhibited.

また、図5に示すように、接着シート2を凹部8内に突出させることも可能である。この場合、凹部8内に充填される透光性樹脂16と接着シート2との接触面積が増大することになって両部材間の密着力が増し、凹部8内底面12を形成する金属パターン9cと、該金属パターン9cに半導体発光素子14を固定する導電性接着剤13との剥離を抑制する作用が極めて強く働くことになる。この場合も上記同様、絶縁基板1aの貫通孔4bの内周面6bを全面金属パターンで覆って反射面とすることも可能である。   Further, as shown in FIG. 5, the adhesive sheet 2 can be protruded into the recess 8. In this case, the contact area between the translucent resin 16 filled in the recess 8 and the adhesive sheet 2 is increased, the adhesion between the two members is increased, and the metal pattern 9c forming the inner bottom surface 12 of the recess 8 And the effect | action which suppresses peeling with the conductive adhesive 13 which fixes the semiconductor light-emitting element 14 to this metal pattern 9c acts very strongly. Also in this case, as described above, the inner peripheral surface 6b of the through hole 4b of the insulating substrate 1a can be covered with the entire metal pattern to be a reflective surface.

なお、半導体発光素子を実装する方の基板(凹部の内底部を構成する基板)を絶縁基板に替えて金属基板にすることもできる。その場合、少なくとも金属パターンが形成される部分には、金属基板と金属パターンとの間に絶縁層を設ける必要がある。基板を金属基板とすることによって半導体発光素子からの熱の放熱が良好になり、半導体発光素子の熱による発光効率低下を抑制して明るさを確保し、且つ熱による封止樹脂の応力を抑制して剥離を阻止することができる。   The substrate on which the semiconductor light emitting element is mounted (the substrate constituting the inner bottom portion of the recess) can be replaced with an insulating substrate to be a metal substrate. In that case, it is necessary to provide an insulating layer between the metal substrate and the metal pattern at least in a portion where the metal pattern is formed. By using a metal substrate as the substrate, heat dissipation from the semiconductor light-emitting element is improved, and the brightness of the semiconductor light-emitting element is suppressed by reducing the light-emitting efficiency due to heat, and the stress of the sealing resin due to heat is suppressed. Thus, peeling can be prevented.

図6は他の実施形態を示す断面図である。絶縁基板1と分離・独立した金属板18a、18bとを接着シート2を挟んで貼り合わせることによってベース基板3が形成されている。接着シート2及び絶縁基板1には夫々中央部に略円形状の貫通孔4a、4bが設けられている。接着シート2の貫通孔4aと絶縁基板1の貫通孔4bとは夫々の中心が金属板18aに垂直な略同一直線上に位置している。つまり、ベース基板3の中央部には、接着シート2と接し、貫通孔を有しない金属板18aを内底部とし、接着シート2の貫通孔4a及び絶縁基板1の貫通孔4bの夫々の内周面6a、6bを内周部とし、絶縁基板1の貫通孔4bの一方を開口7とする凹部8が形成されている。   FIG. 6 is a cross-sectional view showing another embodiment. The base substrate 3 is formed by bonding the insulating substrate 1 and the separated and independent metal plates 18 a and 18 b with the adhesive sheet 2 interposed therebetween. The adhesive sheet 2 and the insulating substrate 1 are provided with substantially circular through holes 4a and 4b in the center. The centers of the through-hole 4a of the adhesive sheet 2 and the through-hole 4b of the insulating substrate 1 are located on substantially the same straight line perpendicular to the metal plate 18a. That is, the central portion of the base substrate 3 is in contact with the adhesive sheet 2 and has a metal plate 18a that does not have a through hole as an inner bottom, and the inner peripheries of the through hole 4a of the adhesive sheet 2 and the through hole 4b of the insulating substrate 1 respectively. A recess 8 is formed with the surfaces 6 a and 6 b as inner peripheries and one of the through holes 4 b of the insulating substrate 1 as an opening 7.

上記構成のベース基板3には、表面側の対向する両縁部に一対の金属パターン9a、9bが形成されており、そのうちの一方の金属パターン9bは絶縁基板1及び接着シート2の夫々の縁部から側面側を経て金属板18bに接続され、他方の金属パターン9aはその一方の端部が絶縁基板1の内周面6bの一部まで延びており、他方の端部が絶縁基板1及び接着シート2の夫々の縁部から側面側を経て金属板18aに接続されている。   The base substrate 3 having the above-described structure has a pair of metal patterns 9a and 9b formed on both opposing edges on the surface side, and one of the metal patterns 9b is the edge of the insulating substrate 1 and the adhesive sheet 2 respectively. One end of the other metal pattern 9a extends to a part of the inner peripheral surface 6b of the insulating substrate 1, and the other end is connected to the insulating substrate 1 and The adhesive sheet 2 is connected to the metal plate 18a through the side surface from each edge.

そして、凹部8の内底面12を形成する金属板18a上に導電性接着剤13を介して半導体発光素子14が載置され、半導体発光素子14の下側電極と金属板18aとの電気的導通が図られている。一方、半導体発光素子14の上側電極はボンディングワイヤ15を介して金属パターン9bに接続され、半導体発光素子14の上側電極と金属パターン9bとの電気的導通が図られている。   Then, the semiconductor light emitting element 14 is placed on the metal plate 18a forming the inner bottom surface 12 of the recess 8 via the conductive adhesive 13, and the lower electrode of the semiconductor light emitting element 14 and the metal plate 18a are electrically connected. Is planned. On the other hand, the upper electrode of the semiconductor light emitting element 14 is connected to the metal pattern 9b via the bonding wire 15, and electrical connection between the upper electrode of the semiconductor light emitting element 14 and the metal pattern 9b is achieved.

更に、半導体発光素子14及びボンディングワイヤ15が透光性樹脂16によって覆われるように樹脂封止されている。   Further, the semiconductor light emitting element 14 and the bonding wire 15 are resin-sealed so as to be covered with the translucent resin 16.

本実施形態においても、凹部8内に露出した絶縁基板1及び接着シート2と透光性樹脂16とが 密着して界面を形成することになり、界面を形成する両部材間の強力な密着力によって高温の実装環境下及び実使用状態に於いて透光性樹脂16による熱応力が加わったとしても、剥離を抑制する作用が極めて強く働くことになる。   Also in the present embodiment, the insulating substrate 1 and the adhesive sheet 2 exposed in the recess 8 and the translucent resin 16 are in close contact to form an interface, and a strong adhesive force between both members forming the interface. Therefore, even if a thermal stress is applied by the translucent resin 16 in a high-temperature mounting environment and in an actual use state, the action of suppressing peeling works extremely strongly.

その結果、透光性樹脂16によって導電性接着剤13及び半導体発光素子14を凹部8内底面12の金属板18a上方に持ち上げる力が加わることがなく、凹部8内底面12の金属板18aに塗布された導電性接着剤13の金属板18aからの剥離が抑制され、実装時及び長期間の使用に対して光学的特性劣化及び電気的特性不良を生じない信頼性の高い半導体発光装置を実現することができる。   As a result, the translucent resin 16 does not apply a force to lift the conductive adhesive 13 and the semiconductor light emitting element 14 above the metal plate 18 a on the inner bottom surface 12 of the recess 8, and is applied to the metal plate 18 a on the inner bottom surface 12 of the recess 8. Peeling of the conductive adhesive 13 made from the metal plate 18a is suppressed, and a highly reliable semiconductor light emitting device that does not cause optical characteristic deterioration and electrical characteristic failure during mounting and long-term use is realized. be able to.

また、半導体発光素子14の下方に金属板18aを設けたことにより、半導体発光装置を実装したときの放熱性が向上し、半導体発光素子14の発光効率の向上及び長寿命化が期待できる。   In addition, by providing the metal plate 18a below the semiconductor light emitting element 14, the heat dissipation when the semiconductor light emitting device is mounted is improved, and the improvement of the light emission efficiency and the long life of the semiconductor light emitting element 14 can be expected.

ところで上記いずれの実施形態においても、接着シートは、樹脂製接着剤をシート状にしたものでもよいし、絶縁体を樹脂製接着剤で被覆したものでもよい。樹脂製接着剤は半導体発光素子の封止樹脂と同種の材質のものが望ましく、例えば、封止樹脂がエポキシ樹脂の場合はエポキシ樹脂系接着剤を使用することが適当である。また、半導体発光素子は、紫外線〜可視光〜赤外線の領域の光を発する発光ダイオード(LED)素子から所望する波長の光を発するLED素子を適宜選択して使用する。   In any of the above embodiments, the adhesive sheet may be a resin adhesive sheet, or an insulator coated with a resin adhesive. The resin adhesive is preferably made of the same material as the sealing resin of the semiconductor light emitting element. For example, when the sealing resin is an epoxy resin, it is appropriate to use an epoxy resin adhesive. In addition, as the semiconductor light emitting element, an LED element that emits light of a desired wavelength is appropriately selected from a light emitting diode (LED) element that emits light in the ultraviolet to visible light to infrared region.

更に、封止樹脂は上記したエポキシ樹脂の他、シリコーン樹脂が使用可能である。更に封止樹脂に拡散剤を混入させて外部に放出させる光を拡散光とするもの、波長変換部材である蛍光体を混入させて半導体発光素子から出射される光とは異なる色調の光を放出させるもの、前記拡散剤と蛍光体の両方を混入させて両方の効果を同時に持たせるもの等が可能である。   In addition to the above-described epoxy resin, a silicone resin can be used as the sealing resin. In addition, the diffuser is mixed with the diffusing agent in the sealing resin to make it diffused light, and the phosphor that is the wavelength conversion member is mixed to emit light with a color tone different from the light emitted from the semiconductor light emitting device. It is possible to mix both the diffusing agent and the phosphor and to have both effects at the same time.

本発明の半導体発光装置に係わる実施形態を示す斜視図である。It is a perspective view which shows embodiment concerning the semiconductor light-emitting device of this invention. 図1のA−A断面図である。It is AA sectional drawing of FIG. 本発明の半導体発光装置に係わる他の実施形態を示す斜視図である。It is a perspective view which shows other embodiment concerning the semiconductor light-emitting device of this invention. 図3のA−A断面図である。It is AA sectional drawing of FIG. 本発明の半導体発光装置に係わる他の実施形態を示す部分断面図である。It is a fragmentary sectional view which shows other embodiment concerning the semiconductor light-emitting device of this invention. 本発明の半導体発光装置に係わる他の実施形態を示す断面図である。It is sectional drawing which shows other embodiment concerning the semiconductor light-emitting device of this invention. 従来の半導体発光装置を示す平面図である。It is a top view which shows the conventional semiconductor light-emitting device. 図7のA−A断面図である。It is AA sectional drawing of FIG.

符号の説明Explanation of symbols

1、1a、1b 絶縁基板
2 接着シート
3 ベース基板
4a、4b 貫通孔
5 内底部
6a、6b 内周面
7 開口
8 凹部
9a、9b、9c 金属パターン
10 内周部
11 内周面
12 内底面
13 導電性接着剤
14 半導体発光素子
15 ボンディングワイヤ
16 透光性樹脂
17 接着剤
18a、18b 金属板
DESCRIPTION OF SYMBOLS 1, 1a, 1b Insulating substrate 2 Adhesive sheet 3 Base substrate 4a, 4b Through-hole 5 Inner bottom part 6a, 6b Inner peripheral surface 7 Opening 8 Recessed part 9a, 9b, 9c Metal pattern 10 Inner peripheral part 11 Inner peripheral surface 12 Inner bottom face 13 Conductive adhesive 14 Semiconductor light emitting element 15 Bonding wire 16 Translucent resin 17 Adhesive 18a, 18b Metal plate

Claims (1)

少なくとも1個の半導体発光素子と、
前記半導体発光素子を実装する凹部の内底部を形成する半導体発光素子実装基板と、
前記凹部の内周部を構成する第一の貫通孔を有する絶縁基板と、
前記凹部の内周部を構成する第二の貫通孔を有し、前記第一の貫通孔と前記第二の貫通孔の夫々の中心を結ぶ線が前記半導体発光素子実装基板に略垂直になるように前記半導体発光素子基板と前記絶縁基板との間に配置して前記両基板を貼り合わせる接着シートと、
前記第一の貫通孔及び前記第二の貫通孔によって構成された前記凹部の内周部の一部を覆う金属反射面と、
前記凹部の内底部に形成され、前記半導体発光素子を実装する金属パターンと、
前記凹部内に実装された前記半導体発光素子を封止する封止樹脂部と、
を有する半導体発光装置であって、
前記第一の貫通孔及び第二の貫通孔は、第二の貫通孔から第一の貫通孔の開口に向かって夫々の中心を結ぶ線に対して略同一角度で外側に傾斜した面で形成されていると共に連続する面で形成され、
少なくとも前記第二の貫通孔の内周面の一部は、封止樹脂部に露出していると共に、前記半導体発光素子を中心として対称に2個づつ設けられていることを特徴とする半導体発光装置。
At least one semiconductor light emitting device;
A semiconductor light emitting device mounting substrate for forming an inner bottom portion of a recess for mounting the semiconductor light emitting device;
An insulating substrate having a first through-hole constituting the inner peripheral portion of the recess;
A second through-hole constituting the inner peripheral portion of the recess is provided, and a line connecting the centers of the first through-hole and the second through-hole is substantially perpendicular to the semiconductor light emitting element mounting substrate. An adhesive sheet that is disposed between the semiconductor light emitting element substrate and the insulating substrate and bonds the two substrates together,
A metal reflecting surface that covers a part of the inner peripheral portion of the recess formed by the first through hole and the second through hole;
A metal pattern that is formed on the inner bottom of the recess and mounts the semiconductor light emitting element;
A sealing resin portion for sealing the semiconductor light emitting element mounted in the recess;
A semiconductor light emitting device comprising:
The first through hole and the second through hole are formed by surfaces inclined outward at substantially the same angle with respect to a line connecting the respective centers from the second through hole toward the opening of the first through hole. Formed with a continuous surface,
At least a part of the inner peripheral surface of the second through-hole is exposed to the sealing resin portion, and two semiconductor light-emitting elements are provided symmetrically around the semiconductor light-emitting element. apparatus.
JP2005251614A 2005-08-31 2005-08-31 Semiconductor light emitting device Expired - Fee Related JP4863193B2 (en)

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KR1020060076098A KR101252676B1 (en) 2005-08-31 2006-08-11 Semiconductor Light Emitting Device

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CN1925179B (en) 2010-05-26

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